JP6112688B2 - ダイ供給装置調整システム及び調整用治具 - Google Patents
ダイ供給装置調整システム及び調整用治具 Download PDFInfo
- Publication number
- JP6112688B2 JP6112688B2 JP2015551304A JP2015551304A JP6112688B2 JP 6112688 B2 JP6112688 B2 JP 6112688B2 JP 2015551304 A JP2015551304 A JP 2015551304A JP 2015551304 A JP2015551304 A JP 2015551304A JP 6112688 B2 JP6112688 B2 JP 6112688B2
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- 238000003825 pressing Methods 0.000 claims description 34
- 230000007246 mechanism Effects 0.000 claims description 31
- 238000012545 processing Methods 0.000 claims description 20
- 238000012937 correction Methods 0.000 claims description 19
- 238000006073 displacement reaction Methods 0.000 claims description 16
- 238000001179 sorption measurement Methods 0.000 claims description 12
- 239000011148 porous material Substances 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 5
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000003860 storage Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000000007 visual effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2013/082385 WO2015083221A1 (fr) | 2013-12-02 | 2013-12-02 | Système de réglage de dispositif de fourniture de puce et gabarit de réglage |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2015083221A1 JPWO2015083221A1 (ja) | 2017-03-16 |
JP6112688B2 true JP6112688B2 (ja) | 2017-04-12 |
Family
ID=53273019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015551304A Active JP6112688B2 (ja) | 2013-12-02 | 2013-12-02 | ダイ供給装置調整システム及び調整用治具 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP6112688B2 (fr) |
WO (1) | WO2015083221A1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6752250B2 (ja) * | 2018-03-28 | 2020-09-09 | 東レエンジニアリング株式会社 | ツール高さ調整装置およびこれを備えたチップ部品転写装置 |
JP6872261B2 (ja) * | 2019-10-11 | 2021-05-19 | 上野精機株式会社 | 電子部品の処理装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2726651B2 (ja) * | 1996-04-22 | 1998-03-11 | 東京エレクトロン株式会社 | 不良素子へのマーキング方法 |
JP2006339211A (ja) * | 2005-05-31 | 2006-12-14 | Kawasaki Microelectronics Kk | 半導体装置ダイの選別方法及び半導体基板 |
JP5596929B2 (ja) * | 2009-02-12 | 2014-09-24 | 富士機械製造株式会社 | 突き上げピンの位置決め方法およびその方法を用いた電子部品供給装置 |
JP5892735B2 (ja) * | 2011-05-12 | 2016-03-23 | 富士機械製造株式会社 | 突き上げピンの位置補正方法 |
JP5800383B2 (ja) * | 2011-06-21 | 2015-10-28 | 富士機械製造株式会社 | 部品実装機 |
-
2013
- 2013-12-02 JP JP2015551304A patent/JP6112688B2/ja active Active
- 2013-12-02 WO PCT/JP2013/082385 patent/WO2015083221A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2015083221A1 (fr) | 2015-06-11 |
JPWO2015083221A1 (ja) | 2017-03-16 |
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