CN110648894B - 用于电离样品的质谱分析探针和系统 - Google Patents

用于电离样品的质谱分析探针和系统 Download PDF

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Publication number
CN110648894B
CN110648894B CN201910835375.2A CN201910835375A CN110648894B CN 110648894 B CN110648894 B CN 110648894B CN 201910835375 A CN201910835375 A CN 201910835375A CN 110648894 B CN110648894 B CN 110648894B
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mass spectrometry
sample
spectrometry probe
paper
voltage
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Chinese (zh)
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CN110648894A (zh
Inventor
罗伯特·格雷厄姆·库克斯
D·萨卡尔
塔拉皮·普拉迪普
R·玛拉亚南
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Indian Institute of Technology Madras
Purdue Research Foundation
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Indian Institute of Technology Madras
Purdue Research Foundation
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/18—Printed circuits structurally associated with non-printed electric components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201910835375.2A 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统 Active CN110648894B (zh)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
IN6137/CHE/2013 2013-12-30
IN6137CH2013 2013-12-30
US201461926713P 2014-01-13 2014-01-13
US61/926,713 2014-01-13
PCT/US2014/071856 WO2015100221A2 (en) 2013-12-28 2014-12-22 Mass spectrometry probes and systems for ionizing a sample
CN201480076440.3A CN106102873B (zh) 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统

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CN110648894B true CN110648894B (zh) 2022-05-13

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US (3) US10395913B2 (enExample)
EP (2) EP3667701A3 (enExample)
JP (2) JP6577950B2 (enExample)
CN (2) CN110648894B (enExample)
WO (1) WO2015100221A2 (enExample)

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US10056218B1 (en) 2017-02-17 2018-08-21 Savannah River Nuclear Solutions, Llc Graphene/graphite-based filament for thermal ionization
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
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WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
US11264228B2 (en) 2018-10-09 2022-03-01 Savannah River Nuclear Solutions, Llc Method of making a carbon filament for thermal ionization
CN109187713B (zh) * 2018-10-17 2020-12-22 湖南师范大学 负载纸基、其制备方法和离子源及其应用
WO2020154477A1 (en) 2019-01-25 2020-07-30 Board Of Regents, The University Of Texas System Apparatus and methods for cleaning and/or exchanging medical devices
US11424116B2 (en) 2019-10-28 2022-08-23 Ionsense, Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
US12390811B1 (en) * 2020-06-17 2025-08-19 The United States Of America, As Represented By The Secretary Of The Navy Sampling platform apparatus
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US12409451B1 (en) * 2020-06-17 2025-09-09 The United States Of America, As Represented By The Secretary Of The Navy Sampling platform system
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CN113109416B (zh) * 2021-04-20 2022-06-14 清华大学 一种激素的快速高通量质谱检测装置及方法

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CN102414778A (zh) * 2009-04-30 2012-04-11 普度研究基金会 使用潮湿的多孔材料产生离子

Also Published As

Publication number Publication date
CN106102873A (zh) 2016-11-09
US10395913B2 (en) 2019-08-27
US10559455B2 (en) 2020-02-11
WO2015100221A2 (en) 2015-07-02
EP3667701A2 (en) 2020-06-17
EP3089811B1 (en) 2019-11-06
JP6577950B2 (ja) 2019-09-18
WO2015100221A3 (en) 2015-12-17
EP3667701A3 (en) 2020-07-29
JP2017502467A (ja) 2017-01-19
US20160314956A1 (en) 2016-10-27
CN110648894A (zh) 2020-01-03
US20190355567A1 (en) 2019-11-21
US20200168446A1 (en) 2020-05-28
US10991564B2 (en) 2021-04-27
CN106102873B (zh) 2019-09-24
EP3089811A2 (en) 2016-11-09
EP3089811A4 (en) 2017-07-26
JP2022002214A (ja) 2022-01-06

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