JP6230693B2 - マス・サイトメトリーのための試料分析 - Google Patents

マス・サイトメトリーのための試料分析 Download PDF

Info

Publication number
JP6230693B2
JP6230693B2 JP2016507962A JP2016507962A JP6230693B2 JP 6230693 B2 JP6230693 B2 JP 6230693B2 JP 2016507962 A JP2016507962 A JP 2016507962A JP 2016507962 A JP2016507962 A JP 2016507962A JP 6230693 B2 JP6230693 B2 JP 6230693B2
Authority
JP
Japan
Prior art keywords
ablation
injector
plume
laser
icp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2016507962A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016522887A (ja
JP2016522887A5 (enExample
Inventor
ロボダ アレクサンドル
ロボダ アレクサンドル
Original Assignee
フリューダイム カナダ インコーポレイテッド
フリューダイム カナダ インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by フリューダイム カナダ インコーポレイテッド, フリューダイム カナダ インコーポレイテッド filed Critical フリューダイム カナダ インコーポレイテッド
Publication of JP2016522887A publication Critical patent/JP2016522887A/ja
Publication of JP2016522887A5 publication Critical patent/JP2016522887A5/ja
Application granted granted Critical
Publication of JP6230693B2 publication Critical patent/JP6230693B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1404—Handling flow, e.g. hydrodynamic focusing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G01N15/1436—Optical arrangements the optical arrangement forming an integrated apparatus with the sample container, e.g. a flow cell
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/01—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1006—Investigating individual particles for cytology
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2016507962A 2013-04-17 2014-04-17 マス・サイトメトリーのための試料分析 Active JP6230693B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361812893P 2013-04-17 2013-04-17
US61/812,893 2013-04-17
PCT/CA2014/050387 WO2014169394A1 (en) 2013-04-17 2014-04-17 Sample analysis for mass cytometry

Publications (3)

Publication Number Publication Date
JP2016522887A JP2016522887A (ja) 2016-08-04
JP2016522887A5 JP2016522887A5 (enExample) 2017-06-01
JP6230693B2 true JP6230693B2 (ja) 2017-11-15

Family

ID=51730644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016507962A Active JP6230693B2 (ja) 2013-04-17 2014-04-17 マス・サイトメトリーのための試料分析

Country Status (8)

Country Link
US (6) US9589779B2 (enExample)
EP (2) EP2987177B1 (enExample)
JP (1) JP6230693B2 (enExample)
CN (1) CN105190829B (enExample)
CA (2) CA2895360C (enExample)
RU (1) RU2637795C2 (enExample)
SG (2) SG10201808165YA (enExample)
WO (1) WO2014169394A1 (enExample)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150134373A (ko) 2013-03-22 2015-12-01 에테하 취리히 레이저 어블레이션 셀
RU2637795C2 (ru) 2013-04-17 2017-12-07 Флуидигм Кэнада Инк. Анализ образцов для масс-цитометрии
JP6546177B2 (ja) 2013-09-13 2019-07-17 ザ ボード オブ トラスティーズ オブ ザ レランド スタンフォード ジュニア ユニバーシティー 質量タグ及び二次イオン質量分析計を用いた組織の多重化イメージング
GB201403625D0 (en) * 2014-02-28 2014-04-16 Asrepresented By The Sec Dep Of Health And Human Services The Multiplexed imaging of tissue samples by mass cytometry
EP3195346B1 (en) * 2014-09-18 2020-05-06 Universiteit Gent Laser ablation probe
EP4321852A3 (en) * 2014-12-29 2024-05-29 Fluidigm Canada Inc. Mass cytometry apparatus and methods
JP6757730B2 (ja) 2014-12-31 2020-09-23 フリューダイム カナダ インコーポレイテッド マスサイトメトリーによる分析用の構造化生体試料
WO2016126988A1 (en) * 2015-02-04 2016-08-11 Fluidigm Canada Inc. Laser enabled imaging mass cytometry
US9766224B2 (en) 2015-03-25 2017-09-19 The Board Of Trustees Of The Leland Stanford Junior University Single cell analysis using secondary ion mass spectrometry
CA2981496C (en) 2015-04-23 2023-09-05 The Board Of Trustees Of The Leland Stanford Junior University Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
EP3494591A1 (en) * 2016-08-02 2019-06-12 Fluidigm Canada Inc. Laser ablation system
JP2020506736A (ja) * 2016-12-22 2020-03-05 アドバンスト オステオトミー ツールズ − エーオーティー アーゲー レーザデバイスおよび組織特徴解析方法
US11092519B1 (en) * 2017-02-06 2021-08-17 Elemental Scientific Lasers, Llc System and method for automated sampling and analysis
JP7078382B2 (ja) * 2017-11-22 2022-05-31 藤太郎 今坂 飛行時間型質量分析装置及び質量分析方法
JP7146905B2 (ja) * 2018-04-18 2022-10-04 株式会社エス・テイ・ジャパン レーザーアブレーション装置および分析装置
CA3104126A1 (en) * 2018-06-18 2019-12-26 Fluidigm Canada Inc. High resolution imaging apparatus and method
US20210333173A1 (en) * 2018-09-10 2021-10-28 Fluidigm Canada Inc. High speed modulation sample imaging apparatus and method
CN118837275A (zh) 2018-09-10 2024-10-25 富鲁达加拿大公司 自动聚焦样本成像的设备、方法、系统和计算机程序产品
US11488816B2 (en) 2018-09-11 2022-11-01 Lg Energy Solution, Ltd. Interface unit
KR102577694B1 (ko) * 2018-09-11 2023-09-12 주식회사 엘지에너지솔루션 검출 감도 향상을 위한 레이저 탈착-dart-ms 시스템 및 이에 사용되는 인터페이스 유닛
US12345650B2 (en) 2018-10-29 2025-07-01 Standard Biotools Canada Inc. Inductively coupled plasma torch with reverse vortex flow and method of operation
CN109668818B (zh) * 2018-12-26 2024-07-12 宁波大学 基于激光烧蚀的细胞分析装置及方法
EP3911760A4 (en) * 2019-01-15 2022-10-12 Fluidigm Canada Inc. DIRECT IONIZATION IN IMAGING MASS SPECTROMETRY
EP3712923A1 (en) * 2019-03-18 2020-09-23 ETH Zurich Ion source for inductively coupled plasma mass spectrometry
CN114207775B (zh) 2019-05-15 2023-06-06 上海宸安生物科技有限公司 用于质谱法的样品输送装置
JP7624413B2 (ja) * 2019-06-18 2025-01-30 フリューダイム カナダ インコーポレイテッド 改良マスサイトメトリー
WO2021127657A1 (en) * 2019-12-20 2021-06-24 Fluidigm Canada Inc. Plasma and sampling geometries for imaging mass cytometry
WO2021168213A1 (en) * 2020-02-19 2021-08-26 Elemental Scientific Lasers, Llc Variable beam size via homqgenizer movement
EP3943197A1 (en) * 2020-07-20 2022-01-26 The Provost, Fellows, Scholars and other Members of Board of Trinity College Dublin Jet deposition using laser-produced dry aerosol
CA3193031A1 (en) 2020-09-18 2022-03-24 Fluidigm Canada Inc. Inductively coupled plasma based atomic analysis systems and methods
US11443933B1 (en) * 2020-10-30 2022-09-13 Agilent Technologies, Inc. Inductively coupled plasma mass spectrometry (ICP-MS) with ion trapping
JP2022131579A (ja) 2021-02-26 2022-09-07 キオクシア株式会社 分析装置および分析方法
JP2024511743A (ja) 2021-03-15 2024-03-15 ザ ガバニング カウンシル オブ ザ ユニバーシティ オブ トロント 標識レベルの制御を備えた金属標識ポリマーマイクロビーズ
CN113218846A (zh) * 2021-03-18 2021-08-06 上海交通大学 一种面向于单细胞质谱流式分析的icp装置
US20240203722A1 (en) * 2021-04-14 2024-06-20 Kimia Analytics Inc A system to generate a high yield of negative ions for icp-ms
AT525093B1 (de) * 2021-10-05 2022-12-15 Univ Wien Tech Vorrichtung zur Aufnahme eines Feststoff-Probenmaterials
CN116169008B (zh) * 2021-11-25 2026-04-07 中国科学院大连化学物理研究所 一种激光诱导冷电子中性后电离源
WO2024224612A1 (ja) * 2023-04-28 2024-10-31 株式会社 イアス レーザーアブレーションｉｃｐ分析方法及び分析装置

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4740692A (en) 1985-06-13 1988-04-26 Mitsubishi Denki Kabushiki Kaisha Laser mass spectroscopic analyzer and method
DE4108462C2 (de) * 1991-03-13 1994-10-13 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung zum Erzeugen von Ionen aus thermisch instabilen, nichtflüchtigen großen Molekülen
DE4200497A1 (de) 1992-01-10 1993-07-15 Bayer Ag Verfahren und vorrichtung zur schnellen identifizierung von kunststoffen mit hilfe der massenspektrometrie
JP2870364B2 (ja) * 1993-06-29 1999-03-17 日本鋼管株式会社 レーザー気化分析方法及び装置
US5526110A (en) 1994-07-08 1996-06-11 Iowa State University Research Foundation, Inc. In situ calibration of inductively coupled plasma-atomic emission and mass spectroscopy
US5777324A (en) 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
JPH11201945A (ja) * 1998-01-09 1999-07-30 Jeol Ltd レーザーアブレーション装置
US5965884A (en) * 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
EP1430508A1 (en) * 2001-09-17 2004-06-23 MDS Inc., doing business as MDS Sciex Method and apparatus for cooling and focusing ions
US6683277B1 (en) 2002-12-20 2004-01-27 Osram Opto Semiconductors Laser ablation nozzle assembly
EP1562042A3 (en) * 2004-01-22 2007-02-21 Ionalytics Corporation Method and apparatus for FAIMS for In-Line analysis of multiple samples
WO2005095942A1 (ja) 2004-03-30 2005-10-13 Riken レーザーアブレーションを用いた生体試料の分析方法およびその装置
US7180058B1 (en) * 2005-10-05 2007-02-20 Thermo Finnigan Llc LDI/MALDI source for enhanced spatial resolution
WO2008019492A1 (en) 2006-08-15 2008-02-21 Alexei Antonov Apparatus and method for elemental analysis of particles by mass spectrometry
CA2668410C (en) 2006-11-02 2017-05-16 Mitchell A. Winnik Particles containing detectable elemental code
CA2673912A1 (en) * 2006-12-29 2008-07-10 Scott D. Tanner Cell injector for flow cytometer having mass spectrometer detector and method for using same
US8174691B1 (en) * 2007-03-15 2012-05-08 Arkansas State University—Jonesboro Detection of a component of interest with an ultraviolet laser and method of using the same
US9079268B2 (en) * 2007-09-14 2015-07-14 Robert C. Fry Analytical laser ablation of solid samples for ICP, ICP-MS, and FAG-MS analysis
US8207494B2 (en) * 2008-05-01 2012-06-26 Indiana University Research And Technology Corporation Laser ablation flowing atmospheric-pressure afterglow for ambient mass spectrometry
US9383260B1 (en) * 2008-05-05 2016-07-05 Applied Spectra, Inc. Laser ablation analysis system
DE102008049833A1 (de) 2008-10-01 2010-04-22 Forschungszentrum Jülich GmbH Verfahren und Vorrichtung zur Durchführung einer quantitativen ortsaufgelösten Lokal- und Verteilunganalyse chemischer Elemente und in-situ Charakterisierung der ablatierten Oberflächenregionen
EP2391877B1 (en) * 2009-02-02 2019-05-15 Light Matter Interaction Inc. Soft ablative desorption method and system
DE102009016512B4 (de) * 2009-04-08 2011-05-12 Forschungszentrum Jülich GmbH Verfahren und Vorrichtung zur Durchführung einer quantitativen ortsaufgelösten Lokal- und Verteilungsanalyse chemischer Elemente und in-situ Charakterisierung der ablatierten Oberflächenregionen
US8319964B2 (en) * 2009-07-10 2012-11-27 University Of Florida Research Foundation, Inc. Method and apparatus to laser ablation—laser induced breakdown spectroscopy
DE202010010932U1 (de) * 2010-04-19 2011-10-07 Witec Wissenschaftliche Instrumente Und Technologie Gmbh Vorrichtung zur Abbildung einer Probenoberfläche
US8519330B2 (en) * 2010-10-01 2013-08-27 Ut-Battelle, Llc Systems and methods for laser assisted sample transfer to solution for chemical analysis
US8879064B2 (en) * 2011-12-23 2014-11-04 Electro Scientific Industries, Inc. Apparatus and method for transporting an aerosol
US8598488B2 (en) * 2011-12-23 2013-12-03 Electro Scientific Industries, Inc. Method and apparatus for adjusting radiation spot size
EP2948973A2 (en) * 2013-01-28 2015-12-02 Westfälische Wilhelms-Universität Münster Parallel elemental and molecular mass spectrometry analysis with laser ablation sampling
US20150357173A1 (en) * 2013-01-28 2015-12-10 Westfälische Wilhelms Universität Münster Laser ablation atmospheric pressure ionization mass spectrometry
CN105074419B (zh) * 2013-02-14 2019-02-01 伊雷克托科学工业股份有限公司 用于组成分析系统的雷射剥蚀单元和火炬系统
US20140268134A1 (en) * 2013-03-15 2014-09-18 Electro Scientific Industries, Inc. Laser sampling methods for reducing thermal effects
KR20150134373A (ko) 2013-03-22 2015-12-01 에테하 취리히 레이저 어블레이션 셀
RU2637795C2 (ru) 2013-04-17 2017-12-07 Флуидигм Кэнада Инк. Анализ образцов для масс-цитометрии
WO2016126988A1 (en) * 2015-02-04 2016-08-11 Fluidigm Canada Inc. Laser enabled imaging mass cytometry

Also Published As

Publication number Publication date
CA2895360A1 (en) 2014-10-23
EP2987177B1 (en) 2020-01-08
US9952132B2 (en) 2018-04-24
US11099116B2 (en) 2021-08-24
WO2014169394A1 (en) 2014-10-23
CN105190829B (zh) 2018-04-03
SG11201504874QA (en) 2015-07-30
US20190271630A1 (en) 2019-09-05
SG10201808165YA (en) 2018-10-30
US10241023B2 (en) 2019-03-26
US20160056031A1 (en) 2016-02-25
EP2987177A4 (en) 2016-11-30
US9589779B2 (en) 2017-03-07
US20170248507A1 (en) 2017-08-31
CN105190829A (zh) 2015-12-23
US20180306695A1 (en) 2018-10-25
EP2987177A1 (en) 2016-02-24
US10705006B2 (en) 2020-07-07
CA2895360C (en) 2023-05-02
US20200408662A1 (en) 2020-12-31
US20220178809A1 (en) 2022-06-09
JP2016522887A (ja) 2016-08-04
EP3690923A1 (en) 2020-08-05
US11630050B2 (en) 2023-04-18
RU2015123440A (ru) 2017-05-22
RU2637795C2 (ru) 2017-12-07
CA3191952A1 (en) 2014-10-23

Similar Documents

Publication Publication Date Title
US11630050B2 (en) Sample analysis for mass cytometry
CA2907483C (en) Laser ablation cell
US20160260598A1 (en) Laser enabled imaging mass cytometry
US10622199B2 (en) Laser ablation system
JP7698648B2 (ja) イメージングマスサイトメトリー用プラズマおよびサンプリングジオメトリー
TW201443415A (zh) 用於減少熱效應的雷射取樣方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20151029

RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7426

Effective date: 20151029

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170413

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170413

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20170413

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20170523

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20170530

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170829

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20170919

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20171017

R150 Certificate of patent or registration of utility model

Ref document number: 6230693

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250