JP6219959B2 - 雑音検出および補正ルーチン - Google Patents
雑音検出および補正ルーチン Download PDFInfo
- Publication number
- JP6219959B2 JP6219959B2 JP2015532069A JP2015532069A JP6219959B2 JP 6219959 B2 JP6219959 B2 JP 6219959B2 JP 2015532069 A JP2015532069 A JP 2015532069A JP 2015532069 A JP2015532069 A JP 2015532069A JP 6219959 B2 JP6219959 B2 JP 6219959B2
- Authority
- JP
- Japan
- Prior art keywords
- noise
- delays
- touch
- sampling waveform
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/945—Proximity switches
- H03K17/955—Proximity switches using a capacitive detector
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0443—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a single layer of sensing electrodes
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0445—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using two or more layers of sensing electrodes, e.g. using two layers of electrodes separated by a dielectric layer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Human Computer Interaction (AREA)
- Position Input By Displaying (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261700399P | 2012-09-13 | 2012-09-13 | |
| US61/700,399 | 2012-09-13 | ||
| US14/025,143 | 2013-09-12 | ||
| US14/025,143 US9568526B2 (en) | 2012-09-13 | 2013-09-12 | Noise detection and correction routines |
| PCT/US2013/059630 WO2014043453A1 (en) | 2012-09-13 | 2013-09-13 | Noise detection and correction routines |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015528616A JP2015528616A (ja) | 2015-09-28 |
| JP2015528616A5 JP2015528616A5 (enExample) | 2016-10-27 |
| JP6219959B2 true JP6219959B2 (ja) | 2017-10-25 |
Family
ID=50234181
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015532069A Active JP6219959B2 (ja) | 2012-09-13 | 2013-09-13 | 雑音検出および補正ルーチン |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9568526B2 (enExample) |
| EP (1) | EP2895943B1 (enExample) |
| JP (1) | JP6219959B2 (enExample) |
| KR (1) | KR102151672B1 (enExample) |
| CN (1) | CN104685457B (enExample) |
| TW (1) | TWI616796B (enExample) |
| WO (1) | WO2014043453A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI484396B (zh) * | 2013-04-16 | 2015-05-11 | Ene Technology Inc | A method for filtering an interference source and a touch sensing device |
| KR102098878B1 (ko) * | 2013-09-03 | 2020-04-08 | 엘지디스플레이 주식회사 | 터치 센서를 갖는 전자장치와 이의 구동 방법 |
| US9600121B2 (en) * | 2014-04-25 | 2017-03-21 | Synaptics Incorporated | Driving sensor electrodes for noise measurement |
| DE112014003074B4 (de) * | 2014-06-02 | 2021-01-14 | Mitsubishi Electric Corporation | Rauschenanalysevorrichtung, elektronisches Gerät und Rauschquellenidentifikationssystem |
| US9772725B2 (en) * | 2014-09-24 | 2017-09-26 | Synaptics Incorporated | Hybrid sensing to reduce latency |
| CN106249970B (zh) * | 2015-06-05 | 2020-11-27 | 恩智浦美国有限公司 | 具有噪声抑制的电容传感器 |
| US10444892B2 (en) * | 2015-10-07 | 2019-10-15 | Microchip Technology Incorporated | Capacitance measurement device with reduced noise |
| US9904412B2 (en) * | 2015-12-30 | 2018-02-27 | Synaptics Incorporated | Display noise subtraction via substantially orthogonal noise templates |
| US10466839B2 (en) * | 2016-03-30 | 2019-11-05 | Synaptics Incorporated | Dynamic differential algorithm for side touch signals |
| TWI588714B (zh) * | 2016-09-01 | 2017-06-21 | 友達光電股份有限公司 | 時序控制器及觸控面板的雜訊抑制方法 |
| US20190137549A1 (en) * | 2017-11-03 | 2019-05-09 | Velodyne Lidar, Inc. | Systems and methods for multi-tier centroid calculation |
| KR102566581B1 (ko) * | 2019-11-19 | 2023-08-11 | 알프스 알파인 가부시키가이샤 | 정전 용량식 센서, 정전 용량 검출 방법, 및 정전 용량 검출 프로그램 |
| TWI758978B (zh) * | 2020-11-30 | 2022-03-21 | 創意電子股份有限公司 | 時脈樹的修正裝置及其修正方法 |
| JP7752983B2 (ja) * | 2021-07-16 | 2025-10-14 | アルプスアルパイン株式会社 | 接触判定装置 |
| WO2025188353A1 (en) * | 2024-03-05 | 2025-09-12 | Microchip Technology Incorporated | Electronic device including a touch detection system and a noise detection system |
| CN120595959A (zh) | 2024-03-05 | 2025-09-05 | 微芯片技术股份有限公司 | 包括触摸检测系统和噪声检测系统的电子设备 |
| CN119935305B (zh) * | 2025-04-03 | 2025-06-27 | 青岛智腾微电子有限公司 | 基于多元数据融合处理的噪声传感器运行监测系统及方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04371916A (ja) * | 1991-06-20 | 1992-12-24 | Alps Electric Co Ltd | 液晶表示装置 |
| US5789689A (en) | 1997-01-17 | 1998-08-04 | Doidic; Michel | Tube modeling programmable digital guitar amplification system |
| JP2006079405A (ja) * | 2004-09-10 | 2006-03-23 | Oki Electric Ind Co Ltd | 情報処理装置、及び情報処理装置の制御方法 |
| KR20060133330A (ko) * | 2005-06-20 | 2006-12-26 | 삼성전자주식회사 | 터치 스크린이 내장된 액정 표시 장치 및 터치 스크린의신호 처리 방법 |
| JP2007208682A (ja) * | 2006-02-02 | 2007-08-16 | Matsushita Electric Ind Co Ltd | タッチパネル |
| US8279180B2 (en) * | 2006-05-02 | 2012-10-02 | Apple Inc. | Multipoint touch surface controller |
| US7825672B2 (en) * | 2006-06-19 | 2010-11-02 | Mrl Industries, Inc. | High accuracy in-situ resistance measurements methods |
| US8125441B2 (en) | 2006-11-20 | 2012-02-28 | Cypress Semiconductor Corporation | Discriminating among activation of multiple buttons |
| JP2009130730A (ja) * | 2007-11-26 | 2009-06-11 | Fujitsu Microelectronics Ltd | 2次元固体撮像素子、そのノイズ検出方法、補正方法およびプログラム |
| JP2010015262A (ja) * | 2008-07-01 | 2010-01-21 | Seiko Instruments Inc | 静電検出装置及び静電検出方法 |
| RU2011107306A (ru) * | 2009-06-29 | 2012-08-27 | Сони Корпорейшн (JP) | Емкостная сенсорная панель и дисплейное устройство с функцией обнаружения касания |
| TWI431520B (zh) * | 2009-08-14 | 2014-03-21 | Elan Microelectronics Corp | Front - end signal detectors and methods for improving the anti - noise capability of capacitive touch panels |
| CN201590059U (zh) * | 2009-09-27 | 2010-09-22 | 智点科技(深圳)有限公司 | 一种触控电路 |
| CN102725715B (zh) * | 2009-10-20 | 2016-11-09 | 谱瑞科技股份有限公司 | 减少触控屏幕控制器中的耦合噪声影响的方法和设备 |
| WO2011047698A1 (en) * | 2009-10-21 | 2011-04-28 | Verigy (Singapore) Pte. Ltd. | Apparatus comprising a recursive delayer and method for measuring a phase noise |
| KR20110091380A (ko) * | 2010-02-05 | 2011-08-11 | 삼성전자주식회사 | 터치 패널의 노이즈 보상 방법 및 장치 |
| US9391607B2 (en) * | 2010-04-22 | 2016-07-12 | Qualcomm Technologies, Inc. | Use of random sampling technique to reduce finger-coupled noise |
| WO2012027327A2 (en) | 2010-08-24 | 2012-03-01 | Cypress Semiconductor Corporation | Noise suppression circuits and methods for capacitance sensing systems |
| US20130268229A1 (en) * | 2012-04-04 | 2013-10-10 | Ridgetop Group, Inc. | Method for finding fault-to-failure signatures using ordered health states |
-
2013
- 2013-09-12 US US14/025,143 patent/US9568526B2/en active Active
- 2013-09-13 CN CN201380050670.8A patent/CN104685457B/zh active Active
- 2013-09-13 JP JP2015532069A patent/JP6219959B2/ja active Active
- 2013-09-13 WO PCT/US2013/059630 patent/WO2014043453A1/en not_active Ceased
- 2013-09-13 KR KR1020157009431A patent/KR102151672B1/ko active Active
- 2013-09-13 EP EP13767201.0A patent/EP2895943B1/en active Active
- 2013-09-13 TW TW102133310A patent/TWI616796B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2895943A1 (en) | 2015-07-22 |
| US20140074436A1 (en) | 2014-03-13 |
| CN104685457A (zh) | 2015-06-03 |
| EP2895943B1 (en) | 2020-07-15 |
| TWI616796B (zh) | 2018-03-01 |
| CN104685457B (zh) | 2018-03-20 |
| KR102151672B1 (ko) | 2020-10-16 |
| WO2014043453A1 (en) | 2014-03-20 |
| KR20150055026A (ko) | 2015-05-20 |
| US9568526B2 (en) | 2017-02-14 |
| JP2015528616A (ja) | 2015-09-28 |
| TW201428589A (zh) | 2014-07-16 |
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