JP5787597B2 - 撮像装置 - Google Patents

撮像装置 Download PDF

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Publication number
JP5787597B2
JP5787597B2 JP2011098586A JP2011098586A JP5787597B2 JP 5787597 B2 JP5787597 B2 JP 5787597B2 JP 2011098586 A JP2011098586 A JP 2011098586A JP 2011098586 A JP2011098586 A JP 2011098586A JP 5787597 B2 JP5787597 B2 JP 5787597B2
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JP
Japan
Prior art keywords
shielding
grating
interference pattern
light
relative position
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Expired - Fee Related
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JP2011098586A
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English (en)
Japanese (ja)
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JP2012228371A5 (OSRAM
JP2012228371A (ja
Inventor
佐藤　玄太
玄太 佐藤
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2011098586A priority Critical patent/JP5787597B2/ja
Publication of JP2012228371A publication Critical patent/JP2012228371A/ja
Publication of JP2012228371A5 publication Critical patent/JP2012228371A5/ja
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Publication of JP5787597B2 publication Critical patent/JP5787597B2/ja
Expired - Fee Related legal-status Critical Current
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JP2011098586A 2011-04-26 2011-04-26 撮像装置 Expired - Fee Related JP5787597B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011098586A JP5787597B2 (ja) 2011-04-26 2011-04-26 撮像装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011098586A JP5787597B2 (ja) 2011-04-26 2011-04-26 撮像装置

Publications (3)

Publication Number Publication Date
JP2012228371A JP2012228371A (ja) 2012-11-22
JP2012228371A5 JP2012228371A5 (OSRAM) 2014-05-22
JP5787597B2 true JP5787597B2 (ja) 2015-09-30

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ID=47430466

Family Applications (1)

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JP2011098586A Expired - Fee Related JP5787597B2 (ja) 2011-04-26 2011-04-26 撮像装置

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JP (1) JP5787597B2 (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10393890B2 (en) * 2015-04-09 2019-08-27 Shimadzu Corporation X-ray imaging device
CN109328035B (zh) * 2016-06-15 2022-05-10 株式会社岛津制作所 放射线摄影装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
JP2008224661A (ja) * 2007-02-14 2008-09-25 Konica Minolta Medical & Graphic Inc Ｘ線撮像素子、装置及び方法
CN102197303A (zh) * 2008-10-29 2011-09-21 佳能株式会社 X射线成像装置和x射线成像方法
JP5459659B2 (ja) * 2009-10-09 2014-04-02 キヤノン株式会社 Ｘ線位相コントラスト像の撮像に用いられる位相格子、該位相格子を用いた撮像装置、ｘ線コンピューター断層撮影システム
US10028716B2 (en) * 2010-10-19 2018-07-24 Koniklijke Philips N.V. Differential phase-contrast imaging

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JP2012228371A (ja) 2012-11-22

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