JP6196787B2 - 画像形成装置、及びイメージングシステム - Google Patents

画像形成装置、及びイメージングシステム Download PDF

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Publication number
JP6196787B2
JP6196787B2 JP2013046193A JP2013046193A JP6196787B2 JP 6196787 B2 JP6196787 B2 JP 6196787B2 JP 2013046193 A JP2013046193 A JP 2013046193A JP 2013046193 A JP2013046193 A JP 2013046193A JP 6196787 B2 JP6196787 B2 JP 6196787B2
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Japan
Prior art keywords
signal
image forming
forming apparatus
pixels
frequency
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JP2013046193A
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English (en)
Japanese (ja)
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JP2014175819A5 (cg-RX-API-DMAC10.html
JP2014175819A (ja
Inventor
亮太 関口
亮太 関口
尾内　敏彦
敏彦 尾内
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2013046193A priority Critical patent/JP6196787B2/ja
Priority to US14/763,548 priority patent/US9961280B2/en
Priority to PCT/JP2014/055200 priority patent/WO2014136698A1/en
Priority to EP14712051.3A priority patent/EP2965115A1/en
Publication of JP2014175819A publication Critical patent/JP2014175819A/ja
Publication of JP2014175819A5 publication Critical patent/JP2014175819A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4913—Circuits for detection, sampling, integration or read-out
    • G01S7/4914—Circuits for detection, sampling, integration or read-out of detector arrays, e.g. charge-transfer gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618—Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Immunology (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2013046193A 2013-03-08 2013-03-08 画像形成装置、及びイメージングシステム Active JP6196787B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2013046193A JP6196787B2 (ja) 2013-03-08 2013-03-08 画像形成装置、及びイメージングシステム
US14/763,548 US9961280B2 (en) 2013-03-08 2014-02-25 Image forming apparatus and imaging system
PCT/JP2014/055200 WO2014136698A1 (en) 2013-03-08 2014-02-25 Image forming apparatus and imaging system
EP14712051.3A EP2965115A1 (en) 2013-03-08 2014-02-25 Image forming apparatus and imaging system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013046193A JP6196787B2 (ja) 2013-03-08 2013-03-08 画像形成装置、及びイメージングシステム

Publications (3)

Publication Number Publication Date
JP2014175819A JP2014175819A (ja) 2014-09-22
JP2014175819A5 JP2014175819A5 (cg-RX-API-DMAC10.html) 2016-04-28
JP6196787B2 true JP6196787B2 (ja) 2017-09-13

Family

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JP2013046193A Active JP6196787B2 (ja) 2013-03-08 2013-03-08 画像形成装置、及びイメージングシステム

Country Status (4)

Country Link
US (1) US9961280B2 (cg-RX-API-DMAC10.html)
EP (1) EP2965115A1 (cg-RX-API-DMAC10.html)
JP (1) JP6196787B2 (cg-RX-API-DMAC10.html)
WO (1) WO2014136698A1 (cg-RX-API-DMAC10.html)

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FR3010837B1 (fr) * 2013-09-17 2015-10-02 Commissariat Energie Atomique Capteur d'image terahertz
JP6424801B2 (ja) * 2014-11-19 2018-11-21 株式会社豊田中央研究所 レーザレーダ装置およびレーザレーダ装置の光受信方法
JP6544600B2 (ja) 2015-02-24 2019-07-17 国立大学法人 東京大学 動的高速高感度イメージング装置及びイメージング方法
WO2017073737A1 (ja) 2015-10-28 2017-05-04 国立大学法人東京大学 分析装置
CN113406004A (zh) 2016-08-15 2021-09-17 国立大学法人大阪大学 电磁波相位振幅生成装置、方法和非临时记录介质
WO2019116998A1 (ja) 2017-12-13 2019-06-20 キヤノン株式会社 テラヘルツ波カメラおよび検出モジュール
JP7288296B2 (ja) 2017-12-13 2023-06-07 キヤノン株式会社 テラヘルツ波カメラおよび検出モジュール
CN112638529B (zh) 2018-06-13 2023-05-30 新克赛特株式会社 细胞计数的方法和系统
US10897073B2 (en) * 2018-08-27 2021-01-19 Canon Kabushiki Kaisha Receiver for detecting a terahertz wave and image forming apparatus
JP7208032B2 (ja) * 2019-01-28 2023-01-18 キヤノン株式会社 半導体装置
CN109889215B (zh) * 2019-03-22 2023-09-26 创意银航(山东)技术有限公司 一种用于8mm波段的参数可调射频照射源
JP7301667B2 (ja) 2019-08-07 2023-07-03 キヤノン株式会社 検出装置および検出システム
JP7414428B2 (ja) * 2019-08-26 2024-01-16 キヤノン株式会社 発振器、照明装置、撮像装置および装置
JP7496111B2 (ja) * 2019-12-24 2024-06-06 国立大学法人東京工業大学 サブキャリア変調方式テラヘルツレーダー
WO2021132484A1 (ja) 2019-12-27 2021-07-01 シンクサイト株式会社 フローサイトメータ性能評価方法、及び標準粒子懸濁液
JPWO2021200960A1 (cg-RX-API-DMAC10.html) 2020-04-01 2021-10-07
CN121476024A (zh) 2020-04-01 2026-02-06 兴科尚株式会社 流式细胞仪

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DE4440613C1 (de) 1994-11-14 1996-07-25 Leica Ag Vorrichtung und Verfahren zur Detektion und Demodulation eines intensitätsmodulierten Strahlungsfeldes
JPH09197042A (ja) 1996-01-17 1997-07-31 Eikichi Yamashita ミリ波カメラ装置
US6525862B2 (en) 1996-10-30 2003-02-25 Photogen, Inc. Methods and apparatus for optical imaging
JP3481481B2 (ja) * 1998-12-24 2003-12-22 日本電気株式会社 フェーズドアレイアンテナおよびその製造方法
JP4368082B2 (ja) * 1999-06-21 2009-11-18 浜松ホトニクス株式会社 テラヘルツ波分光器
JP3650307B2 (ja) 2000-03-24 2005-05-18 独立行政法人科学技術振興機構 ２次元光ヘテロダイン走査検出システム
JP2002051357A (ja) * 2000-08-01 2002-02-15 Canon Inc 撮像素子及びそれを用いた撮像装置
JP3832441B2 (ja) 2002-04-08 2006-10-11 松下電工株式会社 強度変調光を用いた空間情報の検出装置
US6909094B2 (en) 2003-02-12 2005-06-21 Philip Norris Usa Inc. System and method for terahertz imaging using a single terahertz detector
JP5506258B2 (ja) * 2008-08-06 2014-05-28 キヤノン株式会社 整流素子
US9040922B2 (en) * 2009-06-03 2015-05-26 Koninklijke Philips N.V. THz frequency range antenna
CN103348235B (zh) 2011-02-10 2015-06-03 株式会社日立高新技术 异物检测装置和异物检测方法
GB201116518D0 (en) * 2011-09-23 2011-11-09 Isis Innovation Investigation of physical properties of an object

Also Published As

Publication number Publication date
WO2014136698A1 (en) 2014-09-12
US20150365611A1 (en) 2015-12-17
EP2965115A1 (en) 2016-01-13
US9961280B2 (en) 2018-05-01
JP2014175819A (ja) 2014-09-22

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