JP6314148B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP6314148B2
JP6314148B2 JP2015538934A JP2015538934A JP6314148B2 JP 6314148 B2 JP6314148 B2 JP 6314148B2 JP 2015538934 A JP2015538934 A JP 2015538934A JP 2015538934 A JP2015538934 A JP 2015538934A JP 6314148 B2 JP6314148 B2 JP 6314148B2
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JP
Japan
Prior art keywords
sample
reading
automatic analyzer
container
disk
Prior art date
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Active
Application number
JP2015538934A
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English (en)
Japanese (ja)
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JPWO2015045461A1 (ja
Inventor
鈴木　直人
直人 鈴木
佳幸 田中
佳幸 田中
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Publication of JPWO2015045461A1 publication Critical patent/JPWO2015045461A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G01N2035/00742—Type of codes
    • G01N2035/00752—Type of codes bar codes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0441—Rotary sample carriers, i.e. carousels for samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0453—Multiple carousels working in parallel
    • G01N2035/0455—Coaxial carousels

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2015538934A 2013-09-30 2014-04-21 自動分析装置 Active JP6314148B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013202950 2013-09-30
JP2013202950 2013-09-30
PCT/JP2014/061120 WO2015045461A1 (ja) 2013-09-30 2014-04-21 自動分析装置

Publications (2)

Publication Number Publication Date
JPWO2015045461A1 JPWO2015045461A1 (ja) 2017-03-09
JP6314148B2 true JP6314148B2 (ja) 2018-04-18

Family

ID=52742621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015538934A Active JP6314148B2 (ja) 2013-09-30 2014-04-21 自動分析装置

Country Status (3)

Country Link
JP (1) JP6314148B2 (zh)
CN (1) CN105556314B (zh)
WO (1) WO2015045461A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108872618A (zh) * 2017-05-08 2018-11-23 北京普利生仪器有限公司 样本测试申请方法、样本分析仪、存储介质
JP6914799B2 (ja) * 2017-10-06 2021-08-04 日本電子株式会社 自動分析装置及び動作量補正方法
JP7054620B2 (ja) * 2017-12-05 2022-04-14 日本電子株式会社 自動分析装置および自動分析方法
EP3933410B1 (en) * 2019-03-01 2023-08-16 Hitachi High-Tech Corporation Automated analyzer
CN114556106A (zh) * 2019-12-13 2022-05-27 深圳迈瑞生物医疗电子股份有限公司 体外诊断设备、检验流水线和异常检测方法
CN118805087A (zh) 2022-03-07 2024-10-18 株式会社日立高新技术 自动分析装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03162672A (ja) * 1989-11-20 1991-07-12 Shimadzu Corp 自動分析装置の試料分注装置
JP2000258427A (ja) * 1999-03-12 2000-09-22 Toshiba Corp 検知装置及び当該検知装置を有する自動分析装置
JP4130905B2 (ja) * 2003-06-23 2008-08-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP2006292699A (ja) * 2005-04-15 2006-10-26 Hitachi High-Technologies Corp 自動分析装置
CN200965539Y (zh) * 2006-10-26 2007-10-24 深圳迈瑞生物医疗电子股份有限公司 支持条码扫描的样本盘结构
JP2008203007A (ja) * 2007-02-19 2008-09-04 Hitachi High-Technologies Corp 自動分析装置
JP2009210444A (ja) * 2008-03-05 2009-09-17 Hitachi High-Technologies Corp 自動分析装置
WO2010058736A1 (ja) * 2008-11-21 2010-05-27 株式会社日立ハイテクノロジーズ 自動分析装置
EP2367010A3 (en) * 2010-03-18 2015-09-09 Sysmex Corporation Sample analyzer
JP5548496B2 (ja) * 2010-03-25 2014-07-16 シスメックス株式会社 検体分析装置

Also Published As

Publication number Publication date
CN105556314B (zh) 2017-03-29
CN105556314A (zh) 2016-05-04
JPWO2015045461A1 (ja) 2017-03-09
WO2015045461A1 (ja) 2015-04-02

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