JP6784550B2 - Ophthalmic device and method of displaying the eye to be inspected - Google Patents

Description

The present invention relates to an ophthalmic apparatus and a method for displaying an eye to be inspected.

Conventionally, there is a slit lamp microscope as a kind of ophthalmic apparatus used in the field of ophthalmology. This is generally used in the daily examination of an ophthalmologist, and various lesions of the eye to be examined can be observed by devising the lighting method.

Such a slit lamp microscope includes a slit-shaped illumination light (hereinafter referred to as slit light) that is emitted from the main illumination system to the eye to be inspected, and a background illumination system that illuminates the entire eye to be inspected separately from the slit light. (See Patent Document 1).

When an ophthalmologist or other examiner inspects the eye to be examined precisely, the larger the difference in brightness between the slit light irradiation area and the other areas, the easier it is to see the observation site. Therefore, the background illumination system is usually turned off in a dark room. , Perform a detailed inspection while irradiating only slit light. On the other hand, when it was desired to observe the entire eye to be inspected, the background illumination system was turned on for observation.

Further, in the slit lamp microscope shown in Patent Document 1, in addition to the observation with the naked eye, it is also possible to display and observe the eye to be inspected taken through the imaging device on the display unit.

Japanese Unexamined Patent Publication No. 2014-188339

However, in the slit lamp microscope of Patent Document 1, when the imaged eye to be inspected is displayed on the display unit, the observed portion irradiated with the slit light can be clearly seen, but the portion other than the observed portion is dark. It is difficult for anyone other than an ophthalmologist or other person with specialized knowledge to know which part of the eye to be examined is being observed. On the other hand, the eye to be inspected, which was imaged with the background illumination system turned on, can grasp the whole state of the eye to be inspected, but the contrast of the observation site irradiated with the slit light is lowered, and the lesion portion with weak scattering is observed. Difficult to confirm.

Therefore, the present invention has been made to solve such a problem, and an object of the present invention is to provide an ophthalmic apparatus and an eye examination display method capable of more easily and objectively observing an eye to be inspected. Is to provide.

In order to achieve the above object, in the ophthalmic apparatus according to the present invention, a main lighting system that irradiates the eye to be inspected with slit light and a background lighting system that illuminates the surrounding area with respect to the slit light irradiation area by the main lighting system. An observation system having an imaging unit for imaging the eye to be inspected including the surrounding area, and the imaging when the eye to be inspected is irradiated with slit light by the main illumination system and the background illumination system is turned off. A slit image in which a first image is taken by a unit, a second image is taken by the imaging unit when the background illumination system is lit, and an irradiation region of the slit light is cut out from the first image. parts and the third image that generates the control unit from the second image by synthesizing the background portion cut out an irradiation region of the slit light, at least the first image, the second image, and the A display unit capable of displaying a third image is provided.

Further, in the ophthalmic apparatus according to the present invention, the control unit performs the third only when the deviation of the position of the feature point corresponding to each of the first image and the second image is within a predetermined range. It may be possible to generate an image of.

Further, in the ophthalmic apparatus according to the present invention, the control unit may be able to adjust the brightness of at least one of the slit image portion and the background portion in the third image.

Further, in the ophthalmic apparatus according to the present invention, the control unit may capture at least the first image and the second image by the imaging unit with one trigger operation.

In order to achieve the above object, in the eye inspection display method according to the present invention, a main illumination system that irradiates the eye to be inspected with slit light and a background that illuminates the surrounding area with respect to the slit light irradiation region by the main illumination system. A method for displaying an eye to be inspected by an ophthalmic apparatus having an illumination system, an observation system having an imaging unit that images the eye to be inspected including the surrounding area, and a display unit that can display an image taken by the imaging unit. The first imaging step of capturing the first image by the imaging unit when the subject to be inspected is irradiated with the slit light by the main illumination system and the background illumination system is off, and the background illumination system. A second imaging step of capturing a second image by the imaging unit when is lit, a slit image portion obtained by cutting out an irradiation region of the slit light from the first image, and the second image. A synthesis step of generating a third image obtained by synthesizing the background portion obtained by cutting out the irradiation region of the slit light from the above, and displaying at least the first image , the second image, and the third image on the display unit. It is provided with a display process for displaying in.

Further, in the eye display method according to the present invention, the synthesis step is performed only when the deviation of the positions of the feature points corresponding to each of the first image and the second image is within a predetermined range. A third image may be generated.

Further, the eye display method according to the present invention may further include a light / dark adjustment step for adjusting the light / darkness of at least one of the slit image portion and the background portion in the third image.

Further, in the eye display method according to the present invention, at least the first imaging step and the second imaging step may be performed by one trigger operation.

According to the present invention using the above means, it is possible to more easily and objectively observe the eye to be inspected and to easily grasp the state.

It is a schematic block diagram which shows the structure of the ophthalmic apparatus which concerns on one Embodiment of this invention. It is the schematic which shows the optical system composition of the ophthalmic apparatus which concerns on one Embodiment of this invention. It is a block diagram which shows the control structure of the ophthalmic apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows the display routine of the eye under test executed by the control part of the ophthalmic apparatus which concerns on one Embodiment of this invention. It is explanatory drawing which shows the 1st image example (a) and 2nd image example (b). It is explanatory drawing which shows the 3rd image generated by synthesizing the 1st image and the 2nd image. It is explanatory drawing which shows the image example (a) which darkened the background part in the 3rd image, and image example (b) which darkened the slit light irradiation area.

An example of an embodiment of the ophthalmic apparatus according to the present invention will be described in detail with reference to the drawings. In addition, the description content of the document described in this specification can be appropriately incorporated as the content of the following embodiment.

First, define the direction. The direction from the lens (objective lens) located closest to the subject in the optical system of the device toward the subject is the front direction, and the opposite direction is the rear direction. Further, the horizontal direction perpendicular to the front direction is defined as the left-right direction. Further, the direction orthogonal to both the front-rear direction and the left-right direction is defined as the vertical direction.

[Appearance configuration]
The ophthalmic apparatus according to this embodiment is a slit lamp microscope 1, and the appearance configuration of the slit lamp microscope 1 will be described with reference to FIG. A computer 100 is connected to the slit lamp microscope 1. The computer 100 performs various control processes and arithmetic processes. Instead of providing the computer 100 separately from the microscope main body (housing for storing the optical system and the like), it is also possible to apply a configuration in which the same computer 100 is mounted on the microscope main body.

The slit lamp microscope 1 is placed on the table 2. The computer 100 may be installed on another table or in another place. The base 4 is configured to be movable in the horizontal direction via the moving mechanism unit 3. The base 4 is moved by tilting the operation handle 5.

A support portion 15 for supporting the observation system 6 and the main lighting system 8 is provided on the upper surface of the base 4. Further, the support portion 15 supports the background illumination system 20 shown in FIG. A support arm 16 that supports the observation system 6 is rotatably attached to the front portion of the support portion 15 in the left-right direction. A support arm 17 that supports the main lighting system 8 and the background lighting system 20 is rotatably attached to the front portion of the support arm 16. The support arms 16 and 17 each have a coaxial rotation shaft A at the front portion thereof, and can rotate independently of each other.

The observation system 6 is moved by manually rotating the support arm 16. The main lighting system 8 and the background lighting system 20 are moved by manually rotating the support arm 17. The support arms 16 and 17 may be configured to be rotated by an electric mechanism. In that case, an actuator for generating a driving force for rotating the support arms 16 and 17 and a transmission mechanism for transmitting the driving force are provided. The actuator is composed of, for example, a stepping motor (pulse motor). The transmission mechanism is composed of, for example, a combination of gears or a rack and pinion.

The main illumination system 8 irradiates the eye E to be inspected with the main illumination light. As described above, the main lighting system 8 can be swung in the left-right direction about the rotation axis A. As a result, the irradiation direction of the main illumination light with respect to the eye E to be inspected is changed. The main lighting system 8 may be configured to swing in the vertical direction as well. That is, it may be configured so that the elevation angle and the depression angle of the main illumination light can be changed.

The intensity of the main illumination light is changed by using the illumination intensity control unit 18 provided on the base 4. The intensity of the background illumination light radiated to the eye E to be inspected by the background illumination system 20 may also be configured so that it can be performed by using the illumination intensity control unit 18. It is also possible to configure the intensity of the main illumination light and the background illumination light so that they can be changed by other operating members. Other operating members include an operating member provided in the housing of the slit lamp microscope 1 and an operating member provided in the computer 100.

The observation system 6 has a pair of left and right optical systems that guide the reflected light from the eye E to be inspected for the main illumination light (and the background illumination light). This optical system is housed in the lens barrel main body 9. The end of the lens barrel body 9 is the eyepiece 9a. The examiner observes the eye E to be inspected with the naked eye by looking into the eyepiece 9a. As described above, the lens barrel body 9 can be rotated in the left-right direction by rotating the support arm 16. Thereby, the orientation of the observation system 6 with respect to the eye E to be inspected can be changed. The reflected light of the main illumination light includes various types of light that have passed through the eye E to be inspected, such as scattered light, and these various types of light are also referred to as "reflected light".

A jaw cradle 10 is arranged at a position facing the lens barrel main body 9. The chin cradle 10 is provided with a chin rest portion 10a and a forehead pad 10b for stably arranging the face of the subject.

An observation magnification operation knob 11 for changing the observation magnification is arranged on the side surface of the lens barrel main body 9. Further, an imaging device 13 (imaging unit) for imaging the eye E to be inspected is connected to the lens barrel main body 9. The image pickup device 13 is a camera having an image pickup element such as a camera capable of capturing still images and moving images, for example, a CCD (Charge Coupled Device) camera or a CMOS (Complementary Metal Oxide Semiconductor) camera. These image pickup devices have a function of outputting the input light as an electric signal (image signal). A mirror 12 that reflects the luminous flux of the main illumination light output from the main illumination system 8 toward the eye E to be inspected is arranged below the main illumination system 8. Further, the mirror 12 reflects the background illumination light output from the background illumination system 20 toward the eye E to be inspected.

[Optical system configuration]
The configuration of the optical system of the slit lamp microscope 1 will be described with reference to FIG. The optical system included in the slit lamp microscope 1 includes an observation system 6, a main illumination system 8, and a background illumination system 20.

[Observation system]
The observation system 6 includes a pair of left and right optical systems. The left and right optical systems have almost the same configuration. The examiner can observe the eye E to be inspected binocularly by the left and right optical systems. Note that FIG. 2 shows only one of the left and right optical systems of the observation system 6. Reference numeral O1 is an optical axis (observation optical axis) of the observation system 6.

Each of the left and right optical systems of the observation system 6 has an objective lens 31, a variable magnification optical system 32, an aperture 33, a relay lens 35, a prism 36, and an eyepiece lens 37. Further, a beam splitter 34 is provided between the variable magnification optical system 32 and the relay lens 35 in one or both of the left and right optical systems. The eyepiece lens 37 is provided in the eyepiece portion 9a. Reference numeral P indicates an imaging position of light guided to the eyepiece lens 37. The reference numeral Ec indicates the cornea of the eye E to be inspected, the reference numeral Ep indicates the iris, and the reference numeral Er indicates the fundus. The symbol Eo indicates the examiner's eye.

The variable magnification optical system 32 includes a plurality of (for example, two) variable magnification lenses 32a and 32b. In this embodiment, a plurality of variable magnification lens groups that can be selectively inserted into the optical path of the observation system 6 are provided. These variable magnification lens groups are configured to give different magnifications. The variable magnification lens group arranged in the optical path of the observation system 6 is used as the variable magnification lenses 32a and 32b. Thereby, the magnification (angle of view) of the macroscopic observation image of the eye E to be inspected and the photographed image can be changed. The change of the magnification, that is, the switching of the variable magnification lens group arranged in the optical path of the observation system 6 is performed by operating the observation magnification operation knob 11. Further, the magnification may be changed electrically by using a switch or the like (not shown). Alternatively, the magnification may be continuously changed as a zoom lens.

The beam splitter 34 splits the light traveling along the observation optical axis O1 into two. The light transmitted through the beam splitter 34 is guided to the examiner's eye Eo via the relay lens 35, the prism 36, and the eyepiece 37. The prism 36 includes two optical elements 36a and 36b and translates the traveling direction of light upward.

On the other hand, the light reflected by the beam splitter 34 is guided to the image sensor 43 of the camera included in the image pickup device 13 via the relay lens 41 and the mirror 42. The image pickup device 43 detects the reflected light, generates an image signal, and outputs the image signal to the computer 100, so that the image pickup image is displayed on a display unit described later. Therefore, it is possible to observe the eye E to be inspected through the displayed captured image.

[Main lighting system]
The main illumination system 8 includes a light source 51, a relay lens 52, an illumination diaphragm 56, a condenser lens 53, a slit forming portion 54, and a condenser lens 55. Reference numeral O2 indicates an optical axis (main illumination optical axis) of the main illumination system 8.

The light source 51 outputs the main illumination light. A plurality of light sources may be provided in the main lighting system 8. For example, both a light source that outputs constant light (halogen lamp, LED, etc.) and a light source that outputs flash light (xenon lamp, LED, etc.) can be provided as the light source 51. Further, a light source for observing the cornea and a light source for observing the fundus may be provided separately. The light source 51 includes at least a visible light source that outputs visible light.

The slit forming portion 54 is used to generate slit light. The slit forming portion 54 has a pair of slit blades. The width of the slit light is changed by changing the interval (slit width) of these slit blades.

The illumination diaphragm 56 is configured so that the size of the translucent portion thereof can be changed. The illumination diaphragm 56 is particularly effective for fundus observation. For example, the illumination diaphragm 56 has applications such as reducing the reflection of the main illumination light by the cornea Ec and the crystalline lens, and adjusting the brightness of the main illumination light.

[Background lighting system]
The background illumination system 20 irradiates the eye E to be inspected with background illumination light. The background illumination light is applied to the area around the irradiation region of the main illumination light for the eye E to be inspected by the main illumination system 8. The irradiation area of the background illumination light may include at least this surrounding area. For example, the irradiation area of the background illumination light may overlap with at least a part of the irradiation area by the main illumination system 8.

The background illumination system 20 includes a light source (background light source). The background light source includes at least a visible light source that outputs visible light. This visible light is used, for example, for macroscopic observation and imaging. The background light source may include an infrared light source that outputs infrared light. This infrared light is used, for example, for observing and photographing the meibomian glands. When the background illumination system 20 includes both a visible light source and a background light source, these light sources are used alternately, for example. The background illumination system 20 may include one or more lenses that focus the light output from the background light source. Reference numeral O3 indicates an optical axis (background illumination optical axis) of the background illumination system 20.

The light output from the background light source is reflected by the mirror 12 (after being focused by the lens) and irradiated to the eye E to be inspected. The irradiation region of the background illumination light includes the region around the irradiation region (irradiation region of the slit light) of the eye E to be inspected by the main illumination system 8.

[Control system configuration]
The control system of the slit lamp microscope 1 will be described with reference to FIG. The control system of the slit lamp microscope 1 is configured around the control unit 101. The computer 100 may include at least a part of the configuration of the control system.

[Control unit]
The control unit 101 controls each unit of the slit lamp microscope 1. The control unit 101 controls the observation system 6, the main lighting system 8, and the background lighting system 20. The control of the observation system 6 includes control of the variable magnification optical system 32, control of the diaphragm 33, control of the charge accumulation time, sensitivity, frame rate, etc. of the image sensor 43. The control of the main lighting system 8 includes a control of the light source 51, a control of the slit forming portion 54, a control of the illumination diaphragm 56, and the like. The control of the background illumination system 20 includes the control of the background light source. In the example shown in FIG. 3, a visible background light source 20a that outputs visible light and an infrared background light source 20b that outputs infrared light are provided as background light sources, and one of them (for example, a visible background light source) is provided. ) May be provided.

The control unit 101 includes a microprocessor, RAM, ROM, a hard disk drive, and the like. A control program is stored in advance in a storage device such as a ROM or a hard disk drive. The operation of the control unit 101 is realized by the cooperation of the control program and the hardware. The control unit 101 is arranged in the apparatus main body (for example, in the base 4) of the slit lamp microscope 1 or in the computer 100.

[Display]
The display unit 102 can display various types of information under the control of the control unit 101. The display unit 102 includes a display device such as a flat panel display such as an LCD. The display unit 102 may be provided on the main body of the apparatus of the slit lamp microscope 1, or may be provided on the computer 100. Further, the display unit 102 may be connected to the slit lamp microscope 1 via a communication network such as a LAN or the Internet, or may display via a storage medium.

[Operation unit]
The operation unit 103 includes an operation device and an input device. The operation unit 103 includes buttons and switches (for example, an operation handle 5, an illumination intensity operation unit 18, etc.) provided on the slit lamp microscope 1, and an operation device (mouse, keyboard, etc.) provided on the computer 100. Further, the operation unit 103 may include any operation device or input device such as a trackball, an operation panel, a switch, a button, and a dial. Further, the operation unit 103 is provided with a shutter that serves as a trigger for capturing an image captured by the camera included in the image pickup device 13. The shutter is provided, for example, on the operation handle 5 as a push-type switch.

Although the display unit 102 and the operation unit 103 are shown separately in FIG. 3, at least a part thereof can be integrally configured. As a specific example, a touch screen can be used.

The slit lamp microscope 1 is configured in this way, and the control unit 101 acquires image data of the eye to be inspected and displays it on the display unit 102. Here, referring to FIG. 4, a flowchart showing a display routine of the eye to be inspected executed by the control unit 101 is shown. Further, FIG. 5 shows a first image example (a) and a second image example (b), and FIG. 6 shows a third image example. While referring to these figures on the way, A method of displaying the eye to be inspected by the control unit 101 will be described with reference to the flowchart of FIG.

As shown in FIG. 4, in the display routine of the eye E to be inspected, the control unit 101 first sets the imaging conditions as step S1. As a shooting condition, at least the main lighting system 8 is lit and the eye E to be inspected is irradiated with slit light. Other imaging conditions include, for example, observation position alignment, observation magnification determination, focus adjustment, slit width adjustment, slit brightness adjustment, slit incident angle adjustment, and turning on / off of the background light source. These imaging conditions may be set manually by the examiner while observing the eye E to be inspected, or the imaging conditions may be set in advance and automatically controlled by the control unit 101.

Next, in step S2, the control unit 101 determines whether or not the shutter has been pressed. If the determination result is false (No), that is, while the shutter is not pressed, the process returns to step S1 and the setting of shooting conditions is continued. On the other hand, if the determination result is true (Yes), that is, if there is a shooting request by pressing the shutter, the process proceeds to step S3.

As step S3, the control unit 101 turns off the background lighting system 20. That is, at this time, when the background lighting system 20 is in the lighting state, the control unit 101 switches to turn off the background light source, and when the background lighting system 20 is already in the lighting state, the state is maintained. As described above, the background illumination system 20 includes the visible background light source 20a and the infrared background light source 20b, and at least the visible background light source 20a is turned off here.

Next, as step S4, the control unit 101 captures and saves the first image P1 (first photographing step). Specifically, the control unit 101 uses the captured image output from the imaging device 13 as the first image P1 while the eye E to be inspected is irradiated with the slit light by the main illumination system 8 and the background illumination system 20 is turned off. It is captured and stored in, for example, a storage device included in the control unit 101. Hereinafter, capturing and saving the captured image output by the imaging device 13 in this way is also referred to as shooting. In this first image P1, as shown in FIG. 5A, since the background illumination system 20 is turned off, only the slit light irradiation region S1 is bright, and the background region B1 which is the surrounding region is dark. .. The dark part in FIG. 5A is indicated by a diagonal line (the same applies hereinafter).

In the following step S5, the control unit 101 turns on the background illumination system 20. Here, at least the visible background light source 20a is turned on.

Next, as step S6, the control unit 101 captures and saves (shoots) the second image P2 (second shooting step). Specifically, the control unit 101 uses the captured image output from the imaging device 13 as the second image P2 while the eye E to be inspected is irradiated with the slit light by the main illumination system 8 and the background illumination system 20 is lit. It is captured and stored in, for example, a storage device included in the control unit 101. In this second image P2, as shown in FIG. 5B, since the background illumination system 20 is lit, not only the slit light irradiation region S2 but also the background region B2 which is a peripheral region is shown brightly.

Next, in step S7, the control unit 101 determines whether or not to combine the first image P1 and the second image P2. For example, the operation unit 103 can set in advance whether or not to perform the synthesis, and the control unit 101 makes the determination based on this setting. If the determination result is false (No), that is, if it is set not to synthesize, the process proceeds to step S8.

In step S8, the control unit 101 causes the display unit 102 to display both or one of the first image P1 and the second image P2, and ends the routine (display step). The display of the first image P1 and the second image P2 here may be displayed side by side on the display unit 102 at the same time, or the first image P1 and the second image P2 may be continuously switched. It may be displayed.

On the other hand, if the determination result in step S7 is true (Yes), that is, if it is set to synthesize, the process proceeds to step S9.

In step S9, the control unit 101 determines whether or not the displacement between the slit light irradiation region S1 of the first image P1 and the slit light irradiation region S2 of the second image P2 is within the allowable range. In this method, for example, the first image P1 and the second image P2 are superposed, feature points of the slit light irradiation regions S1 and S2 are selected, and the amount of deviation between the corresponding feature points is calculated. It is determined whether or not the deviation amount is equal to or greater than a predetermined threshold value. If the determination result is false (No), that is, if the displacement of the slit light irradiation areas S1 and S2 is out of the permissible range, the control unit 101 returns to the setting of the imaging conditions in step S1. On the other hand, if the determination result is true (Yes), that is, if the positions of the slit light irradiation regions S1 and S2 are within the allowable deviation range, the process proceeds to step S10.

From this point onward, steps S10, S11, and S12 are steps of synthesizing the first image P1 and the second image P2 to generate the third image P3 as shown in FIG. 6 (synthesis step).

Specifically, in step S10, the control unit 101 acquires the slit image unit S3 obtained by cutting out the slit light irradiation region S1 from the first image P1.

In the following step S11, the control unit 101 acquires the background portion B3 obtained by cutting out the slit light irradiation region S2 from the second image P2.

Then, in step S12, the control unit 101 generates a third image P3 by integrating the slit image unit S3 acquired in step S10 and the background unit B3 acquired in step S11. That is, as shown in FIG. 6, the third image P3 is generated by fitting the slit image portion S3 into the portion cut out in the background portion B3. Then, the third image P3 generated in this way is displayed on the display unit 102, and the routine is terminated (display step).

Further, the control unit 101 can adjust the brightness of the slit image portion S3 (slit light irradiation region) and the background portion B3 (surrounding region) in the third image P3 displayed on the display unit 102 (brightness adjustment step). ). For example, as in the third image P3'shown in FIG. 7 (a), the background portion B3'is darkened to make the slit image portion S3 stand out, or the third image shown in FIG. 7 (b). As in P3'', the slit image portion S3'' can be darkened to make the background portion B3 stand out. In this way, the contrast between the slit image portion S3 and the background portion B3 can be adjusted.

As described above, the slit lamp microscope 1 first captures the first image P1 in which the background illumination system 20 is off and the second image P2 in which the background illumination system 20 is on in a series of operations. The first image P1 and the second image P2 can be displayed on the display unit 102. Therefore, the first image P1 in which the slit light irradiation region S1 which is the main observation site is shown with high contrast and the second image P2 in which the entire eye E to be inspected is clearly shown are displayed simultaneously or continuously. It can be confirmed, and the observed portion of the eye E to be inspected and the whole can be easily compared through the display unit 102. As a result, even if the person does not have specialized knowledge, the observation site of the eye E to be inspected can be located at any position in the whole, and the state of the observation site can be closely examined.

Further, the slit image portion S3 obtained by cutting out the slit light irradiation region S1 from the first image P1 and the background portion B3 obtained by cutting out the slit light irradiation region S2 from the second image P2 are combined to generate the third image P3. As a result, the entire eye E to be inspected and the details of the observation site can be observed at the same time with one image. As a result, the eye E to be inspected can be observed more easily.

Further, the accuracy is obtained by generating the third image P3 only when the positional deviation between the slit light irradiation region S1 of the first image P1 and the slit light irradiation region S2 of the second image P2 is within the allowable range. It is possible to eliminate the generation of low composite images. This allows for more reliable observations.

Further, in the third image P3, the brightness of the slit image portion S3 and the background portion B3 can be adjusted as necessary, so that the eye E to be inspected can be further easily observed.

Further, in the slit lamp microscope 1 of the present embodiment, since the first image and the second image are taken only by pressing the shutter once, the first image and the second image can be taken by the same operation as before. It is possible to take an image, generate a third image, and the like.

Therefore, according to the ophthalmic apparatus and the method for displaying the eye to be inspected according to the present embodiment, it is possible to more easily and objectively observe the eye to be inspected.

Although the description of the embodiment of the present invention is completed above, the aspect of the present invention is not limited to this embodiment.

The observation system 6 of the slit lamp microscope 1 in the above embodiment can observe the image of the eye to be inspected E captured by the image pickup apparatus 13 through the display unit 102, and can also observe the eye to be inspected with the naked eye through the eyepiece 37. The present invention can also be applied to a slit lamp microscope that can only be observed by an imaging device.

Further, in the above embodiment, as a display routine of the eye to be inspected, the second image P2 is photographed (steps S5 and S6) after the first image P1 is photographed (steps S3 and S4). The order is not limited to this, and for example, the second image may be taken before the first image is taken.

Further, in the above embodiment, in the generation of the third image P3, after the slit image portion S3 is acquired from the first image P1 (step S10), the background portion B3 is acquired from the second image (step S11). However, the order thereof is not limited to this, and for example, the acquisition of the background portion from the second image may be performed before the acquisition of the slit image portion from the first image.

Further, in the above embodiment, the third image P3 is generated and displayed on the display unit 102 (step S12), but at this time, not only the third image P3 but also the first image P1 and the second image are displayed. P2 may also be displayed on the display unit 102 simultaneously or continuously.

Further, in the above embodiment, the second image is taken with the background illumination system lit while the subject eye E is irradiated with the slit light and the background illumination system 20 irradiates the subject eye. The slit light does not need to be irradiated, and may be taken when the main lighting system is off and only the background lighting system 20 is on. In that case, when the third image is generated, the irradiation region of the slit light may be estimated in the second image, and the estimated portion may be cut out to acquire the background portion.

Further, in the above embodiment, the deviation between the two images is determined from the deviation amount of the feature points of the slit light irradiation region S1 of the first image P1 and the slit light irradiation region S2 of the second image P2. The selection of is not limited to the slit light irradiation area. For example, a feature point may be selected from the pupil of the eye.

Further, in the above embodiment, the shutter for capturing the first image and the second image is a push-type switch provided on the operation handle 5, but for capturing the first image and the second image. The trigger is not limited to this, and may be operated by a keyboard or a mouse, for example.

1 Slit lamp microscope (ophthalmic equipment)
6 Observation system 8 Lighting system 13 Imaging device (imaging unit)
20 Background illumination system 20a Visible background light source 20b Infrared visible light source 37 Eyepiece 51 Light source 54 Slit forming unit 100 Computer 101 Control unit 102 Display unit 103 Operation unit E Eye to be inspected P1 First image P2 Second image P3 Third Image S1, S2 Slit light irradiation area S3 Slit image part B1, B2 Background area B3 Background part

Claims (8)

The main lighting system that irradiates the eye to be inspected with slit light,
A background lighting system that illuminates the surrounding area with respect to the slit light irradiation area by the main lighting system,
An observation system having an imaging unit that images the eye to be inspected including the surrounding area,
When the eye to be inspected is irradiated with slit light by the main illumination system and the background illumination system is off, the imaging unit is made to take a first image, and when the background illumination system is on, the image is taken. A slit image portion obtained by capturing a second image by the imaging unit and cutting out the slit light irradiation region from the first image, and a background portion obtained by cutting out the slit light irradiation region from the second image. a control unit that generates a third image-synthesized,
A display unit capable of displaying at least the first image , the second image, and the third image, and
An ophthalmic device equipped with. Wherein the control unit includes a first image, of respective displacement positions of feature points corresponding to to generate the third image only if it is within a predetermined range according to claim 1, wherein said second image Ophthalmic device. The ophthalmic apparatus according to claim 1 or 2 , wherein the control unit can adjust the brightness of at least one of the slit image portion and the background portion in the third image. The ophthalmic apparatus according to any one of claims 1 to 3 , wherein the control unit captures at least the first image and the second image by the imaging unit with one trigger operation. A main illumination system that irradiates the eye to be inspected with slit light, a background illumination system that illuminates the ambient area of the slit light irradiation region by the main illumination system, and an imaging unit that images the eye to be inspected including the peripheral region A method for displaying an eye to be inspected by an ophthalmic apparatus having an observation system and a display unit capable of displaying an image captured by the imaging unit.
A first imaging step of capturing a first image by the imaging unit when the eye to be inspected is irradiated with slit light by the main illumination system and the background illumination system is off.
A second photographing step of causing the imaging unit to acquire a second image when the background illumination system is lit,
A compositing step of generating a third image in which a slit image portion obtained by cutting out the slit light irradiation region from the first image and a background portion obtained by cutting out the slit light irradiation region from the second image are combined. When,
A display step of displaying at least the first image , the second image, and the third image on the display unit.
A method of displaying an eye to be inspected. The synthesis steps, with the first image, the respective deviation of the position of the feature point corresponding to to generate the third image only if it is within a predetermined range according to claim 5, wherein said second image Examination eye display method. The eye display method according to claim 5 or 6 , further comprising a light / dark adjustment step of adjusting the light / darkness of at least one of the slit image portion and the background portion in the third image. The eye display method according to any one of claims 5 to 7 , wherein at least the first imaging step and the second imaging step are performed by one trigger operation.

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