JP6104746B2 - 自動分析装置および分析方法 - Google Patents

自動分析装置および分析方法 Download PDF

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JP6104746B2
JP6104746B2 JP2013153092A JP2013153092A JP6104746B2 JP 6104746 B2 JP6104746 B2 JP 6104746B2 JP 2013153092 A JP2013153092 A JP 2013153092A JP 2013153092 A JP2013153092 A JP 2013153092A JP 6104746 B2 JP6104746 B2 JP 6104746B2
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JP2015021952A5 (enExample
JP2015021952A (ja
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安藤　学
学 安藤
飯島　昌彦
昌彦 飯島
創 山崎
創 山崎
佳幸 田中
佳幸 田中
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Hitachi High Tech Corp
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JP2013153092A 2013-07-23 2013-07-23 自動分析装置および分析方法 Active JP6104746B2 (ja)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102341445B (zh) * 2009-03-03 2013-07-03 积水化成品工业株式会社 用于长期保存的发泡性复合树脂颗粒、由其形成的预发泡颗粒和发泡模制品
US11237179B2 (en) 2017-10-31 2022-02-01 Canon Medical Systems Corporation Calibration curve generating method and automatic analyzing apparatus

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6657016B2 (ja) * 2016-05-27 2020-03-04 株式会社日立ハイテクノロジーズ 自動分析装置
JP6581726B2 (ja) 2016-07-19 2019-09-25 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法
CN111094993B (zh) * 2017-12-26 2021-10-22 株式会社日立高新技术 自动分析装置以及自动分析方法
CN111323393A (zh) * 2020-04-07 2020-06-23 宁波普瑞柏生物技术股份有限公司 一种联合散射比浊法和透射比浊法的测量方法
JP7420976B2 (ja) * 2020-12-22 2024-01-23 株式会社日立ハイテク 自動分析装置および分析方法

Family Cites Families (15)

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JPS60154161A (ja) * 1984-01-24 1985-08-13 Shimadzu Corp 免疫反応測定に使用する検量線の作成方法
JPS61247376A (ja) * 1985-04-26 1986-11-04 Hitachi Ltd 自動分析装置
JPH06331630A (ja) * 1993-05-25 1994-12-02 Daikin Ind Ltd キャリブレーション結果判定方法およびキャリブレーション結果処理方法
DE19948587A1 (de) * 1999-10-08 2001-04-12 Dade Behring Marburg Gmbh Spektralphotometrische und nephelometrische Detektionseinheit
JP3694449B2 (ja) * 1999-10-28 2005-09-14 松下電器産業株式会社 溶液濃度計測方法および溶液濃度計測装置
JP2001249134A (ja) * 1999-12-28 2001-09-14 Matsushita Electric Ind Co Ltd タンパク質濃度計測用試薬、これを用いたタンパク質濃度計測方法および尿検査方法
JP4287753B2 (ja) * 2004-01-19 2009-07-01 株式会社日立ハイテクノロジーズ 分析装置
JP2008122333A (ja) * 2006-11-15 2008-05-29 Toshiba Corp 自動分析装置及びその方法
JP5037439B2 (ja) * 2008-06-23 2012-09-26 株式会社堀場製作所 分析装置
JP2010032505A (ja) * 2008-06-30 2010-02-12 Arkray Inc 目的物質の検出方法、それに用いる検出試薬およびその用途
JP5599219B2 (ja) * 2010-04-20 2014-10-01 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法
JP5786188B2 (ja) * 2010-06-08 2015-09-30 株式会社シノテスト 試料中のｃ反応性蛋白質の測定試薬、測定方法及び測定範囲の拡大方法
JP2012242122A (ja) * 2011-05-16 2012-12-10 Hitachi High-Technologies Corp 自動分析装置及び自動分析プログラム
JP5860643B2 (ja) * 2011-09-08 2016-02-16 株式会社日立ハイテクノロジーズ 自動分析装置
JP5740264B2 (ja) * 2011-09-20 2015-06-24 株式会社日立ハイテクノロジーズ 自動分析装置及び分析方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102341445B (zh) * 2009-03-03 2013-07-03 积水化成品工业株式会社 用于长期保存的发泡性复合树脂颗粒、由其形成的预发泡颗粒和发泡模制品
US11237179B2 (en) 2017-10-31 2022-02-01 Canon Medical Systems Corporation Calibration curve generating method and automatic analyzing apparatus

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