JP6577950B2 - 試料をイオン化するための質量分析プローブおよびシステム - Google Patents

試料をイオン化するための質量分析プローブおよびシステム Download PDF

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JP6577950B2
JP6577950B2 JP2016543047A JP2016543047A JP6577950B2 JP 6577950 B2 JP6577950 B2 JP 6577950B2 JP 2016543047 A JP2016543047 A JP 2016543047A JP 2016543047 A JP2016543047 A JP 2016543047A JP 6577950 B2 JP6577950 B2 JP 6577950B2
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probe
voltage
paper substrate
paper
mass
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JP2017502467A (ja
JP2017502467A5 (enExample
Inventor
ロバート グラハム クックス，
ロバート グラハム クックス，
デパンジャン サルカル，
デパンジャン サルカル，
サラッピル プラディープ，
サラッピル プラディープ，
ルフル マラヤナン，
ルフル マラヤナン，
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Purdue Research Foundation
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Purdue Research Foundation
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/18—Printed circuits structurally associated with non-printed electric components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2016543047A 2013-12-30 2014-12-22 試料をイオン化するための質量分析プローブおよびシステム Active JP6577950B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
IN6137/CHE/2013 2013-12-30
IN6137CH2013 2013-12-30
US201461926713P 2014-01-13 2014-01-13
US61/926,713 2014-01-13
PCT/US2014/071856 WO2015100221A2 (en) 2013-12-28 2014-12-22 Mass spectrometry probes and systems for ionizing a sample

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019153063A Division JP6749459B2 (ja) 2013-12-30 2019-08-23 試料をイオン化するための質量分析プローブおよびシステム

Publications (3)

Publication Number Publication Date
JP2017502467A JP2017502467A (ja) 2017-01-19
JP2017502467A5 JP2017502467A5 (enExample) 2018-02-08
JP6577950B2 true JP6577950B2 (ja) 2019-09-18

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JP2016543047A Active JP6577950B2 (ja) 2013-12-30 2014-12-22 試料をイオン化するための質量分析プローブおよびシステム
JP2021151100A Pending JP2022002214A (ja) 2013-12-30 2021-09-16 試料をイオン化するための質量分析プローブおよびシステム

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JP2021151100A Pending JP2022002214A (ja) 2013-12-30 2021-09-16 試料をイオン化するための質量分析プローブおよびシステム

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US (3) US10395913B2 (enExample)
EP (2) EP3667701A3 (enExample)
JP (2) JP6577950B2 (enExample)
CN (2) CN110648894B (enExample)
WO (1) WO2015100221A2 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
WO2013184320A1 (en) 2012-06-06 2013-12-12 Purdue Research Foundation Ion focusing
US9620344B2 (en) * 2013-06-25 2017-04-11 Purdue Research Foundation Mass spectrometry analysis of microorganisms in samples
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US10656157B2 (en) 2014-09-24 2020-05-19 Purdue Research Foundation Rare event detection using mass tags
JP6631132B2 (ja) * 2015-09-30 2020-01-15 東ソー株式会社 イオン化合物のイオン変換方法及びイオン変換装置
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
SG11201901866TA (en) * 2016-09-02 2019-03-28 Univ Texas Collection probe and methods for the use thereof
US10056218B1 (en) 2017-02-17 2018-08-21 Savannah River Nuclear Solutions, Llc Graphene/graphite-based filament for thermal ionization
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
WO2019104328A1 (en) 2017-11-27 2019-05-31 Board Of Regents, The University Of Texas System Minimally invasive collection probe and methods for the use thereof
WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
US11264228B2 (en) 2018-10-09 2022-03-01 Savannah River Nuclear Solutions, Llc Method of making a carbon filament for thermal ionization
CN109187713B (zh) * 2018-10-17 2020-12-22 湖南师范大学 负载纸基、其制备方法和离子源及其应用
WO2020154477A1 (en) 2019-01-25 2020-07-30 Board Of Regents, The University Of Texas System Apparatus and methods for cleaning and/or exchanging medical devices
US11424116B2 (en) 2019-10-28 2022-08-23 Ionsense, Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
US12390811B1 (en) * 2020-06-17 2025-08-19 The United States Of America, As Represented By The Secretary Of The Navy Sampling platform apparatus
US11635353B2 (en) * 2020-06-17 2023-04-25 The United States Of America, As Represented By The Secretary Of The Navy Sample collection device
US12409451B1 (en) * 2020-06-17 2025-09-09 The United States Of America, As Represented By The Secretary Of The Navy Sampling platform system
US11688596B2 (en) 2021-02-12 2023-06-27 Lawrence Livermore National Security, Llc Systems and methods lattice spray substrates for mass spectrometry
CN113109416B (zh) * 2021-04-20 2022-06-14 清华大学 一种激素的快速高通量质谱检测装置及方法

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4663230A (en) 1984-12-06 1987-05-05 Hyperion Catalysis International, Inc. Carbon fibrils, method for producing same and compositions containing same
US6452167B1 (en) * 1998-05-20 2002-09-17 Sandia National Laboratories Miniature quadrupole mass spectrometer having a cold cathode ionization source
CA2301451A1 (en) 2000-03-20 2001-09-21 Thang T. Pham Method for analysis of analytes by mass spectrometry
US7368708B2 (en) * 2000-05-25 2008-05-06 Agilent Technologies, Inc. Apparatus for producing ions from an electrospray assembly
US6803568B2 (en) * 2001-09-19 2004-10-12 Predicant Biosciences, Inc. Multi-channel microfluidic chip for electrospray ionization
US6958475B1 (en) * 2003-01-09 2005-10-25 Colby Steven M Electron source
US7579077B2 (en) * 2003-05-05 2009-08-25 Nanosys, Inc. Nanofiber surfaces for use in enhanced surface area applications
US6891156B2 (en) 2003-04-30 2005-05-10 Perkin Elmer Instruments Llc Sample plate for matrix-assisted laser desorption and ionization mass spectrometry
US6885010B1 (en) * 2003-11-12 2005-04-26 Thermo Electron Corporation Carbon nanotube electron ionization sources
JP4370510B2 (ja) * 2003-12-25 2009-11-25 努 升島 質量分析用エレクトロスプレーイオン化ノズル
WO2005104179A2 (en) * 2004-04-27 2005-11-03 Koninklijke Philips Electronics N.V. Use of carbon nanotubes (cnts) for analysis of samples
EP1913800A4 (en) * 2005-07-27 2016-09-21 Wisconsin Alumni Res Found NANOELECTROMECHANICAL AND MICROELECTROMECHANICAL SENSORS AND ANALYZERS
US20070272852A1 (en) * 2006-01-26 2007-11-29 Sionex Corporation Differential mobility spectrometer analyzer and pre-filter apparatus, methods, and systems
US7884359B2 (en) * 2006-06-09 2011-02-08 The United States Of America As Represented By The Secretary Of The Navy Integrally gated carbon nanotube ionizer device
WO2008103733A2 (en) * 2007-02-20 2008-08-28 Applied Nanotech, Inc. Gas ionizer
WO2009023361A2 (en) 2007-06-01 2009-02-19 Purdue Research Foundation Discontinuous atmospheric pressure interface
US20120160997A1 (en) * 2007-09-21 2012-06-28 Richard Lee Fink Non-radioactive ion sources with ion flow control
JP5671523B2 (ja) * 2009-04-30 2015-02-18 パーデュー・リサーチ・ファウンデーションＰｕｒｄｕｅ Ｒｅｓｅａｒｃｈ Ｆｏｕｎｄａｔｉｏｎ 濡れた多孔質材料を用いるイオン生成
KR101094453B1 (ko) * 2009-06-11 2011-12-15 고려대학교 산학협력단 전자 방출원의 제조방법 및 이를 적용한 전자소자의 제조방법
US8841454B2 (en) * 2009-07-17 2014-09-23 Exxonmobil Research And Engineering Company Functionalized carbon nanostructures which are soluble in hydrocarbons and method for preparation
US8207496B2 (en) * 2010-02-05 2012-06-26 Thermo Finnigan Llc Multi-needle multi-parallel nanospray ionization source for mass spectrometry
US20110223085A1 (en) * 2010-03-12 2011-09-15 E. I. Du Pont De Nemours And Company Carbon dioxide capture with ionic liquid electrospray
WO2012094227A2 (en) 2011-01-05 2012-07-12 Purdue Research Foundation (Prf) Systems and methods for sample analysis
US8895918B2 (en) * 2011-06-03 2014-11-25 Purdue Research Foundation Ion generation using modified wetted porous materials
WO2012170301A1 (en) 2011-06-04 2012-12-13 Purdue Research Foundation (Prf) Cassettes, systems, and methods for ion generation using wetted porous materials
JP5771458B2 (ja) * 2011-06-27 2015-09-02 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
CN102324375B (zh) * 2011-07-22 2013-12-04 中国科学院上海有机化学研究所 一种质谱纳喷雾电极及其制作方法和应用
CN102522311A (zh) * 2011-10-20 2012-06-27 中国科学院上海有机化学研究所 一种纳喷雾电极及其制作方法和应用
US9733228B2 (en) * 2013-01-31 2017-08-15 Purdue Research Foundation Methods of analyzing crude oil

Also Published As

Publication number Publication date
CN110648894B (zh) 2022-05-13
CN106102873A (zh) 2016-11-09
US10395913B2 (en) 2019-08-27
US10559455B2 (en) 2020-02-11
WO2015100221A2 (en) 2015-07-02
EP3667701A2 (en) 2020-06-17
EP3089811B1 (en) 2019-11-06
WO2015100221A3 (en) 2015-12-17
EP3667701A3 (en) 2020-07-29
JP2017502467A (ja) 2017-01-19
US20160314956A1 (en) 2016-10-27
CN110648894A (zh) 2020-01-03
US20190355567A1 (en) 2019-11-21
US20200168446A1 (en) 2020-05-28
US10991564B2 (en) 2021-04-27
CN106102873B (zh) 2019-09-24
EP3089811A2 (en) 2016-11-09
EP3089811A4 (en) 2017-07-26
JP2022002214A (ja) 2022-01-06

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