JP6336735B2 - 外観検査装置 - Google Patents

外観検査装置 Download PDF

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Publication number
JP6336735B2
JP6336735B2 JP2013233158A JP2013233158A JP6336735B2 JP 6336735 B2 JP6336735 B2 JP 6336735B2 JP 2013233158 A JP2013233158 A JP 2013233158A JP 2013233158 A JP2013233158 A JP 2013233158A JP 6336735 B2 JP6336735 B2 JP 6336735B2
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JP
Japan
Prior art keywords
mirror
inspection
inspection object
transport
area sensor
Prior art date
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Active
Application number
JP2013233158A
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English (en)
Japanese (ja)
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JP2015094621A (ja
Inventor
晋也 松田
晋也 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daiichi Jitsugyo Viswill Co Ltd
Original Assignee
Daiichi Jitsugyo Viswill Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daiichi Jitsugyo Viswill Co Ltd filed Critical Daiichi Jitsugyo Viswill Co Ltd
Priority to JP2013233158A priority Critical patent/JP6336735B2/ja
Priority to KR1020140151958A priority patent/KR102246301B1/ko
Priority to CN201410643914.XA priority patent/CN104634264B/zh
Publication of JP2015094621A publication Critical patent/JP2015094621A/ja
Application granted granted Critical
Publication of JP6336735B2 publication Critical patent/JP6336735B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9508—Capsules; Tablets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N2021/8592—Grain or other flowing solid samples

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2013233158A 2013-11-11 2013-11-11 外観検査装置 Active JP6336735B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013233158A JP6336735B2 (ja) 2013-11-11 2013-11-11 外観検査装置
KR1020140151958A KR102246301B1 (ko) 2013-11-11 2014-11-04 외관 검사 장치
CN201410643914.XA CN104634264B (zh) 2013-11-11 2014-11-11 外观检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013233158A JP6336735B2 (ja) 2013-11-11 2013-11-11 外観検査装置

Publications (2)

Publication Number Publication Date
JP2015094621A JP2015094621A (ja) 2015-05-18
JP6336735B2 true JP6336735B2 (ja) 2018-06-06

Family

ID=53197119

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013233158A Active JP6336735B2 (ja) 2013-11-11 2013-11-11 外観検査装置

Country Status (3)

Country Link
JP (1) JP6336735B2 (zh)
KR (1) KR102246301B1 (zh)
CN (1) CN104634264B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6524803B2 (ja) * 2015-06-02 2019-06-05 三星ダイヤモンド工業株式会社 ブレイクシステム
JP6815162B2 (ja) * 2016-10-20 2021-01-20 株式会社日立製作所 溶接監視システムおよび溶接監視方法
CN109997049A (zh) * 2016-11-29 2019-07-09 精工爱普生株式会社 电子元件输送装置以及电子元件检查装置
JP6450815B1 (ja) * 2017-08-24 2019-01-09 Ckd株式会社 外観検査装置及びブリスター包装機
US10427882B2 (en) * 2017-11-28 2019-10-01 John Bean Technologies Corporation Conveyor belt support system
FR3076619B1 (fr) * 2018-01-05 2020-01-24 Tiama Procede, dispositif et ligne d'inspection pour determiner la geometrie tridimensionnelle d'une surface de bague de recipient
EP3862749A4 (en) * 2018-10-01 2022-07-13 System Square Inc. TRAINING DATA GENERATION DEVICE AND TRAINING DATA GENERATION SYSTEM
JP7246938B2 (ja) * 2019-01-18 2023-03-28 第一実業ビスウィル株式会社 検査装置
CN113347891B (zh) * 2019-01-28 2023-08-29 湖北长松食品有限公司 一种九蒸九晒过程中控制芝麻均匀分布的方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63229310A (ja) * 1987-03-18 1988-09-26 Fujitsu Ltd パタ−ン検査装置
JP3887809B2 (ja) * 1998-03-26 2007-02-28 アイシン精機株式会社 撮像装置
US6369401B1 (en) * 1999-09-10 2002-04-09 Agri-Tech, Inc. Three-dimensional optical volume measurement for objects to be categorized
JP3640247B2 (ja) * 2002-06-21 2005-04-20 シーケーディ株式会社 錠剤の外観検査装置及びｐｔｐ包装機
JP2010014735A (ja) * 2009-10-20 2010-01-21 Daiichi Jitsugyo Viswill Co Ltd 外観検査装置
JP5654486B2 (ja) * 2009-12-11 2015-01-14 第一実業ビスウィル株式会社 外観検査装置
JP5563372B2 (ja) * 2010-05-20 2014-07-30 第一実業ビスウィル株式会社 外観検査装置
DE102011104550B4 (de) * 2011-06-17 2014-04-30 Precitec Kg Optische Messvorrichtung zur Überwachung einer Fügenaht, Fügekopf und Laserschweißkopf mit der selben
JP2013172038A (ja) * 2012-02-21 2013-09-02 Panasonic Corp 部品実装装置、撮像装置および撮像方法

Also Published As

Publication number Publication date
KR102246301B1 (ko) 2021-04-29
CN104634264B (zh) 2019-03-29
JP2015094621A (ja) 2015-05-18
KR20150054663A (ko) 2015-05-20
CN104634264A (zh) 2015-05-20

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