JP6593342B2 - 測色センサ装置及び画像形成装置 - Google Patents
測色センサ装置及び画像形成装置 Download PDFInfo
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- G03G15/00—Apparatus for electrographic processes using a charge pattern
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- G03G15/5062—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control by measuring the characteristics of an image on the copy material
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
- G01J2003/102—Plural sources
- G01J2003/106—Plural sources the two sources being alternating or selectable, e.g. in two ranges or line:continuum
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
- G01N2021/155—Monitoring cleanness of window, lens, or other parts
- G01N2021/157—Monitoring by optical means
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G21/00—Arrangements not provided for by groups G03G13/00 - G03G19/00, e.g. cleaning, elimination of residual charge
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Description
第1の局面に係るセンサ装置は、光の通過口を有する筐体と、前記筐体に収容された受光レンズと、前記通過口に配置された透明部材と、を備え、前記透明部材を介して前記受光レンズで受光された光を電気信号に変換して出力するセンサヘッドと、前記センサヘッドから出力された前記電気信号を利用して、前記受光レンズで受光された光の光量を演算する光量演算部と、前記光量演算部で演算された前記光量が、予め定められた値以下であるか否かを判定する第1の判定部と、前記第1の判定部によって、前記光量が前記予め定められた値以下と判定されたとき、所定の報知をする報知部と、を備える。
Claims (3)
- 光の通過口を有する筐体と、前記筐体に収容された受光レンズと、前記通過口に配置された透明部材と、前記透明部材を介して前記受光レンズで受光された光を電気信号に変換する測色部と、を備え、前記電気信号を出力するセンサヘッドと、
前記センサヘッドから出力された前記電気信号を利用して、前記受光レンズで受光された光の光量を演算する光量演算部と、
前記光量演算部で演算された前記光量が、予め定められた値以下であるか否かを判定する第1の判定部と、
前記第1の判定部によって、前記光量が前記予め定められた値以下と判定されたとき、所定の報知をする報知部と、
を備える測色センサ装置であって、
前記センサヘッドは、前記筐体に収容され、光源部から出射された照明光を反射し、前記透明部材を介して試料面に照明光を照射するミラーを含む1以上のミラーを、さらに備え、
前記受光レンズは、前記試料面で反射された反射光を、前記透明部材を介して受光し、
前記測色センサ装置は、さらに、
前記第1の判定部によって、前記光量が前記予め定められた値以下と判定されたとき、前記受光レンズで受光された前記反射光について、短波長側の予め定められた第1の波長成分の反射率と、長波長側の予め定められた第2の波長成分の反射率と、を演算する反射率演算部と、
前記第1の波長成分の反射率の基準値に対する、前記反射率演算部で演算された前記第1の波長成分の反射率の減少量、及び、前記第2の波長成分の反射率の基準値に対する、前記反射率演算部で演算された前記第2の波長成分の反射率の減少量をそれぞれ演算し、前記第1の波長成分の方が前記第2の波長成分よりも前記減少量が大きいとき、前記1以上のミラーの劣化と判定する第2の判定部と、を備え、
前記報知部は、前記第2の判定部によって前記1以上のミラーの劣化が判定されたとき、前記1以上のミラーの劣化を示す報知をする、測色センサ装置。 - 光の通過口を有する筐体と、前記通過口に配置された透明部材と、前記筐体に収容され、前記透明部材を介して試料面に照射する照明光を出射する第1の光源部と、前記筐体に収容され、前記試料面で反射された反射光を、前記透明部材を介して受光する受光レンズと、を備え、前記透明部材を介して前記受光レンズで受光された前記反射光を電気信号に変換して出力するセンサヘッドと、
前記透明部材に紫外線を照射する第2の光源部と、
前記第2の光源部によって、前記透明部材に前記紫外線が照射されているときに、前記センサヘッドから出力された前記電気信号を利用して、前記受光レンズで受光された光の光量を演算する光量演算部と、
前記光量演算部で演算された前記光量が、予め定められた値以上であるか否かを判定する判定部と、
前記判定部よって、前記光量が前記予め定められた値以上と判定されたとき、所定の報知をする報知部と、を備える測色センサ装置。 - 用紙を搬送する搬送路と、
前記搬送路を用いて搬送されてきた前記用紙に、画像データで示される画像を形成する画像形成部と、
前記用紙に形成された前記画像の色を測定する請求項1または2に記載の測色センサ装置と、を備える画像形成装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2014248001 | 2014-12-08 | ||
JP2014248001 | 2014-12-08 | ||
PCT/JP2015/082757 WO2016093043A1 (ja) | 2014-12-08 | 2015-11-20 | 測色センサ装置及び画像形成装置 |
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JP6765722B2 (ja) * | 2017-09-15 | 2020-10-07 | スガ試験機株式会社 | 光学特性測定器 |
US10769505B2 (en) | 2018-03-20 | 2020-09-08 | Ricoh Company, Ltd. | Optical sensor device performing color correction using light adjustment |
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JPH11202696A (ja) | 1998-01-20 | 1999-07-30 | Canon Inc | 画像形成装置 |
US6359212B1 (en) * | 2000-07-13 | 2002-03-19 | Trw Inc. | Method for testing solar cell assemblies and second surface mirrors by ultraviolet reflectometry for susceptibility to ultraviolet degradation |
EP1213569B1 (de) * | 2000-12-08 | 2006-05-17 | Gretag-Macbeth AG | Vorrichtung zur bildelementweisen Ausmessung eines flächigen Messobjekts |
EP1213568B1 (de) * | 2000-12-08 | 2005-12-28 | Gretag-Macbeth AG | Vorrichtung zur bildelementweisen Ausmessung eines flächigen Messobjekts |
KR100566152B1 (ko) * | 2002-08-30 | 2006-03-31 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피장치 및 디바이스 제조방법 |
US7557969B2 (en) * | 2004-03-22 | 2009-07-07 | Kabushiki Kaisha Toshiba | Color balance correction chart, color balance correction method, and image forming apparatus |
US7259853B2 (en) | 2004-12-22 | 2007-08-21 | Xerox Corporation | Systems and methods for augmenting spectral range of an LED spectrophotometer |
EP1694049B1 (de) * | 2005-02-16 | 2009-07-01 | X-Rite Europe GmbH | Farbmessgerät und zugehöriger Messkopf |
US7688447B2 (en) * | 2005-12-29 | 2010-03-30 | Honeywell International Inc. | Color sensor |
EP1936337B1 (de) | 2006-12-21 | 2010-06-02 | X-Rite Europe GmbH | Farbmesskopf und damit ausgestattete Abtastvorrichtung |
JP5299138B2 (ja) | 2009-07-21 | 2013-09-25 | コニカミノルタ株式会社 | 反射特性測定装置、反射特性測定システム |
EP2447686B1 (en) * | 2010-10-28 | 2014-05-21 | Canon Kabushiki Kaisha | Spectral colorimetric apparatus and image forming apparatus including the same |
JP5864848B2 (ja) | 2010-10-28 | 2016-02-17 | キヤノン株式会社 | 分光測色装置及びそれを有する画像形成装置 |
JP5806527B2 (ja) | 2011-06-30 | 2015-11-10 | キヤノン株式会社 | 画像形成装置、およびその制御方法 |
EP2620284B1 (en) | 2012-01-25 | 2014-08-13 | Bobst Bielefeld GmbH | Sensor head for a colour proofing apparatus |
JP6278625B2 (ja) * | 2012-07-30 | 2018-02-14 | キヤノン株式会社 | 測色装置及びそれを備える画像形成装置 |
JP6099974B2 (ja) | 2012-12-28 | 2017-03-22 | キヤノン株式会社 | 画像形成装置 |
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- 2015-11-20 US US15/533,848 patent/US10663348B2/en active Active
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WO2016093043A1 (ja) | 2016-06-16 |
US10663348B2 (en) | 2020-05-26 |
JPWO2016093043A1 (ja) | 2017-09-14 |
US20190086264A1 (en) | 2019-03-21 |
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