JP5836683B2 - 電磁波発生素子、電磁波検出素子、時間領域分光装置 - Google Patents
電磁波発生素子、電磁波検出素子、時間領域分光装置 Download PDFInfo
- Publication number
- JP5836683B2 JP5836683B2 JP2011161411A JP2011161411A JP5836683B2 JP 5836683 B2 JP5836683 B2 JP 5836683B2 JP 2011161411 A JP2011161411 A JP 2011161411A JP 2011161411 A JP2011161411 A JP 2011161411A JP 5836683 B2 JP5836683 B2 JP 5836683B2
- Authority
- JP
- Japan
- Prior art keywords
- electromagnetic wave
- light
- dielectric
- waveguide
- partial
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/37—Non-linear optics for second-harmonic generation
- G02F1/377—Non-linear optics for second-harmonic generation in an optical waveguide structure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/37—Non-linear optics for second-harmonic generation
- G02F1/374—Cherenkov radiation
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/13—Function characteristic involving THZ radiation
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Nonlinear Science (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Toxicology (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011161411A JP5836683B2 (ja) | 2010-08-24 | 2011-07-22 | 電磁波発生素子、電磁波検出素子、時間領域分光装置 |
| EP20110760875 EP2609466B1 (en) | 2010-08-24 | 2011-08-08 | Electromagnetic thz wave generating device, electromagnetic thz wave detecting device, and time-domain spectroscopy apparatus |
| US13/818,437 US9244331B2 (en) | 2010-08-24 | 2011-08-08 | Electromagnetic wave generating device, electromagnetic wave detecting device, and time-domain spectroscopy apparatus |
| CN201180040604.3A CN103097952B (zh) | 2010-08-24 | 2011-08-08 | 电磁THz波产生器件、电磁THz波检测器件和时域分光装置 |
| PCT/JP2011/068492 WO2012029534A1 (en) | 2010-08-24 | 2011-08-08 | Electromagnetic thz wave generating device, electromagnetic thz wave detecting device, and time -domain spectroscopy apparatus |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010187563 | 2010-08-24 | ||
| JP2010187563 | 2010-08-24 | ||
| JP2011161411A JP5836683B2 (ja) | 2010-08-24 | 2011-07-22 | 電磁波発生素子、電磁波検出素子、時間領域分光装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012068620A JP2012068620A (ja) | 2012-04-05 |
| JP2012068620A5 JP2012068620A5 (enExample) | 2014-09-04 |
| JP5836683B2 true JP5836683B2 (ja) | 2015-12-24 |
Family
ID=44675772
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011161411A Expired - Fee Related JP5836683B2 (ja) | 2010-08-24 | 2011-07-22 | 電磁波発生素子、電磁波検出素子、時間領域分光装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9244331B2 (enExample) |
| EP (1) | EP2609466B1 (enExample) |
| JP (1) | JP5836683B2 (enExample) |
| CN (1) | CN103097952B (enExample) |
| WO (1) | WO2012029534A1 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ITPD20130190A1 (it) * | 2013-07-05 | 2015-01-06 | Istituto Naz Di Fisica Nuclea Re | Metodo e sistema per caratterizzare impulsi laser brevi e ultrabrevi emessi ad elevata frequenza di ripetizione |
| WO2016070273A1 (en) | 2014-11-07 | 2016-05-12 | Institut National De La Recherche Scientifique | Method and apparatus for characterization of terahertz radiation |
| US9496921B1 (en) * | 2015-09-09 | 2016-11-15 | Cpg Technologies | Hybrid guided surface wave communication |
| JP6731868B2 (ja) * | 2017-02-17 | 2020-07-29 | 株式会社Screenホールディングス | 撮像方法および撮像装置 |
| CN109946262B (zh) * | 2017-12-21 | 2024-01-26 | 深圳先进技术研究院 | 一种基于太赫兹波的检测装置及检测系统 |
| CN108377139B (zh) * | 2018-01-30 | 2021-09-14 | Oppo广东移动通信有限公司 | 电子装置 |
| CN108535520A (zh) * | 2018-05-18 | 2018-09-14 | 浙江大学 | 一种电磁场近场测量装置和制作电磁探针的方法 |
| CN110927700B (zh) * | 2019-11-13 | 2023-04-28 | 中国航空工业集团公司洛阳电光设备研究所 | 一种保护接收探测器的激光回波控制光路 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3644846A (en) * | 1970-05-04 | 1972-02-22 | Bell Telephone Labor Inc | Optical modulation by submillimeter-wave signals and applications thereof |
| US4446448A (en) * | 1982-08-13 | 1984-05-01 | The United States Of America As Represented By The Secretary Of The Army | Biasing magnet holder-tuning cap for dielectric waveguide circulator |
| JP2895204B2 (ja) * | 1990-10-22 | 1999-05-24 | パイオニア株式会社 | 光波長変換素子及びその製造方法 |
| JPH09197454A (ja) * | 1996-01-19 | 1997-07-31 | Mitsubishi Materials Corp | 導波路型非線形光学デバイス |
| IL136673A0 (en) * | 2000-06-11 | 2001-06-14 | Orsense Ltd | A method and device for measuring the concentration of glucose or other substance in blood |
| JP4609993B2 (ja) | 2004-12-08 | 2011-01-12 | 独立行政法人理化学研究所 | テラヘルツ波発生方法及び装置 |
| JP4565198B2 (ja) * | 2005-03-01 | 2010-10-20 | 国立大学法人大阪大学 | 高分解・高速テラヘルツ分光計測装置 |
| US7486247B2 (en) * | 2006-02-13 | 2009-02-03 | Optimer Photonics, Inc. | Millimeter and sub-millimeter wave detection |
| US7515801B2 (en) * | 2006-12-28 | 2009-04-07 | Wisconsin Alumni Research Foundation | Coherent terahertz radiation source |
| JP4834718B2 (ja) * | 2008-01-29 | 2011-12-14 | キヤノン株式会社 | パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 |
| JP5318608B2 (ja) | 2009-02-16 | 2013-10-16 | 理研ビタミン株式会社 | 粉末状チーズ加工品の製造方法 |
| JP2011161411A (ja) | 2010-02-15 | 2011-08-25 | Sumitomo Metal Mining Co Ltd | 濾過方法および濾過装置 |
-
2011
- 2011-07-22 JP JP2011161411A patent/JP5836683B2/ja not_active Expired - Fee Related
- 2011-08-08 EP EP20110760875 patent/EP2609466B1/en not_active Not-in-force
- 2011-08-08 WO PCT/JP2011/068492 patent/WO2012029534A1/en not_active Ceased
- 2011-08-08 CN CN201180040604.3A patent/CN103097952B/zh not_active Expired - Fee Related
- 2011-08-08 US US13/818,437 patent/US9244331B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012029534A1 (en) | 2012-03-08 |
| EP2609466A1 (en) | 2013-07-03 |
| CN103097952A (zh) | 2013-05-08 |
| CN103097952B (zh) | 2015-11-25 |
| JP2012068620A (ja) | 2012-04-05 |
| US9244331B2 (en) | 2016-01-26 |
| US20130146768A1 (en) | 2013-06-13 |
| EP2609466B1 (en) | 2014-07-16 |
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| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
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| A61 | First payment of annual fees (during grant procedure) |
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| LAPS | Cancellation because of no payment of annual fees |