JP5853494B2 - 熱サイクル装置及び異常判定方法 - Google Patents

熱サイクル装置及び異常判定方法 Download PDF

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Publication number
JP5853494B2
JP5853494B2 JP2011183376A JP2011183376A JP5853494B2 JP 5853494 B2 JP5853494 B2 JP 5853494B2 JP 2011183376 A JP2011183376 A JP 2011183376A JP 2011183376 A JP2011183376 A JP 2011183376A JP 5853494 B2 JP5853494 B2 JP 5853494B2
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reaction
arrangement
reaction vessel
unit
flow path
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Japanese (ja)
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JP2013044661A (ja
JP2013044661A5 (enExample
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富美男 ▲高▼城
富美男 ▲高▼城
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Seiko Epson Corp
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Seiko Epson Corp
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  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2011183376A 2011-08-25 2011-08-25 熱サイクル装置及び異常判定方法 Expired - Fee Related JP5853494B2 (ja)

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JP2011183376A JP5853494B2 (ja) 2011-08-25 2011-08-25 熱サイクル装置及び異常判定方法

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JP2011183376A JP5853494B2 (ja) 2011-08-25 2011-08-25 熱サイクル装置及び異常判定方法

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JP2013044661A JP2013044661A (ja) 2013-03-04
JP2013044661A5 JP2013044661A5 (enExample) 2014-08-28
JP5853494B2 true JP5853494B2 (ja) 2016-02-09

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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2004245119A1 (en) * 2003-06-05 2004-12-16 Bioprocessors Corp. Apparatus and method for manipulating substrates
JP4170947B2 (ja) * 2004-04-09 2008-10-22 株式会社日立ハイテクノロジーズ 生体試料成分検出法及びその装置
CN101501496B (zh) * 2007-01-10 2013-05-15 爱科来株式会社 光学检测装置的性能确认方法及其使用的标准试剂
JP5196126B2 (ja) * 2007-12-10 2013-05-15 セイコーエプソン株式会社 生体試料反応装置および生体試料反応方法
JP2011155969A (ja) * 2010-11-22 2011-08-18 Seiko Epson Corp バイオチップ、検体反応装置及び検体反応方法

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