JP6474111B2 - 高調波相殺を備えた差動サンプリング回路 - Google Patents

高調波相殺を備えた差動サンプリング回路 Download PDF

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JP6474111B2
JP6474111B2 JP2016513059A JP2016513059A JP6474111B2 JP 6474111 B2 JP6474111 B2 JP 6474111B2 JP 2016513059 A JP2016513059 A JP 2016513059A JP 2016513059 A JP2016513059 A JP 2016513059A JP 6474111 B2 JP6474111 B2 JP 6474111B2
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coupled
field effect
effect transistor
differential
drain
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Japanese (ja)
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JP2016523048A (ja
JP2016523048A5 (enExample
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フランシス ロスワルド
フランシス ロスワルド
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日本テキサス・インスツルメンツ合同会社
テキサス インスツルメンツ インコーポレイテッド
テキサス インスツルメンツ インコーポレイテッド
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Amplifiers (AREA)
  • Electronic Switches (AREA)
  • Analogue/Digital Conversion (AREA)
JP2016513059A 2013-05-08 2014-05-08 高調波相殺を備えた差動サンプリング回路 Active JP6474111B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/890,031 US8854085B1 (en) 2013-05-08 2013-05-08 Method and apparatus for cancellation of the second harmonic in a differential sampling circuit
US13/890,031 2013-05-08
PCT/US2014/037257 WO2014182876A1 (en) 2013-05-08 2014-05-08 Differential sampling circuit with harmonic cancellation

Publications (3)

Publication Number Publication Date
JP2016523048A JP2016523048A (ja) 2016-08-04
JP2016523048A5 JP2016523048A5 (enExample) 2017-06-15
JP6474111B2 true JP6474111B2 (ja) 2019-02-27

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JP2016513059A Active JP6474111B2 (ja) 2013-05-08 2014-05-08 高調波相殺を備えた差動サンプリング回路

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US (1) US8854085B1 (enExample)
EP (1) EP2995004B1 (enExample)
JP (1) JP6474111B2 (enExample)
CN (1) CN105164922B (enExample)
WO (1) WO2014182876A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105680864B (zh) * 2015-12-31 2020-03-31 杭州士兰微电子股份有限公司 逐次逼近模数转换器、模数转换方法和传感信号处理装置
US10084466B1 (en) * 2017-12-28 2018-09-25 Texas Instruments Incorporated Top plate sampling circuit including input-dependent dual clock boost circuits
CN109245768B (zh) * 2018-09-19 2022-04-05 中国电子科技集团公司第二十四研究所 一种具有高精度采样开关的sar adc
KR20220072005A (ko) * 2020-11-23 2022-06-02 삼성전자주식회사 멀티플렉서 및 이를 포함하는 반도체 장치

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4779029A (en) * 1985-03-11 1988-10-18 Ncr Corporation Digitally compensated multiplying digital to analog converter
US5909131A (en) * 1996-07-31 1999-06-01 Analog Devices, Inc. Low-distortion technique to bandlimit a switched-capacitor sampling circuit
US5963156A (en) * 1997-10-22 1999-10-05 National Semiconductor Corporation Sample and hold circuit and method with common mode differential signal feedback for converting single-ended signals to differential signals
US6137321A (en) * 1999-01-12 2000-10-24 Qualcomm Incorporated Linear sampling switch
JP3795338B2 (ja) * 2001-02-27 2006-07-12 旭化成マイクロシステム株式会社 全差動型サンプリング回路及びデルタシグマ型変調器
US20030128068A1 (en) * 2001-08-16 2003-07-10 Farbod Behbahani Low noise image-reject gm-c filter
CN1307795C (zh) * 2002-01-17 2007-03-28 皇家飞利浦电子股份有限公司 改进的差分反相电路
US6590438B1 (en) * 2002-03-08 2003-07-08 Sirific Wireless Corporation Integrated circuit adjustable RF mixer
US7019679B2 (en) * 2002-05-31 2006-03-28 Broadcom Corporation Multiplexer with low parasitic capacitance effects
US6650263B1 (en) * 2002-11-04 2003-11-18 Analog Devices, Inc. Differential sampler structures with reduced distortion and current demand
US20040222842A1 (en) * 2002-11-13 2004-11-11 Owens Ronnie Edward Systems and methods for generating a reference voltage
US6882292B1 (en) * 2004-01-07 2005-04-19 Analog Devices, Inc. Analog to digital converter with bandwidth tuning circuit
US7227483B2 (en) * 2004-09-22 2007-06-05 Dongwon Seo High-speed and high-accuracy digital-to-analog converter
US7279940B1 (en) * 2005-10-25 2007-10-09 National Semiconductor Corporation Switched-capacitor circuit with time-shifted switching scheme
WO2007121148A2 (en) * 2006-04-11 2007-10-25 Akros Silicon, Inc. Network devices for separating power and data signals
US7439755B2 (en) * 2007-01-31 2008-10-21 International Business Machines Corporation Electronic circuit for measurement of transistor variability and the like
KR100877626B1 (ko) * 2007-05-02 2009-01-09 삼성전자주식회사 클래스 ａｂ 증폭기 및 이를 위한 입력 스테이지 회로
CN101964661B (zh) * 2009-07-23 2013-12-11 雷凌科技股份有限公司 用于管线式模拟数字转换器的比较器及相关信号取样方法
US8223046B2 (en) * 2009-08-14 2012-07-17 Entropic Communications, Inc. Method and system for accelerated analog to digital conversion
US8866541B2 (en) * 2012-04-20 2014-10-21 Analog Devices, Inc. Distortion cancellation in analog circuits

Also Published As

Publication number Publication date
JP2016523048A (ja) 2016-08-04
US8854085B1 (en) 2014-10-07
CN105164922B (zh) 2019-05-07
WO2014182876A1 (en) 2014-11-13
CN105164922A (zh) 2015-12-16
EP2995004A4 (en) 2017-03-01
EP2995004A1 (en) 2016-03-16
EP2995004B1 (en) 2019-06-19

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