JP6125506B2 - 問題のある高度プロセス制御パラメータの検出及び訂正のための方法及びシステム - Google Patents
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Description
Claims (24)
- フィードバックプロセス制御システムを監視する方法であって、
半導体デバイス処理ラインの半導体ウェハ処理装置の調節と関連付けられた複数の適用プロセス制御パラメータを受け取るステップと、
半導体ウェハの複数の計測ターゲット位置においてオーバレイエラーを測定するステップと、
前記測定されたオーバレイエラーに基づいて、前記オーバレイエラーを訂正するための前記適用プロセス制御パラメータへの変更を示す測定パラメータの組を決定するステップと、
前記適用プロセス制御パラメータ及び前記測定パラメータに基づいて、訂正プロセス制御パラメータの組を決定するステップと、
前記測定パラメータと関連付けられた第1の統計パラメータの組及び前記訂正プロセス制御パラメータと関連付けられた第2の統計パラメータの組の少なくとも一方を決定するステップと、
前記第1の統計パラメータの組及び前記第2の統計パラメータの組の少なくとも一方を表示するステップと、
を含む、方法。 - 前記処理装置は、フォトリソグラフィスキャナ及びフォトリソグラフィステッパの少なくとも一方を含む、請求項1に記載の方法。
- 前記第1の統計パラメータの組及び前記第2の統計パラメータの組の少なくとも一方を示すグラフを計算および表示するステップをさらに含む、請求項1に記載の方法。
- 前記第1の統計パラメータの組は、前記測定パラメータの平均及び偏差の少なくとも一方を含む、請求項1に記載の方法。
- 前記第2の統計パラメータの組は、前記訂正プロセス制御パラメータの偏差を少なくとも含む、請求項1に記載の方法。
- 前記第1の統計パラメータの組は、共通の軸の組上に並んで表示された前記測定パラメータの正規化平均+偏差値を含むグラフを含む、請求項1に記載の方法。
- 前記第2の統計パラメータの組は、共通の軸の組上に並んで表示された前記訂正プロセス制御パラメータの偏差値を含むグラフを含む、請求項1に記載の方法。
- 前記訂正プロセス制御パラメータの前記偏差値はn×シグマ値を含み、シグマは標準偏差を示し、nはユーザによって予め設定された値である、請求項7に記載の方法。
- 前記適用プロセス制御パラメータは、平行移動パラメータ、回転パラメータ、倍率パラメータ、線量パラメータ及び焦点パラメータの少なくとも一方を含む、請求項1に記載の方法。
- 連続するウェハロットについて発生する適用プロセス制御パラメータ、測定パラメータ及び訂正プロセス制御パラメータのグラフを表示するステップをさらに含む、請求項1に記載の方法。
- 自己回帰重み付けパラメータの組を決定するステップと、
前記自己回帰重み付けパラメータ及び連続するウェハロットについて発生する前記測定パラメータに基づいて、前記訂正フィードバック制御パラメータを決定するステップと、をさらに含む、請求項1に記載の方法。 - 前記訂正フィードバック制御パラメータは、EWMAラムダ値を含む、請求項11に記載の方法。
- コンピュータ実行可能命令を有する、非一時的コンピュータ読み取り可能記憶媒体であって、前記コンピュータ実行可能命令により、コンピュータ制御装置は、フィードバックプロセス制御システムを監視する方法を実行し、前記方法は、
半導体デバイス処理ラインの半導体ウェハ処理装置の調節と関連付けられた複数の適用プロセス制御パラメータを受け取るステップと、
半導体ウェハの複数の計測ターゲット位置においてオーバレイエラーを測定するステップと、
前記測定されたオーバレイエラーに基づいて、前記オーバレイエラーを訂正するための前記適用プロセス制御パラメータへの変更を示す測定パラメータの組を決定するステップと、
前記適用プロセス制御パラメータ及び前記測定パラメータに基づいて訂正プロセス制御パラメータの組を決定するステップと、
前記測定パラメータと関連付けられた第1の統計パラメータの組及び前記訂正プロセス制御パラメータと関連付けられた第2の統計パラメータの組の少なくとも一方を決定するステップと、
前記第1の統計パラメータの組及び前記第2の統計パラメータの組の少なくとも一方を表示するステップと、
を含む、非一時的コンピュータ読み取り可能記憶媒体。 - 前記処理装置は、フォトリソグラフィスキャナ及びフォトリソグラフィステッパの少なくとも一方を含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記第1の統計パラメータの組及び前記第2の統計パラメータの組の少なくとも一方を示すグラフを計算及びグラフ化するステップをさらに含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記第1の統計パラメータの組は、前記測定パラメータの平均及び偏差の少なくとも一方を含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記第2の統計パラメータの組は、前記訂正プロセス制御パラメータの偏差を少なくとも含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記第1の統計パラメータの組は、共通の軸の組上に並んで表示された前記測定パラメータの正規化平均+偏差値を含むグラフを含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記第2の統計パラメータの組は、共通の軸の組上に並んで表示された前記訂正プロセス制御パラメータの偏差値を含むグラフを含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記訂正プロセス制御パラメータの前記偏差値はn×シグマ値を含み、シグマは標準偏差を示し、nはユーザによって予め設定された値である、請求項19に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 前記適用プロセス制御パラメータは、平行移動パラメータ、回転パラメータ、倍率パラメータ、線量パラメータ及び焦点パラメータの少なくとも一方を含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 連続するウェハロットについて発生する適用プロセス制御パラメータ、測定パラメータ及び訂正プロセス制御パラメータのグラフを表示するステップをさらに含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。
- 自己回帰重み付けパラメータの組を決定するステップと、
前記自己回帰重み付けパラメータ及び連続するウェハロットについて発生する前記測定パラメータに基づいて前記訂正フィードバック制御パラメータを決定するステップと、をさらに含む、請求項13に記載の非一時的コンピュータ読み取り可能記憶媒体。 - 前記訂正フィードバック制御パラメータは、EWMAラムダ値を含む、請求項23に記載の非一時的コンピュータ読み取り可能記憶媒体。
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US13/597,944 US10295993B2 (en) | 2011-09-01 | 2012-08-29 | Method and system for detecting and correcting problematic advanced process control parameters |
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PCT/US2012/053028 WO2013033322A1 (en) | 2011-09-01 | 2012-08-30 | Method and system for detecting and correcting problematic advanced process control parameters |
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