JP5785741B2 - 測定装置 - Google Patents
測定装置 Download PDFInfo
- Publication number
- JP5785741B2 JP5785741B2 JP2011047008A JP2011047008A JP5785741B2 JP 5785741 B2 JP5785741 B2 JP 5785741B2 JP 2011047008 A JP2011047008 A JP 2011047008A JP 2011047008 A JP2011047008 A JP 2011047008A JP 5785741 B2 JP5785741 B2 JP 5785741B2
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- JP
- Japan
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- value
- characteristic value
- calibration
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus
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- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Molecular Biology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
1 ・・・本体
2 ・・・電極部
21 ・・・検出部
6 ・・・校正開始指令受付部
7 ・・・安定度算出部
8 ・・・表示出力部
Claims (5)
- 対をなす電極部を有しそれら各電極部を測定対象物に接触させて生じる電位差を出力する検出部と、その電位差に基づいて得られる前記測定対象物の特性値を測定結果として表示する本体と、を備えた測定装置であって、
ユーザからの校正開始指令を受け付ける校正開始指令受付部と、
前記特性値の変化に基づいて、当該特性値の安定度を算出する安定度算出部と、
少なくとも前記校正開始指令受付部が前記ユーザからの校正開始指令を受け付ける以前において、前記安定度の値そのものを表示する表示出力部と、を備え、
前記安定度が、前記特性値の変化量の値自体、又は、前記特性値の変化量の値自体を用いた四則演算により算出される値であることを特徴とする測定装置。 - 前記安定度算出部が、所定期間ごとに前記安定度を算出するものであり、
当該安定度が、前記所定期間内に得られた特性値の最大値と最小値の差分である請求項1記載の測定装置。 - 前記表示出力部が、前記安定度とともに現在の特性値の値そのものを表示するように構成された請求項1又は2記載の測定装置。
- 対をなす電極部を測定対象物に接触させて生じる信号に基づいて得られる前記測定対象物の特性値を測定結果として表示する本体を備えた測定装置であって、
ユーザからの校正開始指令を受け付ける校正開始指令受付部と、
前記特性値の変化に基づいて、当該特性値の安定度を算出する安定度算出部と、
少なくとも前記校正開始指令受付部が前記ユーザからの校正開始指令を受け付ける以前において、前記安定度の値そのものを表示する表示出力部と、を備え、
前記安定度が、前記特性値の変化量の値自体、又は、前記特性値の変化量の値自体を用いた四則演算により算出される値であることを特徴とする測定装置。 - 前記特性値が、pHである請求項1乃至4いずれかに記載の測定装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011047008A JP5785741B2 (ja) | 2011-03-03 | 2011-03-03 | 測定装置 |
CN201210052135.3A CN102680522B (zh) | 2011-03-03 | 2012-03-01 | 测量装置 |
US13/412,047 US8965724B2 (en) | 2011-03-03 | 2012-03-05 | Measuring device |
EP12166127A EP2498087A1 (en) | 2011-03-03 | 2012-04-30 | Measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011047008A JP5785741B2 (ja) | 2011-03-03 | 2011-03-03 | 測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012184970A JP2012184970A (ja) | 2012-09-27 |
JP5785741B2 true JP5785741B2 (ja) | 2015-09-30 |
Family
ID=45774087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011047008A Active JP5785741B2 (ja) | 2011-03-03 | 2011-03-03 | 測定装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8965724B2 (ja) |
EP (1) | EP2498087A1 (ja) |
JP (1) | JP5785741B2 (ja) |
CN (1) | CN102680522B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3101414B1 (en) | 2014-01-31 | 2020-09-02 | Kabushiki Kaisha Pilot Corporation | Acrylamide-free electrochemical measurement apparatus with lanthanide glass electrode |
JP6047535B2 (ja) * | 2014-09-24 | 2016-12-21 | アンリツ株式会社 | 移動体端末試験装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3099362B2 (ja) * | 1990-11-30 | 2000-10-16 | 横河電機株式会社 | pH計のセンサ応答時間測定方法 |
JP2815978B2 (ja) * | 1990-05-25 | 1998-10-27 | 株式会社東芝 | 放射線測定装置 |
JP3019904B2 (ja) * | 1993-04-28 | 2000-03-15 | 松下精工株式会社 | 炭酸ガス濃度検知装置 |
JPH08220049A (ja) | 1995-02-20 | 1996-08-30 | Hitachi Ltd | 電解質測定法及び装置 |
US6735535B1 (en) * | 2000-05-05 | 2004-05-11 | Electro Industries/Gauge Tech. | Power meter having an auto-calibration feature and data acquisition capabilities |
DE10141556B4 (de) * | 2001-08-24 | 2009-11-19 | Knick Elektronische Messgeräte GmbH & Co. KG | Verfahren zur Überwachung der Messung von Prozessgrößen, insbesondere bei der pH-Messung |
JP4395318B2 (ja) * | 2003-04-21 | 2010-01-06 | 株式会社堀場製作所 | 測定装置 |
US8456152B2 (en) * | 2007-08-14 | 2013-06-04 | Fluke Corporation | Digital multimeter with context-sensitive explanatory information |
JP2009244006A (ja) * | 2008-03-31 | 2009-10-22 | Dkk Toa Corp | イオン濃度の変化量を示す測定装置 |
-
2011
- 2011-03-03 JP JP2011047008A patent/JP5785741B2/ja active Active
-
2012
- 2012-03-01 CN CN201210052135.3A patent/CN102680522B/zh active Active
- 2012-03-05 US US13/412,047 patent/US8965724B2/en active Active
- 2012-04-30 EP EP12166127A patent/EP2498087A1/en not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
US8965724B2 (en) | 2015-02-24 |
US20120226459A1 (en) | 2012-09-06 |
JP2012184970A (ja) | 2012-09-27 |
CN102680522A (zh) | 2012-09-19 |
CN102680522B (zh) | 2016-10-05 |
EP2498087A1 (en) | 2012-09-12 |
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