JP6444406B2 - 高解像度スキャニング顕微鏡法 - Google Patents
高解像度スキャニング顕微鏡法 Download PDFInfo
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- JP6444406B2 JP6444406B2 JP2016533862A JP2016533862A JP6444406B2 JP 6444406 B2 JP6444406 B2 JP 6444406B2 JP 2016533862 A JP2016533862 A JP 2016533862A JP 2016533862 A JP2016533862 A JP 2016533862A JP 6444406 B2 JP6444406 B2 JP 6444406B2
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
- G02B21/025—Objectives with variable magnification
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
- G02B6/06—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0825—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Multimedia (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102013013793.4 | 2013-08-15 | ||
| DE102013013793 | 2013-08-15 | ||
| DE102013019348.6 | 2013-11-15 | ||
| DE201310019348 DE102013019348A1 (de) | 2013-08-15 | 2013-11-15 | Hochauflösende Scanning-Mikroskopie |
| PCT/EP2014/065502 WO2015022147A1 (de) | 2013-08-15 | 2014-07-18 | Hochauflösende scanning-mikroskopie |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016532154A JP2016532154A (ja) | 2016-10-13 |
| JP2016532154A5 JP2016532154A5 (enExample) | 2017-07-06 |
| JP6444406B2 true JP6444406B2 (ja) | 2018-12-26 |
Family
ID=52430067
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016533862A Active JP6444406B2 (ja) | 2013-08-15 | 2014-07-18 | 高解像度スキャニング顕微鏡法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10281701B2 (enExample) |
| EP (1) | EP3033646B1 (enExample) |
| JP (1) | JP6444406B2 (enExample) |
| CN (2) | CN105612454A (enExample) |
| DE (1) | DE102013019348A1 (enExample) |
| WO (1) | WO2015022147A1 (enExample) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102013012609B4 (de) * | 2013-07-26 | 2024-06-27 | Carl Zeiss Microscopy Gmbh | Optoelektronischer Detektor, insbesondere für hochauflösende Lichtrastermikroskope und Lichtrastermikroskop |
| DE102013015933A1 (de) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013015932A1 (de) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102014111167A1 (de) | 2014-08-06 | 2016-02-11 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
| DE102015100695B4 (de) * | 2015-01-19 | 2024-10-31 | Carl Zeiss Ag | Optische Anordnung für ein Laser-Scanner-System |
| DE102015111702A1 (de) | 2015-07-20 | 2017-01-26 | Carl Zeiss Microscopy Gmbh | Hochauflösende, spektral selektive Scanning-Mikroskopie einer Probe |
| DE102015116435A1 (de) * | 2015-09-29 | 2017-03-30 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche |
| WO2017090210A1 (ja) * | 2015-11-27 | 2017-06-01 | 株式会社ニコン | 顕微鏡、観察方法、及び画像処理プログラム |
| DE102016119262B4 (de) * | 2016-10-10 | 2018-06-07 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren zum räumlich hochauflösenden Bestimmen des Orts eines vereinzelten, mit Anregungslicht zur Emission von Lumineszenzlicht anregbaren Moleküls in einer Probe |
| JP6784603B2 (ja) * | 2017-01-05 | 2020-11-11 | 東レエンジニアリング株式会社 | 分光測定方法および分光測定装置 |
| DE102017101829A1 (de) * | 2017-01-31 | 2018-08-02 | Carl Zeiss Microscopy Gmbh | Anordnung zur Auflösungssteigerung eines Laser-Scanning-Mikroskops |
| DE102017203414A1 (de) | 2017-03-02 | 2018-09-06 | Carl Zeiss Microscopy Gmbh | Detektorbaugruppe und Mikroskop mit einer solchen Detektorbaugruppe |
| DE102017113683A1 (de) | 2017-06-21 | 2018-12-27 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
| DE102017116982B4 (de) * | 2017-07-27 | 2025-06-26 | Coretronic Corporation | Leuchteinrichtung zum abgeben von licht |
| CN111226136B (zh) * | 2017-10-30 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
| DE102017128773A1 (de) | 2017-12-04 | 2019-06-06 | Leica Microsystems Cms Gmbh | Detektoranordnung für die Mikroskopie |
| WO2019133837A1 (en) * | 2017-12-28 | 2019-07-04 | University Of Notre Dame Du Lac | Super-resolution fluorescence microscopy by stepwise optical saturation |
| EP3518017B1 (de) * | 2018-01-24 | 2020-06-17 | Technische Universität Dresden | Verfahren und faseroptisches system zur beleuchtung und detektion eines objekts mit licht |
| DE102018127281A1 (de) * | 2018-10-31 | 2020-04-30 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren zur Mikroskopie |
| US10545099B1 (en) * | 2018-11-07 | 2020-01-28 | Kla-Tencor Corporation | Ultra-high sensitivity hybrid inspection with full wafer coverage capability |
| DE102018128590A1 (de) * | 2018-11-14 | 2020-05-14 | Carl Zeiss Microscopy Gmbh | Fluktuationsbasierte Fluoreszenzmikroskopie |
| DE102019100184A1 (de) * | 2019-01-07 | 2020-07-09 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102020120114A1 (de) * | 2020-07-30 | 2022-02-03 | Abberior Instruments Gmbh | Detektionseinrichtung für ein Laserscanning-Mikroskop |
| US20220299711A1 (en) * | 2020-09-22 | 2022-09-22 | Google Llc | Waveguide with regional anti-reflection coating |
| WO2023114213A1 (en) * | 2021-12-13 | 2023-06-22 | The Board Of Trustees Of The Leland Stanford Junior University | Apparatus and method for multiplexed one-photon and nonlinear microscopy and method for biological tissue alignment |
| DE102023100926A1 (de) * | 2023-01-17 | 2024-07-18 | Carl Zeiss Microscopy Gmbh | Mikroskop |
| EP4657133A1 (en) * | 2024-05-29 | 2025-12-03 | Leica Microsystems CMS GmbH | An optical system for a microscope and a method for operating the microscope |
Family Cites Families (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59214818A (ja) * | 1983-05-21 | 1984-12-04 | Fuji Photo Film Co Ltd | 撮像装置 |
| JPS62218823A (ja) * | 1986-03-20 | 1987-09-26 | Fujitsu Ltd | 赤外線撮像装置 |
| DE19908883A1 (de) | 1999-03-02 | 2000-09-07 | Rainer Heintzmann | Verfahren zur Erhöhung der Auflösung optischer Abbildung |
| DE19951482C2 (de) | 1999-10-26 | 2003-01-09 | Zeiss Carl Jena Gmbh | Fluoreszenzmikroskop |
| US7616986B2 (en) * | 2001-05-07 | 2009-11-10 | University Of Washington | Optical fiber scanner for performing multimodal optical imaging |
| US7298461B2 (en) * | 2001-10-09 | 2007-11-20 | Ruprecht-Karls-Universitat | Far field light microscopical method, system and computer program product for analysing at least one object having a subwavelength size |
| JP2003283906A (ja) * | 2002-03-20 | 2003-10-03 | Nippon Telegr & Teleph Corp <Ntt> | 高解像度撮像装置 |
| US6953927B2 (en) * | 2002-08-09 | 2005-10-11 | California Institute Of Technology | Method and system for scanning apertureless fluorescence microscope |
| DE102004034970A1 (de) * | 2004-07-16 | 2006-02-02 | Carl Zeiss Jena Gmbh | Lichtrastermikroskop und Verwendung |
| EP2453239B1 (en) | 2005-05-23 | 2017-04-26 | Harald F. Hess | Optical microscopy with transformable optical labels |
| US20070057211A1 (en) * | 2005-05-25 | 2007-03-15 | Karsten Bahlman | Multifocal imaging systems and method |
| US7247842B1 (en) * | 2005-07-12 | 2007-07-24 | California Institute Of Technology | Method and system for scanning apertureless fluorescence mircroscope |
| US7298476B2 (en) * | 2005-10-14 | 2007-11-20 | Laser Microtech, L.L.C. | Method and system for far-field microscopy to exceeding diffraction-limit resolution |
| JP2009516568A (ja) * | 2005-11-23 | 2009-04-23 | ユニヴァーシティ オブ ワシントン | 中断される走査共振を使用する可変順次フレーミングを用いたビームの走査 |
| DE102006021317B3 (de) | 2006-05-06 | 2007-10-11 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe |
| CN101210969A (zh) * | 2006-12-31 | 2008-07-02 | 中国科学院西安光学精密机械研究所 | 凝视型高分辨率三维成像探测器 |
| US8275226B2 (en) * | 2008-12-09 | 2012-09-25 | Spectral Applied Research Ltd. | Multi-mode fiber optically coupling a radiation source module to a multi-focal confocal microscope |
| JP5340799B2 (ja) * | 2009-05-08 | 2013-11-13 | オリンパス株式会社 | レーザ走査型顕微鏡 |
| JP5852305B2 (ja) * | 2009-10-28 | 2016-02-03 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 分解能の向上した顕微鏡法および顕微鏡 |
| US20130126756A1 (en) * | 2010-01-22 | 2013-05-23 | Cornell University | Fluorescence imaging apparatus and method |
| FR2959305B1 (fr) * | 2010-04-26 | 2014-09-05 | Nanotec Solution | Dispositif optique et procede d'inspection d'objets structures. |
| TWI414817B (zh) * | 2010-07-23 | 2013-11-11 | Univ Nat Taipei Technology | 線型彩色共焦顯微系統 |
| CN202102170U (zh) * | 2010-10-20 | 2012-01-04 | 中国科学院西安光学精密机械研究所 | 使用同心双锥面镜实现全内反射荧光显微的系统 |
| DE102010060121C5 (de) * | 2010-10-22 | 2023-09-28 | Leica Microsystems Cms Gmbh | SPIM-Mikroskop mit sequenziellem Lightsheet |
| CA2824447C (en) * | 2010-12-24 | 2018-03-20 | Huron Technologies International Inc. | Pathology slide scanner |
| JP2012237647A (ja) * | 2011-05-11 | 2012-12-06 | Univ Of Tokyo | 多焦点共焦点ラマン分光顕微鏡 |
| JP2012242141A (ja) * | 2011-05-16 | 2012-12-10 | Olympus Corp | 共焦点顕微鏡又は多光子顕微鏡の光学系を用いた光分析装置及び光分析方法 |
| TWI434022B (zh) * | 2011-11-29 | 2014-04-11 | Univ Nat Taipei Technology | 彩色共焦顯微系統及其訊號處理方法 |
| DE102012204128B4 (de) * | 2012-03-15 | 2023-11-16 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| CN202563160U (zh) * | 2012-04-11 | 2012-11-28 | 上海理工大学 | 一种同轴光路实现多路频分复用荧光共焦显微成像系统 |
| US9575304B2 (en) * | 2012-06-25 | 2017-02-21 | Huron Technologies International Inc. | Pathology slide scanners for fluorescence and brightfield imaging and method of operation |
| DE102013019347A1 (de) * | 2013-08-15 | 2015-02-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013218795A1 (de) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Laserscanningmikroskop und Verfahren zur Korrektur von Abbildungsfehlern insbesondere in der hochauflösenden Scanning-Mikroskopie |
-
2013
- 2013-11-15 DE DE201310019348 patent/DE102013019348A1/de not_active Ceased
-
2014
- 2014-07-18 CN CN201480055894.2A patent/CN105612454A/zh active Pending
- 2014-07-18 JP JP2016533862A patent/JP6444406B2/ja active Active
- 2014-07-18 CN CN201810735160.9A patent/CN108873285B/zh active Active
- 2014-07-18 EP EP14744023.4A patent/EP3033646B1/de active Active
- 2014-07-18 WO PCT/EP2014/065502 patent/WO2015022147A1/de not_active Ceased
- 2014-08-12 US US14/457,856 patent/US10281701B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016532154A (ja) | 2016-10-13 |
| CN108873285B (zh) | 2020-11-24 |
| DE102013019348A1 (de) | 2015-02-19 |
| EP3033646A1 (de) | 2016-06-22 |
| EP3033646B1 (de) | 2024-09-25 |
| US10281701B2 (en) | 2019-05-07 |
| WO2015022147A1 (de) | 2015-02-19 |
| CN105612454A (zh) | 2016-05-25 |
| CN108873285A (zh) | 2018-11-23 |
| US20150085099A1 (en) | 2015-03-26 |
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