JP2015528616A5 - - Google Patents

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Publication number
JP2015528616A5
JP2015528616A5 JP2015532069A JP2015532069A JP2015528616A5 JP 2015528616 A5 JP2015528616 A5 JP 2015528616A5 JP 2015532069 A JP2015532069 A JP 2015532069A JP 2015532069 A JP2015532069 A JP 2015532069A JP 2015528616 A5 JP2015528616 A5 JP 2015528616A5
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JP
Japan
Prior art keywords
noise
delays
sampling waveform
item
measurement
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JP2015532069A
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English (en)
Japanese (ja)
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JP6219959B2 (ja
JP2015528616A (ja
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Priority claimed from US14/025,143 external-priority patent/US9568526B2/en
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Publication of JP2015528616A publication Critical patent/JP2015528616A/ja
Publication of JP2015528616A5 publication Critical patent/JP2015528616A5/ja
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Publication of JP6219959B2 publication Critical patent/JP6219959B2/ja
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JP2015532069A 2012-09-13 2013-09-13 雑音検出および補正ルーチン Active JP6219959B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261700399P 2012-09-13 2012-09-13
US61/700,399 2012-09-13
US14/025,143 2013-09-12
US14/025,143 US9568526B2 (en) 2012-09-13 2013-09-12 Noise detection and correction routines
PCT/US2013/059630 WO2014043453A1 (en) 2012-09-13 2013-09-13 Noise detection and correction routines

Publications (3)

Publication Number Publication Date
JP2015528616A JP2015528616A (ja) 2015-09-28
JP2015528616A5 true JP2015528616A5 (enExample) 2016-10-27
JP6219959B2 JP6219959B2 (ja) 2017-10-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015532069A Active JP6219959B2 (ja) 2012-09-13 2013-09-13 雑音検出および補正ルーチン

Country Status (7)

Country Link
US (1) US9568526B2 (enExample)
EP (1) EP2895943B1 (enExample)
JP (1) JP6219959B2 (enExample)
KR (1) KR102151672B1 (enExample)
CN (1) CN104685457B (enExample)
TW (1) TWI616796B (enExample)
WO (1) WO2014043453A1 (enExample)

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US10444892B2 (en) * 2015-10-07 2019-10-15 Microchip Technology Incorporated Capacitance measurement device with reduced noise
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US20190137549A1 (en) * 2017-11-03 2019-05-09 Velodyne Lidar, Inc. Systems and methods for multi-tier centroid calculation
KR102566581B1 (ko) * 2019-11-19 2023-08-11 알프스 알파인 가부시키가이샤 정전 용량식 센서, 정전 용량 검출 방법, 및 정전 용량 검출 프로그램
TWI758978B (zh) * 2020-11-30 2022-03-21 創意電子股份有限公司 時脈樹的修正裝置及其修正方法
JP7752983B2 (ja) * 2021-07-16 2025-10-14 アルプスアルパイン株式会社 接触判定装置
WO2025188353A1 (en) * 2024-03-05 2025-09-12 Microchip Technology Incorporated Electronic device including a touch detection system and a noise detection system
CN120595959A (zh) 2024-03-05 2025-09-05 微芯片技术股份有限公司 包括触摸检测系统和噪声检测系统的电子设备
CN119935305B (zh) * 2025-04-03 2025-06-27 青岛智腾微电子有限公司 基于多元数据融合处理的噪声传感器运行监测系统及方法

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