JP5972264B2 - 陰極防食したパッドコンディショナー及び使用方法 - Google Patents
陰極防食したパッドコンディショナー及び使用方法 Download PDFInfo
- Publication number
- JP5972264B2 JP5972264B2 JP2013519695A JP2013519695A JP5972264B2 JP 5972264 B2 JP5972264 B2 JP 5972264B2 JP 2013519695 A JP2013519695 A JP 2013519695A JP 2013519695 A JP2013519695 A JP 2013519695A JP 5972264 B2 JP5972264 B2 JP 5972264B2
- Authority
- JP
- Japan
- Prior art keywords
- cathodic protection
- polishing
- anode
- metal substrate
- pad conditioner
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/001—Devices or means for dressing or conditioning abrasive surfaces involving the use of electric current
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Electroplating Methods And Accessories (AREA)
- Prevention Of Electric Corrosion (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/837,055 US8496511B2 (en) | 2010-07-15 | 2010-07-15 | Cathodically-protected pad conditioner and method of use |
| US12/837,055 | 2010-07-15 | ||
| PCT/US2011/041843 WO2012009139A1 (en) | 2010-07-15 | 2011-06-24 | Cathodically-protected pad conditioner and method of use |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013534734A JP2013534734A (ja) | 2013-09-05 |
| JP2013534734A5 JP2013534734A5 (enExample) | 2014-07-24 |
| JP5972264B2 true JP5972264B2 (ja) | 2016-08-17 |
Family
ID=44628604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013519695A Expired - Fee Related JP5972264B2 (ja) | 2010-07-15 | 2011-06-24 | 陰極防食したパッドコンディショナー及び使用方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8496511B2 (enExample) |
| JP (1) | JP5972264B2 (enExample) |
| KR (1) | KR20130128370A (enExample) |
| CN (1) | CN103003026B (enExample) |
| SG (1) | SG187009A1 (enExample) |
| TW (1) | TWI531444B (enExample) |
| WO (1) | WO2012009139A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9550247B2 (en) * | 2013-07-18 | 2017-01-24 | Aps Materials, Inc. | Double coupon reference cell and methods of making same |
| JP7232763B2 (ja) * | 2016-12-21 | 2023-03-03 | スリーエム イノベイティブ プロパティズ カンパニー | スペーサ及びウェハ平坦化システムを有するパッドコンディショナ |
| EP3691830A4 (en) * | 2017-10-04 | 2021-11-17 | Saint-Gobain Abrasives, Inc. | ABRASIVE ARTICLE AND ITS FORMATION PROCESS |
| US11490664B2 (en) * | 2018-02-23 | 2022-11-08 | Linderton Holdings, Inc. | Supporting garments and sizing systems |
| EP3948702A4 (en) | 2019-03-29 | 2023-07-26 | Saint-Gobain Abrasives, Inc. | POWER LOOP SOLUTIONS |
| WO2020206382A1 (en) | 2019-04-03 | 2020-10-08 | Saint-Gobain Abrasives, Inc. | Abrasive article, abrasive system and method for using and forming same |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2817634A (en) | 1953-09-22 | 1957-12-24 | Texas Co | Device for preventing corrosion |
| US3022234A (en) | 1958-06-30 | 1962-02-20 | Engelhard Ind Inc | Cathodic protection of ships |
| US5352342A (en) | 1993-03-19 | 1994-10-04 | William J. Riffe | Method and apparatus for preventing corrosion of metal structures |
| ZA9410384B (en) | 1994-04-08 | 1996-02-01 | Ultimate Abrasive Syst Inc | Method for making powder preform and abrasive articles made therefrom |
| US6123612A (en) | 1998-04-15 | 2000-09-26 | 3M Innovative Properties Company | Corrosion resistant abrasive article and method of making |
| US6176992B1 (en) * | 1998-11-03 | 2001-01-23 | Nutool, Inc. | Method and apparatus for electro-chemical mechanical deposition |
| US6203413B1 (en) | 1999-01-13 | 2001-03-20 | Micron Technology, Inc. | Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies |
| JP3665523B2 (ja) * | 1999-12-28 | 2005-06-29 | 株式会社東芝 | ドレッシング方法 |
| US6264536B1 (en) * | 2000-02-01 | 2001-07-24 | Lucent Technologies Inc. | Reducing polish platen corrosion during integrated circuit fabrication |
| US6811680B2 (en) * | 2001-03-14 | 2004-11-02 | Applied Materials Inc. | Planarization of substrates using electrochemical mechanical polishing |
| EP1446514A4 (en) * | 2001-11-13 | 2007-11-28 | Acm Res Inc | ELECTROPOLIER ASSEMBLY AND METHOD FOR ELECTROPOLISHING CONDUCTIVE LAYERS |
| US7276454B2 (en) | 2002-11-02 | 2007-10-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Application of impressed-current cathodic protection to prevent metal corrosion and oxidation |
| CA2434986A1 (en) | 2003-07-11 | 2005-01-11 | G.I. Russell & Company Ltd. | Method and apparatus for instrumental analysis in remote locations |
| US7125324B2 (en) | 2004-03-09 | 2006-10-24 | 3M Innovative Properties Company | Insulated pad conditioner and method of using same |
| CN1562566A (zh) * | 2004-04-06 | 2005-01-12 | 北京工业大学 | 金属结合剂砂轮在线电解磨削修整法及其装置 |
| US7608173B2 (en) | 2004-12-02 | 2009-10-27 | Applied Materials, Inc. | Biased retaining ring |
| JP2007537052A (ja) | 2004-05-13 | 2007-12-20 | アプライド マテリアルズ インコーポレイテッド | 導電部を備えた保持リング |
| JP2008192749A (ja) * | 2007-02-02 | 2008-08-21 | Matsushita Electric Ind Co Ltd | 研磨装置および研磨方法 |
-
2010
- 2010-07-15 US US12/837,055 patent/US8496511B2/en active Active
-
2011
- 2011-06-24 SG SG2013001904A patent/SG187009A1/en unknown
- 2011-06-24 CN CN201180035149.8A patent/CN103003026B/zh active Active
- 2011-06-24 JP JP2013519695A patent/JP5972264B2/ja not_active Expired - Fee Related
- 2011-06-24 KR KR1020137003514A patent/KR20130128370A/ko not_active Ceased
- 2011-06-24 WO PCT/US2011/041843 patent/WO2012009139A1/en not_active Ceased
- 2011-07-08 TW TW100124321A patent/TWI531444B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| KR20130128370A (ko) | 2013-11-26 |
| CN103003026A (zh) | 2013-03-27 |
| US20120015589A1 (en) | 2012-01-19 |
| WO2012009139A1 (en) | 2012-01-19 |
| TWI531444B (zh) | 2016-05-01 |
| US8496511B2 (en) | 2013-07-30 |
| SG187009A1 (en) | 2013-02-28 |
| CN103003026B (zh) | 2016-01-20 |
| JP2013534734A (ja) | 2013-09-05 |
| TW201206628A (en) | 2012-02-16 |
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