JP5940887B2 - 固体撮像装置 - Google Patents
固体撮像装置 Download PDFInfo
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- JP5940887B2 JP5940887B2 JP2012114331A JP2012114331A JP5940887B2 JP 5940887 B2 JP5940887 B2 JP 5940887B2 JP 2012114331 A JP2012114331 A JP 2012114331A JP 2012114331 A JP2012114331 A JP 2012114331A JP 5940887 B2 JP5940887 B2 JP 5940887B2
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/199—Back-illuminated image sensors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F99/00—Subject matter not provided for in other groups of this subclass
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/804—Containers or encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/331—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/413—Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/1015—Shape
- H01L2924/10155—Shape being other than a cuboid
- H01L2924/10158—Shape being other than a cuboid at the passive surface
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8053—Colour filters
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/734—Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
- Y10S977/742—Carbon nanotubes, CNTs
- Y10S977/752—Multi-walled
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Light Receiving Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Description
Claims (5)
- 互いに対向する第一主面と第二主面とを有し、前記第一主面側に光感応領域が設けられると共に、前記光感応領域に対応する部分が該部分の周辺部分を残して前記第二主面側から薄化されている裏面入射型の半導体光検出素子と、
互いに対向する第三主面と第四主面とを有し、前記第三主面と前記第四主面とに開口し且つ前記半導体光検出素子を収容する収容空間が形成されたパッケージと、
光入射端面と光出射端面とを有し、前記光出射端面が前記第二主面と対向するように配置されたファイバ光学プレートと、
前記第一主面側から前記半導体光検出素子に固定され、前記半導体光検出素子の薄化されている部分を保護する保護部材と、を備え、
前記ファイバ光学プレートの前記光入射端面側の部分は、前記第三主面より前記パッケージの外側に突出し、
前記ファイバ光学プレートの前記光出射端面側の部分は、前記半導体光検出素子の前記周辺部分に対応する第一部分と、前記半導体光検出素子の薄化されている部分に対応し且つ前記第一部分よりも前記半導体光検出素子に向けて突出する第二部分と、を含み、
前記ファイバ光学プレートの前記第一部分と前記第二部分とで構成される段差の高さは、前記半導体光検出素子の薄化されている前記部分と前記周辺部分とで構成される段差の高さよりも低く、
前記半導体光検出素子と前記ファイバ光学プレートとは、前記光出射端面と薄化されている前記部分との間に充填された被検出光に対して光学的に透明な樹脂により、前記第一部分と前記周辺部分とが当接し且つ前記第二部分と薄化されている前記部分とが離れている状態で固定されており、
前記第二部分と薄化されている前記部分とは、前記樹脂を介して光学的に結合されていることを特徴とする固体撮像装置。 - 前記ファイバ光学プレートの前記第二部分の、前記半導体光検出素子の薄化されている前記部分に対向する面には、波長選択フィルタが配置されており、
前記半導体光検出素子と前記ファイバ光学プレートとは、前記波長選択フィルタと薄化されている前記部分とが離れている状態で固定されていることを特徴とする請求項1に記載の固体撮像装置。 - 前記半導体光検出素子が、台座を介して前記パッケージに固定されていることを特徴とする請求項1又は2に記載の固体撮像装置。
- 前記収容空間を前記第四主面側から閉塞し、前記保護部材に固定される蓋部材を更に備え、
前記保護部材と蓋部材とが、熱的に結合されていることを特徴とする請求項1〜3のいずれか一項に記載の固体撮像装置。 - 前記保護部材と蓋部材とが、樹脂と該樹脂よりも熱伝導率が高い材料からなるフィラーとを含む接着剤により固定されていることを特徴とする請求項4に記載の固体撮像装置。
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012114331A JP5940887B2 (ja) | 2012-05-18 | 2012-05-18 | 固体撮像装置 |
| US14/401,224 US9401381B2 (en) | 2012-05-18 | 2013-03-13 | Solid-state image pickup device |
| KR1020147028037A KR102004016B1 (ko) | 2012-05-18 | 2013-03-13 | 고체 촬상 장치 |
| CN201380026040.7A CN104303303B (zh) | 2012-05-18 | 2013-03-13 | 固体摄像装置 |
| EP13790820.8A EP2851953B1 (en) | 2012-05-18 | 2013-03-13 | Solid-state image pickup device |
| PCT/JP2013/057003 WO2013172081A1 (ja) | 2012-05-18 | 2013-03-13 | 固体撮像装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012114331A JP5940887B2 (ja) | 2012-05-18 | 2012-05-18 | 固体撮像装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013243197A JP2013243197A (ja) | 2013-12-05 |
| JP5940887B2 true JP5940887B2 (ja) | 2016-06-29 |
Family
ID=49583503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012114331A Active JP5940887B2 (ja) | 2012-05-18 | 2012-05-18 | 固体撮像装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9401381B2 (ja) |
| EP (1) | EP2851953B1 (ja) |
| JP (1) | JP5940887B2 (ja) |
| KR (1) | KR102004016B1 (ja) |
| CN (1) | CN104303303B (ja) |
| WO (1) | WO2013172081A1 (ja) |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6138207Y2 (ja) * | 1980-12-20 | 1986-11-05 | ||
| US4814847A (en) * | 1986-11-21 | 1989-03-21 | Bell Communications Research, Inc. | Ingaas semiconductor structures |
| JPH05303058A (ja) * | 1992-04-24 | 1993-11-16 | Matsushita Electric Ind Co Ltd | 光ファイバアレイ基板および光ファイバアレイ基板を用いた完全密着型イメージセンサ |
| JP4005704B2 (ja) * | 1998-07-14 | 2007-11-14 | 浜松ホトニクス株式会社 | X線パネルセンサ |
| JP3717685B2 (ja) | 1998-09-22 | 2005-11-16 | 日本原子力研究所 | イメージングプレートの放射線画像読み出し装置及びその読み出し方法 |
| JP4562875B2 (ja) * | 2000-07-17 | 2010-10-13 | 浜松ホトニクス株式会社 | 半導体装置 |
| US6667528B2 (en) * | 2002-01-03 | 2003-12-23 | International Business Machines Corporation | Semiconductor-on-insulator lateral p-i-n photodetector with a reflecting mirror and backside contact and method for forming the same |
| JP4227389B2 (ja) * | 2002-10-09 | 2009-02-18 | 浜松ホトニクス株式会社 | 撮像装置及びその製造方法 |
| JP4494745B2 (ja) * | 2003-09-25 | 2010-06-30 | 浜松ホトニクス株式会社 | 半導体装置 |
| FR2888043B1 (fr) * | 2005-07-01 | 2007-11-30 | Atmel Grenoble Soc Par Actions | Capteur d'image a galette de fibres optiques |
| JP4490406B2 (ja) * | 2006-10-11 | 2010-06-23 | 浜松ホトニクス株式会社 | 固体撮像装置 |
| US8106363B2 (en) * | 2008-04-17 | 2012-01-31 | Carestream Health, Inc. | Digital radiography panel with pressure-sensitive adhesive for optical coupling between scintillator screen and detector and method of manufacture |
| JP5922519B2 (ja) * | 2012-07-20 | 2016-05-24 | 浜松ホトニクス株式会社 | シンチレータパネル及び放射線検出器 |
| EP4075477A3 (en) * | 2014-04-17 | 2024-02-28 | Gatan, Inc. | Hybrid energy conversion and processing detector |
-
2012
- 2012-05-18 JP JP2012114331A patent/JP5940887B2/ja active Active
-
2013
- 2013-03-13 EP EP13790820.8A patent/EP2851953B1/en active Active
- 2013-03-13 KR KR1020147028037A patent/KR102004016B1/ko active Active
- 2013-03-13 US US14/401,224 patent/US9401381B2/en active Active
- 2013-03-13 CN CN201380026040.7A patent/CN104303303B/zh active Active
- 2013-03-13 WO PCT/JP2013/057003 patent/WO2013172081A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CN104303303B (zh) | 2017-04-12 |
| WO2013172081A1 (ja) | 2013-11-21 |
| EP2851953A1 (en) | 2015-03-25 |
| KR20150022749A (ko) | 2015-03-04 |
| KR102004016B1 (ko) | 2019-07-25 |
| JP2013243197A (ja) | 2013-12-05 |
| US20150130004A1 (en) | 2015-05-14 |
| CN104303303A (zh) | 2015-01-21 |
| EP2851953B1 (en) | 2016-11-16 |
| EP2851953A4 (en) | 2016-01-20 |
| US9401381B2 (en) | 2016-07-26 |
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