JP6271404B2 - 接合方法、プログラム、コンピュータ記憶媒体、接合装置及び接合システム - Google Patents
接合方法、プログラム、コンピュータ記憶媒体、接合装置及び接合システム Download PDFInfo
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- JP6271404B2 JP6271404B2 JP2014240240A JP2014240240A JP6271404B2 JP 6271404 B2 JP6271404 B2 JP 6271404B2 JP 2014240240 A JP2014240240 A JP 2014240240A JP 2014240240 A JP2014240240 A JP 2014240240A JP 6271404 B2 JP6271404 B2 JP 6271404B2
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- H01L2224/8012—Aligning
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Description
Q1=Q2−ΔP ・・・(1)
ΔP=P1−P2 ・・・(2)
P1=Q2+P2−Q1 ・・・(3)
2 搬入出ステーション
3 処理ステーション
30 表面改質装置
40 表面親水化装置
41 接合装置
61 ウェハ搬送装置
70 制御部
120 温度調節部
160 上チャック
161 下チャック
171 上部撮像部
180 第1の下チャック移動部
181 下部撮像部
183 第2の下チャック移動部
200 押動部
201 アクチュエータ部
WU 上ウェハ
WL 下ウェハ
WT 重合ウェハ
Claims (13)
- 基板同士を接合する接合方法であって、
第1の基板を第1の保持部の下面で保持する第1の保持工程と、
温度調節部によって第2の基板の温度を第1の基板の温度より高く調節する温度調節工程と、
前記温度調節工程で温度調節された第2の基板を第2の保持部の上面で保持する第2の保持工程と、
前記第2の保持部に保持された第2の基板の複数の基準点を撮像部によって撮像し、当該複数の基準点の位置を測定した後、測定結果と所定の許容範囲とを比較して、第2の基板の状態を検査する検査工程と、
前記検査工程において第2の基板の状態が正常であると判定された場合、押動部材によって第1の基板の中心部を押圧し、当該第1の基板の中心部と第2の基板の中心部を当接させた状態で、第1の基板の中心部から外周部に向けて、第1の基板と第2の基板を順次接合する接合工程と、を有することを特徴とする、接合方法。 - 前記第1の保持工程と前記第2の保持工程の後であって前記検査工程の前に、第1の基板の複数の位置調節点を他の撮像部によって撮像すると共に、第2の基板の複数の位置調節点を前記撮像部によって撮像し、撮像結果に基づいて、移動部によって前記第1の保持部と前記第2の保持部を相対的に水平方向に移動させ、第1の基板と第2の基板の水平方向の位置を調節する位置調節工程をさらに有することを特徴とする、請求項1に記載の接合方法。
- 前記第1の保持工程と前記第2の保持工程の後、第1の基板の複数の基準点を他の撮像部によって撮像すると共に、第2の基板の複数の基準点を前記撮像部によって撮像し、撮像結果に基づいて、移動部によって前記第1の保持部と前記第2の保持部を相対的に水平方向に移動させ、第1の基板と第2の基板の水平方向の位置を調節する位置調節工程をさらに有し、
前記検査工程は、前記位置調節工程における第2の基板の複数の基準点の撮像結果を用いて行われ、
前記位置調節工程と前記検査工程は、並行して行われることを特徴とする、請求項1に記載の接合方法。 - 前記検査工程において第2の基板の状態が異常であると判定された場合、当該検査工程における第2の基板の複数の基準点の位置の測定結果に基づき、前記温度調節工程において前記温度調節部で調節する第2の基板の温度を補正することを特徴とする、請求項1〜3のいずれか一項に記載の接合方法。
- 前記検査工程において第2の基板の状態が異常であると判定された場合、当該第2の基板に対して、補正された温度で前記温度調節工程を再度行うことを特徴とする、請求項4に記載の接合方法。
- 請求項1〜5のいずれか一項に記載の接合方法を接合装置によって実行させるように、当該接合装置を制御する制御装置のコンピュータ上で動作するプログラム。
- 請求項6に記載のプログラムを格納した読み取り可能なコンピュータ記憶媒体。
- 基板同士を接合する接合装置であって、
下面に第1の基板を保持する第1の保持部と、
前記第1の保持部の下方に設けられ、上面に第2の基板を保持する第2の保持部と、
前記第1の保持部に設けられ、第1の基板の中心部を押圧する押動部材と、
第2の基板の温度調節を行う温度調節部と、
前記第2の保持部に保持された第2の基板を撮像する撮像部と、
第1の基板を前記第1の保持部の下面で保持する第1の保持工程と、前記温度調節部によって第2の基板の温度を第1の基板の温度より高く調節する温度調節工程と、前記温度調節工程で温度調節された第2の基板を前記第2の保持部の上面で保持する第2の保持工程と、前記第2の保持部に保持された第2の基板の複数の基準点を前記撮像部によって撮像し、当該複数の基準点の位置を測定した後、測定結果と所定の許容範囲とを比較して、第2の基板の状態を検査する検査工程と、前記検査工程において第2の基板の状態が正常であると判定された場合、前記押動部材によって第1の基板の中心部を押圧し、当該第1の基板の中心部と第2の基板の中心部を当接させた状態で、第1の基板の中心部から外周部に向けて、第1の基板と第2の基板を順次接合する接合工程と、を実行するように、前記第1の保持部、前記第2の保持部、前記押動部材、前記温度調節部及び前記撮像部を制御する制御部と、を有することを特徴とする、接合装置。 - 前記第1の保持部に保持された第1の基板を撮像する他の撮像部と、
前記第1の保持部と前記第2の保持部を相対的に水平方向に移動させる移動部と、をさらに有し、
前記制御部は、前記第1の保持工程と前記第2の保持工程の後であって前記検査工程の前に、第1の基板の複数の位置調節点を前記他の撮像部によって撮像すると共に、第2の基板の複数の位置調節点を前記撮像部によって撮像し、撮像結果に基づいて、前記移動部によって前記第1の保持部と前記第2の保持部を相対的に水平方向に移動させ、第1の基板と第2の基板の水平方向の位置を調節するように、前記撮像部、前記他の撮像部及び前記移動部を制御することを特徴とする、請求項8に記載の接合装置。 - 前記第1の保持部に保持された第1の基板を撮像する他の撮像部と、
前記第1の保持部と前記第2の保持部を相対的に水平方向に移動させる移動部と、をさらに有し、
前記制御部は、前記第1の保持工程と前記第2の保持工程の後、第1の基板の複数の基準点を前記他の撮像部によって撮像すると共に、第2の基板の複数の基準点を前記撮像部によって撮像し、撮像結果に基づいて、前記移動部によって前記第1の保持部と前記第2の保持部を相対的に水平方向に移動させ、第1の基板と第2の基板の水平方向の位置を調節する位置調節工程をさらに行い、前記検査工程が前記位置調節工程における第2の基板の複数の基準点の撮像結果を用いて行われ、前記位置調節工程と前記検査工程が並行して行われるように、前記撮像部、前記他の撮像部及び前記移動部を制御することを特徴とする、請求項8に記載の接合装置。 - 前記制御部は、前記検査工程において第2の基板の状態が異常であると判定された場合、当該検査工程における第2の基板の複数の基準点の位置の測定結果に基づき、前記温度調節工程において前記温度調節部で調節する第2の基板の温度を補正することを特徴とする、請求項8〜10のいずれか一項に記載の接合装置。
- 前記制御部は、前記検査工程において第2の基板の状態が異常であると判定された場合、当該第2の基板に対して、補正された温度で前記温度調節工程を再度行うように、前記温度調節部を制御することを特徴とする、請求項11に記載の接合装置。
- 請求項8〜12のいずれか一項に記載の接合装置を備えた接合システムであって、
前記接合装置を備えた処理ステーションと、
第1の基板、第2の基板又は第1の基板と第2の基板が接合された重合基板をそれぞれ複数保有可能で、且つ前記処理ステーションに対して第1の基板、第2の基板又は重合基板を搬入出する搬入出ステーションと、を備え、
前記処理ステーションは、
第1の基板又は第2の基板の接合される表面を改質する表面改質装置と、
前記表面改質装置で改質された第1の基板又は第2の基板の表面を親水化する表面親水化装置と、
前記表面改質装置、前記表面親水化装置及び前記接合装置に対して、第1の基板、第2の基板又は重合基板を搬送するための搬送装置と、を有し、
前記接合装置では、前記表面親水化装置で表面が親水化された第1の基板と第2の基板を接合することを特徴とする、接合システム。
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TW104138366A TWI600055B (zh) | 2014-11-27 | 2015-11-20 | 接合方法、電腦記錄媒體、接合裝置及接合系統 |
US14/950,281 US9741595B2 (en) | 2014-11-27 | 2015-11-24 | Bonding method, storage medium, bonding apparatus and bonding system |
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US10541223B2 (en) * | 2017-05-05 | 2020-01-21 | Kulicke And Soffa Industries, Inc. | Methods of operating a wire bonding machine to improve clamping of a substrate, and wire bonding machines |
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US11056356B1 (en) * | 2017-09-01 | 2021-07-06 | Intel Corporation | Fluid viscosity control during wafer bonding |
US10497667B2 (en) | 2017-09-26 | 2019-12-03 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus for bond wave propagation control |
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