JP6358774B2 - リルート可能なダイ間通信を用いるマルチチップモジュール - Google Patents

リルート可能なダイ間通信を用いるマルチチップモジュール Download PDF

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Publication number
JP6358774B2
JP6358774B2 JP2012282703A JP2012282703A JP6358774B2 JP 6358774 B2 JP6358774 B2 JP 6358774B2 JP 2012282703 A JP2012282703 A JP 2012282703A JP 2012282703 A JP2012282703 A JP 2012282703A JP 6358774 B2 JP6358774 B2 JP 6358774B2
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Prior art keywords
connections
module
connection
redundant
signals
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Japanese (ja)
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JP2013145554A5 (https=
JP2013145554A (ja
Inventor
ルイス デイビッド
ルイス デイビッド
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Altera Corp
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Altera Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/611—Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • H10P74/232—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes comprising connection or disconnection of parts of a device in response to a measurement
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/641—Adaptable interconnections, e.g. fuses or antifuses
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63—Vias, e.g. via plugs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2012282703A 2011-12-28 2012-12-26 リルート可能なダイ間通信を用いるマルチチップモジュール Expired - Fee Related JP6358774B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/339,130 2011-12-28
US13/339,130 US8895981B2 (en) 2011-12-28 2011-12-28 Multichip module with reroutable inter-die communication

Publications (3)

Publication Number Publication Date
JP2013145554A JP2013145554A (ja) 2013-07-25
JP2013145554A5 JP2013145554A5 (https=) 2015-12-17
JP6358774B2 true JP6358774B2 (ja) 2018-07-18

Family

ID=47469790

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012282703A Expired - Fee Related JP6358774B2 (ja) 2011-12-28 2012-12-26 リルート可能なダイ間通信を用いるマルチチップモジュール

Country Status (4)

Country Link
US (2) US8895981B2 (https=)
EP (1) EP2610900A3 (https=)
JP (1) JP6358774B2 (https=)
CN (1) CN103219308B (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9030227B1 (en) * 2013-08-20 2015-05-12 Altera Corporation Methods and apparatus for providing redundancy on multi-chip devices
KR20150043045A (ko) * 2013-10-14 2015-04-22 에스케이하이닉스 주식회사 반도체 장치
JP6398451B2 (ja) 2014-08-11 2018-10-03 富士通株式会社 半導体回路装置および半導体回路装置の試験方法
JP6488699B2 (ja) 2014-12-26 2019-03-27 富士通株式会社 試験回路および試験回路の制御方法
US10082541B2 (en) 2015-06-11 2018-09-25 Altera Corporation Mixed redundancy scheme for inter-die interconnects in a multichip package
US10064276B2 (en) * 2015-10-21 2018-08-28 Adventive Ipbank 3D bendable printed circuit board with redundant interconnections
US20220244323A9 (en) * 2018-06-01 2022-08-04 Lexmark International, Inc. Magnetic Sensor Array Device Optimizations and Hybrid Magnetic Camera
US12452173B2 (en) * 2023-12-19 2025-10-21 Advanced Micro Devices, Inc. Reduced mesh lane routing

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3301047B2 (ja) * 1993-09-16 2002-07-15 株式会社日立製作所 半導体メモリシステム
US5701263A (en) * 1995-08-28 1997-12-23 Hyundai Electronics America Inverse discrete cosine transform processor for VLSI implementation
US5905383A (en) * 1995-08-29 1999-05-18 Tektronix, Inc. Multi-chip module development substrate
JPH11331374A (ja) * 1998-05-20 1999-11-30 Nec Corp クロスバスイッチ装置及びその冗長化方法
JP2002009156A (ja) * 2000-06-16 2002-01-11 Hitachi Ltd 論理モジュール及び論理エミュレーション方法
JP2003309183A (ja) * 2002-04-17 2003-10-31 Toshiba Corp 半導体システム、半導体システムの接続テスト方法及び半導体システムの製造方法
JP2004028885A (ja) * 2002-06-27 2004-01-29 Fujitsu Ltd 半導体装置、半導体パッケージ及び半導体装置の試験方法
US7124213B2 (en) * 2003-09-30 2006-10-17 International Business Machines Corporation Device having spare I/O and method of using a device having spare I/O
US6991947B1 (en) * 2004-03-22 2006-01-31 Tushar Gheewala Hybrid semiconductor circuit with programmable intraconnectivity
US7310758B1 (en) * 2005-08-22 2007-12-18 Xilinx, Inc. Circuit for and method of implementing programmable logic devices
US7707465B2 (en) * 2006-01-26 2010-04-27 International Business Machines Corporation Routing of shared I/O fabric error messages in a multi-host environment to a master control root node
US7602056B2 (en) * 2006-06-14 2009-10-13 Intel Corporation On-die termination method for multi-chip packages
US7475315B1 (en) * 2007-01-10 2009-01-06 Altera Corporation Configurable built in self test circuitry for testing memory arrays
US8384417B2 (en) * 2008-09-10 2013-02-26 Qualcomm Incorporated Systems and methods utilizing redundancy in semiconductor chip interconnects
US20130159587A1 (en) * 2011-12-15 2013-06-20 Aaron Nygren Interconnect Redundancy for Multi-Interconnect Device

Also Published As

Publication number Publication date
US9368451B1 (en) 2016-06-14
CN103219308A (zh) 2013-07-24
US20130168672A1 (en) 2013-07-04
JP2013145554A (ja) 2013-07-25
US8895981B2 (en) 2014-11-25
EP2610900A2 (en) 2013-07-03
EP2610900A3 (en) 2016-12-14
CN103219308B (zh) 2019-12-13

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