JP6274728B2 - 光干渉断層撮像装置およびその制御方法 - Google Patents

光干渉断層撮像装置およびその制御方法 Download PDF

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JP6274728B2
JP6274728B2 JP2013017662A JP2013017662A JP6274728B2 JP 6274728 B2 JP6274728 B2 JP 6274728B2 JP 2013017662 A JP2013017662 A JP 2013017662A JP 2013017662 A JP2013017662 A JP 2013017662A JP 6274728 B2 JP6274728 B2 JP 6274728B2
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eye
scanning
light
examined
focus position
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JP2014147504A5 (enExample
JP2014147504A (ja
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祐輝 下里
祐輝 下里
武藤　健二
健二 武藤
重秋 小野
重秋 小野
弘樹 内田
弘樹 内田
坂川　幸雄
幸雄 坂川
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Canon Inc
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Canon Inc
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JP2013017662A 2013-01-31 2013-01-31 光干渉断層撮像装置およびその制御方法 Expired - Fee Related JP6274728B2 (ja)

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JP2014147504A JP2014147504A (ja) 2014-08-21
JP2014147504A5 JP2014147504A5 (enExample) 2016-03-10
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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6606640B2 (ja) * 2015-04-10 2019-11-20 株式会社トーメーコーポレーション 眼科装置及びその制御方法
JP2019054981A (ja) * 2017-09-20 2019-04-11 キヤノン株式会社 検査装置、該検査装置の制御方法、及びプログラム
JP2019054982A (ja) * 2017-09-20 2019-04-11 キヤノン株式会社 検査装置、該検査装置の制御方法、及びプログラム
CN114668583B (zh) * 2022-05-30 2022-09-20 季华实验室 一种眼科激光手术治疗系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2390072C (en) * 2002-06-28 2018-02-27 Adrian Gh Podoleanu Optical mapping apparatus with adjustable depth resolution and multiple functionality
CA2595324C (en) * 2005-01-21 2015-08-11 Massachusetts Institute Of Technology Methods and apparatus for optical coherence tomography scanning
JP4996917B2 (ja) * 2006-12-26 2012-08-08 株式会社トプコン 光画像計測装置及び光画像計測装置を制御するプログラム
JP5448353B2 (ja) * 2007-05-02 2014-03-19 キヤノン株式会社 光干渉断層計を用いた画像形成方法、及び光干渉断層装置
JP5340636B2 (ja) * 2008-05-19 2013-11-13 株式会社トプコン 眼底観察装置
JP2010012109A (ja) * 2008-07-04 2010-01-21 Nidek Co Ltd 眼底撮影装置
JP5737830B2 (ja) * 2009-04-13 2015-06-17 キヤノン株式会社 光断層撮像装置及びその制御方法
JP5025715B2 (ja) * 2009-12-08 2012-09-12 キヤノン株式会社 断層画像撮影装置、画像処理装置、画像処理システム、画像処理装置の制御方法及びプログラム
JP5511437B2 (ja) * 2010-02-25 2014-06-04 株式会社ニデック 光断層像撮影装置
JP2012161382A (ja) * 2011-02-03 2012-08-30 Nidek Co Ltd 眼科装置
JP5917004B2 (ja) * 2011-03-10 2016-05-11 キヤノン株式会社 撮像装置及び撮像装置の制御方法
US9033510B2 (en) * 2011-03-30 2015-05-19 Carl Zeiss Meditec, Inc. Systems and methods for efficiently obtaining measurements of the human eye using tracking
JP5958027B2 (ja) * 2011-03-31 2016-07-27 株式会社ニデック 眼科用レーザ治療装置

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