JP6304044B2 - 感放射線樹脂組成物および電子部品 - Google Patents
感放射線樹脂組成物および電子部品 Download PDFInfo
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- JP6304044B2 JP6304044B2 JP2014559797A JP2014559797A JP6304044B2 JP 6304044 B2 JP6304044 B2 JP 6304044B2 JP 2014559797 A JP2014559797 A JP 2014559797A JP 2014559797 A JP2014559797 A JP 2014559797A JP 6304044 B2 JP6304044 B2 JP 6304044B2
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- WUMSTCDLAYQDNO-UHFFFAOYSA-N triethoxy(hexyl)silane Chemical compound CCCCCC[Si](OCC)(OCC)OCC WUMSTCDLAYQDNO-UHFFFAOYSA-N 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 1
- NBXZNTLFQLUFES-UHFFFAOYSA-N triethoxy(propyl)silane Chemical compound CCC[Si](OCC)(OCC)OCC NBXZNTLFQLUFES-UHFFFAOYSA-N 0.000 description 1
- BOVWGKNFLVZRDU-UHFFFAOYSA-N triethoxy(trifluoromethyl)silane Chemical compound CCO[Si](OCC)(OCC)C(F)(F)F BOVWGKNFLVZRDU-UHFFFAOYSA-N 0.000 description 1
- SRPWOOOHEPICQU-UHFFFAOYSA-N trimellitic anhydride Chemical compound OC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 SRPWOOOHEPICQU-UHFFFAOYSA-N 0.000 description 1
- JLGNHOJUQFHYEZ-UHFFFAOYSA-N trimethoxy(3,3,3-trifluoropropyl)silane Chemical compound CO[Si](OC)(OC)CCC(F)(F)F JLGNHOJUQFHYEZ-UHFFFAOYSA-N 0.000 description 1
- HQYALQRYBUJWDH-UHFFFAOYSA-N trimethoxy(propyl)silane Chemical compound CCC[Si](OC)(OC)OC HQYALQRYBUJWDH-UHFFFAOYSA-N 0.000 description 1
- ORVBHOQTQDOUIW-UHFFFAOYSA-N trimethoxy(trifluoromethyl)silane Chemical compound CO[Si](OC)(OC)C(F)(F)F ORVBHOQTQDOUIW-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 150000003682 vanadium compounds Chemical class 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/0226—Quinonediazides characterised by the non-macromolecular additives
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/13—Phenols; Phenolates
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/16—Nitrogen-containing compounds
- C08K5/22—Compounds containing nitrogen bound to another nitrogen atom
- C08K5/27—Compounds containing a nitrogen atom bound to two other nitrogen atoms, e.g. diazoamino-compounds
- C08K5/28—Azides
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/36—Sulfur-, selenium-, or tellurium-containing compounds
- C08K5/37—Thiols
- C08K5/375—Thiols containing six-membered aromatic rings
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (3)
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JP2013019167 | 2013-02-04 | ||
JP2013019167 | 2013-02-04 | ||
PCT/JP2014/052408 WO2014119777A1 (ja) | 2013-02-04 | 2014-02-03 | 感放射線樹脂組成物および電子部品 |
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JPWO2014119777A1 JPWO2014119777A1 (ja) | 2017-01-26 |
JP6304044B2 true JP6304044B2 (ja) | 2018-04-04 |
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JP (1) | JP6304044B2 (ko) |
KR (1) | KR102217197B1 (ko) |
CN (1) | CN104969125B (ko) |
TW (1) | TWI632163B (ko) |
WO (1) | WO2014119777A1 (ko) |
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WO2016063909A1 (ja) * | 2014-10-24 | 2016-04-28 | 住友ベークライト株式会社 | 感光性接着剤組成物および半導体装置 |
JPWO2017038620A1 (ja) * | 2015-08-31 | 2018-06-14 | 日本ゼオン株式会社 | 樹脂組成物 |
US11467494B2 (en) * | 2019-03-15 | 2022-10-11 | Merck Patent Gmbh | Positive type photosensitive polysiloxane composition |
TW202422223A (zh) | 2019-10-15 | 2024-06-01 | 美商羅門哈斯電子材料有限公司 | 光致抗蝕劑組成物及圖案形成方法 |
WO2023176680A1 (ja) * | 2022-03-14 | 2023-09-21 | 株式会社Adeka | 組成物及び硬化物 |
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JP4222306B2 (ja) * | 2002-09-30 | 2009-02-12 | 日本ゼオン株式会社 | ポジ型感放射線性樹脂組成物、樹脂パターン膜とその形成方法、及び樹脂パターン膜の利用 |
JP4590893B2 (ja) * | 2004-03-23 | 2010-12-01 | Jsr株式会社 | 接着剤用液状硬化性樹脂組成物 |
JP2005292278A (ja) * | 2004-03-31 | 2005-10-20 | Nippon Zeon Co Ltd | 感放射線組成物、積層体及びその製造方法並びに電子部品 |
JP5589270B2 (ja) * | 2007-10-23 | 2014-09-17 | Jsr株式会社 | 青色カラーフィルタ用感放射線性組成物、カラーフィルタ及び液晶表示素子 |
KR101274384B1 (ko) * | 2008-06-20 | 2013-06-19 | 동우 화인켐 주식회사 | 청색 감광성 수지 조성물, 이를 이용한 컬러필터 및 액정표시장치 |
JP5306903B2 (ja) * | 2008-07-02 | 2013-10-02 | 富士フイルム株式会社 | インプリント用硬化性組成物、これを用いた硬化物およびその製造方法、並びに、液晶表示装置用部材 |
JP5476758B2 (ja) * | 2009-03-19 | 2014-04-23 | Jsr株式会社 | 感放射線性樹脂組成物、液晶表示素子の層間絶縁膜、保護膜及びスペーサーとその形成方法 |
KR20120089650A (ko) * | 2009-10-16 | 2012-08-13 | 제이에스알 가부시끼가이샤 | 감방사선성 수지 조성물 및 층간 절연막의 형성 방법 |
JP5716672B2 (ja) * | 2009-11-30 | 2015-05-13 | 日立化成株式会社 | 感光性樹脂組成物、感光性樹脂ワニス、感光性樹脂フィルム、及び感光性樹脂硬化物 |
JP2012212039A (ja) * | 2011-03-31 | 2012-11-01 | Sekisui Chem Co Ltd | 感光性組成物及びプリント配線板 |
TWI507819B (zh) * | 2011-03-31 | 2015-11-11 | Toyo Ink Sc Holdings Co Ltd | 著色組成物及用此之彩色濾光片 |
JP6010322B2 (ja) * | 2012-04-09 | 2016-10-19 | 株式会社カネカ | 硬化性組成物およびその用途 |
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- 2014-02-03 KR KR1020157023222A patent/KR102217197B1/ko active IP Right Grant
- 2014-02-03 WO PCT/JP2014/052408 patent/WO2014119777A1/ja active Application Filing
- 2014-02-03 JP JP2014559797A patent/JP6304044B2/ja active Active
- 2014-02-03 CN CN201480007070.8A patent/CN104969125B/zh active Active
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TW201439127A (zh) | 2014-10-16 |
KR102217197B1 (ko) | 2021-02-17 |
KR20150115832A (ko) | 2015-10-14 |
CN104969125A (zh) | 2015-10-07 |
JPWO2014119777A1 (ja) | 2017-01-26 |
WO2014119777A1 (ja) | 2014-08-07 |
CN104969125B (zh) | 2019-06-04 |
TWI632163B (zh) | 2018-08-11 |
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