JP6696385B2 - 検査装置 - Google Patents
検査装置 Download PDFInfo
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- JP6696385B2 JP6696385B2 JP2016190102A JP2016190102A JP6696385B2 JP 6696385 B2 JP6696385 B2 JP 6696385B2 JP 2016190102 A JP2016190102 A JP 2016190102A JP 2016190102 A JP2016190102 A JP 2016190102A JP 6696385 B2 JP6696385 B2 JP 6696385B2
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- 238000007689 inspection Methods 0.000 title claims description 115
- 238000003702 image correction Methods 0.000 claims description 30
- 238000005259 measurement Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 4
- 230000002950 deficient Effects 0.000 description 23
- 238000000034 method Methods 0.000 description 16
- 238000010586 diagram Methods 0.000 description 12
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000004891 communication Methods 0.000 description 6
- 238000004590 computer program Methods 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 238000005286 illumination Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 1
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
- G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
- G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
- G06T2207/10021—Stereoscopic video; Stereoscopic image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
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- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Geometry (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
502,502A,502B:乖離情報取得部
503,503A,503B:画像補正部
Claims (4)
- 検査装置であって、
被検査物を検査する作業員に装着されるウェアラブルカメラが撮像した前記被検査物を含む画像データを取得する画像取得部(501)と、
前記画像データにおける前記被検査物の規定距離からの乖離距離及び規定角度からの乖離角の少なくとも一方を算出するための乖離情報を取得する乖離情報取得部(502)と、
前記画像データと前記乖離情報とに基づいて、前記乖離距離及び前記乖離角の少なくとも一方を算出し、前記画像データを補正する画像補正部(503)と、を備え、
前記乖離情報取得部は、前記ウェアラブルカメラと平行等位に配置されてなる補助ウェアラブルカメラが撮像した前記被検査物を含む補助画像データを取得し、
前記画像補正部は、前記画像データ及び前記補助画像データにおける前記被検査物の視差から前記乖離距離及び前記乖離角の少なくとも一方を算出する、検査装置。 - 検査装置であって、
被検査物を検査する作業員に装着されるウェアラブルカメラが撮像した前記被検査物を含む画像データを取得する画像取得部(501A)と、
前記画像データにおける前記被検査物の規定距離からの乖離距離及び規定角度からの乖離角の少なくとも一方を算出するための乖離情報を取得する乖離情報取得部(502A)と、
前記画像データと前記乖離情報とに基づいて、前記乖離距離及び前記乖離角の少なくとも一方を算出し、前記画像データを補正する画像補正部(503A)と、を備え、
前記乖離情報取得部は、前記ウェアラブルカメラの光軸と予め定められた角度で発射された測距光に基づく前記被検査物の距離情報を取得し、
前記画像補正部は、前記画像データ及び前記距離情報から、前記乖離距離及び前記乖離角の少なくとも一方を算出する、検査装置。 - 検査装置であって、
被検査物を検査する作業員に装着されるウェアラブルカメラが撮像した前記被検査物を含む画像データを取得する画像取得部(501B)と、
前記画像データにおける前記被検査物の規定距離からの乖離距離及び規定角度からの乖離角の少なくとも一方を算出するための乖離情報を取得する乖離情報取得部(502B)と、
前記画像データと前記乖離情報とに基づいて、前記乖離距離及び前記乖離角の少なくとも一方を算出し、前記画像データを補正する画像補正部(503B)と、を備え、
前記乖離情報取得部は、前記画像データにおいて前記被検査物と共に撮像される位置特定情報を前記乖離情報として取得し、
前記画像補正部は、前記被検査物と前記位置特定情報との相対的な位置関係から、前記乖離距離及び前記乖離角の少なくとも一方を算出するものであって、
前記位置特定情報は、前記被検査物が載置される部分に記された格子状の模様である、検査装置。 - 検査装置であって、
被検査物を検査する作業員に装着されるウェアラブルカメラが撮像した前記被検査物を含む画像データを取得する画像取得部(501B)と、
前記画像データにおける前記被検査物の規定距離からの乖離距離及び規定角度からの乖離角の少なくとも一方を算出するための乖離情報を取得する乖離情報取得部(502B)と、
前記画像データと前記乖離情報とに基づいて、前記乖離距離及び前記乖離角の少なくとも一方を算出し、前記画像データを補正する画像補正部(503B)と、を備え、
前記乖離情報取得部は、前記画像データにおいて前記被検査物と共に撮像される位置特定情報を前記乖離情報として取得し、
前記画像補正部は、前記被検査物と前記位置特定情報との相対的な位置関係から、前記乖離距離及び前記乖離角の少なくとも一方を算出するものであって、
前記位置特定情報は、前記被検査物が載置される部分における既知の形状情報である、検査装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016190102A JP6696385B2 (ja) | 2016-09-28 | 2016-09-28 | 検査装置 |
PCT/JP2017/034896 WO2018062242A1 (ja) | 2016-09-28 | 2017-09-27 | 検査装置 |
US16/362,823 US20190220999A1 (en) | 2016-09-28 | 2019-03-25 | Inspection device |
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JP2016190102A JP6696385B2 (ja) | 2016-09-28 | 2016-09-28 | 検査装置 |
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Publication Number | Publication Date |
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JP2018054438A JP2018054438A (ja) | 2018-04-05 |
JP6696385B2 true JP6696385B2 (ja) | 2020-05-20 |
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JP2016190102A Expired - Fee Related JP6696385B2 (ja) | 2016-09-28 | 2016-09-28 | 検査装置 |
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US (1) | US20190220999A1 (ja) |
JP (1) | JP6696385B2 (ja) |
WO (1) | WO2018062242A1 (ja) |
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Publication number | Priority date | Publication date | Assignee | Title |
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JP6658430B2 (ja) * | 2016-09-28 | 2020-03-04 | 株式会社デンソー | 検査装置 |
EP3859268B1 (en) * | 2018-09-28 | 2023-04-26 | Panasonic Intellectual Property Management Co., Ltd. | Measurement device and measurement method |
CA3136082A1 (en) * | 2019-04-19 | 2020-10-22 | Ovad Custom Stages, Llc | Photographic paddle and process of use thereof |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2751720B2 (ja) * | 1992-03-25 | 1998-05-18 | 凸版印刷株式会社 | 外観検査機のための検査エリア設定治具及び装置 |
US7079707B2 (en) * | 2001-07-20 | 2006-07-18 | Hewlett-Packard Development Company, L.P. | System and method for horizon correction within images |
US20090123060A1 (en) * | 2004-07-29 | 2009-05-14 | Agency For Science, Technology And Research | inspection system |
US20090097737A1 (en) * | 2004-12-10 | 2009-04-16 | Olympus Corporation | Visual inspection apparatus |
JPWO2007141857A1 (ja) * | 2006-06-08 | 2009-10-15 | オリンパス株式会社 | 外観検査装置 |
JP2008014700A (ja) * | 2006-07-04 | 2008-01-24 | Olympus Corp | ワークの検査方法及びワーク検査装置 |
US20120206485A1 (en) * | 2010-02-28 | 2012-08-16 | Osterhout Group, Inc. | Ar glasses with event and sensor triggered user movement control of ar eyepiece facilities |
JP6506098B2 (ja) * | 2014-11-19 | 2019-04-24 | 日本電産サンキョー株式会社 | 測距装置及び測距方法 |
JP6600945B2 (ja) * | 2015-01-20 | 2019-11-06 | セイコーエプソン株式会社 | 頭部装着型表示装置、頭部装着型表示装置の制御方法、および、コンピュータープログラム |
-
2016
- 2016-09-28 JP JP2016190102A patent/JP6696385B2/ja not_active Expired - Fee Related
-
2017
- 2017-09-27 WO PCT/JP2017/034896 patent/WO2018062242A1/ja active Application Filing
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2019
- 2019-03-25 US US16/362,823 patent/US20190220999A1/en not_active Abandoned
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US20190220999A1 (en) | 2019-07-18 |
JP2018054438A (ja) | 2018-04-05 |
WO2018062242A1 (ja) | 2018-04-05 |
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