JP6132223B2 - 赤外線センサ - Google Patents
赤外線センサ Download PDFInfo
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- JP6132223B2 JP6132223B2 JP2011273208A JP2011273208A JP6132223B2 JP 6132223 B2 JP6132223 B2 JP 6132223B2 JP 2011273208 A JP2011273208 A JP 2011273208A JP 2011273208 A JP2011273208 A JP 2011273208A JP 6132223 B2 JP6132223 B2 JP 6132223B2
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- infrared sensor
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- 239000000758 substrate Substances 0.000 claims description 48
- 238000012545 processing Methods 0.000 claims description 40
- 238000000034 method Methods 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 description 6
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- 230000020169 heat generation Effects 0.000 description 5
- 210000002414 leg Anatomy 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000005678 Seebeck effect Effects 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 210000001217 buttock Anatomy 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 229910000833 kovar Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0205—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0875—Windows; Arrangements for fastening thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J2005/065—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
Description
本実施形態にかかる赤外線センサ1は、赤外線Rを受光する赤外線センサ素子2と、赤外線センサ素子2の出力信号を信号処理するIC素子(信号処理部)3と、を備えており、赤外線センサ素子2およびIC素子3が基板4に実装されている。この赤外線センサ1は、赤外線を受光して、例えば、温度分布や熱源の有無などを検出するものである。
本実施形態にかかる赤外線センサ1Aが、上記第1実施形態と主に異なる点は、カバー7を、赤外線センサ素子2とIC素子3に対応する部分の間で段差状にしたことにある。
2 赤外線センサ素子
3 IC素子(信号処理部)
4 基板
5 ケース
6 結線部
7 カバー
55 窓部(開口部)
71a 下段
71b 上段
75 庇部
Claims (2)
- 赤外線を受光する赤外線センサ素子と、当該赤外線センサ素子の出力信号を処理する信号処理部と、前記赤外線センサ素子および前記信号処理部が並設された基板と、赤外線を前記赤外線センサ素子に入射させる開口部を有し、前記基板に取り付けられて前記赤外線センサ素子および前記信号処理部を覆うケースと、を備え、
前記赤外線センサ素子および前記信号処理部は、当該赤外線センサ素子および前記信号処理部の並設方向と交差する方向両側に設けられた結線部を介して前記基板に電気的に接続されており、
前記赤外線センサ素子および信号処理部の両方を覆うカバーが前記ケース内に設けられており、当該カバーは、前記基板における前記並設方向の両端部で当該基板に取り付けられ、
前記カバー内部の空間の体積は前記ケース内部の空間の体積よりも小さく、
前記ケースと前記カバーとが互いに当接しないように構成されていることを特徴とする赤外線センサ。 - 前記カバーは、前記信号処理部に対応する部位が下段となり、前記赤外線センサ素子に対応する部位が上段となる段差状に形成されていることを特徴とする請求項1に記載の赤外線センサ。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011273208A JP6132223B2 (ja) | 2011-12-14 | 2011-12-14 | 赤外線センサ |
PCT/JP2012/007559 WO2013088653A1 (ja) | 2011-12-14 | 2012-11-26 | 赤外線センサ |
TW101145025A TW201323841A (zh) | 2011-12-14 | 2012-11-30 | 紅外線感測器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011273208A JP6132223B2 (ja) | 2011-12-14 | 2011-12-14 | 赤外線センサ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013124907A JP2013124907A (ja) | 2013-06-24 |
JP6132223B2 true JP6132223B2 (ja) | 2017-05-24 |
Family
ID=48612132
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011273208A Active JP6132223B2 (ja) | 2011-12-14 | 2011-12-14 | 赤外線センサ |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6132223B2 (ja) |
TW (1) | TW201323841A (ja) |
WO (1) | WO2013088653A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102522699B1 (ko) * | 2015-09-08 | 2023-04-18 | 엘지이노텍 주식회사 | 온도 감지 장치 |
KR102633534B1 (ko) * | 2016-05-26 | 2024-02-06 | 엘지이노텍 주식회사 | 온도 센서 및 이를 포함하는 온도 감지 장치 |
US11430906B2 (en) * | 2018-07-26 | 2022-08-30 | Advanced Semiconductor Engineering, Inc. | Optical device including lid having first and second cavity with inclined sidewalls |
CN109708765A (zh) * | 2019-01-09 | 2019-05-03 | 上海烨映电子技术有限公司 | 一种红外线热电堆传感器元器件 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5973742A (ja) * | 1982-10-20 | 1984-04-26 | Sanyo Electric Co Ltd | 赤外線検出装置 |
JP2000331577A (ja) * | 1999-05-18 | 2000-11-30 | Omron Corp | 光電センサ並びにその製造方法 |
JP3743394B2 (ja) * | 2002-05-31 | 2006-02-08 | 株式会社村田製作所 | 赤外線センサおよびそれを用いた電子装置 |
DE10321639A1 (de) * | 2003-05-13 | 2004-12-02 | Heimann Sensor Gmbh | Infrarotsensor mit optimierter Flächennutzung |
JP2007101513A (ja) * | 2005-10-07 | 2007-04-19 | Seiko Npc Corp | 赤外線センサ |
JP2010169520A (ja) * | 2009-01-22 | 2010-08-05 | Nippon Ceramic Co Ltd | 焦電型赤外線検出器 |
JP5793679B2 (ja) * | 2009-12-18 | 2015-10-14 | パナソニックIpマネジメント株式会社 | 赤外線センサモジュール |
JP2011128066A (ja) * | 2009-12-18 | 2011-06-30 | Panasonic Electric Works Co Ltd | 赤外線センサモジュール |
JP5842118B2 (ja) * | 2010-06-24 | 2016-01-13 | パナソニックIpマネジメント株式会社 | 赤外線センサ |
-
2011
- 2011-12-14 JP JP2011273208A patent/JP6132223B2/ja active Active
-
2012
- 2012-11-26 WO PCT/JP2012/007559 patent/WO2013088653A1/ja active Application Filing
- 2012-11-30 TW TW101145025A patent/TW201323841A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2013088653A1 (ja) | 2013-06-20 |
TW201323841A (zh) | 2013-06-16 |
JP2013124907A (ja) | 2013-06-24 |
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