JP6443091B2 - 眼科装置 - Google Patents

眼科装置 Download PDF

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Publication number
JP6443091B2
JP6443091B2 JP2015016590A JP2015016590A JP6443091B2 JP 6443091 B2 JP6443091 B2 JP 6443091B2 JP 2015016590 A JP2015016590 A JP 2015016590A JP 2015016590 A JP2015016590 A JP 2015016590A JP 6443091 B2 JP6443091 B2 JP 6443091B2
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control unit
subject
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JP2015016590A
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Japanese (ja)
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JP2016140423A (ja
JP2016140423A5 (enExample
Inventor
利哉 小林
利哉 小林
真也 岩田
真也 岩田
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Nidek Co Ltd
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Nidek Co Ltd
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  • Eye Examination Apparatus (AREA)
JP2015016590A 2015-01-30 2015-01-30 眼科装置 Expired - Fee Related JP6443091B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015016590A JP6443091B2 (ja) 2015-01-30 2015-01-30 眼科装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015016590A JP6443091B2 (ja) 2015-01-30 2015-01-30 眼科装置

Publications (3)

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JP2016140423A JP2016140423A (ja) 2016-08-08
JP2016140423A5 JP2016140423A5 (enExample) 2018-03-08
JP6443091B2 true JP6443091B2 (ja) 2018-12-26

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JP2015016590A Expired - Fee Related JP6443091B2 (ja) 2015-01-30 2015-01-30 眼科装置

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JP (1) JP6443091B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111163682B (zh) * 2017-10-05 2022-06-03 Qd激光公司 视觉检査装置
JP6606264B1 (ja) * 2018-12-25 2019-11-13 国立大学法人愛媛大学 視野検査装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001258840A (ja) * 2000-03-17 2001-09-25 Topcon Corp 検眼装置
JP2002224038A (ja) * 2001-01-31 2002-08-13 Nidek Co Ltd 眼底カメラ
US20030157464A1 (en) * 2002-02-20 2003-08-21 Cesare Tanassi Instrument for eye examination and method
JP4518077B2 (ja) * 2004-09-15 2010-08-04 パナソニック電工株式会社 視野計
JP6266515B2 (ja) * 2012-07-13 2018-01-24 興和株式会社 視野計

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JP2016140423A (ja) 2016-08-08

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