JP6279234B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP6279234B2
JP6279234B2 JP2013137995A JP2013137995A JP6279234B2 JP 6279234 B2 JP6279234 B2 JP 6279234B2 JP 2013137995 A JP2013137995 A JP 2013137995A JP 2013137995 A JP2013137995 A JP 2013137995A JP 6279234 B2 JP6279234 B2 JP 6279234B2
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Japan
Prior art keywords
light source
source lamp
voltage
automatic analyzer
analysis
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JP2013137995A
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English (en)
Japanese (ja)
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JP2015010986A5 (enExample
JP2015010986A (ja
Inventor
良平 石神
良平 石神
悟郎 吉田
悟郎 吉田
中村　和弘
和弘 中村
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2013137995A priority Critical patent/JP6279234B2/ja
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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2013137995A 2013-07-01 2013-07-01 自動分析装置 Active JP6279234B2 (ja)

Priority Applications (1)

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JP2013137995A JP6279234B2 (ja) 2013-07-01 2013-07-01 自動分析装置

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JP2013137995A JP6279234B2 (ja) 2013-07-01 2013-07-01 自動分析装置

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JP2015010986A JP2015010986A (ja) 2015-01-19
JP2015010986A5 JP2015010986A5 (enExample) 2016-08-04
JP6279234B2 true JP6279234B2 (ja) 2018-02-14

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JP2013137995A Active JP6279234B2 (ja) 2013-07-01 2013-07-01 自動分析装置

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JP (1) JP6279234B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019171435A1 (ja) * 2018-03-05 2019-09-12 株式会社島津製作所 分析装置
WO2022196346A1 (ja) * 2021-03-16 2022-09-22 株式会社日立ハイテク 自動分析装置
JP7592541B2 (ja) * 2021-04-16 2024-12-02 株式会社日立ハイテク 自動分析装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0663976B2 (ja) * 1985-05-14 1994-08-22 コニカ株式会社 生化学分析装置
JPH0812149B2 (ja) * 1985-08-06 1996-02-07 日本テクトロン株式会社 光学測定装置におけるランプ光源の照射光量制御法
JP3445369B2 (ja) * 1994-07-26 2003-09-08 オリンパス光学工業株式会社 自動分析装置
JPH08278252A (ja) * 1995-04-06 1996-10-22 Toshiba Corp 自動化学分析装置
JPH10281978A (ja) * 1997-04-11 1998-10-23 Hitachi Ltd 自動分析装置
JP2003344266A (ja) * 2002-05-22 2003-12-03 Aloka Co Ltd 分析装置用光源
WO2006059705A1 (ja) * 2004-12-03 2006-06-08 Rohm Co., Ltd スイッチング電源およびその制御回路ならびにそれを用いた電子機器
JP2007127583A (ja) * 2005-11-07 2007-05-24 Toshiba Corp 自動分析装置
JP5148921B2 (ja) * 2007-05-24 2013-02-20 矢崎総業株式会社 ガス濃度測定装置及び光源駆動回路
US7928715B2 (en) * 2008-04-22 2011-04-19 Seiko Instruments Inc. Switching regulator

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