JP6517193B2 - アレイベースの試料特性評価 - Google Patents

アレイベースの試料特性評価 Download PDF

Info

Publication number
JP6517193B2
JP6517193B2 JP2016517729A JP2016517729A JP6517193B2 JP 6517193 B2 JP6517193 B2 JP 6517193B2 JP 2016517729 A JP2016517729 A JP 2016517729A JP 2016517729 A JP2016517729 A JP 2016517729A JP 6517193 B2 JP6517193 B2 JP 6517193B2
Authority
JP
Japan
Prior art keywords
sample
detecting
dimensional
sample holder
illumination beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2016517729A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016520847A5 (enExample
JP2016520847A (ja
Inventor
イー． ネイル リュイス
イー． ネイル リュイス
Original Assignee
マルバーン インストゥルメンツ リミテッド
マルバーン インストゥルメンツ リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by マルバーン インストゥルメンツ リミテッド, マルバーン インストゥルメンツ リミテッド filed Critical マルバーン インストゥルメンツ リミテッド
Publication of JP2016520847A publication Critical patent/JP2016520847A/ja
Publication of JP2016520847A5 publication Critical patent/JP2016520847A5/ja
Application granted granted Critical
Publication of JP6517193B2 publication Critical patent/JP6517193B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133—Refractometers, e.g. differential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/05—Flow-through cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • G01N21/6454—Individual samples arranged in a regular 2D-array, e.g. multiwell plates using an integrated detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Computer Vision & Pattern Recognition (AREA)
JP2016517729A 2013-06-07 2014-06-06 アレイベースの試料特性評価 Active JP6517193B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361832699P 2013-06-07 2013-06-07
US61/832,699 2013-06-07
US201361834330P 2013-06-12 2013-06-12
US61/834,330 2013-06-12
PCT/IB2014/062017 WO2014195917A2 (en) 2013-06-07 2014-06-06 Array based sample characterization

Publications (3)

Publication Number Publication Date
JP2016520847A JP2016520847A (ja) 2016-07-14
JP2016520847A5 JP2016520847A5 (enExample) 2018-10-25
JP6517193B2 true JP6517193B2 (ja) 2019-05-22

Family

ID=50979834

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016517729A Active JP6517193B2 (ja) 2013-06-07 2014-06-06 アレイベースの試料特性評価

Country Status (5)

Country Link
US (2) US10156520B2 (enExample)
EP (1) EP3004843A2 (enExample)
JP (1) JP6517193B2 (enExample)
CN (1) CN105378458B (enExample)
WO (1) WO2014195917A2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015009970A1 (en) 2013-07-18 2015-01-22 Erythron Llc Spectroscopic measurements with parallel array detector
JP6456983B2 (ja) 2015-02-03 2019-01-23 株式会社日立ハイテクノロジーズ 多色検出装置
JP6975704B2 (ja) * 2015-02-03 2021-12-01 株式会社日立ハイテク 多色検出装置
US10203271B1 (en) * 2015-07-06 2019-02-12 Malvern Panalytical Limited Particle interaction characterization using overlapping scattering and concentration measurements
WO2017201327A1 (en) * 2016-05-19 2017-11-23 Regents Of The University Of Colorado, A Body Corporate Modulus-enforced probe
JP2018057342A (ja) * 2016-10-06 2018-04-12 株式会社東芝 細胞分取装置および細胞分取システム
JP2020501153A (ja) * 2016-12-08 2020-01-16 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 屈折率を決定するための装置及び方法
US11130686B2 (en) 2017-01-10 2021-09-28 Vermeer Manufacturing Company Systems and methods for dosing slurries to remove suspended solids
TWI775924B (zh) * 2017-08-21 2022-09-01 日商東京威力科創股份有限公司 用以判定相的裝置及方法

Family Cites Families (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4396528A (en) * 1978-10-23 1983-08-02 Varian Associates, Inc. Fluorescent composition, a process for synthesizing the fluorescent composition
US4360270A (en) * 1981-02-17 1982-11-23 Jeck Richard K Calibration and testing device for optical, single particle, size spectrometers
US4547071A (en) * 1981-11-16 1985-10-15 Canadian Patents And Development Limited Method and apparatus for measuring density gradient
US4685328A (en) * 1985-02-20 1987-08-11 Schott Gerate Gmbh Capillary viscometer
US4681437A (en) * 1985-02-28 1987-07-21 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Laser schlieren crystal monitor
JPS62124440A (ja) * 1985-11-25 1987-06-05 Canon Inc 粒子解析装置
US4842406A (en) * 1988-01-15 1989-06-27 Pacific Scientific Company Optical instruments for measuring particle sizes
US4999513A (en) * 1988-09-09 1991-03-12 Canon Kabushiki Kaisha Particle measuring apparatus
US5468359A (en) * 1988-11-14 1995-11-21 Anthony R. Torres Method of determining presence of an analyte by isoelectric focusing
US6509192B1 (en) * 1992-02-24 2003-01-21 Coulter International Corp. Quality control method
SE503289C2 (sv) * 1993-09-28 1996-05-13 Anders Hanning Sätt att bestämma koncentrationen av ämnen i en vätska
US5835211A (en) * 1996-03-28 1998-11-10 Particle Sizing Systems, Inc. Single-particle optical sensor with improved sensitivity and dynamic size range
US6122042A (en) * 1997-02-07 2000-09-19 Wunderman; Irwin Devices and methods for optically identifying characteristics of material objects
US5905568A (en) * 1997-12-15 1999-05-18 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Stereo imaging velocimetry
US20010006416A1 (en) * 1999-01-11 2001-07-05 Johnson Paul E. Ribbon flow cytometry apparatus and methods
ES2215734T3 (es) * 1999-10-21 2004-10-16 Foss Analytical A/S Metodo y aparato para la determinacion de propiedades de comida o de alimentos.
DE10018305C2 (de) * 2000-04-13 2002-02-14 Bosch Gmbh Robert Verfahren und Vorrichtung zur Analyse von Strömungen
US6522775B2 (en) * 2001-03-28 2003-02-18 Alan C. Nelson Apparatus and method for imaging small objects in a flow stream using optical tomography
US7010391B2 (en) * 2001-03-28 2006-03-07 Handylab, Inc. Methods and systems for control of microfluidic devices
US6944322B2 (en) * 2001-03-28 2005-09-13 Visiongate, Inc. Optical tomography of small objects using parallel ray illumination and post-specimen optical magnification
US7352469B2 (en) * 2001-11-06 2008-04-01 Mcgrew Stephen P Quantum resonance analytical instrument
AU2002361858A1 (en) 2001-12-21 2003-07-30 Spectral Dimensions, Inc. Spectrometric process monitoring
US7524459B2 (en) 2002-01-24 2009-04-28 California Institute Of Technology In Pasadena Optoelectronic and microfluidic integration for miniaturized spectroscopic devices
US7294513B2 (en) * 2002-07-24 2007-11-13 Wyatt Technology Corporation Method and apparatus for characterizing solutions of small particles
US6738139B1 (en) * 2002-08-26 2004-05-18 J.A. Woollam Co., Inc. Method of determining bulk refractive indicies of fluids from thin films thereof
JP3536851B2 (ja) * 2003-01-29 2004-06-14 株式会社日立製作所 キャピラリーアレイ電気泳動装置
US20050037499A1 (en) * 2003-08-11 2005-02-17 Symyx Technologies, Inc. Apparatus and method for determining temperatures at which properties of materials change
US7365835B2 (en) * 2003-12-02 2008-04-29 California Institute Of Technology Dark-field laser-scattering microscope for analyzing single macromolecules
US8634072B2 (en) * 2004-03-06 2014-01-21 Michael Trainer Methods and apparatus for determining characteristics of particles
US7751048B2 (en) 2004-06-04 2010-07-06 California Institute Of Technology Optofluidic microscope device
DE102004063438A1 (de) * 2004-12-23 2006-07-06 Oktavia Backes Neuartige mikrofluidische Probenträger
CA2540474A1 (en) * 2005-04-01 2006-10-01 Uti Limited Partnership Cytometer
JPWO2007083755A1 (ja) * 2006-01-20 2009-06-11 住友電気工業株式会社 分析装置、真贋判定装置、真贋判定方法、及び地中探索方法
JP2007255994A (ja) * 2006-03-22 2007-10-04 Canon Inc 標的物質検出システム
US20080291456A1 (en) * 2007-05-24 2008-11-27 Ghislain Lucien P Sensor apparatus and method using optical interferometry
JP2009168747A (ja) * 2008-01-18 2009-07-30 Sumitomo Electric Ind Ltd 食品検査方法及び食品検査装置
US8325349B2 (en) 2008-03-04 2012-12-04 California Institute Of Technology Focal plane adjustment by back propagation in optofluidic microscope devices
GB0903992D0 (en) * 2009-03-09 2009-04-22 Paraytec Ltd Optical cell assenbly, cartridge and apparatus
US8416400B2 (en) * 2009-06-03 2013-04-09 California Institute Of Technology Wavefront imaging sensor
JP5277082B2 (ja) * 2009-06-15 2013-08-28 株式会社日立ハイテクノロジーズ 蛍光分析方法
US20120224053A1 (en) * 2009-06-17 2012-09-06 Board Of Regents, The University Of Texas System Method and apparatus for quantitative microimaging
US7978820B2 (en) * 2009-10-22 2011-07-12 Panalytical B.V. X-ray diffraction and fluorescence
US20130301051A1 (en) * 2010-06-18 2013-11-14 Andrew Pogosyan Scattering light source multi-wavelength photometer
US8717562B2 (en) * 2010-08-23 2014-05-06 Scattering Solutions, Inc. Dynamic and depolarized dynamic light scattering colloid analyzer
WO2012033957A2 (en) 2010-09-09 2012-03-15 California Institute Of Technology Delayed emission detection devices and methods
US8941062B2 (en) * 2010-11-16 2015-01-27 1087 Systems, Inc. System for identifying and sorting living cells
US8901513B2 (en) * 2011-03-08 2014-12-02 Horiba Instruments, Incorporated System and method for fluorescence and absorbance analysis
CA2832411C (en) * 2011-04-06 2020-03-10 Klein Medical Limited Spectroscopic analyser
ES2886583T3 (es) * 2011-05-26 2021-12-20 Massachusetts Gen Hospital Sistema de tromboelastografía óptica y método para la evaluación de las métricas de coagulación sanguínea
JP5845009B2 (ja) * 2011-07-07 2016-01-20 シャープ株式会社 光測定分析装置、貯蔵庫、電磁波発生装置および光測定分析方法。
TWI648532B (zh) * 2011-08-29 2019-01-21 美商安美基公司 用於非破壞性檢測-流體中未溶解粒子之方法及裝置
CN102445406B (zh) 2011-09-22 2013-04-17 云南大学 一种测量液相扩散系数的方法及装置
EP2780692A1 (en) 2011-11-14 2014-09-24 Koninklijke Philips N.V. Apparatus for cluster detection
US20140232853A1 (en) * 2013-02-21 2014-08-21 Neil E. Lewis Imaging microviscometer

Also Published As

Publication number Publication date
CN105378458A (zh) 2016-03-02
US20160252453A1 (en) 2016-09-01
JP2016520847A (ja) 2016-07-14
WO2014195917A2 (en) 2014-12-11
CN105378458B (zh) 2021-05-25
US20190170642A1 (en) 2019-06-06
WO2014195917A3 (en) 2015-04-23
US10156520B2 (en) 2018-12-18
EP3004843A2 (en) 2016-04-13

Similar Documents

Publication Publication Date Title
JP6517193B2 (ja) アレイベースの試料特性評価
US7292333B2 (en) Optical interrogation system and method for 2-D sensor arrays
AU2007297473B2 (en) Focal plane tracking for optical microtomography
Xu Light scattering: A review of particle characterization applications
JP4397813B2 (ja) 時間遅延積分イメージングを使用した微小な動く対象物の光学的断層撮影法
AU2020357863B2 (en) Determination of protein concentration in a fluid
US7430047B2 (en) Small container fluid dynamics to produce optimized inspection conditions
JP2009204616A5 (enExample)
CN103063626A (zh) 一种光路自动校正的细胞激光激发检测装置及其方法
WO2017060105A1 (en) Particle sensor for particle detection
US10768108B2 (en) Surface plasmon resonance biosensor system
US9417176B2 (en) Method and apparatus for detecting and registering properties of samples
RU2764676C1 (ru) Устройство с микрофлюидным чипом для измерений оптической силы и формирования изображения клеток с использованием конфигурации микрофлюидного чипа и динамики
EP3770580B1 (en) Fine particle measurement device
US20120057019A1 (en) Dynamic In-Situ Feature Imager Apparatus and Method
CN203191316U (zh) 一种光路自动校正的细胞激光激发检测装置
KR100691528B1 (ko) 단백질 칩 분석용 표면 플라즈몬 주사 현미경 장치
JPH07503068A (ja) 密度グラジエント造画システムを使用した非移動式の毛管等電フォーカス処理を実施して普遍的に検出する方法及び装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160127

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170606

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170606

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20180528

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20180612

A524 Written submission of copy of amendment under article 19 pct

Free format text: JAPANESE INTERMEDIATE CODE: A524

Effective date: 20180912

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20190219

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20190307

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190319

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20190417

R150 Certificate of patent or registration of utility model

Ref document number: 6517193

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250