JP6382747B2 - 過剰少数キャリアの実効ライフタイム測定方法および過剰少数キャリアの実効ライフタイム測定装置 - Google Patents

過剰少数キャリアの実効ライフタイム測定方法および過剰少数キャリアの実効ライフタイム測定装置 Download PDF

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JP6382747B2
JP6382747B2 JP2015036812A JP2015036812A JP6382747B2 JP 6382747 B2 JP6382747 B2 JP 6382747B2 JP 2015036812 A JP2015036812 A JP 2015036812A JP 2015036812 A JP2015036812 A JP 2015036812A JP 6382747 B2 JP6382747 B2 JP 6382747B2
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intensity
excess minority
effective lifetime
photoconductivity
trapping region
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JP2016157907A5 (cg-RX-API-DMAC7.html
JP2016157907A (ja
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中山　明
明 中山
吉川　博道
博道 吉川
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Kyocera Corp
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JP2015036812A 2015-02-26 2015-02-26 過剰少数キャリアの実効ライフタイム測定方法および過剰少数キャリアの実効ライフタイム測定装置 Expired - Fee Related JP6382747B2 (ja)

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JP6748008B2 (ja) * 2017-03-21 2020-08-26 京セラ株式会社 過剰少数キャリアの実効ライフタイム測定方法および過剰少数キャリアの実効ライフタイム測定装置
JP6826007B2 (ja) * 2017-06-29 2021-02-03 京セラ株式会社 光誘起キャリアのバルクキャリアライフタイムの測定方法および測定装置

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JP3810207B2 (ja) * 1998-04-28 2006-08-16 株式会社アドバンテスト 半導体パラメータの測定方法および測定装置
US9239299B2 (en) * 2010-02-15 2016-01-19 National University Corporation Tokyo University Of Agriculture And Technology Photoinduced carrier lifetime measuring method, light incidence efficiency measuring method, photoinduced carrier lifetime measuring device, and light incidence efficiency measuring device
JP6052536B2 (ja) * 2011-12-16 2016-12-27 国立大学法人東京農工大学 光誘起キャリヤライフタイム測定装置及び光誘起キャリヤライフタイム測定方法
JP2016157931A (ja) * 2015-02-20 2016-09-01 国立大学法人東京農工大学 光誘起キャリヤライフタイム測定方法及び光誘起キャリヤライフタイム測定装置

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