JP2017502467A5 - - Google Patents

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Publication number
JP2017502467A5
JP2017502467A5 JP2016543047A JP2016543047A JP2017502467A5 JP 2017502467 A5 JP2017502467 A5 JP 2017502467A5 JP 2016543047 A JP2016543047 A JP 2016543047A JP 2016543047 A JP2016543047 A JP 2016543047A JP 2017502467 A5 JP2017502467 A5 JP 2017502467A5
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JP
Japan
Prior art keywords
probe
paper substrate
conductive
item
voltage source
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JP2016543047A
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English (en)
Japanese (ja)
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JP6577950B2 (ja
JP2017502467A (ja
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Priority claimed from PCT/US2014/071856 external-priority patent/WO2015100221A2/en
Publication of JP2017502467A publication Critical patent/JP2017502467A/ja
Publication of JP2017502467A5 publication Critical patent/JP2017502467A5/ja
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JP2016543047A 2013-12-30 2014-12-22 試料をイオン化するための質量分析プローブおよびシステム Active JP6577950B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
IN6137/CHE/2013 2013-12-30
IN6137CH2013 2013-12-30
US201461926713P 2014-01-13 2014-01-13
US61/926,713 2014-01-13
PCT/US2014/071856 WO2015100221A2 (en) 2013-12-28 2014-12-22 Mass spectrometry probes and systems for ionizing a sample

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019153063A Division JP6749459B2 (ja) 2013-12-30 2019-08-23 試料をイオン化するための質量分析プローブおよびシステム

Publications (3)

Publication Number Publication Date
JP2017502467A JP2017502467A (ja) 2017-01-19
JP2017502467A5 true JP2017502467A5 (enExample) 2018-02-08
JP6577950B2 JP6577950B2 (ja) 2019-09-18

Family

ID=53479776

Family Applications (2)

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JP2016543047A Active JP6577950B2 (ja) 2013-12-30 2014-12-22 試料をイオン化するための質量分析プローブおよびシステム
JP2021151100A Pending JP2022002214A (ja) 2013-12-30 2021-09-16 試料をイオン化するための質量分析プローブおよびシステム

Family Applications After (1)

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JP2021151100A Pending JP2022002214A (ja) 2013-12-30 2021-09-16 試料をイオン化するための質量分析プローブおよびシステム

Country Status (5)

Country Link
US (3) US10395913B2 (enExample)
EP (2) EP3667701A3 (enExample)
JP (2) JP6577950B2 (enExample)
CN (2) CN110648894B (enExample)
WO (1) WO2015100221A2 (enExample)

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EP4357784A3 (en) 2016-09-02 2024-07-31 Board of Regents, The University of Texas System Collection probe and methods for the use thereof
US10056218B1 (en) 2017-02-17 2018-08-21 Savannah River Nuclear Solutions, Llc Graphene/graphite-based filament for thermal ionization
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
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WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
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EP3914891A4 (en) 2019-01-25 2022-09-28 Board of Regents, The University of Texas System DEVICE AND METHOD FOR CLEANING AND/OR REPLACING MEDICAL DEVICES
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US11688596B2 (en) 2021-02-12 2023-06-27 Lawrence Livermore National Security, Llc Systems and methods lattice spray substrates for mass spectrometry
CN113109416B (zh) * 2021-04-20 2022-06-14 清华大学 一种激素的快速高通量质谱检测装置及方法

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CN102522311A (zh) * 2011-10-20 2012-06-27 中国科学院上海有机化学研究所 一种纳喷雾电极及其制作方法和应用
WO2014120552A1 (en) * 2013-01-31 2014-08-07 Purdue Research Foundation Methods of analyzing crude oil

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