JP6585377B2 - Slit lamp microscope - Google Patents

Description

  The present invention relates to a slit lamp microscope.

  The slit lamp microscope is an ophthalmologic apparatus that acquires an image of a cross section of an observation site by cutting out a light section of the observation site of the eye to be examined using slit light. Observation sites include the entire anterior segment, cornea, retina, and the like.

  There are various observation methods using a slit lamp microscope. Examples thereof include background illumination and fluorescence contrast imaging. In the inspection using the slit lamp microscope, it is necessary to appropriately switch the setting of the optical system, for example, the irradiation angle, the amount of illumination light, the observation magnification, the slit width, and the filter, according to the observation site and the observation method.

Japanese Patent No. 528184

  However, in order to switch the filters according to the observation site and the observation method, a space for storing a plurality of filters having different wavelength transmission characteristics and one of the stored filters are inserted into a predetermined optical path. This mechanism is required. In some cases, it is necessary to change the setting on the light receiving side.

  Further, the slit lamp microscope may be required to slightly change the hue (color) of the observation image of the eye to be examined. However, a subtle change in hue may not be realized by only changing the filter or changing the setting on the light receiving side. For example, in a slit lamp microscope, a halogen lamp is often used as an illumination light source, and by changing the color of the illumination light by controlling the current supplied to the halogen lamp, the color of the eye to be observed can be changed. There are cases where it can be changed slightly. However, when the color of the illumination light from the halogen lamp is changed, it may not be possible to obtain the amount of light necessary for observation of the eye to be examined. On the other hand, even when an LED (Light Emitting Diode) is used as the illumination light source, there are cases where the tint of the observation image of the eye to be inspected cannot be slightly changed.

  The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a slit lamp microscope capable of improving the observation function of the eye to be examined while saving space.

The slit lamp microscope according to the embodiment includes an illumination system and an observation system. The illumination system includes a wavelength selection member, a slit forming unit, and a moving mechanism. The wavelength selection member is disposed in a light path from an illumination light source provided in a projector having a lens, and a plurality of regions having different wavelength selection characteristics are provided. The slit forming unit forms slit light from the light that has passed through the wavelength selection member. The moving mechanism relatively moves the wavelength selection member with respect to the light path from the illumination light source at a position substantially optically conjugate with the illumination light source. The illumination system illuminates the eye to be examined with slit light. The observation system guides the return light of the slit light from the eye to be examined to the imaging device.
A slit lamp microscope according to another embodiment includes an illumination system and an observation system. The illumination system includes a slit light generation unit, a wavelength selection member, and a moving mechanism. The slit light generation unit includes a projector having an illumination light source and a lens, and generates slit light. A wavelength selection member is arrange | positioned in the path | route of the produced | generated slit light, and the some area | region from which a wavelength selection characteristic differs is provided. The moving mechanism moves the wavelength selection member relative to the slit light path at a position substantially optically conjugate with the illumination light source. The illumination system illuminates the eye to be examined with the slit light that has passed through the wavelength selection member. The observation system guides the return light of the slit light from the eye to be examined to the imaging device.

  According to the present invention, it is possible to provide a slit lamp microscope capable of improving the observation function of the eye to be examined while saving space.

It is a schematic side view showing an example of the appearance composition of the slit lamp microscope concerning an embodiment. It is a schematic side view showing an example of a structure of the optical system of the slit lamp microscope which concerns on embodiment. It is the schematic showing the structure of the slit lamp microscope which concerns on embodiment. It is the schematic showing the structure of the slit lamp microscope which concerns on embodiment. It is the schematic showing the structure of the slit lamp microscope which concerns on embodiment. It is a schematic block diagram showing an example of the composition of the control system of the slit lamp microscope concerning an embodiment. It is a flowchart showing an example of operation | movement of the slit lamp microscope which concerns on embodiment. It is the schematic showing the structure of the slit lamp microscope which concerns on embodiment. It is the schematic showing the structure of the slit lamp microscope which concerns on embodiment. It is a schematic side view showing an example of a structure of the optical system of the slit lamp microscope which concerns on embodiment. It is a schematic side view showing an example of a structure of the optical system of the slit lamp microscope which concerns on embodiment. It is a schematic block diagram showing an example of the composition of the control system of the slit lamp microscope concerning an embodiment.

  An example of an embodiment of a slit lamp microscope according to the present invention will be described in detail with reference to the drawings. In addition, it is possible to use suitably the description content of the literature described in this specification as the content of the following embodiment.

  First, the direction is defined. The direction from the optical element located closest to the subject in the apparatus optical system toward the subject is defined as the front direction, and the opposite direction is defined as the rear direction. The horizontal direction orthogonal to the front direction is the left-right direction. Furthermore, the direction orthogonal to both the front-rear direction and the left-right direction is defined as the up-down direction.

[First Embodiment]
[Appearance configuration]
The external configuration of the slit lamp microscope according to this embodiment will be described with reference to FIG. A computer 100 is connected to the slit lamp microscope 1. The computer 100 performs various control processes and arithmetic processes. Instead of providing the computer 100 separately from the microscope main body (housing for storing the optical system or the like), a configuration in which the same computer is mounted on the microscope main body can be applied.

  The slit lamp microscope 1 is placed on a table 2. The computer 100 may be installed on another table or in another place. The base 4 is configured to be movable in the horizontal direction via the moving mechanism unit 3. The base 4 is moved by tilting the operation handle 5.

  A support portion 15 that supports the observation system 6 and the illumination system 8 is provided on the upper surface of the base 4. A support arm 16 that supports the observation system 6 is attached to the support unit 15 so as to be rotatable in the left-right direction. A support arm 17 that supports the illumination system 8 is attached to an upper portion of the support arm 16 so as to be rotatable in the left-right direction. The support arms 16 and 17 are independently coaxially rotatable.

  The observation system 6 is moved by manually rotating the support arm 16. The illumination system 8 is moved by manually rotating the support arm 17. In addition, each support arm 16 and 17 may be comprised so that it may be rotated by an electrical mechanism. In that case, an actuator for generating a driving force for rotating the support arms 16 and 17 and a transmission mechanism for transmitting the driving force are provided. The actuator is constituted by, for example, a pulse motor. The transmission mechanism is constituted by, for example, a combination of gears, a rack and pinion, or the like.

  The illumination system 8 irradiates the eye E with illumination light. As described above, the illumination system 8 can swing in the left-right direction around the rotation axis. Thereby, the irradiation direction of the illumination light to the eye E is changed. The illumination system 8 may be configured to swing in the vertical direction. That is, you may be comprised so that the elevation angle and depression angle of illumination light can be changed.

  The observation system 6 has a pair of left and right optical systems that guide reflected light of illumination light from the eye E. This optical system is housed in the barrel main body 9. The end of the lens barrel body 9 is an eyepiece 9a. The examiner looks at the eye E with the naked eye by looking into the eyepiece 9a. As described above, the lens barrel body 9 can be rotated in the left-right direction by rotating the support arm 16. Thereby, the direction of the observation system 6 with respect to the eye E can be changed. The reflected light of the illumination light includes various kinds of light passing through the eye E such as scattered light, for example, and these various kinds of light are referred to as “return light” and “reflected light”. To do.

  A chin rest 10 is disposed at a position facing the lens barrel body 9. The chin rest 10 is provided with a chin rest 10a and a forehead rest 10b for stably arranging the face of the subject.

  An observation magnification operation knob 11 for changing the observation magnification is disposed on the side surface of the barrel main body 9. Further, an imaging device 13 for photographing the eye E is connected to the barrel main body 9. The imaging device 13 includes an imaging element. The imaging element is a photoelectric conversion element that detects light and outputs an image signal GS (electric signal). The image signal GS is input to the computer 100. As the imaging element, for example, a CCD (Charge Coupled Device) image sensor or a CMOS (Complementary Metal Oxide Semiconductor) image sensor is used. A mirror 12 that reflects the illumination light beam output from the illumination system 8 toward the eye E is disposed below the illumination system 8.

[Configuration of optical system]
The configuration of the optical system of the slit lamp microscope 1 will be described with reference to FIG. The slit lamp microscope 1 has an observation system (imaging system) 6 and an illumination system 8.

[Observation system]
The observation system 6 includes a pair of left and right optical systems. The left and right optical systems have substantially the same configuration. The examiner can observe the eye E with binoculars using the left and right optical systems. In FIG. 2, only one of the left and right optical systems of the observation system 6 is shown. Reference numeral O <b> 1 is an optical axis (observation optical axis) of the observation system 6.

  Each of the left and right optical systems of the observation system 6 includes an objective lens 31, a variable magnification optical system 32, a diaphragm 33, a relay lens 35, a prism 36, and an eyepiece lens 37. The beam splitter 34 is provided in only one or both of the left and right optical systems. The eyepiece lens 37 is provided in the eyepiece 9a. A symbol P indicates an imaging position of light guided to the eyepiece lens 37. Reference sign Ec represents the cornea of the eye E, reference sign Ep represents the iris, and reference sign Er represents the fundus. Reference Eo indicates the examiner's eye.

  The variable magnification optical system 32 includes a plurality of (for example, two) variable magnification lenses 32a and 32b. In this embodiment, a plurality of variable power lens groups that can be selectively inserted into the optical path of the observation system 6 are provided. These variable power lens groups are configured to give different magnifications. A variable power lens group disposed in the optical path of the observation system 6 is used as the variable power lenses 32a and 32b. Thereby, the magnification (field angle) of the naked eye observation image of the eye E and the captured image can be changed. Changing the magnification, that is, switching the zoom lens group disposed in the optical path of the observation system 6 is performed by operating the observation magnification operation knob 11. Moreover, you may comprise so that a magnification may be electrically changed using a switch etc. which are not illustrated.

  The beam splitter 34 divides the light traveling along the observation optical axis O1 into two. The light transmitted through the beam splitter 34 is guided to the examiner's eye Eo via the relay lens 35, the prism 36 and the eyepiece lens 37. The prism 36 includes two optical elements 36a and 36b, and translates the traveling direction of light upward.

  On the other hand, the light reflected by the beam splitter 34 is guided to the imaging element 43 of the imaging device 13 through the relay lens 41 and the mirror 42. The image sensor 43 detects the reflected light and generates an image signal GS.

[Lighting system]
The illumination system 8 includes a light source 51, a linear variable filter 60, a relay lens 52, an illumination stop 56, a condenser lens 53, a slit forming part 54, and a condenser lens 55. A symbol O2 indicates the optical axis of the illumination system 8 (illumination optical axis).

  The light source 51 outputs illumination light. Note that a plurality of light sources may be provided in the illumination system 8. For example, both a light source (halogen lamp, LED, etc.) that outputs steady light and a light source (xenon lamp, LED, etc.) that outputs flash light can be provided as the light source 51. Further, a light source for corneal observation and a light source for fundus observation may be provided separately.

  The linear variable filter (LVF) 60 is a transmissive optical member whose wavelength selection characteristic (wavelength transmission characteristic) linearly changes in a predetermined direction on the illumination light incident surface. The linear variable filter 60 is disposed at a position substantially optically conjugate with the light source 51, and is configured to be relatively movable with respect to the path of the illumination light in a direction substantially orthogonal (crossing) to the incident direction of the illumination light. Since the linear variable filter 60 is movable relative to the path of the illumination light and the incident position of the illumination light on the incident surface of the linear variable filter 60 can be changed, the wavelength of the illumination light transmitted through the linear variable filter 60, It becomes possible to change the hue.

  The outline of the linear variable filter 60 will be described with reference to FIGS. FIG. 3 schematically shows the illumination light incident surface of the linear variable filter 60 when viewed from the light source 51 side. 4 and 5 schematically show an example of the wavelength selection characteristic (wavelength transmission characteristic) of the linear variable filter 60. FIG. In FIG. 4, the horizontal axis represents wavelength, and the vertical axis represents light transmittance. In FIG. 5, the horizontal axis represents the length from the reference position (x = 0) at the left end of the wavelength selection region of the linear variable filter 60, and the vertical axis represents the center wavelength of the wavelength band of the transmitted light.

  As shown in FIG. 3, the linear variable filter 60 has a plurality of wavelength selection regions (transmission regions) in which wavelength selection characteristics change linearly in the direction DR2 (first direction). The direction DR2 may be a direction substantially perpendicular to the direction (slit direction) DR1 of the slit light formed by the later-described slit forming unit 54. Therefore, the wavelength selection characteristic applied to the illumination light incident on the linear variable filter 60 can be changed by moving the linear variable filter 60 in the direction DR2 by the moving mechanism 60B.

For example, as shown in FIG. 4, in the plurality of wavelength selection regions, the center wavelength of the wavelength band of the transmitted light continuously changes from λ ₁ to λ ₂ (λ ₂ > λ ₁ > 0). That is, even if the position is changed by a predetermined amount in the arrangement direction (direction DR2) of the plurality of wavelength selection regions, the center wavelength of the transmission wavelength band at each position after the change is changed without being constant. Here, the left end position x of the wavelength selection region is 0, and the right end position x of the direction DR2 is L (L> 0). For example, as shown in FIG. 5, in the wavelength selection region, the center wavelength of the transmitted wavelength band is changed from λc ₁ to λc ₂ (λc ₂ > λ ₂ > λ ₁ > λc in accordance with the change of the position x in the direction DR2. ₂ > 0) linearly.

  The linear variable filter 60 is configured to be movable automatically or manually. In the case of automatic movement, the linear variable filter 60 is moved by the actuator 60A and the moving mechanism 60B. The actuator 60A is a device that generates a driving force, and is configured by, for example, a pulse motor. The moving mechanism 60B moves the linear variable filter 60 by the driving force generated by the actuator 60A.

  When the actuator 60A is moved manually, the actuator 60A generates a driving force based on an operation input to the operation unit 104 described later. The moving mechanism 60B moves the linear variable filter 60 by the driving force generated by the actuator 60A. Alternatively, the linear variable filter 60 may be moved to a desired position by manually moving the movable stage on which the linear variable filter 60 is mounted.

  The linear variable filter 60 is an example of a transmission-type wavelength selection member having different wavelength selection characteristics depending on the incident position of illumination light. Instead of the linear variable filter 60, a reflective wavelength selection member (for example, a diffraction grating) having different wavelength selection characteristics depending on the incident position of the illumination light may be disposed. The wavelength selection member may be provided with a plurality of wavelength selection regions having wavelength selection characteristics depending on the incident position of the illumination light.

  The slit forming unit 54 is used to generate slit light from illumination light from the light source 51. The slit forming part 54 has a pair of slit blades. The slit width is changed by changing the interval between the slit blades.

  The slit blade is moved by the actuator 54A and the moving mechanism 54B. The actuator 54A is a device that generates a driving force, and is configured by a pulse motor, for example. The moving mechanism 54B changes the interval between the slit blades based on the driving force generated by the actuator 54A.

  The illumination diaphragm 56 is configured to be able to change the size of the translucent portion. The illumination stop 56 is particularly effective in fundus observation. For example, the illumination stop 56 has applications such as reducing the reflection of illumination light by the cornea Ec and the crystalline lens, and adjusting the brightness of the illumination light.

[Control system configuration]
A control system of the slit lamp microscope 1 will be described with reference to FIG. The control system of the slit lamp microscope 1 is configured around the control unit 101. In FIG. 6, only components that are particularly focused on in this embodiment are shown, and other components are omitted.

(Control part)
The control unit 101 controls each unit of the slit lamp microscope 1. For example, the control unit 101 controls the observation system 6 and the illumination system 8. Control of the observation system 6 includes control of the variable power optical system 32, control of the diaphragm 33, control of the exposure time (charge accumulation time) of the image sensor 43, sensitivity, frame rate, and the like. Control of the illumination system 8 includes control of the light source 51, control of the linear variable filter 60, control of the illumination diaphragm 56, control of the slit forming unit 54, and the like.

  The linear variable filter 60 is controlled by controlling the actuator 60A. A moving mechanism 60B driven by the actuator 60A moves the linear variable filter 60. When the actuator 60A is a pulse motor, the control unit 101 transmits a pulse signal to the actuator 60A.

  The control of the slit forming portion 54 is performed by controlling the actuator 54A. The moving mechanism 54B driven by the actuator 54A changes the interval between the pair of slit blades included in the slit forming portion 54. When the actuator 54A is a pulse motor, the control unit 101 transmits a pulse signal to the actuator 54A.

  In addition, the control unit 101 performs a process of reading data stored in the storage unit 102 and a process of writing data to the storage unit 102.

  The control unit 101 includes an analysis unit 101A. The analysis unit 101A analyzes the operation content of a user such as an examiner with respect to the operation unit 104. The control unit 101 reads out the control information 102A corresponding to the analysis result by the analysis unit 101A from the plurality of control information 102A stored in advance in the storage unit 102, and based on the read control information 102A, the slit lamp microscope 1 part is controlled.

  The operation unit 104 is configured to allow an operation input for designating one of a plurality of observation modes such as a contact lens fitting mode. In the slit lamp microscope 1, the movement of the linear variable filter 60 is controlled in accordance with the observation mode designated using the operation unit 104. Thereby, it becomes possible to illuminate the eye E with illumination light having a wavelength and hue corresponding to the observation mode. Examples of observation sites include the entire anterior segment, cornea, sclera, iris, lens, conjunctiva, chamber, corner, vitreous, and retina. Examples of the observation method include diffuse illumination method, direct illumination method, background illumination method, fluorescence contrast imaging, tangential illumination method, transillumination method, imaging with a angle mirror, imaging with an auxiliary lens, and the like. In addition, according to the designated observation mode, the settings of the other optical systems of the slit lamp microscope 1 and the imaging device 13 may be automatically performed.

  For example, the control unit 101 can automatically move at least the linear variable filter 60 based on control information corresponding to the designated observation mode. The control information is stored in advance in the storage unit 102 described later. Therefore, when the user designates the observation mode using the operation unit 104, the control unit 101 can move the linear variable filter 60 based on the control information corresponding to the observation mode. As a result, the eye to be examined can be observed with a wavelength and hue suitable for the designated observation mode.

  The control unit 101 controls the moving mechanism 60B based on the control information so that the wavelength selection region (one or more) having the wavelength selection characteristic corresponding to the designated observation mode becomes the incident position of the illumination light. A linear variable filter 60 is disposed. For example, the control unit 101 controls the linear variable filter 60 to move to the target position specified by the control information. In addition, the control unit 101 may detect the current position of the linear variable filter 60 using a sensor (not shown) and control the linear variable filter 60 to move from the detected current position to the target position. The current position of the linear variable filter 60 may be specified from past control contents (control history, movement history).

  Further, when an observation mode for performing fluorescence contrast observation or the like is designated, the linear variable filter 60 moves so that the incident position of the illumination light is arranged in a wavelength selection region having a wavelength selection characteristic corresponding to the exciter filter. May be. In this case, in conjunction with the linear variable filter 60, a barrier filter corresponding to the exciter filter may be configured to be inserted into a predetermined optical path of the observation system 6 by a moving mechanism (not shown).

  The slit light may be incident across a plurality of wavelength selection regions. The control unit 101 can arrange the linear variable filter 60 so that the illumination light is incident on the plurality of wavelength selection regions by controlling the moving mechanism 60B based on the control information.

  The control unit 101 can change the setting of the optical system of the slit lamp microscope 1 and the setting of the imaging device 13 based on control information corresponding to the observation mode designated by the user using the operation unit 104. It is. For example, based on the control information, the control unit 101 determines the position of the observation system 6 and the illumination system 8, the characteristics of the illumination light (wavelength, light quantity, etc.) from the light source 51, the state of the linear variable filter 60, and the diaphragm state of the illumination diaphragm 56. The shape of the slit light by the slit forming unit 54, the observation magnification by the variable magnification optical system 32, and the like are changed. Control of the shape of the slit light by the slit forming unit 54 includes control for changing the slit width of the slit light, control for changing the direction of the slit, and the like. For example, the control unit 101 controls the charge accumulation time, sensitivity, frame rate, and the like of the image sensor 43 based on the control information.

  Further, the control unit 101 can store setting information 102B including information indicating the setting state of the optical system of the slit lamp microscope 1 and the imaging device 13 in the storage unit 102 at an arbitrary timing. For example, the control unit 101 stores the setting information 102 </ b> B in the storage unit 102 at the examination start timing and the examination end timing of the eye to be examined, the imaging timing of the eye to be examined by the imaging device 13, and the operation input timing to the operation unit 104. The control unit 101 may store the setting information 102 </ b> B in the storage unit 102 at a setting change timing of the optical system of the slit lamp microscope 1 or the imaging device 13, a predetermined time, or a predetermined time interval. The control unit 101 can read the setting information 102B stored in the storage unit 102 and control each unit of the slit lamp microscope 1 based on the read setting information. Accordingly, it is possible to observe the eye to be examined again under the same conditions as the past observation conditions, or to observe the eye to be examined while reproducing a user's favorite color shade.

  The control unit 101 includes hardware such as a microprocessor, RAM (Random Access Memory), ROM (Read Only Memory), and a hard disk drive. This hard disk drive stores a control program in advance. The operation of the control unit 101 is realized by the cooperation of this control program and the hardware.

  The control unit 101 is disposed in the apparatus main body (for example, in the base 4) of the slit lamp microscope 1 or the computer 100.

[Storage section]
Various types of information are stored in the storage unit 102. In particular, the storage unit 102 stores control information 102A and setting information 102B in advance. The storage unit 102 stores in advance control information 102 </ b> A associated with the operation content for the operation unit 104. The storage unit 102 can store a plurality of control information 102A corresponding to a plurality of operation contents.

  The control information 102A includes information for setting the optical system of the slit lamp microscope 1 and information for setting the operation of the imaging device 13. For example, when the actuator 54A is a pulse motor, the control information 102A may be the number of pulses of a pulse signal transmitted from the control unit 101 to the pulse motor. Similarly, for example, when the actuator 60A is a pulse motor, the control information 102A may be the number of pulses of a pulse signal transmitted from the control unit 101 to the pulse motor.

  The setting information 102 </ b> B includes information indicating the setting state of the optical system of the slit lamp microscope 1 and the imaging device 13. The setting state of the optical system of the slit lamp microscope 1 includes the position and state of the optical system of the slit lamp microscope 1. The setting state of the imaging device 13 includes the setting state of the imaging element 43 and the like.

[Display section]
The display unit 103 displays various information under the control of the control unit 101. The display unit 103 includes an arbitrary display device such as a flat panel display such as an LCD (Liquid Crystal Display) or an organic electroluminescence display. The display unit 103 may be provided in the apparatus main body of the slit lamp microscope 1 or may be provided in the computer 100.

[Operation section]
The operation unit 104 includes an operation device and an input device. The operation unit 104 includes buttons and switches (for example, the operation handle 5) provided on the apparatus main body, a mouse of the computer 100, a keyboard, and the like. It is also possible to use any operation device or input device such as a trackball, a dedicated operation panel, a switch, a button, or a dial.

  In FIG. 6, the display unit 103 and the operation unit 104 are shown separately, but they can also be configured integrally. As a specific example, a touch panel LCD can be used. The operation unit 104 is an example of a “designating unit”.

[Operation]
The operation of the slit lamp microscope 1 will be described. An example of the operation of the slit lamp microscope 1 is shown in FIG.

(S1, S2)
First, when the user designates an observation mode using the operation unit 104, the control unit 101 analyzes the operation content for the operation unit 104 by the analysis unit 101 </ b> A, and reads control information corresponding to the analysis result from the storage unit 102. Based on the control information read from the storage unit 102, the control unit 101 controls the linear variable filter 60 so that the wavelength selection region having the wavelength selection characteristic corresponding to the designated observation mode is the incident position of the illumination light. Move.

(S3)
Subsequently, the control unit 101 controls the slit forming unit 54 based on the control information read from the storage unit 102 in S2 so that the slit width corresponds to the designated observation mode.

(S4)
Next, the control unit 101 turns on the light source 51. At this time, the control unit 101 may turn on the light source 51 under a predetermined initial lighting condition, or may turn on the light source 51 under the previous lighting condition. The lighting conditions of the light source 51 include the amount of illumination light. When the illumination light irradiation direction can be automatically changed, the lighting condition of the light source 51 may include the illumination light irradiation angle.

  For example, at this stage, the user adjusts the positions of the observation system 6 and the illumination system 8. The user can adjust the slit width by operating a slit operation knob (not shown) while observing the eye E.

(S5)
The slit lamp microscope 1 is in a state in which it is possible to observe the eye E using the slit light in the designated observation mode, and acquires an image of the eye E using the imaging device 13, for example. Note that the user may perform visual observation using the eyepiece 9a.

  In addition, the control unit 101 stores setting information 102 </ b> B including information indicating the setting state of the optical system of the slit lamp microscope 1 and the imaging device 13 in the storage unit 102. By using the setting information 102B stored here, it becomes possible to inspect the eye E with the slit lamp microscope 1 in the same setting state as the inspection at an arbitrary timing thereafter. This is the end of the description of this operation example (end).

[effect]
The effect of the slit lamp microscope 1 will be described.

  The slit lamp microscope (for example, the slit lamp microscope 1) includes an illumination system (for example, the illumination system 8) and an observation system (for example, the observation system 6). The illumination system includes a wavelength selection member (for example, the linear variable filter 60), a slit forming unit (for example, the slit forming unit 54), and a moving mechanism (for example, moving mechanism 60B). The wavelength selection member is disposed in a path of light (for example, illumination light) from an illumination light source (for example, light source 51), and a plurality of regions having different wavelength selection characteristics are provided. The slit forming unit forms slit light from the light that has passed through the wavelength selection member. The moving mechanism moves the wavelength selection member relative to the light path from the illumination light source. The illumination system illuminates the eye to be examined (for example, eye E to be examined) with slit light. The observation system guides the return light of the slit light from the eye to be examined to the imaging device (for example, the imaging device 13).

  Here, “passing” includes both “transmission” and “reflection”.

  In such a configuration, in the slit lamp microscope, the wavelength selection member provided with a plurality of regions having different wavelength selection characteristics is arranged in the path of light from the illumination light source. Since the wavelength selection member is moved relative to the light path from the illumination light source by the moving mechanism, a region having a desired wavelength selection characteristic can be arranged at the incident position of the illumination light. Thereby, it becomes possible to change the wavelength and hue of the illumination light that has passed through the wavelength selection member, and the observation function of the eye to be examined can be improved in a space-saving manner.

  The movement mechanism may move the wavelength selection member in a direction that intersects the incident direction of light with respect to the wavelength selection member.

  According to such a configuration, it becomes possible to use a wavelength selection member whose wavelength selection characteristic changes in the light incident direction, and the wavelength and hue of the illumination light can be slightly changed with a simple configuration.

  Further, the plurality of regions of the wavelength selection member may be arranged in a first direction (for example, the direction DR2), and the moving mechanism may move the wavelength selection member in the first direction.

  According to such a configuration, the wavelength and color of the illumination light can be slightly changed with a simple configuration by using the wavelength selection member whose wavelength selection characteristic changes at least in the first direction.

  Further, the wavelength selection member may be configured such that the wavelength selection characteristic continuously changes in the first direction.

  According to such a configuration, it is possible to slightly change the wavelength and color of the illumination light with a simple configuration.

  Further, a storage unit (for example, the storage unit 102), a designation unit (for example, the operation unit 104), and a control unit (for example, the control unit 101) may be included. The storage unit stores in advance a plurality of control information corresponding to a plurality of observation modes. The designation unit is used to designate any one of a plurality of observation modes. The control unit moves the moving mechanism based on the control information stored in the storage unit corresponding to the observation mode specified by the specifying unit.

  According to such a configuration, it is possible to provide a slit lamp microscope capable of observing the eye to be examined with a wavelength and hue suitable for the designated observation mode by designating the observation mode with the designation unit. .

  In addition, the storage unit may store control contents executed in the past with respect to the movement mechanism, and the control unit may move the movement mechanism based on the control contents stored in the storage unit.

  According to such a configuration, a slit lamp microscope capable of observing the eye to be examined again under the same conditions as the past observation conditions or observing the eye to be examined while reproducing a user's favorite color shade. Can be provided.

[First Modification]
In the first embodiment, the linear variable filter has been described as an example of the wavelength selection member according to the embodiment, but the wavelength selection member according to the embodiment is not limited to this.

FIG. 8 is an explanatory diagram of a wavelength selection member according to a first modification of the first embodiment. In FIG. 8, as in FIG. 5, the horizontal axis represents the length from the reference position at the left end of the wavelength selection region of the wavelength selection member according to the first modification, and the vertical axis represents the center wavelength of the wavelength band of the transmitted light. Represents. In FIG. 8, the center wavelength of the transmitted wavelength band changes stepwise from λc ₁ to λc ₂ in accordance with the change of the position x in the direction DR2. That is, when the position is changed by a predetermined amount in the arrangement direction (direction DR2) of the plurality of wavelength selection regions, the center wavelength of the transmission wavelength band at each position after the change changes discontinuously. In the wavelength selection region provided in the wavelength selection member according to the first modification, for example, as shown in FIG. 8, the center wavelength of the wavelength band of the transmitted light changes stepwise along the direction DR2 on the incident surface. To do.

  Also in this modification, the wavelength selection member is provided with a plurality of wavelength selection regions having different wavelength selection characteristics. Therefore, by storing control information for moving to the position of each wavelength selection region (for example, the center position of the region) in the storage unit 102 in advance, as in the first embodiment, according to the designated observation mode. It is possible to move the wavelength selection member automatically. As described above, the wavelength selection member may be moved manually.

[effect]
The effect of the slit lamp microscope will be described.

  The wavelength selection member may be configured such that the wavelength selection characteristics change stepwise in the first direction.

  According to such a configuration, it is possible to slightly change the wavelength and color of the illumination light with a simple configuration.

[Second Modification]
In the first embodiment and the modifications thereof, the case where the linear variable filter 60 is moved by moving it in a two-dimensional manner in a direction intersecting the light incident direction (light path of illumination light) has been described. The wavelength selection member is not limited to this.

  FIG. 9 is an explanatory diagram of a linear variable filter according to a second modification of the first embodiment. FIG. 9 schematically shows the illumination light incident surface of the linear variable filter when viewed from the light source 51 side, as in FIG. 3.

  The linear variable filter 60a according to the second modification is configured to be rotatable about a rotation axis G parallel to the optical axis (illumination optical path) of the illumination system 8, for example. For example, the moving mechanism 60B rotates the linear variable filter 60a around the rotation axis G. As shown in FIG. 9, the linear variable filter 60a has a plurality of wavelength selection regions in which the wavelength selection characteristics change linearly in the circumferential direction DR3 with the rotation axis G as the center. The circumferential direction DR3 is a direction orthogonal (crossing) to the radial direction around the rotation axis G. That is, the linear variable filter 60a is a wavelength selection member having different wavelength selection characteristics depending on the position in the circumferential direction around the rotation axis G. Each wavelength selection region has a predetermined shape (rectangular shape, arc shape, etc.) that is divided by a predetermined angle unit around the rotation axis G and extends in the radial direction around the rotation axis G. The direction of the slit of the slit light formed by the slit forming portion 54 may be a radial direction centering on the rotation axis G or a direction intersecting with the radial direction.

  Note that the linear variable filter 60a may be provided with a wavelength selection region (see FIG. 8) in which the wavelength selection characteristics change stepwise in the circumferential direction DR3 with the rotation axis G as the center.

  Also in this modification, control information (an angle about the rotation axis G) corresponding to the position of each wavelength selection region provided in the linear variable filter 60a is stored in the storage unit 102 in advance. Thereby, similarly to the first embodiment, the wavelength selection member can be automatically moved in accordance with the designated observation mode. As described above, the wavelength selection member may be moved manually.

[effect]
The effect of the slit lamp microscope will be described.

  The first direction may be a direction (for example, direction DR3) that intersects a radial direction around a predetermined rotation axis (for example, rotation axis G). The movement mechanism (for example, the movement mechanism 60B) may rotate the wavelength selection member (for example, the linear variable filter 60a) in the first direction around the rotation axis.

  According to such a configuration, by using a wavelength selection member whose wavelength selection characteristic changes in the circumferential direction around the rotation axis, the wavelength and hue of the illumination light can be slightly changed with a simple configuration. Is possible.

[Other variations]
In the first embodiment, the wavelength selection characteristic of the linear variable filter 60 as the wavelength selection member has been described using the characteristic shown in FIG. 4 as an example. However, the wavelength selection member according to the embodiment is not limited to this. You may have the wavelength selection characteristic which becomes the same transmittance | permeability only by a predetermined wavelength width from a center wavelength. The wavelength width may be wider than the slit width of the slit light formed by the slit forming unit 54. In this case, the light flux of the slit light is a light flux that has been wavelength-selected by the same wavelength selection characteristics.

  In the plurality of wavelength selection regions provided in the wavelength selection member, the center wavelength of the transmitted light may not monotonously increase or decrease monotonously in a predetermined direction. The position in the wavelength selection member only needs to be recognized in advance for each of a plurality of wavelength selection regions having different wavelength selection characteristics. When the wavelength selection member is automatically moved, the position of each wavelength selection region may be included in the control information, and the wavelength selection member may be moved based on the control information.

  The width of the illumination light incident on the linear variable filter 60 may be changed. In this case, the illumination system 8 includes a variable stop disposed between the light source 51 and the linear variable filter 60. It is possible to change the width of the illumination light incident on the linear variable filter 60 by automatically or manually controlling the diaphragm of the illumination light by the variable diaphragm. Thereby, it becomes possible to generate illumination light having wavelength components selected with more various wavelength selection characteristics.

[Second Embodiment]
The configuration of the slit lamp microscope according to the embodiment is not limited to the configuration of the slit lamp microscope 1 according to the first embodiment or the modification thereof.

  The configuration of the slit lamp microscope according to the second embodiment is substantially the same as that of the first embodiment. In the following, the second embodiment will be described focusing on the differences from the first embodiment.

  FIG. 10 shows a configuration example of the optical system of the slit lamp microscope according to the second embodiment. 10, parts that are the same as those in FIG. 2 are given the same reference numerals, and descriptions thereof will be omitted as appropriate.

  The configuration of the slit lamp microscope according to the second embodiment is different from the configuration of the slit lamp microscope 1 according to the first embodiment in that a relay lens is added to the illumination system. That is, the slit lamp microscope according to the second embodiment includes an observation system 6 and an illumination system 8b. The illumination system 8 b includes a light source 51, a relay lens 61, a linear variable filter 60, a relay lens 52, an illumination diaphragm 56, a condenser lens 53, a slit forming part 54, and a condenser lens 55. The relay lens 61 is disposed between the light source 51 and the linear variable filter 60. The relay lens 61 relays illumination light from the light source 51.

  Also in this embodiment, the width of the illumination light incident on the linear variable filter 60 may be changed. In this case, in the illumination system 8b, a variable stop is disposed between the light source 51 and the relay lens 61 or between the relay lens 61 and the linear variable filter 60.

  The modification of the first embodiment can also be applied to the slit lamp microscope according to this embodiment.

[Third Embodiment]
In the above-described embodiment or its modification, the case where the slit light is generated by the slit forming unit 54 from the illumination light output from the light source 51 has been described. However, the slit lamp microscope according to the embodiment is limited to this. Is not to be done. For example, the light source 51, the slit forming part 54, and the linear variable filter 60 may be arranged in the order of the illumination optical path so that the slit light is incident on the linear variable filter 60. Hereinafter, a case where slit light is generated by the projector and the generated slit light is incident on the linear variable filter 60 will be described.

  The configuration of the slit lamp microscope according to the third embodiment is substantially the same as that of the first embodiment. In the following, the third embodiment will be described focusing on the differences from the first embodiment.

  FIG. 11 shows a configuration example of an optical system of a slit lamp microscope according to the third embodiment. In FIG. 11, the same parts as those in FIG.

  The configuration of the slit lamp microscope according to the third embodiment is different from the configuration of the slit lamp microscope 1 according to the first embodiment in that a projector 70 is provided in the illumination system instead of the light source 51 and the slit forming unit 54. This is the point. That is, the slit lamp microscope according to the third embodiment includes an observation system 6 and an illumination system 8c. The illumination system 8c includes a projector 70, a linear variable filter 60, and a condenser lens 55.

  The projector 70 irradiates the linear variable filter 60 with an illumination pattern based on the control from the control unit 101. The projector 70 can output slit light that can arbitrarily change the slit width and the direction of the slit. Further, the projector 70 can arbitrarily change the incident position of the slit light in the linear variable filter 60 by changing the position of the illumination pattern.

  The illumination pattern can be set by the user using the operation unit 104, for example. When the user designates, for example, a shape pattern, an outer shape, a size, and the like using the operation unit 104, the control unit 101c identifies an illumination pattern based on the designated shape pattern and the like, and based on the identified illumination pattern. The projector 70 can be controlled.

  The projector 70 may be a known projector using a digital micromirror device. The projector 70 may further include a light source. Examples of the light source include an LED light source and a light source capable of outputting light of each color component of RGB. The projector 70 may further include a relay optical system, a collimator lens, a projection lens, and the like.

  The projector 70 uses an LCoS (Liquid Crystal on Silicon), a MEMS (Micro Electro Mechanical Systems), or an optical scanner (galvano scanner) capable of scanning one-dimensionally or two-dimensionally. Also good. Furthermore, the projector 70 may use a liquid crystal display (transmission type, reflection type). Since such a configuration is known, detailed description thereof is omitted. The projector 70 may be any projector that can output illumination light corresponding to an illumination pattern whose shape and irradiation position can be arbitrarily changed. The projector 70 is an example of a “slit light generation unit”.

  The moving mechanism 60B moves the linear variable filter 60 relative to the slit light path.

  FIG. 12 shows a block diagram of a configuration example of a control system of the slit lamp microscope according to the third embodiment. Also in FIG. 12, as in FIG. 6, only the components that are of particular interest in this embodiment are shown, and the other components are omitted. 12, parts similar to those in FIG. 6 are given the same reference numerals, and description thereof will be omitted as appropriate.

(Control part)
The control unit 101c controls each unit of the slit lamp microscope according to this embodiment. For example, the control unit 101c performs control of the observation system 6 and control of the illumination system 8c. Control of the illumination system 8c includes control of the projector 70 and control of the linear variable filter 60.

  Control of the projector 70 includes control of the color and light amount of the light source of the projector 70 and control of the shape and irradiation position on the illumination light irradiation surface. Control of the shape and irradiation position on the irradiation surface of the illumination light can be performed based on the illumination pattern created by the control unit 101c.

  The linear variable filter 60 is controlled by controlling the actuator 60A. A moving mechanism 60B driven by the actuator 60A moves the linear variable filter 60. When the actuator 60A is a pulse motor, the control unit 101c transmits a pulse signal to the actuator 60A.

  In addition, the control unit 101c performs a process of reading data stored in the storage unit 102c and a process of writing data to the storage unit 102.

  The control unit 101c includes an analysis unit 101A. The analysis unit 101A analyzes the operation content of a user such as an examiner with respect to the operation unit 104. Also in this embodiment, the control unit 101c can automatically move at least the linear variable filter 60 based on the control information 102C corresponding to the designated observation mode. The control information 102C is stored in advance in a storage unit 102c described later. Therefore, when the user designates the observation mode using the operation unit 104, the control unit 101c can move the linear variable filter 60 based on the control information 102C corresponding to the observation mode.

  In addition, the control unit 101c can save setting information 102D including information indicating the setting state of the optical system of the slit lamp microscope and the imaging device 13 in the storage unit 102c at an arbitrary timing.

  According to this embodiment, since the linear variable filter 60 can be moved according to the designated observation mode, it is possible to observe the eye to be examined with a wavelength and hue suitable for the observation mode. Further, since the color and hue of the illumination light can be changed by the projector 70, subtle adjustment of the wavelength and hue can be performed by combining with the movement of the linear variable filter 60, and any wavelength can be adjusted with a simple mechanism. It becomes possible to observe the eye to be inspected with the hue.

  The modification of the first embodiment can also be applied to the slit lamp microscope according to this embodiment.

  The “slit light generation unit” according to this embodiment may include at least a light source 51 and a slit formation unit 54 instead of the projector 70. In this case, the slit light formed by the slit forming unit 54 is applied to the linear variable filter 60.

[effect]
The effect of the slit lamp microscope will be described.

  The slit lamp microscope includes an illumination system (for example, illumination system 8c) and an observation system (for example, observation system 6). The illumination system includes a slit light forming unit, a wavelength selection member (for example, a linear variable filter 60), and a moving mechanism (for example, a moving mechanism 60B). The slit light generation unit generates slit light. A wavelength selection member is arrange | positioned in the path | route of the produced | generated slit light, and the some area | region from which a wavelength selection characteristic differs is provided. The moving mechanism moves the wavelength selecting member relative to the slit light path. The illumination system illuminates the eye to be examined (for example, eye E to be examined) with the slit light that has passed through the wavelength selection member. The observation system guides the return light of the slit light from the eye to be examined to the imaging device (for example, the imaging device 13).

  In such a configuration, in the slit lamp microscope, a slit light forming portion is provided, and a wavelength selection member provided with a plurality of regions having different wavelength selection characteristics is arranged in the path of the slit light. Since the wavelength selection member is moved relative to the path of the slit light by the moving mechanism, a region having a desired wavelength selection characteristic can be arranged at the slit light incident position. Thereby, it becomes possible to change the wavelength and hue of the illumination light that has passed through the wavelength selection member, and the observation function of the eye to be examined can be improved in a space-saving manner.

  In addition, the slit light generation unit includes a slit forming unit (for example, the slit forming unit 54) that is disposed in the light path from the illumination light source (for example, the light source 51) and forms a slit having at least a variable width. May be included.

  According to such a configuration, since the wavelength selection member is moved relative to the slit light path by the moving mechanism, a region having a desired wavelength selection characteristic can be arranged at the slit light incident position. it can. Thereby, it becomes possible to change the wavelength and hue of the illumination light that has passed through the wavelength selection member, and the observation function of the eye to be examined can be improved in a space-saving manner.

  Further, the slit light generation unit may include a projector (for example, projector 70) that can output light of a preset pattern.

  According to such a configuration, by changing the color and hue of the illumination light by the projector, subtle adjustment of the wavelength and hue can be achieved by combining with the movement of the wavelength tunable filter. It becomes possible to observe the eye to be inspected with the wavelength and the hue.

[Modification]
In the third embodiment, for example, two or more light beams may be output by the projector 70, each passing through different wavelength selection regions, and then the light beams may be combined to generate the slit light. . Accordingly, the eye to be examined can be illuminated with slit light including an arbitrary wavelength band. Note that the illumination system may include a plurality of light sources, and two or more light beams may be output from the plurality of light sources. Further, the illumination system may include a single light source, and two or more light beams may be output by dividing the optical path from the single light source.

  The embodiment described above is merely a specific example for carrying out the present invention. A person who intends to implement the present invention can appropriately make arbitrary modifications within the scope of the gist of the present invention.

DESCRIPTION OF SYMBOLS 1 Slit lamp microscope 6 Observation system 8, 8b, 8c Illumination system 13 Imaging device 43 Image pick-up element 51 Light source 54 Slit formation part 54A, 60A Actuator 54B, 60B Moving mechanism 60, 60a Linear variable filter 61 Relay lens 70 Projector 100 Computer 101, 101c Control unit 101A Analysis unit 102, 102c Storage unit 102A, 102C Control information 102B, 102D Setting information 103 Display unit 104 Operation unit E Eye to be examined

Claims (10)

Formed in the light path from an illumination light source provided in a projector having a lens, a wavelength selection member provided with a plurality of regions having different wavelength selection characteristics, and slit light from light passing through the wavelength selection member A slit forming unit that moves the wavelength selecting member relative to a path of light from the illumination light source at a position optically conjugate with the illumination light source, and the slit light. An illumination system that illuminates the subject's eye with
An observation system for guiding the return light of the slit light from the eye to the imaging device;
Including slit lamp microscope. A slit light generation unit that includes a projector having an illumination light source and a lens and generates slit light, and a wavelength selection unit that is disposed in a path of the generated slit light and has a plurality of regions having different wavelength selection characteristics A slit that passes through the wavelength selection member, and a moving mechanism for moving the wavelength selection member relative to the path of the slit light at a position optically conjugate with the illumination light source. An illumination system that illuminates the eye with light;
An observation system for guiding the return light of the slit light from the eye to the imaging device;
Including slit lamp microscope. The slit lamp microscope according to claim 2, wherein the projector is capable of outputting a preset pattern of light. The moving mechanism, slit lamp according to any one of claims 1 to 3, characterized in that moving the wavelength selecting member in a direction crossing the direction of incidence of the light on the wavelength selecting member microscope. The plurality of regions of the wavelength selection member are arranged in a first direction;
The slit lamp microscope according to any one of claims 1 to 4 , wherein the moving mechanism moves the wavelength selection member in the first direction. The first direction is a direction intersecting a radial direction around a predetermined rotation axis,
The slit lamp microscope according to claim 5 , wherein the moving mechanism rotates the wavelength selection member in the first direction around the rotation axis. The slit lamp microscope according to claim 5 or 6 , wherein the wavelength selection member is configured such that wavelength selection characteristics continuously change in the first direction. The slit lamp microscope according to claim 5 or 6 , wherein the wavelength selection member is configured such that a wavelength selection characteristic changes stepwise in the first direction. A storage unit for storing in advance a plurality of control information corresponding to a plurality of observation modes;
A designating unit for designating any one of the plurality of observation modes;
A control unit that moves the moving mechanism based on control information stored in the storage unit corresponding to the observation mode specified by the specifying unit;
The slit lamp microscope according to any one of claims 1 to 8 , characterized by comprising: The storage unit stores control details executed in the past for the moving mechanism,
The slit lamp microscope according to claim 9 , wherein the control unit moves the movement mechanism based on the control content stored in the storage unit.

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