JP5846554B2 - 固体撮像装置、及び画素 - Google Patents
固体撮像装置、及び画素 Download PDFInfo
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- JP5846554B2 JP5846554B2 JP2011167420A JP2011167420A JP5846554B2 JP 5846554 B2 JP5846554 B2 JP 5846554B2 JP 2011167420 A JP2011167420 A JP 2011167420A JP 2011167420 A JP2011167420 A JP 2011167420A JP 5846554 B2 JP5846554 B2 JP 5846554B2
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- 238000003384 imaging method Methods 0.000 title claims description 41
- 238000004891 communication Methods 0.000 claims description 150
- 238000009792 diffusion process Methods 0.000 claims description 142
- 238000007667 floating Methods 0.000 claims description 140
- 238000005036 potential barrier Methods 0.000 claims description 80
- 230000004888 barrier function Effects 0.000 claims description 72
- 238000006243 chemical reaction Methods 0.000 claims description 47
- 238000007599 discharging Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 description 46
- 239000000758 substrate Substances 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 230000007423 decrease Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 6
- 230000004397 blinking Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 238000009825 accumulation Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000003190 augmentative effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/767—Horizontal readout lines, multiplexers or registers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/11—Devices sensitive to infrared, visible or ultraviolet radiation characterised by two potential barriers, e.g. bipolar phototransistors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
- H04N25/623—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by evacuation via the output or reset lines
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Description
Claims (9)
- 第1電位障壁を形成する第1障壁領域、及び第2電位障壁を形成する第2障壁領域の間に設けられた光電変換領域と、
前記第1障壁領域に並設され、前記光電変換領域において生成された第1電荷が転送される第1浮遊拡散領域と、
前記第2障壁領域に並設され、前記光電変換領域において生成された第2電荷が流入し、流入した前記第2電荷の一部を蓄積する第2浮遊拡散領域と、
を備え、
前記第2電位障壁は、前記第1電位障壁より低いことを特徴とする画素。 - 前記第1浮遊拡散領域に接続され、前記第1浮遊拡散領域の電位に応じた画像信号を提供する第1出力回路と、
前記第2浮遊拡散領域に接続され、前記第2浮遊拡散領域の電位に応じた通信信号を提供する第2出力回路と、を更に備えることを特徴とする請求項1に記載の画素。 - 前記第2浮遊拡散領域に並設され、第3電位障壁を形成する第3障壁領域と、
前記第3障壁領域に並設され、前記第3電位障壁を越えて前記第2浮遊拡散領域から溢れ出た前記第2電荷が排出される電荷排出領域と、を更に備えることを特徴とする請求項2に記載の画素。 - 前記第3電位障壁は、前記第2電位障壁より低いことを特徴とする請求項3に記載の画素。
- 一端が前記電荷排出領域に接続され、他端が前記第1出力回路に接続された第3出力回路、を更に備えることを特徴とする請求項3又は4に記載の画素。
- 前記第3出力回路の前記一端と前記他端との間には、スイッチが設けられていることを特徴とする請求項5に記載の画素。
- 前記第1電位障壁は、前記第1電荷の転送時に前記第1障壁領域に印加される転送信号により制御され、
前記第2電位障壁は、所望の固定値に設定されており、
前記第1浮遊拡散領域に転送された前記第1電荷に対応し、前記第1浮遊拡散領域の電位に応じた画像信号が出力され、
前記第2浮遊拡散領域に流入した前記第2電荷に対応し、前記第2浮遊拡散領域の電位に応じた通信信号が出力されることを特徴とする請求項1〜6のいずれか一項に記載の画素。 - 二次元状に配置された複数の画素を有する画素アレイと、
前記画素アレイからの画像信号を読み出す読出回路と、
前記画素アレイからの通信信号を受信する受信回路と、
各画素を制御するための制御信号を生成する制御回路と、
を備え、
前記画素は、
第1電位障壁を形成する第1障壁領域、及び第2電位障壁を形成する第2障壁領域の間に設けられた光電変換領域と、
前記第1障壁領域に並設され前記光電変換領域において生成された第1電荷が転送される第1浮遊拡散領域と、
前記第2障壁領域に並設され前記光電変換領域において生成された第2電荷が流入し、流入した前記第2電荷の一部を蓄積する第2浮遊拡散領域と、
前記第1浮遊拡散領域に接続され前記第1浮遊拡散領域の電位に応じた前記画像信号を提供する第1出力回路と、
前記第2浮遊拡散領域に接続され前記第2浮遊拡散領域の電位に応じた前記通信信号を提供する第2出力回路と、
を含み、
前記第2電位障壁は、前記第1電位障壁より低くなるように設定され、
前記画像信号は、前記第1浮遊拡散領域に転送された前記第1電荷に対応し、
前記通信信号は、前記第2浮遊拡散領域に転送された前記第2電荷に対応する、
ことを特徴とする固体撮像装置。 - 前記画素アレイからの判別信号を読み出し、前記判別信号に基づいて信号が重畳された光が入射された前記画素を探索する探索回路を更に備え、
前記画素は、第3電位障壁を形成する第3障壁領域と、前記第3障壁領域に並設され前記第3電位障壁を越えて前記第2浮遊拡散領域から溢れ出た前記第2電荷が排出される電荷排出領域と、一端が前記電荷排出領域に接続され、他端が前記第1出力回路に接続された第3出力回路を含み、
前記探索回路は、前記第3出力回路及び前記第1出力回路を経由して、前記電荷排出領域に排出された前記第2電荷に対応する前記判別信号を読み出す、
ことを特徴とする請求項8に記載の固体撮像装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011167420A JP5846554B2 (ja) | 2011-07-29 | 2011-07-29 | 固体撮像装置、及び画素 |
EP12819277.0A EP2739037B1 (en) | 2011-07-29 | 2012-07-25 | Solid state image pick-up device, and pixel |
US14/234,878 US9307171B2 (en) | 2011-07-29 | 2012-07-25 | Solid state image pick-up device, and pixel |
PCT/JP2012/068870 WO2013018623A1 (ja) | 2011-07-29 | 2012-07-25 | 固体撮像装置、及び画素 |
KR1020147003604A KR20140044909A (ko) | 2011-07-29 | 2012-07-25 | 고체 촬상 장치 및 화소 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011167420A JP5846554B2 (ja) | 2011-07-29 | 2011-07-29 | 固体撮像装置、及び画素 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013031116A JP2013031116A (ja) | 2013-02-07 |
JP5846554B2 true JP5846554B2 (ja) | 2016-01-20 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011167420A Expired - Fee Related JP5846554B2 (ja) | 2011-07-29 | 2011-07-29 | 固体撮像装置、及び画素 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9307171B2 (ja) |
EP (1) | EP2739037B1 (ja) |
JP (1) | JP5846554B2 (ja) |
KR (1) | KR20140044909A (ja) |
WO (1) | WO2013018623A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6045382B2 (ja) * | 2013-02-13 | 2016-12-14 | オリンパス株式会社 | 固体撮像装置 |
US9402041B2 (en) * | 2013-07-11 | 2016-07-26 | Canon Kabushiki Kaisha | Solid-state image sensor and imaging apparatus using same |
US9984917B2 (en) * | 2014-05-21 | 2018-05-29 | Infineon Technologies Ag | Semiconductor device with an interconnect and a method for manufacturing thereof |
JP2016066766A (ja) * | 2014-09-26 | 2016-04-28 | ソニー株式会社 | 固体撮像装置、および電子装置 |
WO2016046685A1 (en) | 2014-09-26 | 2016-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device |
JP6918552B2 (ja) * | 2016-11-11 | 2021-08-11 | 日本放送協会 | 読出し制御回路、固体撮像素子、および撮像素子の駆動方法 |
CN112397530A (zh) * | 2019-08-12 | 2021-02-23 | 天津大学青岛海洋技术研究院 | 一种提高电荷电压转换增益的四管有源像素结构 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004056048A (ja) * | 2002-07-24 | 2004-02-19 | Microsignal Kk | 固体撮像素子 |
US20040164321A1 (en) * | 2003-02-26 | 2004-08-26 | Dialog Semiconductor | Vertical charge transfer active pixel sensor |
JP4581792B2 (ja) * | 2004-07-05 | 2010-11-17 | コニカミノルタホールディングス株式会社 | 固体撮像装置及びこれを備えたカメラ |
JP4449627B2 (ja) * | 2004-07-27 | 2010-04-14 | ソニー株式会社 | 固体撮像装置 |
JP4649623B2 (ja) * | 2006-01-18 | 2011-03-16 | 国立大学法人静岡大学 | 固体撮像装置及びその画素信号の読みだし方法 |
JP5110535B2 (ja) * | 2006-03-31 | 2012-12-26 | 国立大学法人静岡大学 | 半導体測距素子及び固体撮像装置 |
JP4992129B2 (ja) | 2007-07-19 | 2012-08-08 | 株式会社豊田中央研究所 | 光通信装置 |
JP5501358B2 (ja) * | 2008-07-17 | 2014-05-21 | マイクロソフト インターナショナル ホールディングス ビイ.ヴイ. | 電荷感知セルおよび画素の幾何形状が改良された、cmosフォトゲート3dカメラシステム |
JP5283216B2 (ja) | 2008-07-31 | 2013-09-04 | 国立大学法人静岡大学 | 高速電荷転送フォトダイオード、ロックインピクセル及び固体撮像装置 |
US8891978B2 (en) * | 2008-09-19 | 2014-11-18 | National University Corporation Shizuoka University | Information-acquisition device and optical communication system |
JP2010098260A (ja) * | 2008-10-20 | 2010-04-30 | Honda Motor Co Ltd | 発光装置、受光システム及び撮像システム |
US8698061B2 (en) | 2009-12-10 | 2014-04-15 | Luxima Technology LLC | Image sensors, methods, and pixels with storage and transfer gates |
-
2011
- 2011-07-29 JP JP2011167420A patent/JP5846554B2/ja not_active Expired - Fee Related
-
2012
- 2012-07-25 US US14/234,878 patent/US9307171B2/en not_active Expired - Fee Related
- 2012-07-25 KR KR1020147003604A patent/KR20140044909A/ko not_active Application Discontinuation
- 2012-07-25 EP EP12819277.0A patent/EP2739037B1/en not_active Not-in-force
- 2012-07-25 WO PCT/JP2012/068870 patent/WO2013018623A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
KR20140044909A (ko) | 2014-04-15 |
WO2013018623A1 (ja) | 2013-02-07 |
US9307171B2 (en) | 2016-04-05 |
EP2739037A1 (en) | 2014-06-04 |
EP2739037B1 (en) | 2016-04-20 |
JP2013031116A (ja) | 2013-02-07 |
US20140232917A1 (en) | 2014-08-21 |
EP2739037A4 (en) | 2015-04-01 |
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