JP5852654B2 - タンデム質量分析計において可変質量選択窓幅を用いるためのシステムおよび方法 - Google Patents

タンデム質量分析計において可変質量選択窓幅を用いるためのシステムおよび方法 Download PDF

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JP5852654B2
JP5852654B2 JP2013527693A JP2013527693A JP5852654B2 JP 5852654 B2 JP5852654 B2 JP 5852654B2 JP 2013527693 A JP2013527693 A JP 2013527693A JP 2013527693 A JP2013527693 A JP 2013527693A JP 5852654 B2 JP5852654 B2 JP 5852654B2
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sample
mass
selection window
window width
processor
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JP2013537304A (ja
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ロナルド ボナー，
ロナルド ボナー，
スティーブン エー． テイト，
スティーブン エー． テイト，
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ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド
ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013527693A 2010-09-08 2011-09-07 タンデム質量分析計において可変質量選択窓幅を用いるためのシステムおよび方法 Active JP5852654B2 (ja)

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US38091610P 2010-09-08 2010-09-08
US61/380,916 2010-09-08
PCT/IB2011/002057 WO2012032394A2 (en) 2010-09-08 2011-09-07 Systems and methods for using variable mass selection window widths in tandem mass spectrometry

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JP2015237437A Division JP6185975B2 (ja) 2010-09-08 2015-12-04 タンデム質量分析計において可変質量選択窓幅を用いるためのシステムおよび方法

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JP2013537304A JP2013537304A (ja) 2013-09-30
JP2013537304A5 JP2013537304A5 (https=) 2014-09-25
JP5852654B2 true JP5852654B2 (ja) 2016-02-03

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JP2015237437A Active JP6185975B2 (ja) 2010-09-08 2015-12-04 タンデム質量分析計において可変質量選択窓幅を用いるためのシステムおよび方法

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US (7) US8809772B2 (https=)
EP (1) EP2614517B1 (https=)
JP (2) JP5852654B2 (https=)
CN (2) CN103081055B (https=)
CA (1) CA2810143C (https=)
WO (1) WO2012032394A2 (https=)

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CA2810143C (en) * 2010-09-08 2019-03-26 Dh Technologies Development Pte. Ltd. Systems and methods for using variable mass selection window widths in tandem mass spectrometry

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Publication number Publication date
CN105869981B (zh) 2018-04-13
CA2810143A1 (en) 2012-03-15
US20130153761A1 (en) 2013-06-20
EP2614517B1 (en) 2020-08-05
CN105869981A (zh) 2016-08-17
WO2012032394A3 (en) 2012-05-10
WO2012032394A2 (en) 2012-03-15
US9147562B2 (en) 2015-09-29
US20180096830A1 (en) 2018-04-05
JP2016057312A (ja) 2016-04-21
US20150129757A1 (en) 2015-05-14
CA2810143C (en) 2019-03-26
CN103081055A (zh) 2013-05-01
JP2013537304A (ja) 2013-09-30
US9842731B2 (en) 2017-12-12
US11107666B2 (en) 2021-08-31
US10074527B2 (en) 2018-09-11
US20210050197A1 (en) 2021-02-18
US10825667B2 (en) 2020-11-03
JP6185975B2 (ja) 2017-08-23
CN103081055B (zh) 2016-04-27
EP2614517A2 (en) 2013-07-17
US20180350579A1 (en) 2018-12-06
US9460900B2 (en) 2016-10-04
US8809772B2 (en) 2014-08-19
US20160372312A1 (en) 2016-12-22
US20160079047A1 (en) 2016-03-17

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