JP6267530B2 - 露光装置、および物品の製造方法 - Google Patents
露光装置、および物品の製造方法 Download PDFInfo
- Publication number
- JP6267530B2 JP6267530B2 JP2014019768A JP2014019768A JP6267530B2 JP 6267530 B2 JP6267530 B2 JP 6267530B2 JP 2014019768 A JP2014019768 A JP 2014019768A JP 2014019768 A JP2014019768 A JP 2014019768A JP 6267530 B2 JP6267530 B2 JP 6267530B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- substrate
- exposure
- shot
- exposure apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/7026—Focusing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70641—Focus
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014019768A JP6267530B2 (ja) | 2014-02-04 | 2014-02-04 | 露光装置、および物品の製造方法 |
| US14/608,731 US9746789B2 (en) | 2014-02-04 | 2015-01-29 | Exposure apparatus, and method of manufacturing article |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014019768A JP6267530B2 (ja) | 2014-02-04 | 2014-02-04 | 露光装置、および物品の製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015149316A JP2015149316A (ja) | 2015-08-20 |
| JP2015149316A5 JP2015149316A5 (enExample) | 2017-03-16 |
| JP6267530B2 true JP6267530B2 (ja) | 2018-01-24 |
Family
ID=53754743
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014019768A Expired - Fee Related JP6267530B2 (ja) | 2014-02-04 | 2014-02-04 | 露光装置、および物品の製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US9746789B2 (enExample) |
| JP (1) | JP6267530B2 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6806509B2 (ja) * | 2016-09-15 | 2021-01-06 | キヤノン株式会社 | 露光装置及び物品の製造方法 |
| CA2962809C (en) * | 2017-03-31 | 2019-02-26 | Centre De Recherche Industrielle Du Quebec | System and method for color scanning a moving article |
| JP6882091B2 (ja) * | 2017-06-21 | 2021-06-02 | キヤノン株式会社 | 露光装置及び物品の製造方法 |
| JP7022611B2 (ja) * | 2018-02-06 | 2022-02-18 | キヤノン株式会社 | 露光装置の制御方法、露光装置、及び物品製造方法 |
| JP7137363B2 (ja) * | 2018-06-11 | 2022-09-14 | キヤノン株式会社 | 露光方法、露光装置、物品の製造方法及び計測方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09306833A (ja) * | 1996-03-14 | 1997-11-28 | Nikon Corp | 露光方法 |
| JP2008277468A (ja) * | 2007-04-27 | 2008-11-13 | Canon Inc | 露光装置及びデバイス製造方法 |
| JP2008288347A (ja) * | 2007-05-16 | 2008-11-27 | Canon Inc | 露光装置及びデバイス製造方法 |
| JP4953923B2 (ja) * | 2007-05-30 | 2012-06-13 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
| JP5084432B2 (ja) * | 2007-10-05 | 2012-11-28 | キヤノン株式会社 | 露光方法、露光装置およびデバイス製造方法 |
| JP2009186628A (ja) * | 2008-02-05 | 2009-08-20 | Ricoh Co Ltd | 電子線描画方法及び電子線描画装置 |
| JP2009302344A (ja) * | 2008-06-13 | 2009-12-24 | Canon Inc | 露光装置及びデバイス製造方法 |
| JP5498243B2 (ja) * | 2010-05-07 | 2014-05-21 | キヤノン株式会社 | 露光装置、露光方法及びデバイス製造方法 |
-
2014
- 2014-02-04 JP JP2014019768A patent/JP6267530B2/ja not_active Expired - Fee Related
-
2015
- 2015-01-29 US US14/608,731 patent/US9746789B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015149316A (ja) | 2015-08-20 |
| US9746789B2 (en) | 2017-08-29 |
| US20150220004A1 (en) | 2015-08-06 |
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Legal Events
| Date | Code | Title | Description |
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| A977 | Report on retrieval |
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| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
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| LAPS | Cancellation because of no payment of annual fees |