JP6495322B2 - Ｉｃダイ、超音波プローブ、超音波診断システム及び方法 - Google Patents

Ｉｃダイ、超音波プローブ、超音波診断システム及び方法 Download PDF

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JP6495322B2
JP6495322B2 JP2016559408A JP2016559408A JP6495322B2 JP 6495322 B2 JP6495322 B2 JP 6495322B2 JP 2016559408 A JP2016559408 A JP 2016559408A JP 2016559408 A JP2016559408 A JP 2016559408A JP 6495322 B2 JP6495322 B2 JP 6495322B2
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die
conductive
conductive contact
edge
contact plate
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JP2017514556A5 (cg-RX-API-DMAC7.html
JP2017514556A (ja
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エグベルトゥス レイニエル ヤコブス
エグベルトゥス レイニエル ヤコブス
ヨハネス ウィルヘルムス ウィーカンプ
ヨハネス ウィルヘルムス ウィーカンプ
ニールス コーネリス ウィルヘルムス ヨハネス レイケルス
ニールス コーネリス ウィルヘルムス ヨハネス レイケルス
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Koninklijke Philips NV
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