JP6255136B1 - ディスク装置用疑似フレキシャと、ディスク装置用電子回路のテスト方法 - Google Patents
ディスク装置用疑似フレキシャと、ディスク装置用電子回路のテスト方法 Download PDFInfo
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- 238000010998 test method Methods 0.000 title claims 3
- 239000004020 conductor Substances 0.000 claims abstract description 216
- 238000012360 testing method Methods 0.000 claims abstract description 97
- 239000010410 layer Substances 0.000 claims abstract description 86
- 239000002356 single layer Substances 0.000 claims abstract description 8
- 239000002184 metal Substances 0.000 claims description 67
- 229910052751 metal Inorganic materials 0.000 claims description 67
- 239000000758 substrate Substances 0.000 claims description 54
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 12
- 229910052802 copper Inorganic materials 0.000 claims description 12
- 239000010949 copper Substances 0.000 claims description 12
- 229910001220 stainless steel Inorganic materials 0.000 claims description 12
- 239000010935 stainless steel Substances 0.000 claims description 12
- 239000011347 resin Substances 0.000 claims description 8
- 229920005989 resin Polymers 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims description 3
- 238000013459 approach Methods 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 239000000725 suspension Substances 0.000 description 16
- 239000000523 sample Substances 0.000 description 14
- 230000007423 decrease Effects 0.000 description 10
- 239000004642 Polyimide Substances 0.000 description 5
- 229920001721 polyimide Polymers 0.000 description 5
- 239000003989 dielectric material Substances 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 229910000963 austenitic stainless steel Inorganic materials 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/48—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed
- G11B5/4806—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives
- G11B5/4846—Constructional details of the electrical connection between arm and support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/455—Arrangements for functional testing of heads; Measuring arrangements for heads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/48—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed
- G11B5/4806—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives
- G11B5/486—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives with provision for mounting or arranging electrical conducting means or circuits on or along the arm assembly
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/48—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed
- G11B5/4806—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives
- G11B5/484—Integrated arm assemblies, e.g. formed by material deposition or by etching from single piece of metal or by lamination of materials forming a single arm/suspension/head unit
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Supporting Of Heads In Record-Carrier Devices (AREA)
- Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Recording Or Reproducing By Magnetic Means (AREA)
Abstract
Description
Claims (15)
- 配線部を有するフレキシャ本体部と、前記配線部に導通するテストクーポンとを備えたディスク装置用疑似フレキシャであって、
前記テストクーポンが、
第1の金属からなる基板と、
電気絶縁性の樹脂からなり、第1の面と第2の面とを有し、前記第1の面が前記基板に重なる誘電体層と、
前記第1の金属とは電気抵抗値が異なる第2の金属からなり前記誘電体層の前記第2の面に配置された金属層と、
前記配線部の書込用導体に導通する一対の入力側端子部と、
検出位置に設けられた一対のプロービング用パッドと、
前記入力側端子部と前記プロービング用パッドとの間に形成された疑似素子回路とを有し、
前記疑似素子回路が、
前記第1の金属からなる第1のパターン導体と、前記第2の金属からなり前記誘電体層を間に挟んで前記第1のパターン導体と重なりかつ前記第1のパターン導体に接続された一対の第2のパターン導体と、を含む二層導体構造の主回路部と、
前記誘電体層に沿って配置された一対の線条導体を含み該線条導体がそれぞれ前記各第2のパターン導体と導通した一層導体構造の調整部と、
を具備したディスク装置用疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記第1の金属の電気抵抗値が前記第2の金属の電気抵抗値よりも大きい疑似フレキシャ。 - 請求項2に記載の疑似フレキシャにおいて、
前記第1の金属がステンレス鋼であり、前記第2の金属が銅である疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記線条導体が前記第1の金属からなり、該線条導体が前記誘電体層の前記第1の面に配置された疑似フレキシャ。 - 請求項4に記載の疑似フレキシャにおいて、
前記基板が、前記第1のパターン導体の周りに形成された第1の開口と、前記線条導体の周りに形成された第2の開口とを有した疑似フレキシャ。 - 請求項4に記載の疑似フレキシャにおいて、
前記誘電体層を厚さ方向に貫通する接続導体を有し、該接続導体を介して前記第2のパターン導体と前記線条導体とが互いに導通した疑似フレキシャ。 - 請求項4に記載の疑似フレキシャにおいて、
前記テストクーポンの前記基板と、前記第1のパターン導体と、前記線条導体とが、互いに共通の化学成分のステンレス鋼からなる疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記フレキシャ本体部が、前記第1の金属からなるメタルベースと、電気絶縁性の樹脂からなり前記メタルベース上に形成された絶縁層と、該絶縁層上に形成された前記配線部と、電気絶縁性の樹脂からなり前記配線部を覆うカバー層とを備えた疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記テストクーポンの前記基板が位置決め用の孔を有した疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記線条導体が前記第2のパターン導体と同じ銅からなり、該線条導体が前記誘電体層の前記第2の面に配置された疑似フレキシャ。 - 請求項10に記載の疑似フレキシャにおいて、
前記基板が前記線条導体に沿う開口を有した疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記入力側端子部と前記プロービング用パッドとの間において、前記主回路部が前記プロービング用パッドに近い側に配置され、前記調整部が前記入力側端子部に近い側に配置された疑似フレキシャ。 - 請求項12に記載の疑似フレキシャにおいて、
前記主回路部と前記プロービング用パッドとの間にフィルタ回路を備えた疑似フレキシャ。 - 請求項1に記載の疑似フレキシャにおいて、
前記入力側端子部と前記プロービング用パッドとの間において、前記主回路部が前記入力側端子部に近い側に配置され、前記調整部が前記プロービング用パッドに近い側に配置された疑似フレキシャ。 - ディスク装置用疑似フレキシャを用いる電子回路のテスト方法であって、
前記疑似フレキシャが、
入力側端子部とプロービング用パッドとの間に形成された疑似素子回路を有し、
前記疑似素子回路が主回路部と調整部とを含み、
前記主回路部は、第1の金属からなる第1のパターン導体と、前記第1の金属とは電気抵抗値が異なる第2の金属からなり誘電体層を間に挟んで前記第1のパターン導体と重なる第2のパターン導体とを有し、
前記調整部は、前記誘電体層に沿って配置されかつ前記第2のパターン導体と導通した一対の線条導体を有し、
前記入力側端子部から前記疑似素子回路にパルス信号を入力し、
前記プロービング用パッドにて検出された出力波形が目標波形に近付くように、前記主回路部のインダクタンス成分と抵抗成分を調整するとともに、前記調整部のインダクタンス成分と抵抗成分を調整したのち、
前記電子回路にテスト用のパルス信号を入力し、前記プロービング用パッドから出力された波形に基いて前記電子回路の電気的特性をテストするテスト方法。
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US15/340,582 | 2016-11-01 | ||
US15/340,582 US9841457B1 (en) | 2016-11-01 | 2016-11-01 | Pseudo flexure for disk drive and method of testing electronic circuit for disk drive |
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JP7109379B2 (ja) | 2016-05-18 | 2022-07-29 | ハッチンソン テクノロジー インコーポレイテッド | フレクシャ製造に使用するプロセスクーポン |
EP3982132A1 (en) * | 2020-10-12 | 2022-04-13 | AT & S Austria Technologie & Systemtechnik Aktiengesellschaft | Coupon for testing quality of related component carriers by automated quality test apparatus |
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JP2009181652A (ja) * | 2008-01-31 | 2009-08-13 | Fujitsu Ltd | ヘッド組立体 |
JP2013211074A (ja) * | 2012-03-30 | 2013-10-10 | Dainippon Printing Co Ltd | サスペンション用基板、サスペンション、素子付サスペンションおよびハードディスクドライブ |
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JP2009181652A (ja) * | 2008-01-31 | 2009-08-13 | Fujitsu Ltd | ヘッド組立体 |
JP2013211074A (ja) * | 2012-03-30 | 2013-10-10 | Dainippon Printing Co Ltd | サスペンション用基板、サスペンション、素子付サスペンションおよびハードディスクドライブ |
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CN108022602B (zh) | 2019-05-17 |
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