JP6024949B2 - 穀粒外観測定装置 - Google Patents

穀粒外観測定装置 Download PDF

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Publication number
JP6024949B2
JP6024949B2 JP2012143709A JP2012143709A JP6024949B2 JP 6024949 B2 JP6024949 B2 JP 6024949B2 JP 2012143709 A JP2012143709 A JP 2012143709A JP 2012143709 A JP2012143709 A JP 2012143709A JP 6024949 B2 JP6024949 B2 JP 6024949B2
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Japan
Prior art keywords
grain
image
grains
area
measuring device
Prior art date
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JP2012143709A
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English (en)
Japanese (ja)
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JP2014006215A (ja
Inventor
秀昭 松島
秀昭 松島
裕樹 石突
裕樹 石突
宏明 竹内
宏明 竹内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Satake Corp
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Satake Corp
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Publication date
Priority to JP2012143709A priority Critical patent/JP6024949B2/ja
Application filed by Satake Corp filed Critical Satake Corp
Priority to US14/411,099 priority patent/US9607368B2/en
Priority to IN59KON2015 priority patent/IN2015KN00059A/en
Priority to EP13809865.2A priority patent/EP2869065A4/en
Priority to KR1020157002039A priority patent/KR102037560B1/ko
Priority to CN201380034156.5A priority patent/CN104428657B/zh
Priority to PCT/JP2013/063700 priority patent/WO2014002636A1/ja
Priority to TW102122192A priority patent/TWI585396B/zh
Publication of JP2014006215A publication Critical patent/JP2014006215A/ja
Application granted granted Critical
Publication of JP6024949B2 publication Critical patent/JP6024949B2/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B02—CRUSHING, PULVERISING, OR DISINTEGRATING; PREPARATORY TREATMENT OF GRAIN FOR MILLING
    • B02B—PREPARING GRAIN FOR MILLING; REFINING GRANULAR FRUIT TO COMMERCIAL PRODUCTS BY WORKING THE SURFACE
    • B02B7/00—Auxiliary devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/60—Editing figures and text; Combining figures or text
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20221—Image fusion; Image merging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30128—Food products

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
JP2012143709A 2012-06-27 2012-06-27 穀粒外観測定装置 Active JP6024949B2 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2012143709A JP6024949B2 (ja) 2012-06-27 2012-06-27 穀粒外観測定装置
IN59KON2015 IN2015KN00059A (OSRAM) 2012-06-27 2013-05-16
EP13809865.2A EP2869065A4 (en) 2012-06-27 2013-05-16 DEVICE FOR MEASURING THE APPEARANCE OF GRAINS
KR1020157002039A KR102037560B1 (ko) 2012-06-27 2013-05-16 곡립 외관 측정 장치
US14/411,099 US9607368B2 (en) 2012-06-27 2013-05-16 Grain appearance measuring apparatus
CN201380034156.5A CN104428657B (zh) 2012-06-27 2013-05-16 谷粒外观测定装置
PCT/JP2013/063700 WO2014002636A1 (ja) 2012-06-27 2013-05-16 穀粒外観測定装置
TW102122192A TWI585396B (zh) 2012-06-27 2013-06-21 穀粒外觀測定裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012143709A JP6024949B2 (ja) 2012-06-27 2012-06-27 穀粒外観測定装置

Publications (2)

Publication Number Publication Date
JP2014006215A JP2014006215A (ja) 2014-01-16
JP6024949B2 true JP6024949B2 (ja) 2016-11-16

Family

ID=49782808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012143709A Active JP6024949B2 (ja) 2012-06-27 2012-06-27 穀粒外観測定装置

Country Status (8)

Country Link
US (1) US9607368B2 (OSRAM)
EP (1) EP2869065A4 (OSRAM)
JP (1) JP6024949B2 (OSRAM)
KR (1) KR102037560B1 (OSRAM)
CN (1) CN104428657B (OSRAM)
IN (1) IN2015KN00059A (OSRAM)
TW (1) TWI585396B (OSRAM)
WO (1) WO2014002636A1 (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6481263B2 (ja) 2014-06-05 2019-03-13 株式会社サタケ 粒状物外観品位判別装置における品位判別基準の作成方法
WO2016133175A1 (ja) * 2015-02-19 2016-08-25 株式会社ガオチャオエンジニアリング 莢果選別システム、莢果選別装置及び莢果選別方法
WO2017145824A1 (ja) * 2016-02-22 2017-08-31 株式会社サタケ 粒状物外観品位判別装置
CN108593548A (zh) * 2018-03-07 2018-09-28 四川杰莱美科技有限公司 一种考种用标定托盘
CN111435427B (zh) * 2019-01-14 2024-08-13 珠海格力电器股份有限公司 识别大米的方法、装置和烹饪器具
EP4281227A4 (en) * 2021-01-25 2025-03-26 Inspect Technologies Ltd. Automated grains inspection

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4713781A (en) * 1985-09-19 1987-12-15 Deere & Company Grain damage analyzer
JPH10104165A (ja) * 1996-09-27 1998-04-24 Kubota Corp 撮像式の評価装置
US5917927A (en) * 1997-03-21 1999-06-29 Satake Corporation Grain inspection and analysis apparatus and method
JP4345148B2 (ja) * 1999-07-30 2009-10-14 株式会社サタケ 米粒品位判別装置
KR20000077034A (ko) 1999-04-22 2000-12-26 사따께 사또루 입상물의 품질을 평가하기 위한 장치 및 방법
JP3935768B2 (ja) 2002-04-24 2007-06-27 大日本印刷株式会社 画像合成方法およびシステム
US7058335B2 (en) * 2002-06-14 2006-06-06 Ricoh Company, Ltd. Process cartridge and image forming apparatus with toner fed cleaning mode
JP2004361333A (ja) 2003-06-06 2004-12-24 Yamamoto Co Ltd 粒状被検査物状態判別装置
CN100460176C (zh) 2003-09-11 2009-02-11 三泽住宅株式会社 树脂成形品制造装置
JP4159526B2 (ja) * 2004-09-03 2008-10-01 株式会社山本製作所 粒状被検査物の状態判別装置
JP4529700B2 (ja) 2005-01-18 2010-08-25 株式会社サタケ 穀粒品位判別装置
JP4294706B2 (ja) * 2007-06-22 2009-07-15 財団法人日本穀物検定協会 穀類粒の品質評価システム及び品質評価方法
CN101109743B (zh) 2007-09-10 2011-05-04 肯特大学 基于数字图像处理技术的便携式谷类分析仪
CN101281112A (zh) 2008-04-30 2008-10-08 浙江理工大学 一种对网状粘连稻米的图像式自动分析方法
CN101788497B (zh) 2009-12-30 2013-05-29 深圳先进技术研究院 一种基于图像识别技术的嵌入式豆类分类系统
JP4716389B1 (ja) 2010-03-31 2011-07-06 株式会社ケット科学研究所 穀粒鑑定具
JP5533245B2 (ja) * 2010-05-19 2014-06-25 株式会社サタケ 穀粒外観品位判別装置における品位別重量比率の算出方法
CN201699810U (zh) 2010-06-25 2011-01-05 北京东孚久恒仪器技术有限公司 用于颗粒状物料图像采集的扫描仪
TWM416988U (en) * 2011-05-26 2011-12-01 Univ Far East Inspection structure of paddy machine

Also Published As

Publication number Publication date
EP2869065A4 (en) 2016-02-17
WO2014002636A1 (ja) 2014-01-03
CN104428657B (zh) 2016-11-09
TWI585396B (zh) 2017-06-01
KR20150036203A (ko) 2015-04-07
TW201415005A (zh) 2014-04-16
IN2015KN00059A (OSRAM) 2015-07-31
US9607368B2 (en) 2017-03-28
US20150146938A1 (en) 2015-05-28
EP2869065A1 (en) 2015-05-06
KR102037560B1 (ko) 2019-10-28
CN104428657A (zh) 2015-03-18
JP2014006215A (ja) 2014-01-16

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