JP5991636B2 - 伝導性構造体およびその製造方法{conductivestructurebodyandmethodformanufacturingthesame} - Google Patents
伝導性構造体およびその製造方法{conductivestructurebodyandmethodformanufacturingthesame} Download PDFInfo
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- JP5991636B2 JP5991636B2 JP2015529688A JP2015529688A JP5991636B2 JP 5991636 B2 JP5991636 B2 JP 5991636B2 JP 2015529688 A JP2015529688 A JP 2015529688A JP 2015529688 A JP2015529688 A JP 2015529688A JP 5991636 B2 JP5991636 B2 JP 5991636B2
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- Prior art keywords
- layer
- conductive
- darkening
- intermediate layer
- conductive structure
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Classifications
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- B32B2457/20—Displays, e.g. liquid crystal displays, plasma displays
-
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Description
本明細書において、ディスプレイ装置とはTVやコンピュータ用モニターなどをひっくるめて言う言葉であって、画像を形成するディスプレイ素子およびディスプレイ素子を支持するケースを含む。
全反射率(Rt)=基材の反射率+閉鎖率×暗色化層の反射率
全反射率(Rt)=基材の反射率+閉鎖率×暗色化層の反射率×2
伝導性層である厚さ100nmのCu電極上に反応性スパッタリング法(reactive sputtering)によってCuOx(0<x、CuとOの原子百分率比は95:5)の厚さを異ならせて中間層を蒸着した後、中間層表面でのシート抵抗を測定した。この時、シート抵抗値は下記表1に示す。
伝導性層である厚さ80nmのAl電極上に反応性スパッタリング法(reactive sputtering)によってAlOxNy(0<x、0<y<0.3)の厚さを異ならせて中間層を蒸着した。この中間層の厚さに応じた300nm〜800nm可視光線領域波長の反射率を図5に示す。中間層を含むことで500nm以下の短波長領域での波長において反射率が減少したことを確認することができた。
伝導性層である厚さ100nmのCu電極上に反応性スパッタリング法(reactive sputtering)によってCuOx(0<x、CuとOの原子百分率比は95:5)を15nm厚さで中間層を蒸着した後、中間層上にCuOx(0<x、CuとOの原子百分率比は60:40)を厚さ43nm(実施例1)、54nm(実施例2)、54nm(実施例3)、75nm(実施例4)で暗色化層を蒸着して伝導性構造体を製造した。実施例1〜4の可視光線領域波長の反射率を測定して図6に示す。図6から、実施例1〜4は300〜800nm可視光線の全体波長領域で平均反射率が20%以下であることを確認することができる。
伝導性層である厚さ100nmのCu電極上に反応性スパッタリング法(reactive sputtering)によってCuOx(0<x、CuとOの原子百分率比は95:5)を厚さ8nm(実施例5)、25nm(実施例6)で中間層を蒸着した後、中間層上にCuOx(0<x、CuとOの原子百分率比は60:40)を65nm厚さで暗色化層を蒸着して伝導性構造体を製造した。実施例5、6の可視光線領域波長の反射率を測定し、実施例4、比較例1と共に図7に示す。図7から、実施例5〜6は300〜800nm可視光線の全体波長領域で平均反射率が20%以下であることを確認することができる。比較例1と実施例4〜6を比較してみれば、中間層を含む伝導性構造体は600nm以上の長波長領域での反射率が顕著に減少したことを確認することができる。
伝導性層である厚さ100nmのCu電極上に反応性スパッタリング法(reactive sputtering)によって伝導性層上にCuOx(0<x、CuとOの原子百分率比は60:40)を厚さ65nm(比較例1)、43nm(比較例2)、54nm(比較例3)、75nm(比較例4)で暗色化層を蒸着して伝導性構造体を製造した。比較例1〜4の可視光線領域波長の反射率を測定して図8に示す。
実施例3の伝導性構造体をガラス基材と光学透明接着剤(Optical clear adhesive:OCA)でラミネーションして実施例7の伝導性構造体を製造した。実施例3と実施例7の可視光線領域波長の反射率を図9に示す。
比較例1の伝導性構造体をガラス基材と光学透明接着剤(Optical clear adhesive:OCA)でラミネーションして比較例5の伝導性構造体を製造した。比較例1と比較例5の可視光線領域波長の反射率を図10に示す。
下記表2は、X線光電子分光法(X−ray Photoelectron Spectroscopy:XPS)によって測定した暗色化層、中間層および伝導性層であるCu電極層の組成比率プロファイル(depth profile)として、エッチング時間に応じた各層の原子百分率(Atomic percent)成分比を示すものである。下記表2から、暗色化層は銅:酸素の原子百分率比が60:39〜94:6であり、中間層は銅:酸素の原子百分率(Aomic percent)比が95:5〜97:3であることを確認することができる。また、暗色化層、中間層および伝導性層に応じた原子百分率(Atomic percent)を図11に示す。
伝導性層である厚さ80nmのAl電極上に反応性スパッタリング法(reactive sputtering)によってAlOxNy(0<x、0<y<0.3)を30nm厚さで中間層を蒸着した後、中間層上にAlOxNy(0<x、0.3≦y<1)を厚さ40nm(実施例8)、50nm(実施例9)、60nm(実施例10)、70nm(実施例11)、80nm(実施例12)で暗色化層を蒸着して伝導性構造体を製造した。
200、220 ・・・暗色化層
300 ・・・伝導性層
400、420 ・・・中間層
Claims (35)
- 基材、
伝導性層、
少なくとも1つの中間層、および
暗色化層を含み、
(i)前記伝導性層は銅を含み、
前記中間層および前記暗色化層は銅の酸化物を含み、
前記中間層の全体組成のうち銅の原子百分率は前記暗色化層の全体組成のうち銅の原子百分率より1.01倍〜1.62倍である、
または、
(ii)前記伝導性層はアルミニウムを含み、
前記中間層は全体組成のうち窒素の原子百分率(Aomic percent)が0%超過20%未満であるアルミニウムの酸窒化物を含み、
前記暗色化層は全体組成のうち窒素の原子百分率(Aomic percent)が20%以上45%以下であるアルミニウムの酸窒化物を含む
伝導性構造体。 - 前記伝導性層は前記基材と前記暗色化層との間に備えられ、
前記少なくとも1つの中間層は前記伝導性層と前記暗色化層との間に備えられる請求項1に記載の伝導性構造体。 - 前記暗色化層は前記基材と前記伝導性層との間に備えられ、
前記少なくとも1つの中間層は前記伝導性層と前記暗色化層との間に備えられる請求項1に記載の伝導性構造体。 - 前記伝導性構造体の全反射率が20%以下である請求項1から請求項3のいずれか一項に記載の伝導性構造体。
- 前記伝導性構造体の全反射率が15%以下である請求項1から請求項3のいずれか一項に記載の伝導性構造体。
- 前記伝導性構造体の全反射率が10%以下である請求項1から請求項3のいずれか一項に記載の伝導性構造体。
- 前記伝導性層、前記中間層または前記暗色化層のシート抵抗は0Ω/□超過10Ω/□以下である請求項1から請求項6のいずれか一項に記載の伝導性構造体。
- 前記暗色化層の消滅係数kは0.2以上2.5以下である請求項1から請求項7のいずれか一項に記載の伝導性構造体。
- 前記中間層および前記暗色化層は各々独立して金属の酸化物、金属の窒化物、金属の酸窒化物および金属の炭化物からなる群から選択される1つまたは2つ以上を含み、
前記中間層の全体組成のうち金属の原子百分率は前記暗色化層の全体組成のうち金属の原子百分率より1倍超過2倍以下である請求項1から請求項8のいずれか一項に記載の伝導性構造体。 - 前記金属は、Ni、V、W、Ta、Mo、Nb、Ti、Fe、Cr、Co、AlおよびCuからなる群から選択される1つまたは2つ以上である請求項9に記載の伝導性構造体。
- 前記中間層または前記暗色化層は、誘電性物質および金属のうち少なくとも1つを含む請求項1から請求項10のいずれか一項に記載の伝導性構造体。
- 前記誘電性物質はTiO2−x、SiO2−x、MgF2−xおよびSiN1.3−x(−1≦x≦1)からなる群から選択されるものであり、
前記金属はFe、Co、Ti、V、Al、Mo、Cu、AuおよびAgからなる群から選択される1つまたは2つ以上の合金である請求項11に記載の伝導性構造体。 - 前記伝導性層は金属、金属合金、金属酸化物および金属窒化物からなる群から選択される1つ以上の物質を含み、
前記物質は比抵抗が1×10−6Ω・cm〜30×10−6Ω・cmである請求項1から請求項12のいずれか一項に記載の伝導性構造体。 - 前記伝導性層は、Cu、Al、Ag、Nd、Mo、Ni、その酸化物およびその窒化物からなる群から選択される1つまたは2つ以上を含む請求項1から請求項13のいずれか一項に記載の伝導性構造体。
- 前記暗色化層、前記中間層および前記伝導性層は同一の金属を含む請求項1から請求項14のいずれか一項に記載の伝導性構造体。
- 前記伝導性層は銅を含み、
前記中間層は銅:酸素の原子百分率(Aomic percent)比が95:5〜97:3である銅の酸化物を含み、
前記暗色化層は銅:酸素の原子百分率比が60:39〜94:6である銅の酸化物を含む請求項1から請求項15のいずれか一項に記載の伝導性構造体。 - 前記伝導性層は銅を含み、
前記中間層および前記暗色化層は銅の酸化物を含み、
前記中間層の全体組成のうち銅の原子百分率は厚さ方向に前記暗色化層に隣接するほど小さくなる勾配(gradient)を有し、
前記中間層において銅:酸素の平均原子百分率(Aomic percent)比が95:5〜97:3であり、
前記暗色化層において銅:酸素の原子百分率比が60:39〜94:6である請求項1から請求項16のいずれか一項に記載の伝導性構造体。 - 前記中間層の厚さは5nm〜50nmである請求項1から請求項17のいずれか一項に記載の伝導性構造体。
- 前記暗色化層の厚さは20nm〜150nmである請求項1から請求項18のいずれか一項に記載の伝導性構造体。
- 前記伝導性層の厚さは0.01μm〜10μmである請求項1から請求項19のいずれか一項に記載の伝導性構造体。
- 前記暗色化層が前記伝導性層の少なくとも一面に備えられる請求項1から請求項20のいずれか一項に記載の伝導性構造体。
- 前記伝導性層、前記中間層または前記暗色化層はパターン化される請求項1から請求項21のいずれか一項に記載の伝導性構造体。
- 前記伝導性構造体は、シート抵抗が1Ω/□〜300Ω/□である請求項22に記載の伝導性構造体。
- 前記伝導性層、前記中間層および前記暗色化層はパターン化されたものであり、
前記パターン化された伝導性層におけるパターンの線幅は10μm以下である請求項1から請求項23のいずれか一項に記載の伝導性構造体。 - 前記伝導性層、前記中間層および前記暗色化層はパターン化されたものであり、
前記パターン化された中間層におけるパターンの線幅および前記パターン化された暗色化層におけるパターンの線幅は、各々、前記パターン化された伝導性層におけるパターンの線幅と同一であるか大きい請求項1から請求項24のいずれか一項に記載の伝導性構造体。 - 前記伝導性層、前記中間層および前記暗色化層はパターン化されたものであり、
前記パターン化された中間層および前記パターン化された暗色化層は、各々、前記パターン化された伝導性層が備えられた面積の80%〜120%の面積を有する請求項1から請求項25のいずれか一項に記載の伝導性構造体。 - 請求項1から請求項26のいずれか一項に記載の伝導性構造体を含むタッチスクリーンパネル。
- 請求項1から請求項26のいずれか一項に記載の伝導性構造体を含むディスプレイ装置。
- 請求項1から請求項26のいずれか一項に記載の伝導性構造体を含む太陽電池。
- 伝導性層上に少なくとも1つの中間層を形成するステップ、
前記中間層上に暗色化層を形成するステップ、および
前記伝導性層または前記暗色化層と基材をラミネーションするステップを含み、
(i)前記伝導性層は銅を含み、
前記中間層および前記暗色化層は銅の酸化物を含み、
前記中間層の全体組成のうち銅の原子百分率は前記暗色化層の全体組成のうち銅の原子百分率より1.01倍〜1.62倍である、
または、
(ii)前記伝導性層はアルミニウムを含み、
前記中間層は全体組成のうち窒素の原子百分率(Aomic percent)が0%超過20%未満であるアルミニウムの酸窒化物を含み、
前記暗色化層は全体組成のうち窒素の原子百分率(Aomic percent)が20%以上45%以下であるアルミニウムの酸窒化物を含む
伝導性構造体の製造方法。 - 基材上に伝導性層を形成するステップ、
前記伝導性層上に少なくとも1つの中間層を形成するステップ、および
前記中間層上に暗色化層を形成するステップを含み、
(i)前記伝導性層は銅を含み、
前記中間層および前記暗色化層は銅の酸化物を含み、
前記中間層の全体組成のうち銅の原子百分率は前記暗色化層の全体組成のうち銅の原子百分率より1.01倍〜1.62倍である、
または、
(ii)前記伝導性層はアルミニウムを含み、
前記中間層は全体組成のうち窒素の原子百分率(Aomic percent)が0%超過20%未満であるアルミニウムの酸窒化物を含み、
前記暗色化層は全体組成のうち窒素の原子百分率(Aomic percent)が20%以上45%以下であるアルミニウムの酸窒化物を含む
伝導性構造体の製造方法。 - 前記伝導性層、前記中間層および前記暗色化層を各々または同時にパターニングするステップをさらに含む請求項30または請求項31に記載の伝導性構造体の製造方法。
- 前記中間層または前記暗色化層の形成は、反応性スパッタリング法を利用する請求項30から請求項32のいずれか一項に記載の伝導性構造体の製造方法。
- 基材上にパターン化された伝導性層を形成するステップ、
前記パターン化された伝導性層上に少なくとも1つのパターン化された中間層を形成するステップ、および
前記パターン化された中間層上にパターン化された暗色化層を形成するステップを含み、
(i)前記伝導性層は銅を含み、
前記中間層および前記暗色化層は銅の酸化物を含み、
前記中間層の全体組成のうち銅の原子百分率は前記暗色化層の全体組成のうち銅の原子百分率より1.01倍〜1.62倍である、
または、
(ii)前記伝導性層はアルミニウムを含み、
前記中間層は全体組成のうち窒素の原子百分率(Aomic percent)が0%超過20%未満であるアルミニウムの酸窒化物を含み、
前記暗色化層は全体組成のうち窒素の原子百分率(Aomic percent)が20%以上45%以下であるアルミニウムの酸窒化物を含む
伝導性構造体の製造方法。 - 前記パターン化された中間層または前記パターン化された暗色化層の形成は、反応性スパッタリング法を利用する請求項34に記載の伝導性構造体の製造方法。
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