JP6609109B2 - 熱電変換素子およびその製造方法、および熱電発電装置およびペルチェ装置 - Google Patents

熱電変換素子およびその製造方法、および熱電発電装置およびペルチェ装置 Download PDF

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JP6609109B2
JP6609109B2 JP2015083899A JP2015083899A JP6609109B2 JP 6609109 B2 JP6609109 B2 JP 6609109B2 JP 2015083899 A JP2015083899 A JP 2015083899A JP 2015083899 A JP2015083899 A JP 2015083899A JP 6609109 B2 JP6609109 B2 JP 6609109B2
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material layer
layer
thermoelectric conversion
conversion element
electrode
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JP2016207708A (ja
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和也 長瀬
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Rohm Co Ltd
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Rohm Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N10/00Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
    • H10N10/80Constructional details
    • H10N10/85Thermoelectric active materials
    • H10N10/851Thermoelectric active materials comprising inorganic compositions
    • H10N10/855Thermoelectric active materials comprising inorganic compositions comprising compounds containing boron, carbon, oxygen or nitrogen
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/20Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
    • H01L29/201Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds including two or more compounds, e.g. alloys
    • H01L29/205Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds including two or more compounds, e.g. alloys in different semiconductor regions, e.g. heterojunctions
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N11/00Generators or motors not provided for elsewhere; Alleged perpetua mobilia obtained by electric or magnetic means
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N10/00Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
    • H10N10/10Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects
    • H10N10/17Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects characterised by the structure or configuration of the cell or thermocouple forming the device
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N10/00Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
    • H10N10/80Constructional details
    • H10N10/85Thermoelectric active materials
    • H10N10/857Thermoelectric active materials comprising compositions changing continuously or discontinuously inside the material

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Hall/Mr Elements (AREA)
JP2015083899A 2015-04-16 2015-04-16 熱電変換素子およびその製造方法、および熱電発電装置およびペルチェ装置 Active JP6609109B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015083899A JP6609109B2 (ja) 2015-04-16 2015-04-16 熱電変換素子およびその製造方法、および熱電発電装置およびペルチェ装置
PCT/JP2016/051215 WO2016166997A1 (fr) 2015-04-16 2016-01-18 Élément de conversion thermoélectrique et son procédé de production, et dispositif de production d'énergie thermoélectrique et dispositif de peltier

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JP2015083899A JP6609109B2 (ja) 2015-04-16 2015-04-16 熱電変換素子およびその製造方法、および熱電発電装置およびペルチェ装置

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JP2016207708A JP2016207708A (ja) 2016-12-08
JP6609109B2 true JP6609109B2 (ja) 2019-11-20

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JP (1) JP6609109B2 (fr)
WO (1) WO2016166997A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017065306A1 (fr) * 2015-10-16 2017-04-20 学校法人東京理科大学 Matériau semi-conducteur, procédé pour générer une porteuse dans une couche conductrice de l'électricité, élément de conversion thermoélectrique et élément de commutation
JP6957420B2 (ja) * 2018-07-18 2021-11-02 株式会社東芝 発電素子、発電モジュール、発電装置及び発電システム
US11038048B2 (en) 2019-10-01 2021-06-15 Taiwan Semiconductor Manufacturing Company, Ltd. Gallium nitride-on-silicon devices
WO2022055248A1 (fr) 2020-09-08 2022-03-17 한양대학교에리카산학협력단 Composite thermoélectrique, son procédé de préparation, et dispositif thermoélectrique et dispositif à semi-conducteur comprenant chacun un composite thermoélectrique
KR102597072B1 (ko) * 2020-09-08 2023-11-01 한양대학교 에리카산학협력단 이성분계 산화물 2deg 및 2dhg 열전 소자 기반 능동 냉각 장치 및 그 제조방법
KR102508546B1 (ko) * 2020-09-08 2023-03-09 한양대학교 에리카산학협력단 2차원 전자 가스 및 2차원 정공 가스 기반의 열전 소자, 및 그 제조방법
WO2024010483A1 (fr) * 2022-07-06 2024-01-11 Общество С Ограниченной Ответственностью "Технология Твердотельного Охлаждения" Dispositif de refroidissement à semi-conducteur

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
JP2654828B2 (ja) * 1989-05-22 1997-09-17 日本電信電話株式会社 量子細線を有する半導体装置及びその製造方法
JPH06310426A (ja) * 1993-04-21 1994-11-04 Hitachi Ltd 量子細線構造
JP4872050B2 (ja) * 2007-11-02 2012-02-08 株式会社豊田中央研究所 熱電素子
JP2010153748A (ja) * 2008-12-26 2010-07-08 Sanken Electric Co Ltd 電界効果半導体装置の製造方法
JP2010238699A (ja) * 2009-03-30 2010-10-21 Nippon Telegr & Teleph Corp <Ntt> 半導体装置
DE112010003214B4 (de) * 2009-08-07 2016-06-16 Ngk Insulators, Ltd. Epitaxiesubstrat für eine halbleitervorrichtung, verfahren zur herstellung eines epitaxiesubstrats für eine halbleitervorrichtung, und halbleitervorrichtung
JP2011071356A (ja) * 2009-09-26 2011-04-07 Sanken Electric Co Ltd 半導体装置
JP5672734B2 (ja) * 2010-03-25 2015-02-18 富士通株式会社 半導体装置及びその製造方法
US8716141B2 (en) * 2011-03-04 2014-05-06 Transphorm Inc. Electrode configurations for semiconductor devices
WO2013137957A2 (fr) * 2011-12-21 2013-09-19 The Regents Of The University Of California Amélioration de propriétés thermoélectriques par une technique de polarisation

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WO2016166997A1 (fr) 2016-10-20
JP2016207708A (ja) 2016-12-08

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