JP2018054438A - 検査装置 - Google Patents
検査装置 Download PDFInfo
- Publication number
- JP2018054438A JP2018054438A JP2016190102A JP2016190102A JP2018054438A JP 2018054438 A JP2018054438 A JP 2018054438A JP 2016190102 A JP2016190102 A JP 2016190102A JP 2016190102 A JP2016190102 A JP 2016190102A JP 2018054438 A JP2018054438 A JP 2018054438A
- Authority
- JP
- Japan
- Prior art keywords
- image data
- inspection
- divergence
- information
- distance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 130
- 238000003702 image correction Methods 0.000 claims abstract description 26
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000000926 separation method Methods 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 26
- 238000004891 communication Methods 0.000 description 14
- 238000000034 method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 238000004590 computer program Methods 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
- G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
- G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
- G06T2207/10021—Stereoscopic video; Stereoscopic image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Geometry (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
【解決手段】検査装置1は、ウェアラブルカメラが撮像した被検査物を含む画像データを取得する画像取得部501と、画像データにおける被検査物の規定距離からの乖離距離及び規定角度からの乖離角の少なくとも一方を算出するための乖離情報を取得する乖離情報取得部502と、画像データと乖離情報とに基づいて、乖離距離及び前記乖離角の少なくとも一方を算出し、画像データを補正する画像補正部503と、を備える。
【選択図】図3
Description
502,502A,502B:乖離情報取得部
503,503A,503B:画像補正部
Claims (6)
- 検査装置であって、
被検査物を検査する作業員に装着されるウェアラブルカメラが撮像した前記被検査物を含む画像データを取得する画像取得部(501,501A,501B)と、
前記画像データにおける前記被検査物の規定距離からの乖離距離及び規定角度からの乖離角の少なくとも一方を算出するための乖離情報を取得する乖離情報取得部(502,502A,502B)と、
前記画像データと前記乖離情報とに基づいて、前記乖離距離及び前記乖離角の少なくとも一方を算出し、前記画像データを補正する画像補正部(503,503A,503B)と、を備える検査装置。 - 請求項1に記載の検査装置であって、
前記乖離情報取得部(502)は、前記ウェアラブルカメラと平行等位に配置されてなる補助ウェアラブルカメラが撮像した前記被検査物を含む補助画像データを取得し、
前記画像補正部(503)は、前記画像データ及び前記補助画像データにおける前記被検査物の視差から前記乖離距離及び前記乖離角の少なくとも一方を算出する、検査装置。 - 請求項1に記載の検査装置であって、
前記乖離情報取得部(502A)は、前記ウェアラブルカメラの光軸と予め定められた角度で発射された測距光に基づく前記被検査物の距離情報を取得し、
前記画像補正部(503A)は、前記画像データ及び前記距離情報から、前記乖離距離及び前記乖離角の少なくとも一方を算出する、検査装置。 - 請求項1に記載の検査装置であって、
前記乖離情報取得部(502B)は、前記画像データにおいて前記被検査物と共に撮像される位置特定情報を前記乖離情報として取得し、
前記画像補正部(503B)は、前記被検査物と前記位置特定情報との相対的な位置関係から、前記乖離距離及び前記乖離角の少なくとも一方を算出する、検査装置。 - 請求項4に記載の検査装置であって、
前記位置特定情報は、前記被検査物が載置される部分に記された格子状の模様である、検査装置。 - 請求項4に記載の検査装置であって、
前記位置特定情報は、前記被検査物が載置される部分における既知の形状情報である、検査装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016190102A JP6696385B2 (ja) | 2016-09-28 | 2016-09-28 | 検査装置 |
PCT/JP2017/034896 WO2018062242A1 (ja) | 2016-09-28 | 2017-09-27 | 検査装置 |
US16/362,823 US20190220999A1 (en) | 2016-09-28 | 2019-03-25 | Inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016190102A JP6696385B2 (ja) | 2016-09-28 | 2016-09-28 | 検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018054438A true JP2018054438A (ja) | 2018-04-05 |
JP6696385B2 JP6696385B2 (ja) | 2020-05-20 |
Family
ID=61759762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016190102A Expired - Fee Related JP6696385B2 (ja) | 2016-09-28 | 2016-09-28 | 検査装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20190220999A1 (ja) |
JP (1) | JP6696385B2 (ja) |
WO (1) | WO2018062242A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020066847A1 (ja) * | 2018-09-28 | 2020-04-02 | パナソニックIpマネジメント株式会社 | 採寸装置及び採寸方法 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6658430B2 (ja) * | 2016-09-28 | 2020-03-04 | 株式会社デンソー | 検査装置 |
CA3136082A1 (en) * | 2019-04-19 | 2020-10-22 | Ovad Custom Stages, Llc | Photographic paddle and process of use thereof |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05273133A (ja) * | 1992-03-25 | 1993-10-22 | Toppan Printing Co Ltd | 外観検査機のための検査エリア設定治具及び装置 |
WO2007141857A1 (ja) * | 2006-06-08 | 2007-12-13 | Olympus Corporation | 外観検査装置 |
JP2008014700A (ja) * | 2006-07-04 | 2008-01-24 | Olympus Corp | ワークの検査方法及びワーク検査装置 |
US20090123060A1 (en) * | 2004-07-29 | 2009-05-14 | Agency For Science, Technology And Research | inspection system |
JP2016105068A (ja) * | 2014-11-19 | 2016-06-09 | 日本電産サンキョー株式会社 | 測距装置及び測距方法 |
JP2016133399A (ja) * | 2015-01-20 | 2016-07-25 | セイコーエプソン株式会社 | 頭部装着型表示装置、頭部装着型表示装置の制御方法、および、コンピュータープログラム |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7079707B2 (en) * | 2001-07-20 | 2006-07-18 | Hewlett-Packard Development Company, L.P. | System and method for horizon correction within images |
US20090097737A1 (en) * | 2004-12-10 | 2009-04-16 | Olympus Corporation | Visual inspection apparatus |
US20120206485A1 (en) * | 2010-02-28 | 2012-08-16 | Osterhout Group, Inc. | Ar glasses with event and sensor triggered user movement control of ar eyepiece facilities |
-
2016
- 2016-09-28 JP JP2016190102A patent/JP6696385B2/ja not_active Expired - Fee Related
-
2017
- 2017-09-27 WO PCT/JP2017/034896 patent/WO2018062242A1/ja active Application Filing
-
2019
- 2019-03-25 US US16/362,823 patent/US20190220999A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05273133A (ja) * | 1992-03-25 | 1993-10-22 | Toppan Printing Co Ltd | 外観検査機のための検査エリア設定治具及び装置 |
US20090123060A1 (en) * | 2004-07-29 | 2009-05-14 | Agency For Science, Technology And Research | inspection system |
WO2007141857A1 (ja) * | 2006-06-08 | 2007-12-13 | Olympus Corporation | 外観検査装置 |
JP2008014700A (ja) * | 2006-07-04 | 2008-01-24 | Olympus Corp | ワークの検査方法及びワーク検査装置 |
JP2016105068A (ja) * | 2014-11-19 | 2016-06-09 | 日本電産サンキョー株式会社 | 測距装置及び測距方法 |
JP2016133399A (ja) * | 2015-01-20 | 2016-07-25 | セイコーエプソン株式会社 | 頭部装着型表示装置、頭部装着型表示装置の制御方法、および、コンピュータープログラム |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020066847A1 (ja) * | 2018-09-28 | 2020-04-02 | パナソニックIpマネジメント株式会社 | 採寸装置及び採寸方法 |
JPWO2020066847A1 (ja) * | 2018-09-28 | 2021-08-30 | パナソニックIpマネジメント株式会社 | 採寸装置及び採寸方法 |
JP7249494B2 (ja) | 2018-09-28 | 2023-03-31 | パナソニックIpマネジメント株式会社 | 採寸装置及び採寸方法 |
Also Published As
Publication number | Publication date |
---|---|
US20190220999A1 (en) | 2019-07-18 |
JP6696385B2 (ja) | 2020-05-20 |
WO2018062242A1 (ja) | 2018-04-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6337822B2 (ja) | 検査装置、およびプログラム | |
WO2018062238A1 (ja) | 検査装置 | |
JP5679560B2 (ja) | 寸法測定装置、寸法測定方法及び寸法測定装置用のプログラム | |
US10480931B2 (en) | Dimension measuring apparatus, information reading apparatus having measuring function, and dimension measuring method | |
CN108965690B (zh) | 图像处理系统、图像处理装置及计算机可读存储介质 | |
CN107860311B (zh) | 操作三角测量法激光扫描器以识别工件的表面特性的方法 | |
WO2018062242A1 (ja) | 検査装置 | |
US20120133487A1 (en) | Rfid tag position detection apparatus and rfid tag position detection method | |
JP2017187988A (ja) | コード認識装置 | |
JP6696384B2 (ja) | 検査装置 | |
CN109715307B (zh) | 具有工作区图像捕获设备的弯曲机以及用于表示工作区的方法 | |
CN107656637A (zh) | 一种利用手动选取四点的投影键盘的自动化标定方法 | |
CN107907055B (zh) | 图案投射模组、三维信息获取系统、处理装置及测量方法 | |
US10705025B2 (en) | Inspection device | |
CN108681209A (zh) | 检测设备及方法、图案形成设备、获取方法和制造方法 | |
WO2019080812A1 (zh) | 一种帮助确认目标物体上的目标区域的装置及包括该装置的设备 | |
WO2018062241A1 (ja) | 検査装置 | |
US10908095B2 (en) | Inspection device | |
US20200338919A1 (en) | Laser marking through the lens of an image scanning system | |
US10752017B2 (en) | Laser marking through the lens of an image scanning system with multiple location image calibration | |
TWI504859B (zh) | 拍攝並拼接物件影像的方法 | |
JP6610487B2 (ja) | 検査装置 | |
JP6165069B2 (ja) | 罫書き作業支援システム、罫書き作業方法及び機械加工部品 | |
JP2019135572A (ja) | バーコード読取装置、及びバーコード読取方法、プログラム | |
US20220381678A1 (en) | Non-spatial measurement calibration methods and associated systems and devices |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20180906 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190924 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20191119 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20200324 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20200406 |
|
R151 | Written notification of patent or utility model registration |
Ref document number: 6696385 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R151 |
|
LAPS | Cancellation because of no payment of annual fees |