JP6320436B2 - 撮像装置および撮像方法 - Google Patents

撮像装置および撮像方法 Download PDF

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Publication number
JP6320436B2
JP6320436B2 JP2016005827A JP2016005827A JP6320436B2 JP 6320436 B2 JP6320436 B2 JP 6320436B2 JP 2016005827 A JP2016005827 A JP 2016005827A JP 2016005827 A JP2016005827 A JP 2016005827A JP 6320436 B2 JP6320436 B2 JP 6320436B2
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JP
Japan
Prior art keywords
light
imaging
image
sample container
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2016005827A
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English (en)
Japanese (ja)
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JP2017125789A (ja
Inventor
小林　正嘉
正嘉 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Screen Holdings Co Ltd
Original Assignee
Screen Holdings Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Screen Holdings Co Ltd filed Critical Screen Holdings Co Ltd
Priority to JP2016005827A priority Critical patent/JP6320436B2/ja
Priority to PCT/JP2016/080362 priority patent/WO2017122401A1/ja
Priority to TW105133936A priority patent/TWI641824B/zh
Publication of JP2017125789A publication Critical patent/JP2017125789A/ja
Application granted granted Critical
Publication of JP6320436B2 publication Critical patent/JP6320436B2/ja
Active legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B15/00—Special procedures for taking photographs; Apparatus therefor
    • G03B15/02—Illuminating scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/75—Circuitry for compensating brightness variation in the scene by influencing optical camera components

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Optics & Photonics (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Studio Devices (AREA)
JP2016005827A 2016-01-15 2016-01-15 撮像装置および撮像方法 Active JP6320436B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016005827A JP6320436B2 (ja) 2016-01-15 2016-01-15 撮像装置および撮像方法
PCT/JP2016/080362 WO2017122401A1 (ja) 2016-01-15 2016-10-13 撮像装置および撮像方法
TW105133936A TWI641824B (zh) 2016-01-15 2016-10-20 攝像裝置及攝像方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016005827A JP6320436B2 (ja) 2016-01-15 2016-01-15 撮像装置および撮像方法

Publications (2)

Publication Number Publication Date
JP2017125789A JP2017125789A (ja) 2017-07-20
JP6320436B2 true JP6320436B2 (ja) 2018-05-09

Family

ID=59311036

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016005827A Active JP6320436B2 (ja) 2016-01-15 2016-01-15 撮像装置および撮像方法

Country Status (3)

Country Link
JP (1) JP6320436B2 (zh)
TW (1) TWI641824B (zh)
WO (1) WO2017122401A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109643514B (zh) * 2016-08-26 2023-04-04 株式会社半导体能源研究所 显示装置及电子设备
CN109342370B (zh) * 2018-11-21 2021-06-22 深圳达闼科技控股有限公司 一种检测方法、相关装置及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5091466B2 (ja) * 2005-11-30 2012-12-05 国立大学法人浜松医科大学 観察装置
KR20080075123A (ko) * 2005-11-30 2008-08-14 가부시키가이샤 니콘 관찰장치
JP5018194B2 (ja) * 2007-04-06 2012-09-05 株式会社ニコン 観察装置
JP2010534837A (ja) * 2007-07-23 2010-11-11 リガク オートメイション インコーポレイテッド 顕微鏡対象物を検査するための装置用のコンピュータ制御可能なｌｅｄ光源
JP2010223676A (ja) * 2009-03-23 2010-10-07 Nikon Corp 観察装置

Also Published As

Publication number Publication date
JP2017125789A (ja) 2017-07-20
TW201734431A (zh) 2017-10-01
TWI641824B (zh) 2018-11-21
WO2017122401A1 (ja) 2017-07-20

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