JP6743768B2 - 検査装置 - Google Patents

検査装置 Download PDF

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Publication number
JP6743768B2
JP6743768B2 JP2017116208A JP2017116208A JP6743768B2 JP 6743768 B2 JP6743768 B2 JP 6743768B2 JP 2017116208 A JP2017116208 A JP 2017116208A JP 2017116208 A JP2017116208 A JP 2017116208A JP 6743768 B2 JP6743768 B2 JP 6743768B2
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JP
Japan
Prior art keywords
grip
grip portion
contact
gripping
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2017116208A
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English (en)
Japanese (ja)
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JP2019002746A5 (https=
JP2019002746A (ja
Inventor
剛宏 津田
剛宏 津田
孝 直井
孝 直井
健司 十河
健司 十河
信治 大岡
信治 大岡
河野　秀一
秀一 河野
達矢 小澤
達矢 小澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
Denso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp filed Critical Denso Corp
Priority to JP2017116208A priority Critical patent/JP6743768B2/ja
Priority to PCT/JP2018/012263 priority patent/WO2018230085A1/ja
Publication of JP2019002746A publication Critical patent/JP2019002746A/ja
Publication of JP2019002746A5 publication Critical patent/JP2019002746A5/ja
Application granted granted Critical
Publication of JP6743768B2 publication Critical patent/JP6743768B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP2017116208A 2017-06-13 2017-06-13 検査装置 Expired - Fee Related JP6743768B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017116208A JP6743768B2 (ja) 2017-06-13 2017-06-13 検査装置
PCT/JP2018/012263 WO2018230085A1 (ja) 2017-06-13 2018-03-27 検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017116208A JP6743768B2 (ja) 2017-06-13 2017-06-13 検査装置

Publications (3)

Publication Number Publication Date
JP2019002746A JP2019002746A (ja) 2019-01-10
JP2019002746A5 JP2019002746A5 (https=) 2019-09-12
JP6743768B2 true JP6743768B2 (ja) 2020-08-19

Family

ID=64659624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017116208A Expired - Fee Related JP6743768B2 (ja) 2017-06-13 2017-06-13 検査装置

Country Status (2)

Country Link
JP (1) JP6743768B2 (https=)
WO (1) WO2018230085A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019120620A (ja) * 2018-01-09 2019-07-22 株式会社Ｓｏｋｅｎ 検査装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5884569U (ja) * 1981-12-01 1983-06-08 株式会社精工舎 テスタの測定棒
JPS6095562U (ja) * 1983-12-07 1985-06-29 大阪ヒユーズ株式会社 電気回路測定用片手持ち端子棒
JPH0415067U (https=) * 1990-05-28 1992-02-06
JPH08226934A (ja) * 1995-02-22 1996-09-03 Nippon Telegr & Teleph Corp <Ntt> プローブ
JPH10104268A (ja) * 1996-09-25 1998-04-24 Nippon Dempa Kogyo Co Ltd テスト棒
US6276956B1 (en) * 1999-04-12 2001-08-21 Sencore, Inc. Dual point test probe for surface mount type circuit board connections
JP2004170360A (ja) * 2002-11-22 2004-06-17 Kanto Tsusoku Kiki Kk 積層型プローブ及び接触子

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019120620A (ja) * 2018-01-09 2019-07-22 株式会社Ｓｏｋｅｎ 検査装置

Also Published As

Publication number Publication date
JP2019002746A (ja) 2019-01-10
WO2018230085A1 (ja) 2018-12-20

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