JP6320436B2 - 撮像装置および撮像方法 - Google Patents
撮像装置および撮像方法 Download PDFInfo
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- JP6320436B2 JP6320436B2 JP2016005827A JP2016005827A JP6320436B2 JP 6320436 B2 JP6320436 B2 JP 6320436B2 JP 2016005827 A JP2016005827 A JP 2016005827A JP 2016005827 A JP2016005827 A JP 2016005827A JP 6320436 B2 JP6320436 B2 JP 6320436B2
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- light
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- 238000003384 imaging method Methods 0.000 title claims description 180
- 238000005286 illumination Methods 0.000 claims description 83
- 239000011295 pitch Substances 0.000 claims description 75
- 230000003287 optical effect Effects 0.000 claims description 51
- 238000000034 method Methods 0.000 claims description 23
- 230000000737 periodic effect Effects 0.000 claims description 22
- 230000008569 process Effects 0.000 claims description 17
- 230000008859 change Effects 0.000 claims description 16
- 238000012545 processing Methods 0.000 claims description 15
- 238000001914 filtration Methods 0.000 claims description 11
- 239000004973 liquid crystal related substance Substances 0.000 claims description 8
- 230000000007 visual effect Effects 0.000 claims 2
- 210000004027 cell Anatomy 0.000 description 76
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 55
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B15/00—Special procedures for taking photographs; Apparatus therefor
- G03B15/02—Illuminating scene
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
- H04N23/75—Circuitry for compensating brightness variation in the scene by influencing optical camera components
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Optics & Photonics (AREA)
- Signal Processing (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Studio Devices (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016005827A JP6320436B2 (ja) | 2016-01-15 | 2016-01-15 | 撮像装置および撮像方法 |
PCT/JP2016/080362 WO2017122401A1 (ja) | 2016-01-15 | 2016-10-13 | 撮像装置および撮像方法 |
TW105133936A TWI641824B (zh) | 2016-01-15 | 2016-10-20 | 攝像裝置及攝像方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016005827A JP6320436B2 (ja) | 2016-01-15 | 2016-01-15 | 撮像装置および撮像方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017125789A JP2017125789A (ja) | 2017-07-20 |
JP6320436B2 true JP6320436B2 (ja) | 2018-05-09 |
Family
ID=59311036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016005827A Active JP6320436B2 (ja) | 2016-01-15 | 2016-01-15 | 撮像装置および撮像方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6320436B2 (zh) |
TW (1) | TWI641824B (zh) |
WO (1) | WO2017122401A1 (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109643514B (zh) * | 2016-08-26 | 2023-04-04 | 株式会社半导体能源研究所 | 显示装置及电子设备 |
CN109342370B (zh) * | 2018-11-21 | 2021-06-22 | 深圳达闼科技控股有限公司 | 一种检测方法、相关装置及存储介质 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5091466B2 (ja) * | 2005-11-30 | 2012-12-05 | 国立大学法人浜松医科大学 | 観察装置 |
KR20080075123A (ko) * | 2005-11-30 | 2008-08-14 | 가부시키가이샤 니콘 | 관찰장치 |
JP5018194B2 (ja) * | 2007-04-06 | 2012-09-05 | 株式会社ニコン | 観察装置 |
JP2010534837A (ja) * | 2007-07-23 | 2010-11-11 | リガク オートメイション インコーポレイテッド | 顕微鏡対象物を検査するための装置用のコンピュータ制御可能なled光源 |
JP2010223676A (ja) * | 2009-03-23 | 2010-10-07 | Nikon Corp | 観察装置 |
-
2016
- 2016-01-15 JP JP2016005827A patent/JP6320436B2/ja active Active
- 2016-10-13 WO PCT/JP2016/080362 patent/WO2017122401A1/ja active Application Filing
- 2016-10-20 TW TW105133936A patent/TWI641824B/zh active
Also Published As
Publication number | Publication date |
---|---|
JP2017125789A (ja) | 2017-07-20 |
TW201734431A (zh) | 2017-10-01 |
TWI641824B (zh) | 2018-11-21 |
WO2017122401A1 (ja) | 2017-07-20 |
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