JP6344938B2 - 電子機器 - Google Patents

電子機器 Download PDF

Info

Publication number
JP6344938B2
JP6344938B2 JP2014058801A JP2014058801A JP6344938B2 JP 6344938 B2 JP6344938 B2 JP 6344938B2 JP 2014058801 A JP2014058801 A JP 2014058801A JP 2014058801 A JP2014058801 A JP 2014058801A JP 6344938 B2 JP6344938 B2 JP 6344938B2
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
cooling element
radiation detection
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2014058801A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015185596A5 (https=
JP2015185596A (ja
Inventor
大介 松浦
大介 松浦
能克 黒田
能克 黒田
恵 玄蕃
恵 玄蕃
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP2014058801A priority Critical patent/JP6344938B2/ja
Priority to EP15765100.1A priority patent/EP3093884B1/en
Priority to PCT/JP2015/058099 priority patent/WO2015141737A1/ja
Priority to US15/117,805 priority patent/US10002816B2/en
Publication of JP2015185596A publication Critical patent/JP2015185596A/ja
Publication of JP2015185596A5 publication Critical patent/JP2015185596A5/ja
Application granted granted Critical
Publication of JP6344938B2 publication Critical patent/JP6344938B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/20Arrangements for cooling
    • H10W40/22Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/10Artificial satellites; Systems of such satellites; Interplanetary vehicles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/46Arrangements or adaptations of devices for control of environment or living conditions
    • B64G1/50Arrangements or adaptations of devices for control of environment or living conditions for temperature control
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/46Arrangements or adaptations of devices for control of environment or living conditions
    • B64G1/50Arrangements or adaptations of devices for control of environment or living conditions for temperature control
    • B64G1/503Radiator panels
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/52Protection, safety or emergency devices; Survival aids
    • B64G1/54Protection against radiation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/52Protection, safety or emergency devices; Survival aids
    • B64G1/54Protection against radiation
    • B64G1/546Protection against radiation shielding electronic equipment
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/52Protection, safety or emergency devices; Survival aids
    • B64G1/58Thermal protection, e.g. heat shields
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/66Arrangements or adaptations of apparatus or instruments, not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0003Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
    • G01J5/0007Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter of wafers or semiconductor substrates, e.g. using Rapid Thermal Processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/244Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/85Complementary IGFETs, e.g. CMOS
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/20Arrangements for cooling
    • H10W40/28Arrangements for cooling comprising Peltier coolers
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F25REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
    • F25BREFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
    • F25B21/00Machines, plants or systems, using electric or magnetic effects
    • F25B21/02Machines, plants or systems, using electric or magnetic effects using Peltier effect; using Nernst-Ettinghausen effect
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F25REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
    • F25BREFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
    • F25B2321/00Details of machines, plants or systems, using electric or magnetic effects
    • F25B2321/02Details of machines, plants or systems, using electric or magnetic effects using Peltier effects; using Nernst-Ettinghausen effects
    • F25B2321/021Control thereof
    • F25B2321/0212Control thereof of electric power, current or voltage
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control

Landscapes

  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Remote Sensing (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Critical Care (AREA)
  • Emergency Medicine (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Environmental Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Astronomy & Astrophysics (AREA)
  • Thermal Sciences (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measurement Of Radiation (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
JP2014058801A 2014-03-20 2014-03-20 電子機器 Active JP6344938B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2014058801A JP6344938B2 (ja) 2014-03-20 2014-03-20 電子機器
EP15765100.1A EP3093884B1 (en) 2014-03-20 2015-03-18 Electronic device
PCT/JP2015/058099 WO2015141737A1 (ja) 2014-03-20 2015-03-18 電子機器
US15/117,805 US10002816B2 (en) 2014-03-20 2015-03-18 Electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014058801A JP6344938B2 (ja) 2014-03-20 2014-03-20 電子機器

Publications (3)

Publication Number Publication Date
JP2015185596A JP2015185596A (ja) 2015-10-22
JP2015185596A5 JP2015185596A5 (https=) 2017-02-23
JP6344938B2 true JP6344938B2 (ja) 2018-06-20

Family

ID=54144701

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014058801A Active JP6344938B2 (ja) 2014-03-20 2014-03-20 電子機器

Country Status (4)

Country Link
US (1) US10002816B2 (https=)
EP (1) EP3093884B1 (https=)
JP (1) JP6344938B2 (https=)
WO (1) WO2015141737A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108417571B (zh) * 2018-05-18 2024-08-13 北京时代华诺科技有限公司 一种mos控制晶闸管芯片
CN110617885B (zh) * 2019-09-27 2020-11-24 衢州光明电力投资集团有限公司 一种基于远红外线成像的电力设备测温方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5270551A (en) 1990-02-14 1993-12-14 Hitachi, Ltd. Method of and apparatus for protecting electronic circuit against radiation
JP3000688B2 (ja) * 1990-02-14 2000-01-17 株式会社日立製作所 電子回路の耐放射線保護装置及び人工衛星
US6173576B1 (en) * 1999-03-25 2001-01-16 Intel Corporation Cooling unit for an integrated circuit package
JP2002166898A (ja) * 2000-12-01 2002-06-11 Mitsubishi Heavy Ind Ltd 宇宙機器の冷却装置
JP5351796B2 (ja) 2010-02-22 2013-11-27 三菱重工業株式会社 半導体回路
CN102918578B (zh) * 2010-05-28 2015-10-14 Nec显示器解决方案株式会社 投影显示设备
US8957385B2 (en) * 2010-11-29 2015-02-17 Saint-Gobain Ceramics & Plastics, Inc. Radiation detection system, a radiation sensing unit, and methods of using the same

Also Published As

Publication number Publication date
US20170011984A1 (en) 2017-01-12
EP3093884B1 (en) 2020-01-29
EP3093884A4 (en) 2017-04-26
WO2015141737A1 (ja) 2015-09-24
US10002816B2 (en) 2018-06-19
JP2015185596A (ja) 2015-10-22
EP3093884A1 (en) 2016-11-16

Similar Documents

Publication Publication Date Title
JP5431994B2 (ja) 電流制限回路
JP5547429B2 (ja) 半導体装置
CN104425408B (zh) 用于3d ic的冷却系统
JP4843034B2 (ja) 温度センサ用リングオシレータ、温度センサ回路及びこれを備える半導体装置
JP6171599B2 (ja) 半導体装置及びその制御方法
US10985744B2 (en) Apparatus with integrated protection profile and method
US9875950B2 (en) Semiconductor device
US8514010B2 (en) Reference current generation circuit and power device using the same
JP2008533734A (ja) 温度感知機能を有するmosfet
US20130257329A1 (en) Junction temperature measurement of a power mosfet
CN104967095A (zh) 过温保护电路
US9472547B2 (en) Semiconductor device
Zhang et al. Temperature dependence of soft-error rates for FF designs in 20-nm bulk planar and 16-nm bulk FinFET technologies
JP6344938B2 (ja) 電子機器
JP6110615B2 (ja) リーク電流吸収回路、電圧生成回路、および電源装置
JP4752904B2 (ja) 温度測定回路、及び、方法
JP2014204003A (ja) 電力供給モジュール
JP6588229B2 (ja) 過熱保護回路並びにこれを用いた半導体集積回路装置及び車両
US9804628B2 (en) Reference voltage generator
TWI721045B (zh) 包含一基材及一第一溫度測量元件的半導體構件以及測定流經一半導體構件之電流的方法以及車輛用的控制單元
US12598988B2 (en) Integrated circuit device
JP2009038186A (ja) 半導体装置
CN103022026B (zh) 多芯片模块及其制造方法
US20140085758A1 (en) Integrated circuit device and method of enabling thermal regulation within an integrated circuit device

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170123

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170123

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20171115

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180111

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20180111

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180425

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180522

R150 Certificate of patent or registration of utility model

Ref document number: 6344938

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150