JP6624793B2 - Slit lamp microscope - Google Patents

Description

  The present invention relates to a slit lamp microscope.

  A slit lamp microscope is an ophthalmologic apparatus for observing a cross section of an observation site by cutting out an optical section of the observation site of an eye to be inspected using slit light, and acquiring an image of the cross section. Generally, a slit lamp microscope is used for diagnosis of a cornea, a lens, and the like. For example, a doctor operates a slit lamp microscope and observes the entire diagnostic site by shifting the observation site of the subject's eye illuminated with slit light in a horizontal direction or a depth direction, and observes an abnormality in the diagnostic site. Determine the presence or absence.

JP-T-2013-527775

  However, when observing the entire diagnostic site using a slit lamp microscope, the image that can be stored as a diagnostic record is only a partial cross-sectional image of the diagnostic site, and the cross-sectional images of most other sites are not stored as the diagnostic record. For this reason, the findings on the diagnostic site are likely to be influenced by the subjective opinion of the doctor who has observed the entire diagnostic site, which may hinder the improvement of the diagnostic accuracy.

In recent years, optical coherence tomography (Optical Coherence)
It is possible to take a three-dimensional image of a diagnosis site by using a Tomography (hereinafter, OCT) device. As a result, the number of cases where a doctor diagnoses the diagnostic site from a three-dimensional image acquired by an OCT apparatus has increased. However, when a doctor performs a diagnosis from a wide area image such as a three-dimensional image based on the result of the inspection using the slit lamp microscope, it is necessary to separately prepare an installation space for the OCT device, or to install the OCT device in an inspection position. It may be necessary to move the subject.

  The present invention has been made to solve such a problem, and an object of the present invention is to provide a slit lamp microscope capable of acquiring a wide-range image of an eye to be examined.

The slit lamp microscope according to the embodiment includes an illumination system, an imaging system, a moving mechanism, and an image combining unit . The illumination system includes an illumination focusing mechanism for illuminating the subject's eye with slit light and changing a focus position of the slit light. The imaging system includes an imaging and focusing mechanism for changing the focus position, and guides the return light of the slit light from the subject's eye to the imaging device. The moving mechanism moves the illumination system and the photographing system in coordination. The image synthesizing unit is configured to move the illumination system and the imaging system in cooperation with each other by the moving mechanism, so that the focus position of the slit light is set in the depth direction of the observation site of the subject's eye and in a direction substantially orthogonal to the depth direction. A plurality of images acquired by the imaging device are combined while changing the focus position of the imaging system to form a three-dimensional image of the subject's eye.

  According to the slit lamp microscope according to the present invention, it is possible to provide a slit lamp microscope capable of acquiring a wide-range image of the eye to be inspected.

It is a schematic diagram showing the example of composition of the slit lamp microscope concerning an embodiment. It is a schematic diagram showing an example of composition of an optical system of a slit lamp microscope concerning an embodiment. It is a schematic diagram showing an example of composition of a control system of a slit lamp microscope concerning an embodiment. It is operation | movement explanatory drawing of the slit lamp microscope which concerns on embodiment. It is operation | movement explanatory drawing of the slit lamp microscope which concerns on embodiment. It is a flowchart which shows the operation example of the slit lamp microscope which concerns on embodiment. It is explanatory drawing of the operation example of the slit lamp microscope which concerns on embodiment. It is explanatory drawing of the operation example of the slit lamp microscope which concerns on embodiment. It is explanatory drawing of the operation example of the slit lamp microscope which concerns on embodiment.

  An embodiment of a slit lamp microscope according to the present invention will be described in detail with reference to the drawings. The contents of the documents described in this specification can be appropriately used as the contents of the following embodiments.

  First, the direction is defined. In the apparatus optical system, the direction from the lens (objective lens) closest to the subject toward the subject is defined as the front direction, the depth direction (depth direction), and the opposite direction is defined as the rear direction. The horizontal direction orthogonal to the front direction is defined as the left-right direction. Further, a direction perpendicular to both the front-rear direction and the left-right direction is defined as a vertical direction.

[Appearance configuration]
The external configuration of the slit lamp microscope according to this embodiment will be described with reference to FIG. A computer 100 is connected to the slit lamp microscope 1. The computer 100 performs various control processes and arithmetic processes. Note that, instead of providing the computer 100 separately from the microscope main body (a housing for storing an optical system and the like), a configuration in which a similar computer is mounted on the microscope main body can be applied.

  The slit lamp microscope 1 is placed on a table 2. Note that the computer 100 may be installed on another table or another place. The base 4 is configured to be movable in the horizontal direction via the moving mechanism 3. The base 4 is moved by tilting the operation handle 5.

  On the upper surface of the base 4, a support portion 15 that supports the observation and imaging system 6 and the illumination system 8 is provided. A support arm 16 that supports the observation and imaging system 6 is attached to the support unit 15 so as to be rotatable in the left-right direction. A support arm 17 that supports the illumination system 8 is attached to the upper part of the support arm 16 so as to be rotatable in the left-right direction. The support arms 16 and 17 are independently rotatable coaxially.

  The observation and imaging system 6 is moved by rotating the support arm 16. The illumination system 8 is moved by rotating the support arm 17. The support arms 16 and 17 are configured to be rotated by an electric mechanism. Therefore, the moving mechanism 3 is provided with an actuator that generates a driving force for rotating each of the support arms 16 and 17 and a transmission mechanism that transmits the driving force to each of the support arms. The actuator is constituted by, for example, a stepping motor (pulse motor). The transmission mechanism is composed of, for example, a combination of gears and a rack and pinion. The observation and imaging system 6 may be moved by manually rotating the support arm 16. The illumination system 8 may be moved by manually rotating the support arm 17.

  The illumination system 8 irradiates the eye E with illumination light. As described above, the illumination system 8 can swing right and left around the rotation axis. Thereby, the irradiation direction of the illumination light to the eye E is changed. The illumination system 8 may be configured to swing up and down. That is, the configuration may be such that the elevation angle and the depression angle of the illumination light can be changed.

  The observation and imaging system 6 has a pair of left and right optical systems for guiding the reflected light of the illumination light from the eye E to be inspected. This optical system is housed in the lens barrel body 9. The end of the lens barrel body 9 is an eyepiece 9a. The examiner looks into the eye E with the naked eye by looking into the eyepiece 9a. As described above, by rotating the support arm 16, the lens barrel main body 9 can be rotated in the left-right direction. Thereby, the direction of the observation imaging system 6 with respect to the eye E (the direction of the optical axis of the observation imaging system 6) can be changed. Note that the reflected light of the illumination light includes various kinds of light passing through the eye E, such as scattered light, for example, and these various lights are referred to as “return light” or “reflected light”. I do.

  A chin rest 10 is arranged at a position facing the lens barrel body 9. The chin rest 10 is provided with a chin rest part 10a and a forehead pad 10b for stably placing the face of the subject.

  An observation magnification operation knob 11 for changing the observation magnification is arranged on a side surface of the lens barrel body 9. Further, an imaging device 13 for imaging the eye E is connected to the lens barrel body 9. The imaging device 13 includes an imaging element. The imaging element is a photoelectric conversion element that detects light and outputs an image signal GS (electric signal). The image signal GS is input to the computer 100. For example, a CCD (Charge Coupled Device) image sensor or a CMOS (Complementary Metal Oxide Semiconductor) image sensor is used as the imaging element. A mirror 12 that reflects an illumination light beam output from the illumination system 8 toward the subject's eye E is disposed below the illumination system 8.

[Configuration of optical system]
The configuration of the optical system of the slit lamp microscope 1 will be described with reference to FIG. The slit lamp microscope 1 includes an observation and imaging system 6 and an illumination system 8.

(Observation and photography system)
The observation and imaging system 6 includes a pair of left and right optical systems. The left and right optical systems have substantially the same configuration. The examiner can observe the subject's eye E with his / her binoculars by using the left and right optical systems. FIG. 2 shows only one of the left and right optical systems of the observation and imaging system 6. The observation and imaging system 6 may include only one of the left and right optical systems. Reference numeral O1 denotes an optical axis (observation optical axis, imaging optical axis) of the observation imaging system 6.

  Each of the left and right optical systems of the observation photographing system 6 includes an objective lens 31, a variable power optical system 32, a beam splitter 34, an imaging lens 35, a prism 36, and an eyepiece 37. The beam splitter 34 is provided in one or both of the left and right optical systems. The eyepiece 37 is provided in the eyepiece 9a. Reference symbol P indicates an image forming position of light guided to the eyepiece lens 37. Symbol Ec indicates the cornea of the eye E. Symbol Eo indicates the examiner's eye.

  The variable power optical system 32 includes a plurality (for example, two) of variable power lenses 32a, 32b, and 32c. In this embodiment, a plurality of variable power lens groups that can be selectively inserted into the optical path of the observation and imaging system 6 are provided. These variable power lens groups are configured to give different magnifications. The variable power lens group arranged on the optical path of the observation photographing system 6 is used as the variable power lenses 32a, 32b, and 32c. Thereby, the magnification (angle of view) of the naked eye observation image and the captured image of the eye E can be changed. The change of the magnification, that is, the switching of the variable magnification lens group arranged on the optical path of the observation photographing system 6 is performed by operating the observation magnification operation knob 11. Further, the magnification may be changed electrically using a switch (not shown) or the like.

  The beam splitter 34 splits the light traveling along the optical axis O1 into two. The light transmitted through the beam splitter 34 is guided to the examiner's eye Eo via the imaging lens 35, the prism 36, and the eyepiece 37. The prism 36 translates the traveling direction of the light upward.

  On the other hand, the light reflected by the beam splitter 34 is guided to the imaging device 43 of the imaging device 13 via the condenser lens 41 and the mirror 42. That is, the observation imaging system 6 guides the return light of the slit light from the eye E illuminated by the illumination system 8 to the imaging device 13. The image sensor 43 detects the return light and generates an image signal GS.

  Further, the observation and imaging system 6 includes a focusing mechanism 40 for changing the focus position. The focusing mechanism 40 moves the objective lens 31 along the optical axis O1 (the optical axis of the observation and imaging system 6). For example, the focusing mechanism 40 includes a holding member for holding the objective lens 31, a slide mechanism for moving the holding member in the direction of the optical axis O1, an actuator for generating a driving force, and transmitting the driving force to the slide mechanism. And a member to perform.

  The focusing mechanism 40 can move the objective lens 31 automatically or manually.

  In the case of automatic movement, for example, the computer 100 obtains a focus position based on the return light from the eye E using a known focus adjustment method (a phase difference detection method, a contrast detection method, or the like). The actuator moves the objective lens 31 to the focus position determined by the computer 100 along the optical axis O1. In the case of manual movement, the actuator moves the objective lens 31 along the optical axis O1 based on the operation of a user (for example, an operator) on an operation unit (not shown).

  The observation and imaging system 6 may include a first focusing lens disposed at a predetermined position on the optical axis O1 between the objective lens 31 and the image sensor 43. In this case, the focusing mechanism 40 changes the focus position of the observation imaging system 6 by moving the first focusing lens along the optical axis O1. For example, the focusing mechanism 40 includes a holding member that holds the first focusing lens, a slide mechanism that moves the holding member in the direction of the optical axis O1, an actuator that generates a driving force, and a slide mechanism that generates the driving force. And a member for transmitting to the The focusing mechanism 40 can automatically or manually move the first focusing lens, as in the case where the objective lens 31 is moved.

  Further, the entire observation and imaging system 6 may be configured to be movable along the optical axis O1. In this case, the focusing mechanism 40 changes the focus position of the observation and imaging system 6 by moving the entire observation and imaging system 6 along the optical axis O1. For example, the focusing mechanism 40 includes a movable stage on which the observation and imaging system 6 is mounted, a slide mechanism for moving the movable stage in the direction of the optical axis O1, an actuator for generating a driving force, and a slide mechanism for generating the driving force. And a member for transmitting to the The focusing mechanism 40 can automatically or manually move the entire observation and imaging system 6 in the same manner as when the objective lens 31 is moved.

[Lighting system]
The illumination system 8 has an illumination light source 51, a condenser lens 52, a slit forming section 53, and an objective lens 54. Symbol O2 indicates the optical axis of the illumination system 8 (illumination optical axis).

  The illumination light source 51 outputs illumination light. Note that a plurality of light sources may be provided in the illumination system 8. For example, both a light source (a halogen lamp, an LED, or the like) that outputs stationary light and a light source (a xenon lamp, an LED, or the like) that outputs flash light can be provided as the illumination light source 51. Further, a light source for cornea observation and a light source for fundus observation may be separately provided. The illumination light source 51 includes at least a visible light source that outputs visible light. Illumination light source 51 includes, for example, a light source that outputs infrared light (for example, a center wavelength of 800 nm to 1000 nm), and may output infrared light as illumination light.

  The slit forming section 53 is used to generate slit light. The slit forming section 53 has a pair of slit blades. By changing the interval (slit width) between these slit blades, the width of the slit light is changed.

  The illumination system 8 includes a focusing mechanism 50 for changing the focus position of the slit light. The focusing mechanism 50 moves the objective lens 54 along the optical axis O2 (optical axis of the illumination system). For example, the focusing mechanism 50 includes a holding member for holding the objective lens 54, a slide mechanism for moving the holding member in the direction of the optical axis O1, an actuator for generating a driving force, and transmitting the driving force to the slide mechanism. And a member to perform.

  The focusing mechanism 50 can move the objective lens 54 automatically or manually.

  In the case of automatic movement, for example, the computer 100 obtains a focus position by analyzing an image in which an image based on the return light from the eye E is drawn. The actuator moves the objective lens 54 to the focus position determined by the computer 100 along the optical axis O2. In the case of manual movement, the actuator moves the objective lens 54 along the optical axis O2 based on the user's operation on an operation unit (not shown).

  Note that the illumination system 8 may include a second focusing lens disposed at a predetermined position on the optical axis O2 between the objective lens 54 and the slit forming section 53. In this case, the focusing mechanism 50 changes the focus position of the slit light by moving the second focusing lens along the optical axis O2. For example, the focusing mechanism 50 includes a holding member that holds the second focusing lens, a slide mechanism that moves the holding member in the direction of the optical axis O2, an actuator that generates a driving force, and a slide mechanism that generates the driving force. And a member for transmitting to the The focusing mechanism 50 can automatically or manually move the second focusing lens, as in the case where the objective lens 54 is moved.

  Further, the entire illumination system 8 may be configured to be movable along the optical axis O2. In this case, the focus mechanism 50 changes the focus position of the slit light by moving the entire illumination system 8 along the optical axis O2. For example, the focusing mechanism 50 includes a movable stage on which the illumination system 8 is mounted, a slide mechanism that moves the movable stage in the direction of the optical axis O2, an actuator that generates a driving force, and a driving mechanism that transfers the driving force to the slide mechanism. And a transmitting member. The focusing mechanism 50 can automatically or manually move the entire illumination system 8 as in the case where the objective lens 54 is moved.

  Although not shown in FIG. 2, for example, a mirror 12 is disposed on the optical axis O2. The illumination system 8 may be configured to be movable about a rotation axis integrally with the mirror 12.

  The slit lamp microscope 1 can acquire a plurality of images while changing the focus position of both the observation imaging system 6 and the illumination system 8 with respect to the observation site. For example, the acquired image is stored in association with position information indicating the acquisition position. Thereby, it is possible to combine the acquired plurality of images as a wide-area image (for example, a three-dimensional image) of the observation region, or to display each image in order.

  The slit lamp microscope 1 detects a focus position of a slit light and a focus position detecting unit for detecting a focus position of the observation and imaging system 6, and detects at least one position of the observation and imaging system 6 and the illumination system 8. It may be configured to include a scan position detection unit. The focus position detection unit and the scan position detection unit will be described later.

  In this embodiment, the focusing mechanism 50 is an example of an “illumination focusing mechanism”, the observation / photographing system 6 is an example of a “photographing system”, and the focusing mechanism 40 is an example of a “photographing / focusing mechanism”. . The moving mechanism 3, the support arms 16, 17, and a mechanism for moving these are examples of a "moving mechanism". Further, the objective lens 31 is an example of a “photographing objective lens”, and the objective lens 54 is an example of an “illumination objective lens”.

[Control system configuration]
The control system of the slit lamp microscope 1 will be described with reference to FIGS. As shown in FIG. 3, the control system of the slit lamp microscope 1 is configured around a control unit 101. Note that at least a part of the configuration of the control system may be included in the computer 100.

(Control unit)
The control unit 101 controls each unit of the slit lamp microscope 1. The control unit 101 performs control of the observation and imaging system 6, control of the illumination system 8, control of the image synthesis unit 120, control of the display unit 130, and the like.

  The control of the observation / photographing system 6 includes the control of the variable power optical system 32, the control of the image sensor 43, the control of the focusing mechanism 40, the control of the moving mechanism 60 for moving the observation / photographing system 6, and the focus position detection unit. 150 and control of the scan position detection unit 160. As the control of the variable magnification optical system 32, there is a control for changing the magnification of the naked eye observation image or the photographed image of the eye E to be inspected in response to the operation of the observation magnification operation knob 11. The control of the image sensor 43 includes control for changing the charge accumulation time, sensitivity, frame rate, and the like of the image sensor 43, and control for transmitting the image signal GS obtained by the image sensor 43 to the image synthesis unit 120. The control of the focusing mechanism 40 includes a control of changing the focus position of the observation and imaging system 6 by the focusing mechanism 40. The moving mechanism 60 includes the moving mechanism 3, the support arms 16 and 17, and a mechanism for moving them, and moves at least one of the illumination system 8 and the observation and imaging system 6. The control of the moving mechanism 60 includes a control of moving the observation / photographing system 6 and the like. The control of the focus position detection unit 150 includes a control of acquiring the position detected by the focus position detection unit 150 and transmitting the acquired position to the image synthesis unit 120. The control of the scan position detection unit 160 includes a control of acquiring the position detected by the scan position detection unit 160 and transmitting the acquired position to the image synthesis unit 120.

  The control of the illumination system 8 includes the control of the illumination light source 51, the control of the slit forming unit 53, the control of the focusing mechanism 50, the control of the moving mechanism 60 for moving the illumination system 8, and the control of the focusing position detection unit 150. The control includes control of the scan position detection unit 160 and the like. Examples of the control of the illumination light source 51 include switching between turning on and off the illumination light source 51, and changing the amount of illumination light. The control of the slit forming section 53 includes a change control of the width of the slit light by changing the interval between the pair of slit blades. The control of the focusing mechanism 50 includes a change control of the focus position of the slit light by the focusing mechanism 50 (the focus position of the illumination system 8). The control of the moving mechanism 60 includes a control of moving the illumination system 8. The control of the focus position detection unit 150 includes a control of acquiring the position detected by the focus position detection unit 150 and transmitting the acquired position to the image synthesis unit 120. The control of the scan position detection unit 160 includes a control of acquiring the position detected by the scan position detection unit 160 and transmitting the acquired position to the image synthesis unit 120.

  The control of the image synthesizing unit 120 includes a control on a synthesizing process of a plurality of images acquired by the observation and imaging system 6.

  The control unit 101 includes a focus control unit 101A, a scan control unit 101B, and a storage unit 102.

  The focus control unit 101A controls a focus position for acquiring an image of the eye E.

  FIG. 4 is a diagram illustrating the operation of the focusing control unit 101A. FIG. 4 schematically shows the focus positions of the observation imaging system 6 and the illumination system 8 with respect to the cornea Ec of the eye E. In FIG. 4, only the objective lens 31 is illustrated for the observation and imaging system 6, and only the objective lens 54 is illustrated for the illumination system 8. Reference sign Cf indicates the anterior corneal surface of the cornea Ec, and reference sign Cb indicates the posterior corneal surface of the cornea Ec. Symbol Cc indicates the center of curvature of the cornea Ec (front surface Cf of the cornea) as the center of curvature of the observation site. For example, the rotation axes of the observation imaging system 6 and the illumination system 8 are moved to the curvature center position Cc.

  The focus control unit 101A can control a scan (r-scan) in the depth direction (radial direction) of the observation site of the eye E to be examined. The focusing control unit 101A controls the focusing mechanism 40 and the focusing mechanism 50 in cooperation with each other. For example, the focusing control unit 101A controls the focusing mechanism 40 and the focusing mechanism 50, and focuses the observation imaging system 6 in the order of the positions PS1, PS2, and PS3 in the depth direction (depth direction) of the observation site. And the focus position of the illumination system 8 is changed. The observation photographing system 6 can acquire an image of the eye E in focus within the range of the depth of field corresponding to the changed focus position. For example, the observation imaging system 6 can acquire an image of the eye E in the range of the depth of field PC1 corresponding to the position PS1.

  The focus control unit 101 </ b> A can alternately execute control for causing the imaging device 13 to acquire an image and the above-described link control. Thereby, the focusing control unit 101A can control acquisition of a plurality of cross-sectional images in the depth direction of the observation site of the eye E. For example, the focus control unit 101A can perform control for sequentially acquiring images of the cross sections at the positions PS1, PS2, and PS3.

  For example, the focus control unit 101A can alternately execute one or more image acquisition control and linkage control. The control of obtaining one or more images includes a control of obtaining a plurality of images and generating one image from the obtained plurality of images. Examples of the control for generating one image include a control for adding and averaging a plurality of acquired images to generate one image, a control for selecting one image from the plurality of acquired images, and a wavelength of illumination light. There is a control for selecting one image from a plurality of images obtained while changing the image.

  The scan control unit 101B controls a horizontal scan position (a direction substantially orthogonal to the depth direction) of the observation site of the eye E to be inspected.

  FIG. 5 is a diagram illustrating the operation of the scan control unit 101B. FIG. 5 schematically illustrates focus positions of the observation imaging system 6 and the illumination system 8 with respect to the cornea Ec of the eye E to be inspected. In FIG. 5, the same parts as those in FIG. 4 are denoted by the same reference numerals, and the description will be appropriately omitted.

  The scan control unit 101B can control the horizontal scan (the declination direction) of the observation site of the eye E (θ scan). The scan control unit 101B controls the moving mechanism 60 so that the movement of the illumination system 8 and the movement of the observation and imaging system 6 are linked. For example, the scan control unit 101B moves the observation imaging system 6 and the illumination system 8 in the order of the horizontal scan positions PS1, PS11, and PS12.

  The scan control unit 101B can alternately execute control for causing the imaging device 13 to acquire an image and control for the moving mechanism 60 (movement control). Thereby, the scan control unit 101B can control acquisition of a plurality of cross-sectional images in the horizontal direction of the observation site of the eye E. For example, the scan control unit 101B can perform control for sequentially acquiring images of the cross sections of the positions PS1, PS11, and PS12.

  At each of the horizontal positions PS1, PS11, and PS12, the focus control unit 101A changes the focus position of the observation and imaging system 6 and the focus position of the illumination system 8 in the depth direction. Thereby, it is possible to control the acquisition of the image of the cross section for each of the positions PS1, PS2, PS3, PS11, PS21, PS31, PS12, PS22, and PS32.

  The storage unit 102 stores various computer programs and data. The computer program includes an arithmetic program and a control program for causing the slit lamp microscope 1 to execute various inspections. The data includes data used in various tests. Scan information is an example of such data. The scan information includes, for example, control information for moving the observation imaging system 6 and the illumination system 8 to a plurality of scan positions of the observation region, and the observation imaging system 6 and the illumination at one or more depth positions for each scan position. And control information for changing the focus position of the system 8. These pieces of control information are stored in the storage unit 102 in advance. Using the scan information stored in the storage unit 102, the control unit 101 can control the focus position by the focus control unit 101A while controlling the horizontal scan position by the scan control unit 101B.

  The control unit 101 includes a microprocessor, a random access memory (RAM), a read only memory (ROM), a hard disk drive, and the like. A control program is stored in a storage device such as a ROM or a hard disk drive in advance. The operation of the control unit 101 is realized by cooperation between the control program and hardware. The control unit 101 is arranged in the apparatus main body of the slit lamp microscope 1 (for example, in the base 4) or the computer 100.

(Image synthesis unit)
The image synthesizing unit 120 synthesizes a plurality of images acquired by the imaging device 13 while moving at least one of the observation imaging system 6 and the illumination system 8 by the moving mechanism 60. For example, the image combining unit 120 combines a plurality of images acquired by the imaging device 13 while changing the focus position by the focusing mechanism 40 and the focusing mechanism 50.

  The image combining unit 120 can form a three-dimensional image (image data) of the eye E by combining a plurality of two-dimensional sectional images having different sectional positions. The image data of a three-dimensional image means image data in which the positions of pixels are defined by a three-dimensional coordinate system. As image data of a three-dimensional image, there is image data composed of voxels arranged three-dimensionally. This image data is called volume data or voxel data. When displaying an image based on the volume data, the image synthesis unit 120 performs a rendering process (such as volume rendering or MIP (Maximum Intensity Projection)) on the volume data. Thereby, the image synthesis unit 120 can form image data of a pseudo three-dimensional image when viewed from a specific line of sight. Further, the image synthesizing unit 120 can image an arbitrary cross section of the three-dimensional image (MPR (Multi-Planar Reconstruction): cross section conversion).

  In addition, stack data of a plurality of cross-sectional images can be formed as image data of a three-dimensional image. Stack data is image data obtained by three-dimensionally arranging a plurality of cross-sectional images obtained at a plurality of scan positions based on the positional relationship between the scan positions. That is, the stack data is image data obtained by expressing a plurality of cross-sectional images originally defined by individual two-dimensional coordinate systems in one three-dimensional coordinate system (that is, embedding them in one three-dimensional space). is there. The control unit 101 or the image synthesis unit 120 can perform MPR processing based on stack data.

  The image synthesis unit 120 includes an array processing unit 121 and a synthesis processing unit 122. The image combining unit 120 can combine the plurality of images according to the arrangement of the plurality of focus positions corresponding to the plurality of acquired images.

  The arrangement processing unit 121 arranges a plurality of images acquired by the imaging device 13. For example, the controller 101 receives the focus position of the slit light detected by the focus position detector 150 from the controller 101, and the arrangement processor 121 arranges a plurality of images acquired by the imaging device 13. Further, at least one of the positions of the observation imaging system 6 and the illumination system 8 detected by the scan position detection unit 160 is received from the control unit 101, and the array processing unit 121 arranges a plurality of images acquired by the imaging device 13. I do. The arrangement processing unit 121 may arrange a plurality of images acquired by the imaging device 13 based on at least one of the focus control unit 101A and the scan control unit 101B.

  The combination processing unit 122 combines the plurality of images arranged by the arrangement processing unit 121. Therefore, the combining processing unit 122 can combine the plurality of images according to the arrangement of the plurality of focus positions corresponding to the plurality of arranged images. For synthesizing a plurality of images, a plurality of images may be arranged by adding position information indicating an acquisition position in an observation region to each image, or one combined image may be created based on the position information of each image. Is included. The control unit 101 can cause the display unit 130 to display a plurality of arranged images and one created composite image.

  Further, the image synthesis unit 120 may synthesize a plurality of images by analyzing one or more images acquired by the imaging device 13. That is, the image combining unit 120 may combine a plurality of images by image analysis without providing the focus position detecting unit 150 and the scan position detecting unit 160. For example, the arrangement processing unit 121 specifies the positions of the plurality of images acquired by the imaging device 13 based on the peripheral edge of each image, and arranges the plurality of images based on the specified positions. The combining processing unit 122 combines a plurality of images arranged according to the positions specified by the arrangement processing unit 121 based on the peripheral edge of each image. Alternatively, for example, the array processing unit 121 specifies the positions of the plurality of images acquired by the imaging device 13 based on the positions of the slit light images reflected in the front image of the eye E, and specifies the specified positions. The plurality of images are arranged based on. The combination processing unit 122 combines a plurality of images arranged according to the position specified by the arrangement processing unit 121 based on the position of the slit light image.

(Focus position detector)
The focus position detection unit 150 includes, for example, an imaging system position sensor provided in the observation imaging system 6 for detecting the position of the objective lens 31 and an illumination system position sensor provided in the illumination system 8 for detecting the position of the objective lens 54. including. The focus position detection unit 150 may be configured to include only one of the imaging system position sensor and the illumination system position sensor. The installation mode of the focus position detection unit 150 is not limited as long as the focus position of the slit light can be specified.

  It is also possible to specify the current position of the objective lenses 31 and 54 by referring to control contents such as control history of the objective lenses 31 and 54 by the focusing control unit 101A. In this case, the in-focus position detection unit 150 may not be provided.

[Scan position detector]
The scan position detection unit 160 detects, for example, a position sensor for detecting the position of the base 4 provided with the support unit 15 that supports the observation imaging system 6 and the illumination system 8 and the positions of the support arms 16 and 17. And an angle sensor for performing the operation. The scan position detection unit 160 may not be configured to include all of the position sensor for detecting the position of the base 4 and the angle sensor for detecting the positions of the support arms 16 and 17. If the positions of the observation imaging system 6 and the illumination system 8 can be specified, the installation mode of the scan position detection unit 160 is not limited.

  It is also possible to specify the position and angle of the observation imaging system 6 and the illumination system 8 with reference to control contents such as the control history of the observation imaging system 6 and the illumination system 8 by the scan control unit 101B. In this case, the scan position detector 160 may not be provided.

(Display)
The display unit 130 displays various information under the control of the control unit 101. The display unit 130 includes a display device such as a flat panel display such as an LCD (Liquid Crystal Display). The display unit 130 may be provided in the apparatus main body of the slit lamp microscope 1 or may be provided in the computer 100.

(Operation unit)
The operation unit 140 includes an operation device and an input device. The operation unit 140 includes buttons and switches (for example, the operation handle 5, the observation magnification operation knob 11 and the like) provided on the slit lamp microscope 1, and operation devices (mouse, keyboard, and the like) provided on the computer 100. . The operation unit 140 may include any operation device or input device such as a trackball, an operation panel, a switch, a button, and a dial.

  In FIG. 3, the display unit 130 and the operation unit 140 are separately illustrated, but at least a part thereof may be integrally configured. As a specific example, a touch screen can be used.

  The in-focus position detector is an example of a “first detector”, and the scan position detector is an example of a “second detector”.

[motion]
The operation of the slit lamp microscope 1 will be described. FIG. 6 shows an operation example of the slit lamp microscope 1. 7A to 7C are explanatory diagrams of an operation example of the slit lamp microscope 1 shown in FIG. 7A to 7C schematically show positions of the observation imaging system 6 and the illumination system 8 with respect to the eye E to be inspected.

(S1)
First, when the examiner turns on the power of the slit lamp microscope 1 and places the face of the subject on the chin receiving portion 10a, the shape such as the width of the slit light is adjusted using the operation unit 140. In the slit lamp microscope 1, upon receiving an operation on the operation unit 140, the control unit 101 controls the slit forming unit 53 to change the shape of the slit light into a thin and long slit shape.

(S2)
The control unit 101 arranges the observation / photography system 6 and the illumination system 8 at the initial positions by controlling the moving mechanism 60 by the scan control unit 101B. The initial position is, for example, a position specified by the scan information stored in the storage unit 102. The control unit 101 causes the illumination system 8 to be arranged at a position α degrees (for example, 30 degrees) to the left with respect to the reference direction D (for example, the front direction) of the eye E by rotating the support arm 17. In addition, the control unit 101 causes the observation arm 6 to be arranged at a position α degrees to the right with respect to the reference direction of the eye E by rotating the support arm 16 (see FIG. 7A).

(S3)
The control unit 101 controls the moving mechanism 60 to move the rotation axis of the observation imaging system 6 and the illumination system 8 to a predetermined position for observing the observation site (for example, the center of curvature of the cornea or crystalline lens). For example, the control unit 101 moves the position of the rotation axis to a desired position based on the pupil position of the illumination system 8 reflected on the observation site.

(S4)
The control unit 101 changes the focus control unit 101A using the scan information stored in the storage unit 102, and changes the focus control unit 101A by using the imaging device 13 at the focus position of the observation imaging system 6 and the illumination system 8 at the scan position. The subject's eye E is photographed. For example, the control unit 101 moves the objective lenses 31 and 54 along the optical axis of each system by a predetermined shift amount, and acquires a plurality of images having different shift amounts in the depth direction at each scan position. The shift amounts of the objective lenses 31 and 54 can be set so as to be uniquely determined based on information on the observation site and observation range of the eye E to be examined.

  The control unit 101 generates image data based on the image signal GS obtained by the image sensor 43, and stores the generated image data in the storage unit 102.

  Here, the control unit 101 compares the focus position of the slit light detected by the focus position detection unit 150 and the positions of the observation imaging system 6 and the illumination system 8 detected by the scan position detection unit 160 with the above. Save in association with image data.

  When the focus position of the slit light can be specified based on the control contents such as the control history by the focus control unit 101A, information based on the control contents by the focus control unit 101A is stored in association with the image data. May be. Similarly, when the positions of the observation imaging system 6 and the illumination system 8 can be specified based on the control contents such as the control history by the scan control unit 101B, information based on the control contents of the scan control unit 101B is added to the image data. They may be stored in association with each other.

(S5)
The control unit 101 determines whether or not the shooting has been completed based on the scan information stored in the storage unit 102. When the photographing for all the scan positions specified by the scan information is completed, it is determined that the photographing is completed. When it is determined that the photographing has been completed (S5: Y), the operation of the slit lamp microscope 1 proceeds to S7. When it is determined that the photographing is not completed (S5: N), the operation of the slit lamp microscope 1 proceeds to S6.

(S6)
When it is determined in S5 that the photographing is not completed (S5: N), the control unit 101 controls the moving mechanism 60 by the scan control unit 101B using the scan information stored in the storage unit 102 to perform observation and photographing. The system 6 and the illumination system 8 are relatively moved. For example, the scanning position is moved in the horizontal direction by rotating the illumination system 8 rightward by a predetermined angle. The operation of the slit lamp microscope 1 shifts to S4. In S4, a plurality of images having different focus positions are acquired at the scan position moved in S6.

  As shown in FIG. 7B, when the angle of the illumination system 8 with respect to the reference direction D of the subject's eye E becomes 0 degree, the control unit 101 moves the observation / photography system 6 to the left with respect to the reference direction D by α degrees. Position. The control unit 101 rotates the illumination system 8 rightward by a predetermined angle. The relative movement and imaging of the observation imaging system 6 and the illumination system 8 until the position becomes α degrees to the right with respect to the reference direction D. Are repeated (see FIG. 7C).

(S7)
When it is determined in S5 that the shooting has been completed (S5: Y), the control unit 101 causes the image combining unit 120 to combine the plurality of images repeatedly acquired in S4 to form, for example, a three-dimensional image. Accordingly, the control unit 101 can display a three-dimensional image of the cornea, the crystalline lens, or the like on the display unit 130 or display an image of an arbitrary cross section specified based on the operation performed on the operation unit 140. . When information based on the control contents of the focus control unit 101A and the scan control unit 101B is stored in association with the image data in S4, the image combining unit 120 combines a plurality of images based on the information. You may.

  Thus, the operation of the slit lamp microscope 1 is completed (end).

  In this embodiment, since the focus position of each system is changed by moving the objective lens along the optical axis, the weight of the drive target can be reduced, and the drive target can be moved at high speed. Become. Thereby, a slit lamp microscope suitable for high-speed imaging can be provided.

  When the angle between the optical axis of the observation and imaging system 6 and the optical axis of the illumination system 8 increases, the deviation between the focus position of the observation and imaging system 6 and the focus position of the illumination system 8 increases. However, in this embodiment, the focus position is independently adjusted in each of the observation and imaging system 6 and the illumination system 8, so that the difference between the focus position of the observation and imaging system 6 and the focus position of the illumination system 8 is determined. Correction can be easily performed. In particular, by providing angle sensors on the support arms 16 and 17 as the focus position detection unit 150, the deviation between the focus position of the observation and imaging system 6 and the focus position of the illumination system 8 can be easily and accurately corrected. Becomes possible.

  Further, in this embodiment, the observation site of the eye E is scanned mainly by changing the angle of the illumination system 8 with respect to the reference direction D of the eye E. Accordingly, a wide-area image of the eye E can be smoothly acquired only by adjusting the positions of the rotation axes of the observation imaging system 6 and the illumination system 8 to the center of curvature of the observation site. For example, the focus position of the observation and imaging system 6 is slightly shifted from the focus position of the illumination system 8, and scanning (horizontal scanning) is performed in the horizontal direction within the depth of field of the observation and imaging system 6. Images can be obtained.

[Action / Effect]
The operation and effect of the ophthalmologic apparatus according to the embodiment will be described.

  The slit lamp microscope (for example, the slit lamp microscope 1) according to the embodiment includes an illumination system (for example, the illumination system 8) and an imaging system (for example, the observation imaging system 6). The illumination system includes an illumination focusing mechanism (for example, a focusing mechanism 40) for illuminating the eye to be inspected (for example, the eye E to be inspected) with slit light and changing a focus position of the slit light. The imaging system guides the return light of the slit light from the subject's eye to an imaging device (for example, the imaging device 13).

  According to such a configuration, since it becomes possible to acquire an image of a cross section of the eye to be examined at a plurality of focus positions of the slit light in the depth direction of the observation site of the eye to be inspected, a cross section of a wide area of the eye to be inspected is obtained. A slit lamp microscope capable of acquiring an image can be provided.

  Further, the photographing system may include a photographing and focusing mechanism (for example, focusing mechanism 50) for changing the focus position.

  According to such a configuration, it is possible to change the focus position of the imaging system for a plurality of focus positions of the slit light in the depth direction of the observation site of the eye to be inspected. Images can be obtained.

  Further, the slit lamp microscope may include a first control unit (for example, a focusing control unit 101A) that controls the illumination focusing mechanism and the photographing focusing mechanism in cooperation.

  According to such a configuration, since the focus position of the slit light and the focus position of the imaging system can be changed in association with an arbitrary position of the observation site of the eye to be inspected, a wide-area cross section of the eye to be inspected can be obtained. Can be easily obtained.

  Further, the first control unit may alternately execute the control of causing the imaging device to acquire an image and the above-described cooperative control.

  According to such a configuration, it is possible to obtain an image of a cross section at each focus position while changing the focus position of the slit light in the depth direction of the observation site of the eye to be inspected. Acquisition and management of images, synthesis of acquired images of a plurality of cross sections, etc. can be facilitated. In addition, since an image of a wide area cross section of the eye to be inspected can be efficiently acquired, the examination load on the eye to be inspected can be reduced.

  Further, the slit lamp microscope may include at least a moving mechanism (for example, moving mechanism 60) for moving the illumination system.

  According to such a configuration, a cross-sectional image can be acquired at a plurality of horizontal positions in the observation region of the subject's eye, so that a wider-area cross-sectional image of the subject's eye can be acquired.

  Further, the moving mechanism may move both the illumination system and the photographing system. The slit lamp microscope may include a second control unit (for example, a scan control unit 101B) that controls a movement mechanism so as to link movement of the illumination system and movement of the imaging system.

  According to such a configuration, a plurality of cross-sectional images can be acquired at a plurality of positions in the horizontal direction and the depth direction with respect to the observation site of the subject's eye, so that a three-dimensional image of the subject's eye can be acquired. .

  Further, the second control unit may alternately execute control for causing the imaging device to acquire an image and control for the above-described moving mechanism.

  According to such a configuration, an image of a cross section can be obtained at the focus position of the slit light in the depth direction of the observation site of the subject's eye while moving the illumination system and the imaging system. Acquisition and management of cross-sectional images, synthesis of acquired plural cross-sectional images, and the like can be facilitated. In addition, since an image of a wide area cross section of the eye to be inspected can be efficiently acquired, the examination load on the eye to be inspected can be reduced.

  Further, the slit lamp microscope may include an image combining unit (for example, the image combining unit 120). The image combining unit combines a plurality of images acquired by the imaging device while moving at least the illumination system by the moving mechanism.

  According to such a configuration, an image of a cross section is obtained at the focus position of the slit light in the depth direction of the observation site of the subject's eye while moving the illumination system and the imaging system, and the obtained image of the cross section is synthesized. As a result, acquisition of a composite image is facilitated.

  The image combining unit may combine the plurality of images acquired by the imaging device while changing the focus position by the illumination focusing mechanism.

  According to such a configuration, a cross-sectional image can be acquired at the focus position of the slit light in the depth direction of the observation site of the eye to be inspected, so that acquisition, management, and acquisition of an image of a wide area cross-section of the eye to be inspected can be performed. It is possible to facilitate the synthesis of the images of the plurality of slices obtained. In addition, since an image of a wide area cross section of the eye to be inspected can be efficiently acquired, the examination load on the eye to be inspected can be reduced.

  Further, the slit lamp microscope may include an image combining unit that combines a plurality of images acquired by the imaging device while changing the focus position by the illumination focusing mechanism.

  According to such a configuration, an image of the cross section is acquired at the focus position of the slit light in the depth direction of the observation site of the eye to be inspected, and the acquired image of the cross section is synthesized. Becomes easier.

  Further, the image combining section may include an array processing section (for example, array processing section 121) and a combining processing section (for example, combining processing section 122). The arrangement processing unit arranges a plurality of images. The combination processing unit combines the plurality of images arranged by the arrangement processing unit.

  According to such a configuration, it is possible to simplify the synthesis of the image of the cross section acquired at the focus position of the slit light in the depth direction of the observation site of the subject's eye.

  In addition, the slit lamp microscope includes a first detection unit (for example, a focus position detection unit 150) that detects a focus position of the slit light, and the array processing unit detects a focus position detected by the first detection unit. A plurality of images may be arranged on the basis of the images.

  According to such a configuration, it is possible to arrange the acquired image of the cross section according to the arrangement of the focus positions of the slit light. This facilitates observation of the image of the cross section at the focus position of the slit light.

  In addition, the slit lamp microscope includes a second detection unit (for example, a scan position detection unit 160) that detects at least one position of the illumination system and the imaging system, and the array processing unit is detected by the second detection unit. A plurality of images may be arranged based on the positions.

  According to such a configuration, it is possible to arrange the acquired cross-sectional images according to the positions of the illumination system and the imaging system. This facilitates observation of an image of a cross section at the positions of the illumination system and the imaging system.

  Further, the photographing system may include a photographing objective lens (for example, the objective lens 31), and the photographing focusing mechanism may move the photographing objective lens along the optical axis of the photographing system.

  According to such a configuration, since the focus position is changed by moving the photographing objective lens along the optical axis, the weight of the driving target can be reduced, and the driving target can be moved at high speed. become. Thereby, a slit lamp microscope suitable for high-speed imaging can be provided.

  Further, the illumination system may include an illumination objective lens (for example, the objective lens 54), and the illumination focusing mechanism may move the illumination objective lens along an optical axis of the illumination system.

  According to such a configuration, since the focus position is changed by moving the illumination objective lens along the optical axis, the weight of the driving target can be reduced, and the driving target can be moved at high speed. become. Thereby, a slit lamp microscope suitable for high-speed imaging can be provided.

(Modification)
The embodiments described above are merely examples for embodying the present invention. Those who intend to implement the present invention can make arbitrary modifications, omissions, additions, etc. within the scope of the present invention.

  In the above-described embodiment, the observation imaging system 6 and the illumination system 8 are moved relative to the observation site of the eye E by moving the base 4 provided with the observation imaging system 6 and the illumination system 8 that are configured to be rotatable coaxially. 8 has been described. However, embodiments according to the present invention are not limited to this. For example, each of the observation imaging system 6 and the illumination system 8 is configured to be non-coaxial and rotatable, and the rotation axis of the observation imaging system 6 and the rotation axis of the illumination system 8 are configured to be independently movable. Is also good. The position of each system can be acquired by the scan position detection unit provided in each system, as in the above embodiment. Therefore, similarly to the above embodiment, it is possible to acquire a cross-sectional image at each position while changing the focus position of each system in the horizontal direction and the depth direction of the observation site of the subject's eye.

  In the above-described embodiment, a case has been described in which a plurality of images are acquired at a plurality of positions of the observation site of the eye E by mainly moving the observation imaging system 6 and the illumination system 8. However, embodiments according to the present invention are not limited to this. For example, the slit forming section 53 may be configured to be able to move the positions of the pair of slit blades in the horizontal direction. Alternatively, the slit forming portion 53 may be configured to be able to rotate the direction of the interval between the pair of slit blades (the direction of the slit). In this case, by changing the position of the pair of slit blades and the direction of the interval between the pair of slit blades, it is possible to change the photographing position at which a cross-sectional image is obtained.

  In the above embodiment, the case where the illumination system 8 illuminates the eye E with the slit light formed by the illumination light source 51 and the slit forming portion 53 has been described, but the embodiment according to the present invention is not limited thereto. It is not done. For example, the illumination system 8 may include a projection unit that projects illumination light of an illumination pattern specified by the control of the control unit 101, and illuminate the eye E with the illumination light projected by the projection unit.

  In the above embodiment, the case where the image combining unit 120 combines a plurality of images using the detection result of the focus position detecting unit 150 and the scan position detecting unit 160, the control content of the control unit 101, and the like has been described. The embodiment according to the invention is not limited to this. For example, the slit lamp microscope 1 performs a known tracking control so that the observation imaging system 6 and the illumination system 8 follow the movement of the eye E, and the image synthesizing unit 120 uses the contents for the tracking control to generate a plurality of images. You may make it synthesize | combine.

  In the above-described embodiment, a plurality of images acquired at a plurality of positions in the observation region of the eye E may be stored in association with the positions of the eye E in a separately acquired front image.

  In the above embodiment, the slit lamp microscope has been described, but the device to which the present invention can be applied is not limited to this. For example, an apparatus having any function that can be used in the ophthalmic field, such as an axial length measurement function, an intraocular pressure measurement function, a fundus imaging function, an optical coherence tomography (OCT) function, an ultrasonic examination function, etc. Can be provided. The axial length measurement function is realized by an optical coherence tomography or the like. In addition, the axial length measurement function projects light onto the eye to be inspected, and detects return light from the fundus while adjusting the position of the optical system in the Z direction (front-back direction) with respect to the eye to be inspected. May be measured. The tonometry function is realized by a tonometer or the like. The fundus photographing function is realized by a fundus camera, a scanning ophthalmoscope (SLO), or the like. The OCT function is realized by an optical coherence tomography or the like. The ultrasonic inspection function is realized by an ultrasonic diagnostic device or the like. Further, the present invention can be applied to an apparatus (multifunction peripheral) having two or more of such functions.

DESCRIPTION OF SYMBOLS 1 Slit lamp microscope 3 Moving mechanism part 4 Base 6 Observation and photography system 8 Illumination system 10 Jaw rest 10a Jaw rest 10b Forehead support 13 Imaging device 15 Supporting parts 16, 17 Supporting arms 31, 54 Objective lens 34 Beam splitter 40 , 50 focusing mechanism 43 imaging element 51 illumination light source 53 slit forming section 60 moving mechanism 100 computer 101 control section 101A focusing control section 101B scan control section 102 storage section 120 image synthesis section 121 array processing section 122 synthesis processing section 130 display Unit 140 Operation unit 150 Focus position detection unit 160 Scan position detection unit E Eye Ec to be inspected Cornea

Claims (11)

Illuminating the subject's eye with slit light, an illumination system including an illumination focusing mechanism for changing the focus position of the slit light,
An imaging system that includes an imaging focusing mechanism for changing the focus position, and guides the return light of the slit light from the eye to be inspected to an imaging device;
A moving mechanism that moves the illumination system and the imaging system in cooperation with each other ;
By moving the illumination system and the photographing system in cooperation with the moving mechanism, the focus position of the slit light in a depth direction of the observation site of the subject's eye and in a direction substantially orthogonal to the depth direction. And an image combining unit that combines a plurality of images acquired by the imaging apparatus while changing a focus position of the imaging system to form a three-dimensional image of the subject's eye ;
The including, slit lamp microscope. Illuminating the subject's eye with slit light, an illumination system including an illumination focusing mechanism for changing the focus position of the slit light,
An imaging system that includes an imaging focusing mechanism for changing the focus position, and guides the return light of the slit light from the eye to be inspected to an imaging device;
A plurality of images obtained by the imaging device while changing the focus position of the slit light and the focus position of the imaging system in a depth direction of the observation site of the subject's eye and a direction substantially orthogonal to the depth direction . An image synthesis unit that synthesizes an image to form a three-dimensional image of the subject's eye ;
Slit lamp microscope including. 3. The slit lamp microscope according to claim 1, further comprising a first control unit that controls the illumination focusing mechanism and the imaging focusing mechanism in cooperation with each other. 4. 4. The slit lamp microscope according to claim 3 , wherein the first control unit alternately performs control for causing the imaging device to acquire an image and the linkage control. 5. The slit lamp microscope according to claim 1 , further comprising a second control unit that controls the moving mechanism so as to link movement of the illumination system and movement of the imaging system. The slit lamp microscope according to claim 5 , wherein the second control unit alternately executes control for causing the imaging device to acquire an image and control for the moving mechanism. The image composition unit,
An array processing unit that arranges the plurality of images,
A combination processing unit that combines the plurality of images arranged by the arrangement processing unit;
Slit lamp microscope according to any one of claims 1 to 6, characterized in that it comprises a. Illuminating the subject's eye with slit light, an illumination system including an illumination focusing mechanism for changing the focus position of the slit light,
An imaging system that includes an imaging focusing mechanism for changing the focus position, and guides the return light of the slit light from the eye to be inspected to an imaging device;
A moving mechanism that moves the illumination system and the imaging system in cooperation with each other ;
By moving the illumination system and the photographing system in cooperation with the moving mechanism, the focus position of the slit light in a depth direction of the observation site of the subject's eye and in a direction substantially orthogonal to the depth direction. And an image combining unit that combines a plurality of images acquired by the imaging apparatus while changing a focus position of the imaging system to form a three-dimensional image of the subject's eye ;
A first detection unit that detects a focus position of the slit light,
Including
The image composition unit,
An array processing unit that arranges the plurality of images,
A combination processing unit that combines the plurality of images arranged by the arrangement processing unit;
Including
The slit lamp microscope, wherein the arrangement processing unit arranges the plurality of images based on the focus position detected by the first detection unit. Illuminating the eye to be examined with slit light, an illumination system including an illumination focusing mechanism for changing the focus position of the slit light,
An imaging system that includes an imaging focusing mechanism for changing the focus position, and guides the return light of the slit light from the eye to be inspected to an imaging device;
A moving mechanism that moves the illumination system and the imaging system in cooperation with each other ;
By moving the illumination system and the imaging system in cooperation with each other by the moving mechanism, the focus position of the slit light in a depth direction of the observation site of the eye to be inspected and in a direction substantially orthogonal to the depth direction. An image combining unit that combines a plurality of images obtained by the imaging device while changing a focus position of the imaging system and forms a three-dimensional image of the subject's eye ;
A second detection unit that detects a position of at least one of the illumination system and the imaging system;
Including
The image composition unit,
An array processing unit that arranges the plurality of images,
A combination processing unit that combines the plurality of images arranged by the arrangement processing unit;
Including
The slit lamp microscope, wherein the arrangement processing unit arranges the plurality of images based on the position detected by the second detection unit. The imaging system includes an imaging objective lens,
The slit lamp microscope according to any one of claims 1 to 9 , wherein the imaging and focusing mechanism moves the imaging objective lens along an optical axis of the imaging system. The illumination system includes an illumination objective lens,
The slit lamp microscope according to any one of claims 1 to 10 , wherein the illumination focusing mechanism moves the illumination objective lens along an optical axis of the illumination system.

Images