JP6341852B2 - 半導体装置及びそれを備えた半導体システム - Google Patents

半導体装置及びそれを備えた半導体システム Download PDF

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Publication number
JP6341852B2
JP6341852B2 JP2014266206A JP2014266206A JP6341852B2 JP 6341852 B2 JP6341852 B2 JP 6341852B2 JP 2014266206 A JP2014266206 A JP 2014266206A JP 2014266206 A JP2014266206 A JP 2014266206A JP 6341852 B2 JP6341852 B2 JP 6341852B2
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level
voltage
module
signal
circuit
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Japanese (ja)
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JP2016126488A5 (enExample
JP2016126488A (ja
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池永　佳史
佳史 池永
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Renesas Electronics Corp
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Renesas Electronics Corp
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Priority to JP2014266206A priority Critical patent/JP6341852B2/ja
Priority to US14/925,366 priority patent/US9819518B2/en
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Publication of JP2016126488A5 publication Critical patent/JP2016126488A5/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0264—Arrangements for coupling to transmission lines
    • H04L25/0272—Arrangements for coupling to multiple lines, e.g. for differential transmission

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Power Sources (AREA)
JP2014266206A 2014-12-26 2014-12-26 半導体装置及びそれを備えた半導体システム Active JP6341852B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014266206A JP6341852B2 (ja) 2014-12-26 2014-12-26 半導体装置及びそれを備えた半導体システム
US14/925,366 US9819518B2 (en) 2014-12-26 2015-10-28 Semiconductor device, semiconductor system including the same, and control method of semiconductor device

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JP2014266206A JP6341852B2 (ja) 2014-12-26 2014-12-26 半導体装置及びそれを備えた半導体システム

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JP2016126488A JP2016126488A (ja) 2016-07-11
JP2016126488A5 JP2016126488A5 (enExample) 2017-07-06
JP6341852B2 true JP6341852B2 (ja) 2018-06-13

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US (1) US9819518B2 (enExample)
JP (1) JP6341852B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10839730B2 (en) 2018-10-18 2020-11-17 Samsung Display Co., Ltd. Communication device, display device test system using the same, and display device test method using the communication device

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107077442A (zh) * 2014-11-14 2017-08-18 瑞萨电子株式会社 半导体器件及其控制方法
JP6341852B2 (ja) * 2014-12-26 2018-06-13 ルネサスエレクトロニクス株式会社 半導体装置及びそれを備えた半導体システム
JPWO2022224815A1 (enExample) 2021-04-19 2022-10-27
US11824534B2 (en) 2021-11-16 2023-11-21 Xilinx, Inc. Transmit driver architecture with a jtag configuration mode, extended equalization range, and multiple power supply domains

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010055472A (ja) * 2008-08-29 2010-03-11 Internatl Business Mach Corp <Ibm> シリアルバスシステム、ハングアップスレーブ特定方法及びハングアップスレーブ特定プログラム
JP2010154615A (ja) 2008-12-24 2010-07-08 Toshiba Lighting & Technology Corp 電源電圧供給システム
JP2010183533A (ja) * 2009-02-09 2010-08-19 Toshiba Corp 半導体集積装置
US9124557B2 (en) * 2010-05-20 2015-09-01 Kandou Labs, S.A. Methods and systems for chip-to-chip communication with reduced simultaneous switching noise
US9000675B2 (en) * 2010-09-21 2015-04-07 Avago Technologies General Ip (Singapore) Pte. Ltd. Transmitting and receiving digital and analog signals across an isolator
GB2497967B (en) * 2011-12-23 2018-02-21 Reinhausen Maschf Scheubeck Fault-tolerant control systems
JP5912808B2 (ja) * 2012-04-25 2016-04-27 ルネサスエレクトロニクス株式会社 半導体装置
KR20130132169A (ko) * 2012-05-25 2013-12-04 페어차일드코리아반도체 주식회사 스위치 제어 장치, 이를 포함하는 전력 공급 장치, 및 그 구동 방법
JP6341852B2 (ja) * 2014-12-26 2018-06-13 ルネサスエレクトロニクス株式会社 半導体装置及びそれを備えた半導体システム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10839730B2 (en) 2018-10-18 2020-11-17 Samsung Display Co., Ltd. Communication device, display device test system using the same, and display device test method using the communication device

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US9819518B2 (en) 2017-11-14
JP2016126488A (ja) 2016-07-11
US20160191044A1 (en) 2016-06-30

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