JP5836683B2 - 電磁波発生素子、電磁波検出素子、時間領域分光装置 - Google Patents

電磁波発生素子、電磁波検出素子、時間領域分光装置 Download PDF

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Publication number
JP5836683B2
JP5836683B2 JP2011161411A JP2011161411A JP5836683B2 JP 5836683 B2 JP5836683 B2 JP 5836683B2 JP 2011161411 A JP2011161411 A JP 2011161411A JP 2011161411 A JP2011161411 A JP 2011161411A JP 5836683 B2 JP5836683 B2 JP 5836683B2
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Japan
Prior art keywords
electromagnetic wave
light
dielectric
waveguide
partial
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Expired - Fee Related
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JP2011161411A
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English (en)
Japanese (ja)
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JP2012068620A5 (enExample
JP2012068620A (ja
Inventor
亮太 関口
亮太 関口
康介 加治木
康介 加治木
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2011161411A priority Critical patent/JP5836683B2/ja
Priority to EP20110760875 priority patent/EP2609466B1/en
Priority to US13/818,437 priority patent/US9244331B2/en
Priority to CN201180040604.3A priority patent/CN103097952B/zh
Priority to PCT/JP2011/068492 priority patent/WO2012029534A1/en
Publication of JP2012068620A publication Critical patent/JP2012068620A/ja
Publication of JP2012068620A5 publication Critical patent/JP2012068620A5/ja
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35Non-linear optics
    • G02F1/37Non-linear optics for second-harmonic generation
    • G02F1/377Non-linear optics for second-harmonic generation in an optical waveguide structure
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4795Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35Non-linear optics
    • G02F1/37Non-linear optics for second-harmonic generation
    • G02F1/374Cherenkov radiation
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00Function characteristic
    • G02F2203/13Function characteristic involving THZ radiation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nonlinear Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2011161411A 2010-08-24 2011-07-22 電磁波発生素子、電磁波検出素子、時間領域分光装置 Expired - Fee Related JP5836683B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2011161411A JP5836683B2 (ja) 2010-08-24 2011-07-22 電磁波発生素子、電磁波検出素子、時間領域分光装置
EP20110760875 EP2609466B1 (en) 2010-08-24 2011-08-08 Electromagnetic thz wave generating device, electromagnetic thz wave detecting device, and time-domain spectroscopy apparatus
US13/818,437 US9244331B2 (en) 2010-08-24 2011-08-08 Electromagnetic wave generating device, electromagnetic wave detecting device, and time-domain spectroscopy apparatus
CN201180040604.3A CN103097952B (zh) 2010-08-24 2011-08-08 电磁THz波产生器件、电磁THz波检测器件和时域分光装置
PCT/JP2011/068492 WO2012029534A1 (en) 2010-08-24 2011-08-08 Electromagnetic thz wave generating device, electromagnetic thz wave detecting device, and time -domain spectroscopy apparatus

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010187563 2010-08-24
JP2010187563 2010-08-24
JP2011161411A JP5836683B2 (ja) 2010-08-24 2011-07-22 電磁波発生素子、電磁波検出素子、時間領域分光装置

Publications (3)

Publication Number Publication Date
JP2012068620A JP2012068620A (ja) 2012-04-05
JP2012068620A5 JP2012068620A5 (enExample) 2014-09-04
JP5836683B2 true JP5836683B2 (ja) 2015-12-24

Family

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JP2011161411A Expired - Fee Related JP5836683B2 (ja) 2010-08-24 2011-07-22 電磁波発生素子、電磁波検出素子、時間領域分光装置

Country Status (5)

Country Link
US (1) US9244331B2 (enExample)
EP (1) EP2609466B1 (enExample)
JP (1) JP5836683B2 (enExample)
CN (1) CN103097952B (enExample)
WO (1) WO2012029534A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITPD20130190A1 (it) * 2013-07-05 2015-01-06 Istituto Naz Di Fisica Nuclea Re Metodo e sistema per caratterizzare impulsi laser brevi e ultrabrevi emessi ad elevata frequenza di ripetizione
WO2016070273A1 (en) 2014-11-07 2016-05-12 Institut National De La Recherche Scientifique Method and apparatus for characterization of terahertz radiation
US9496921B1 (en) * 2015-09-09 2016-11-15 Cpg Technologies Hybrid guided surface wave communication
JP6731868B2 (ja) * 2017-02-17 2020-07-29 株式会社Screenホールディングス 撮像方法および撮像装置
CN109946262B (zh) * 2017-12-21 2024-01-26 深圳先进技术研究院 一种基于太赫兹波的检测装置及检测系统
CN108377139B (zh) * 2018-01-30 2021-09-14 Oppo广东移动通信有限公司 电子装置
CN108535520A (zh) * 2018-05-18 2018-09-14 浙江大学 一种电磁场近场测量装置和制作电磁探针的方法
CN110927700B (zh) * 2019-11-13 2023-04-28 中国航空工业集团公司洛阳电光设备研究所 一种保护接收探测器的激光回波控制光路

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644846A (en) * 1970-05-04 1972-02-22 Bell Telephone Labor Inc Optical modulation by submillimeter-wave signals and applications thereof
US4446448A (en) * 1982-08-13 1984-05-01 The United States Of America As Represented By The Secretary Of The Army Biasing magnet holder-tuning cap for dielectric waveguide circulator
JP2895204B2 (ja) * 1990-10-22 1999-05-24 パイオニア株式会社 光波長変換素子及びその製造方法
JPH09197454A (ja) * 1996-01-19 1997-07-31 Mitsubishi Materials Corp 導波路型非線形光学デバイス
IL136673A0 (en) * 2000-06-11 2001-06-14 Orsense Ltd A method and device for measuring the concentration of glucose or other substance in blood
JP4609993B2 (ja) 2004-12-08 2011-01-12 独立行政法人理化学研究所 テラヘルツ波発生方法及び装置
JP4565198B2 (ja) * 2005-03-01 2010-10-20 国立大学法人大阪大学 高分解・高速テラヘルツ分光計測装置
US7486247B2 (en) * 2006-02-13 2009-02-03 Optimer Photonics, Inc. Millimeter and sub-millimeter wave detection
US7515801B2 (en) * 2006-12-28 2009-04-07 Wisconsin Alumni Research Foundation Coherent terahertz radiation source
JP4834718B2 (ja) * 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
JP5318608B2 (ja) 2009-02-16 2013-10-16 理研ビタミン株式会社 粉末状チーズ加工品の製造方法
JP2011161411A (ja) 2010-02-15 2011-08-25 Sumitomo Metal Mining Co Ltd 濾過方法および濾過装置

Also Published As

Publication number Publication date
WO2012029534A1 (en) 2012-03-08
EP2609466A1 (en) 2013-07-03
CN103097952A (zh) 2013-05-08
CN103097952B (zh) 2015-11-25
JP2012068620A (ja) 2012-04-05
US9244331B2 (en) 2016-01-26
US20130146768A1 (en) 2013-06-13
EP2609466B1 (en) 2014-07-16

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