JP6366657B2 - 発生ガス分析装置及び発生ガス分析方法 - Google Patents

発生ガス分析装置及び発生ガス分析方法 Download PDF

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Publication number
JP6366657B2
JP6366657B2 JP2016173395A JP2016173395A JP6366657B2 JP 6366657 B2 JP6366657 B2 JP 6366657B2 JP 2016173395 A JP2016173395 A JP 2016173395A JP 2016173395 A JP2016173395 A JP 2016173395A JP 6366657 B2 JP6366657 B2 JP 6366657B2
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sample holder
cooling
sample
unit
heating
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Japanese (ja)
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JP2017102101A5 (zh
JP2017102101A (ja
Inventor
秀之 秋山
秀之 秋山
山田 健太郎
健太郎 山田
俊公 竹内
俊公 竹内
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Hitachi High Tech Science Corp
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Hitachi High Tech Science Corp
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Priority to TW105131917A priority Critical patent/TWI690700B/zh
Priority to KR1020160136524A priority patent/KR102051178B1/ko
Priority to CN201611016238.9A priority patent/CN106908307B/zh
Priority to US15/356,579 priority patent/US10401342B2/en
Publication of JP2017102101A publication Critical patent/JP2017102101A/ja
Publication of JP2017102101A5 publication Critical patent/JP2017102101A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/20Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4806Details not adapted to a particular type of sample
    • G01N25/4826Details not adapted to a particular type of sample concerning the heating or cooling arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44Sample treatment involving radiation, e.g. heat
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/42Low-temperature sample treatment, e.g. cryofixation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/20Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/22Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on combustion or catalytic oxidation, e.g. of components of gas mixtures
    • G01N25/44Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on combustion or catalytic oxidation, e.g. of components of gas mixtures the heat developed being transferred to a fixed quantity of fluid
    • G01N25/46Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on combustion or catalytic oxidation, e.g. of components of gas mixtures the heat developed being transferred to a fixed quantity of fluid for investigating the composition of gas mixtures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004Gaseous mixtures, e.g. polluted air
    • G01N33/0009General constructional details of gas analysers, e.g. portable test equipment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
JP2016173395A 2015-11-20 2016-09-06 発生ガス分析装置及び発生ガス分析方法 Active JP6366657B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TW105131917A TWI690700B (zh) 2015-11-20 2016-10-03 產生氣體分析裝置及產生氣體分析方法
KR1020160136524A KR102051178B1 (ko) 2015-11-20 2016-10-20 발생 가스 분석 장치 및 발생 가스 분석 방법
CN201611016238.9A CN106908307B (zh) 2015-11-20 2016-11-18 产生气体分析装置以及产生气体分析方法
US15/356,579 US10401342B2 (en) 2015-11-20 2016-11-19 Evolved gas analyzer and method for analyzing evolved gas

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015227370 2015-11-20
JP2015227370 2015-11-20

Publications (3)

Publication Number Publication Date
JP2017102101A JP2017102101A (ja) 2017-06-08
JP2017102101A5 JP2017102101A5 (zh) 2018-02-01
JP6366657B2 true JP6366657B2 (ja) 2018-08-01

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JP2016173395A Active JP6366657B2 (ja) 2015-11-20 2016-09-06 発生ガス分析装置及び発生ガス分析方法

Country Status (4)

Country Link
JP (1) JP6366657B2 (zh)
KR (1) KR102051178B1 (zh)
CN (1) CN106908307B (zh)
TW (1) TWI690700B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6505166B2 (ja) * 2017-07-21 2019-04-24 株式会社日立ハイテクサイエンス 発生ガス分析装置及び発生ガス分析方法
CN110954435A (zh) * 2019-12-20 2020-04-03 武汉科技大学 一种多因素耦合作用下的蒸发速率测量装置及方法
CN113551842B (zh) * 2021-06-23 2023-01-24 鞍钢蒂森克虏伯(重庆)汽车钢有限公司 一种在线检测退火炉水冷设备泄漏的方法及系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59180651U (ja) * 1983-05-20 1984-12-03 塩野義製薬株式会社 自動元素分析機用オ−トサンプラ−
JPH0331762A (ja) * 1989-06-29 1991-02-12 Mitsubishi Kasei Corp 固体試料の分解方法
JPH05298961A (ja) * 1992-04-22 1993-11-12 Hitachi Ltd 携帯形電子計算機
JP3123843B2 (ja) * 1992-12-17 2001-01-15 日本電子株式会社 プラズマフレームを用いた試料気化装置
JP2531427B2 (ja) * 1993-02-24 1996-09-04 株式会社島津製作所 炭素測定装置
JPH08327615A (ja) * 1995-03-24 1996-12-13 Shimadzu Corp 試料採取装置
JP3965234B2 (ja) * 1997-10-20 2007-08-29 フロンティア・ラボ株式会社 熱分析装置
JP2002372483A (ja) * 2001-04-09 2002-12-26 Toshiba Microelectronics Corp 脱離ガス分析装置及びその分析方法
WO2007129513A1 (ja) * 2006-05-09 2007-11-15 Sumitomo Seika Chemicals Co., Ltd. 試料導入システム
WO2010067399A1 (ja) * 2008-12-10 2010-06-17 株式会社島津製作所 ヘッドスペース試料導入装置
KR101102414B1 (ko) * 2010-05-28 2012-01-05 한국표준과학연구원 열전 소자 특성 측정 장치 및 그 측정 방법
KR101246318B1 (ko) * 2011-04-27 2013-03-21 현대제철 주식회사 가열로
JP5935908B2 (ja) * 2013-01-24 2016-06-15 株式会社島津製作所 試料加熱装置及び元素分析計
JP5949603B2 (ja) * 2013-03-08 2016-07-06 株式会社島津製作所 試料冷却装置
JP6107593B2 (ja) * 2013-10-21 2017-04-05 株式会社島津製作所 元素分析装置
JP6115483B2 (ja) * 2014-01-22 2017-04-19 株式会社島津製作所 炭素測定装置
CN104483423B (zh) * 2014-12-31 2016-03-09 同方威视技术股份有限公司 样品采集和热解析进样装置和方法以及痕量检测设备

Also Published As

Publication number Publication date
KR102051178B1 (ko) 2019-12-02
TWI690700B (zh) 2020-04-11
KR20170059387A (ko) 2017-05-30
TW201727211A (zh) 2017-08-01
JP2017102101A (ja) 2017-06-08
CN106908307A (zh) 2017-06-30
CN106908307B (zh) 2019-06-28

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