JP5961614B2 - 位相差イメージングのための格子装置、位相差イメージングのための装置、当該装置を有するｘ線システム、当該装置の使用方法 - Google Patents

位相差イメージングのための格子装置、位相差イメージングのための装置、当該装置を有するｘ線システム、当該装置の使用方法 Download PDF

Info

Publication number
JP5961614B2
JP5961614B2 JP2013526576A JP2013526576A JP5961614B2 JP 5961614 B2 JP5961614 B2 JP 5961614B2 JP 2013526576 A JP2013526576 A JP 2013526576A JP 2013526576 A JP2013526576 A JP 2013526576A JP 5961614 B2 JP5961614 B2 JP 5961614B2
Authority
JP
Japan
Prior art keywords
grating
pitch
ray
region
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2013526576A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013541699A (ja
JP2013541699A5 (enExample
Inventor
トマス ケーラー
トマス ケーラー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of JP2013541699A publication Critical patent/JP2013541699A/ja
Publication of JP2013541699A5 publication Critical patent/JP2013541699A5/ja
Application granted granted Critical
Publication of JP5961614B2 publication Critical patent/JP5961614B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4035—Arrangements for generating radiation specially adapted for radiation diagnosis the source being combined with a filter or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Surgery (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Optics & Photonics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2013526576A 2010-09-03 2011-08-26 位相差イメージングのための格子装置、位相差イメージングのための装置、当該装置を有するｘ線システム、当該装置の使用方法 Expired - Fee Related JP5961614B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP10175176 2010-09-03
EP10175176.6 2010-09-03
PCT/IB2011/053750 WO2012029005A1 (en) 2010-09-03 2011-08-26 Differential phase-contrast imaging with improved sampling

Publications (3)

Publication Number Publication Date
JP2013541699A JP2013541699A (ja) 2013-11-14
JP2013541699A5 JP2013541699A5 (enExample) 2014-10-09
JP5961614B2 true JP5961614B2 (ja) 2016-08-02

Family

ID=44674840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013526576A Expired - Fee Related JP5961614B2 (ja) 2010-09-03 2011-08-26 位相差イメージングのための格子装置、位相差イメージングのための装置、当該装置を有するｘ線システム、当該装置の使用方法

Country Status (5)

Country Link
US (1) US9105369B2 (enExample)
EP (1) EP2611364B1 (enExample)
JP (1) JP5961614B2 (enExample)
CN (1) CN103079469B (enExample)
WO (1) WO2012029005A1 (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012029005A1 (en) * 2010-09-03 2012-03-08 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with improved sampling
JP6228457B2 (ja) * 2010-10-19 2017-11-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 微分位相コントラスト画像形成
EP2630476B1 (en) * 2010-10-19 2017-12-13 Koninklijke Philips N.V. Differential phase-contrast imaging
US9597050B2 (en) * 2012-01-24 2017-03-21 Koninklijke Philips N.V. Multi-directional phase contrast X-ray imaging
US9826949B2 (en) * 2012-03-05 2017-11-28 University Of Rochester Methods and apparatus for differential phase-contrast cone-beam CT and hybrid cone-beam CT
JP2013255536A (ja) * 2012-06-11 2013-12-26 Konica Minolta Inc 放射線画像撮影装置
EP3064930B1 (en) * 2013-10-31 2018-04-18 Tohoku University Non-destructive inspection device
CN104622492A (zh) * 2013-11-11 2015-05-20 中国科学技术大学 一种x射线光栅相位衬度成像装置和方法
KR20170015886A (ko) * 2014-05-09 2017-02-10 더 존스 홉킨스 유니버시티 위상 콘트라스트 엑스레이 이미징을 위한 시스템 및 방법
US10368815B2 (en) 2014-07-17 2019-08-06 Koninklijke Philips N.V. X-ray imaging device
US10420521B2 (en) 2014-08-05 2019-09-24 Koninklijke Philips N.V. Grating device for an X-ray imaging device
AU2014250719A1 (en) * 2014-10-17 2016-05-05 Canon Kabushiki Kaisha Image processing method, system and apparatus
CN107106101B (zh) * 2014-12-22 2020-04-24 株式会社岛津制作所 放射线相位差摄影装置
JPWO2017168844A1 (ja) * 2016-03-28 2019-02-07 コニカミノルタ株式会社 Ｘ線タルボ撮影装置
KR102543948B1 (ko) 2016-05-17 2023-06-15 삼성전자주식회사 클럭 신호 생성기 및 기판 검사 장치
EP3427664A1 (en) 2017-07-13 2019-01-16 Koninklijke Philips N.V. A device for scatter correction in an x-ray image and a method for scatter correction in an xray image
TWI613804B (zh) * 2017-09-04 2018-02-01 友達光電股份有限公司 光感測裝置
JP6743983B2 (ja) * 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
US11422292B1 (en) * 2018-06-10 2022-08-23 Apple Inc. Super-blazed diffractive optical elements with sub-wavelength structures
EP3603515A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
CN109458922B (zh) * 2018-11-05 2019-08-30 浙江大学 一种静电式自供能位移栅格传感器
WO2020095482A1 (ja) * 2018-11-06 2020-05-14 株式会社島津製作所 Ｘ線位相撮像システム
US11754767B1 (en) 2020-03-05 2023-09-12 Apple Inc. Display with overlaid waveguide
EP4029451A1 (en) 2021-01-19 2022-07-20 Koninklijke Philips N.V. An x-ray imaging system and method
WO2022197339A1 (en) 2021-03-17 2022-09-22 Apple Inc. Waveguide-based transmitters with adjustable lighting
CN113758952B (zh) * 2021-08-20 2022-10-11 中国科学院上海光学精密机械研究所 基于动量编码的x射线衍射成像装置及方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
JP3987676B2 (ja) * 2000-07-10 2007-10-10 株式会社日立メディコ Ｘ線計測装置
DE102006015356B4 (de) * 2006-02-01 2016-09-22 Siemens Healthcare Gmbh Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System
DE102006063048B3 (de) * 2006-02-01 2018-03-29 Siemens Healthcare Gmbh Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen
DE102006037256B4 (de) * 2006-02-01 2017-03-30 Paul Scherer Institut Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System
CN101013613B (zh) * 2006-02-01 2011-10-19 西门子公司 X射线设备的焦点-检测器装置的x射线光学透射光栅
JP2008224661A (ja) * 2007-02-14 2008-09-25 Konica Minolta Medical & Graphic Inc Ｘ線撮像素子、装置及び方法
JP5493852B2 (ja) * 2007-02-21 2014-05-14 コニカミノルタ株式会社 放射線画像撮影装置
CN101952900B (zh) * 2008-02-14 2013-10-23 皇家飞利浦电子股份有限公司 用于相位对比成像的x射线探测器
JP5339975B2 (ja) 2008-03-13 2013-11-13 キヤノン株式会社 Ｘ線位相イメージングに用いられる位相格子、該位相格子を用いたｘ線位相コントラスト像の撮像装置、ｘ線コンピューター断層撮影システム
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
JP5660910B2 (ja) * 2010-03-30 2015-01-28 富士フイルム株式会社 放射線画像撮影用グリッドの製造方法
WO2012029005A1 (en) * 2010-09-03 2012-03-08 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with improved sampling
JP6228457B2 (ja) * 2010-10-19 2017-11-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 微分位相コントラスト画像形成
JP2012157690A (ja) * 2011-01-14 2012-08-23 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
JP2012166010A (ja) * 2011-01-26 2012-09-06 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
JP2012161412A (ja) * 2011-02-04 2012-08-30 Fujifilm Corp 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム

Also Published As

Publication number Publication date
EP2611364A1 (en) 2013-07-10
CN103079469A (zh) 2013-05-01
EP2611364B1 (en) 2018-03-07
CN103079469B (zh) 2016-02-24
US9105369B2 (en) 2015-08-11
US20130170618A1 (en) 2013-07-04
JP2013541699A (ja) 2013-11-14
WO2012029005A1 (en) 2012-03-08

Similar Documents

Publication Publication Date Title
JP5961614B2 (ja) 位相差イメージングのための格子装置、位相差イメージングのための装置、当該装置を有するｘ線システム、当該装置の使用方法
JP5461438B2 (ja) 位相コントラストイメージング用のｘ線検出器
JP5142540B2 (ja) Ｘ線装置の焦点‐検出器システム
RU2562879C2 (ru) Устройство для фазоконтрастного формирования изображений, содержащее перемещаемый элемент детектора рентгеновского излучения, и соответствующий способ
US8972191B2 (en) Low dose single step grating based X-ray phase contrast imaging
JP5127247B2 (ja) Ｘ線装置の焦点‐検出器装置
CN101013613B (zh) X射线设备的焦点-检测器装置的x射线光学透射光栅
US10058300B2 (en) Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
JP5127249B2 (ja) Ｘ線装置の焦点‐検出器装置のｘ線光学透過格子
CN101036582B (zh) 用于产生投影和断层造影的相位对比拍摄的方法
US9907524B2 (en) Material decomposition technique using x-ray phase contrast imaging system
JP6581713B2 (ja) 位相コントラスト及び／又は暗視野撮像のためのｘ線検出器、該ｘ線検出器を有する干渉計、ｘ線撮像システム、位相コントラストｘ線撮像及び／又は暗視野ｘ線撮像を行う方法、コンピュータプログラム、コンピュータ読取可能な媒体
JP5601909B2 (ja) Ｘ線撮像装置及びこれを用いるｘ線撮像方法
WO2007125833A1 (ja) Ｘ線撮像装置及びｘ線撮像方法
US9269469B2 (en) Arrangement and method for inverse X-ray phase contrast imaging
US9575015B2 (en) Systems and methods for x-ray phase contrast imaging using arrays of x-ray focusing elements
JP2016509872A (ja) 高エネルギにおけるｘ線位相コントラストイメージング及びｃｔのための大視野格子干渉計

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140822

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140822

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150624

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150630

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20150929

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151224

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160531

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160627

R150 Certificate of patent or registration of utility model

Ref document number: 5961614

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees