JP5773743B2 - Circuit board inspection apparatus and circuit board inspection method - Google Patents

Description

  The present invention relates to a circuit board inspection apparatus and a circuit board inspection method for inspecting an insulation state between conductor patterns in a circuit board having a plurality of conductor patterns.

  As a circuit board inspection method for inspecting an insulation state between conductor patterns formed on a circuit board, a circuit that performs an insulation inspection on a pair of conductor patterns selected from each conductor pattern for all combinations of a pair of conductor patterns Substrate inspection methods are known. In this case, when a circuit board on which a large number of conductor patterns are formed is inspected by this circuit board inspection method, the number of combinations of a pair of conductor patterns becomes enormous, and a long time is required for the inspection. . As a circuit board inspection method capable of solving such problems, the number of inspections is performed by inspecting the insulation state between one of the conductor patterns and a part or all of the other conductor patterns except the one. There is known a circuit board inspection method (for example, insulation inspection disclosed in paragraphs (0002) to (0006) of JP-A-2000-193702, hereinafter also referred to as “1 to N inspection”).

  For example, when the above 1-to-N inspection is performed on a circuit board having M conductor patterns numbered from 1 to M, the first inspection is performed as shown in FIG. The first conductor pattern is selected as one of the M conductor patterns, and the second to Mth conductor patterns other than the selected first conductor pattern are set to the same potential while the second to Mth conductor patterns are set to the same potential. A test signal is supplied between the first conductor pattern and the first conductor pattern, the resistance value between the conductor patterns is measured, and the insulation state between the conductor patterns is inspected. In this case, when the resistance value is equal to or greater than a predetermined lower limit value, it is determined that the insulation state between the conductor patterns is good. Next, in the second inspection, the first conductor pattern that has been inspected is excluded from the inspection target, and the second conductor pattern is newly selected as one of the M conductor patterns. The conductor patterns from No. 3 to No. M except for the No. conductor pattern are set to the same potential, and an inspection signal is supplied between the No. 3 to No. M conductor patterns and the No. 2 conductor pattern to each conductor pattern. Check the insulation state between. Hereinafter, as shown in the figure, a conductor pattern having a larger number is sequentially selected as one of the M conductor patterns, and an inspection signal is supplied while keeping each conductor pattern having a larger number than that conductor pattern at the same potential. Then, the insulation state between each conductor pattern is inspected, and this inspection is repeated until the number of the conductor pattern to be selected as one of the M conductor patterns becomes (M-1). -1) Perform inspections one time. By performing the inspection in such a procedure, the inspection time can be significantly shortened.

  Further, when performing the inspection by the circuit board inspection method described above, the probe is brought into contact with all inspection target points (connection points (so-called lands) for connecting electronic components etc.) provided in each conductor pattern. In this state, the inspection signal is supplied by connecting and disconnecting the power supply unit and the probe using a scanner switch or the like. By adopting such a configuration and method, a plurality of conductor patterns can be set to the same potential, and the inspection time can be further shortened.

JP 2000-193702 A (page 3, FIGS. 9-11)

  However, the above-described conventional circuit board inspection method has the following problems to be solved. That is, in the circuit board inspection method described above, the power supply unit and the probe are connected and disconnected in a state where the probe is in contact with all the inspection target points provided on each conductor pattern of the circuit board. On the other hand, since a large number of electronic components are connected to the power supply conductor pattern and the power supply conductor pattern connected to the reference potential, a large number of inspection points are generally provided in these conductor patterns. For this reason, when the inspection is performed by the circuit board inspection method, many probes come into contact with these conductor patterns. Therefore, when inspecting the insulation state between conductor patterns having a large number of inspection target points, in addition to the fact that there are many probes in contact with the inspection target points of these conductor patterns, they are connected to the probes. Due to the large number of cables and the number of scanner switches connected to each cable, there is a stray capacitance between these many probes, cables and scanner switches (collectively referred to as “signal supply medium”). growing. For this reason, when inspecting the insulation state between conductor patterns with a large number of points to be inspected, the time from the start of supplying the inspection signal to the voltage between the conductor patterns reaching the specified voltage required for the inspection becomes longer. It becomes difficult to improve efficiency. Further, when the stray capacitance between the signal supply media is large, a lot of electric charges are charged. For this reason, when dielectric breakdown occurs during the inspection of the insulation state between conductor patterns having a large number of inspection target points, there is a possibility that many charged charges are discharged all at once and damage the circuit board.

  The present invention has been made in view of such problems to be solved, and mainly provides a circuit board inspection apparatus and a circuit board inspection method capable of improving inspection efficiency and preventing damage to a circuit board during inspection. Objective.

In order to achieve the above object, a circuit board inspection apparatus according to claim 1, wherein an inspection probe brought into contact with each inspection target point on a circuit board having a plurality of conductor patterns having one or a plurality of inspection target points is provided. A measuring unit for measuring a resistance value between the conductor patterns in a state in which an inspection signal is supplied to the conductor patterns, and setting one of the conductor patterns as a first object to be inspected. A part or all of the conductor pattern other than the first object to be inspected is set as a second object to be inspected, and the inspection target points in the second object to be inspected are set to the same potential. The second object to be inspected and the first object to be inspected based on the resistance value measured by the measuring unit in a state where the inspection signal is supplied between the two object to be inspected and the first object to be inspected. Insulation with the specimen When the first insulation inspection for inspecting the state is performed a plurality of times while changing the combination of the first object to be inspected and the second object to be inspected, the first insulation inspection after the second time is more than that. The conductor pattern set as the first inspection object in the previous first insulation inspection is excluded from the objects to be set as the first inspection object and the second inspection object, and in the immediately preceding first insulation inspection. Circuit board inspection provided with an inspection unit that excludes one of the conductor patterns set as the second object to be inspected from the object to be set as the second object to be inspected and sets it as the first object to be inspected In the apparatus, when the inspection unit includes a specific conductor pattern having a predetermined number or more of the inspection target points in the conductor patterns on the circuit board, the specific conductor After the turn is excluded from the object to be set as the first object to be tested and the plurality of first insulation inspections are performed, one specific conductor pattern is set as the third object to be inspected, and the specific object Of the other conductor patterns excluding the conductor pattern set as the first object to be inspected and the specific conductor pattern in the first insulation inspection executed by setting the conductor pattern as the second object to be inspected. set the part as a fourth object to be inspected, the fourth said inspection signal between the third inspection object at the same potential to each inspection point in the object to be inspected while being with the fourth object to be tested A second insulation test is performed for inspecting an insulation state between the fourth object to be inspected and the third object to be inspected based on the resistance value measured by the measurement unit in a state where the measurement object is supplied.

  The circuit board inspection apparatus according to claim 2 is the circuit board inspection apparatus according to claim 1, wherein the inspection section performs the second and subsequent second insulation inspections when there are a plurality of the specific conductor patterns. The specific conductor pattern set as the third inspection object in the second insulation inspection before that is excluded from the target to be set as the fourth inspection object.

  The circuit board inspection apparatus according to claim 3 is the circuit board inspection apparatus according to claim 1 or 2, wherein the inspection unit is configured to use the conductor pattern as the fourth object to be inspected when the second insulation inspection is performed. Set only one.

The circuit board inspection method according to claim 4 sets one of the conductor patterns in the circuit board having a plurality of conductor patterns having one or a plurality of inspection target points as a first object to be inspected. In addition, a part or all of the conductor pattern other than the first object to be inspected is set as a second object to be inspected, and each inspection object in the first object to be inspected and the second object to be inspected is set. An inspection signal is supplied between the second object to be inspected and the first object to be inspected through the inspection probe brought into contact with the point while keeping the respective inspection object points in the second object to be inspected at the same potential. A resistance value between the second object to be inspected and the first object to be inspected is measured, and based on the resistance value, between the second object to be inspected and the first object to be inspected. A first insulation test for inspecting an insulation state of the first test When performing a plurality of times while changing the combination of the body and the second object to be inspected, in the first insulation inspection after the second time, as the first object to be inspected in the first insulation inspection before that One of the conductor patterns set as the second object to be inspected in the immediately preceding first insulation inspection while excluding the set conductor pattern from the object to be set as the first object to be inspected and the second object to be inspected. A circuit board inspection method in which two conductor patterns are excluded from an object to be set as the second object to be tested and set as the first object to be inspected, and are determined in advance in each conductor pattern on the circuit board When there is a specific conductor pattern having a plurality of inspection target points, the specific conductor pattern is excluded from the target to be set as the first inspected object, and the plurality of times After performing the insulation inspection, the one specific conductor pattern is set as the third object to be inspected, and the first insulation inspection is performed by setting the specific conductor pattern as the second object to be inspected. the part of the other of the conductor pattern excluding said conductive pattern and the specific conductor pattern set as the first object to be inspected is set as the fourth object to be inspected, each inspection in the fourth device under test Based on the resistance value measured by the measurement unit in a state where the inspection signal is supplied between the fourth object to be inspected and the third object to be inspected while keeping the target point at the same potential. A second insulation test is performed to inspect the insulation state between the four test objects and the third test object.

  In the circuit board inspection apparatus according to claim 1 and the circuit board inspection method according to claim 4, when there is a specific conductor pattern having a predetermined number of inspection points or more, the specific conductor pattern is changed to the first pattern. After performing the first insulation inspection by excluding it from the object to be set as one inspection object, one specific conductor pattern is set as the third inspection object and the second insulation inspection is executed. For this reason, in this circuit board inspection apparatus and circuit board inspection method, in the first insulation inspection and the second insulation inspection, the inspection signal Hi side (high level) via a signal supply medium such as a probe pin for supplying the inspection signal. As a result, the smaller of the number of inspection target points connected to the potential side) and the number of inspection target points connected to the Lo side (low potential side) of the inspection signal can be reduced. As a parameter, the stray capacitance between the signal supply media whose sizes are determined can be sufficiently reduced. Therefore, according to the circuit board inspection apparatus and the circuit board inspection method, it is possible to shorten the time from the start of supplying the inspection signal to the conductor pattern to the time when the voltage between the conductor patterns reaches the specified voltage required for the inspection. As a result, the inspection efficiency can be improved sufficiently. Further, according to the circuit board inspection apparatus and the circuit board inspection method, since the stray capacitance between the signal supply media is sufficiently small, the charge charge can be suppressed to a low level. Even if this occurs, it is possible to reliably prevent the circuit board from being damaged by the discharge of the charged charges.

  According to the circuit board inspection apparatus of claim 2, when there are a plurality of specific conductor patterns having a predetermined number of inspection target points or more, in the second and subsequent second insulation inspections, By excluding the specific conductor pattern set as the third inspected object in the previous second insulation inspection from the object to be set as the fourth inspected object, the type of combination of the third inspected object and the fourth inspected object Since the number of the second insulation inspections can be reduced by the reduction in the inspection efficiency, the inspection efficiency can be further improved.

  In the circuit board inspection apparatus according to claim 3, one conductor pattern is set as the fourth object to be inspected when the second insulation inspection is performed. For this reason, according to this circuit board inspection apparatus, the conductor connected to the Hi side of the inspection signal in the second insulation inspection as compared with the configuration and method of setting a plurality of conductor patterns as the fourth inspected object As a result of the fact that the smaller one of the number of inspection points of the pattern and the number of inspection points of the conductor pattern connected to the Lo side of the inspection signal can be reduced, floating between the signal supply media The capacity can be further reduced. Therefore, according to this circuit board inspection apparatus, it is possible to further improve the inspection efficiency and more reliably prevent the circuit board from being damaged during the inspection.

1 is a configuration diagram showing a configuration of a circuit board inspection device 1. FIG. 1 is a configuration diagram showing a configuration of a circuit board 100. FIG. It is the 1st explanatory view explaining a circuit board inspection method. It is the 2nd explanatory view explaining a circuit board inspection method. It is explanatory drawing explaining a comparative example. It is the 3rd explanatory view explaining a circuit board inspection method. It is explanatory drawing explaining the conventional circuit board inspection method.

  Hereinafter, an embodiment of a circuit board inspection apparatus and a circuit board inspection method will be described with reference to the accompanying drawings.

  First, the configuration of the circuit board inspection apparatus 1 will be described. A circuit board inspection apparatus 1 shown in FIG. 1 is a circuit board on which a plurality of (for example, eight) conductor patterns P1 to P8 (see FIG. 2; hereinafter, also referred to as “conductor pattern P” when not distinguished) are arranged. The insulation state between the conductor patterns P in 100 can be inspected according to a circuit board inspection method described later. In this case, each conductor pattern P of the circuit board 100 is a connection point (a so-called land) for connecting those terminals when mounting an electronic component or the like, and a probe pin 21 described later at the time of inspection. An inspection target point Pj to be contacted (probed) is provided.

  On the other hand, as shown in FIG. 1, the circuit board inspection apparatus 1, as an example, includes a substrate holding unit 11, a probe unit 12, a moving mechanism 13, an inspection signal output unit 14, a scanner unit 15, a measurement unit 16, and a storage unit 17. And a control unit 18.

  For example, the substrate holding unit 11 includes a holding table and a clamp mechanism (none of which is shown) that is attached to the holding table and sandwiches and fixes the end of the circuit board 100 to hold the circuit board 100. It is configured. The probe unit 12 includes a plurality of probe pins (inspection probes) 21 that are brought into contact (probing) with the inspection target points Pj in the respective conductor patterns P of the circuit board 100, and are configured in a jig shape. The moving mechanism 13 performs probing by moving the probe unit 12 in the vertical direction under the control of the control unit 18.

  The inspection signal output unit 14 outputs an inspection signal S (for example, a DC voltage signal) whose voltage value (signal level) is regulated to about 200 V, for example, according to the control of the control unit 18. The scanner unit 15 includes a plurality of switches (not shown), and switches each switch to an on state or an off state according to the control of the control unit 18, whereby the probe pin 21 and the inspection signal in the probe unit 12 are switched. Connection / disconnection with the output unit 14 and connection / disconnection between the probe pin 21 and the measurement unit 16 are performed (hereinafter, these processes are also referred to as “connection / disconnection process”).

  In the state where the inspection signal S is supplied to each conductor pattern P through the probe pin 21 in contact with each inspection target point Pj in each conductor pattern P of the circuit board 100, the measurement unit 16 A measurement process for measuring the resistance value R is executed.

  The storage unit 17 is a conductor used in a later-described first insulation test and second insulation test (hereinafter also referred to as “insulation test” when the first insulation test and the second insulation test are not distinguished), which is executed by the control unit 18. Stores pattern data. In this case, the conductor pattern data includes, for example, information for identifying each conductor pattern P of the circuit board 100 (for example, information indicating the number assigned to each conductor pattern P), and inspection target points provided in each pattern P. It includes information indicating the number of Pj, information that can identify the probe pins 21 that are in contact (probing) with each inspection target point Pj of each conductor pattern P at the time of inspection, and the like.

  The control unit 18 controls each component constituting the circuit board inspection apparatus 1 according to an operation signal output from an operation unit (not shown). Specifically, the control unit 18 controls the movement of the probe unit 12 by the moving mechanism 13. The control unit 18 controls the output of the inspection signal S by the inspection signal output unit 14.

  Further, the control unit 18 functions as an inspection unit, and a resistance value obtained by measuring the insulation state between the conductor patterns P on the circuit board 100 by the measurement unit 16 by performing a first insulation test described later a plurality of times. Inspect based on R. In the first insulation inspection, the control unit 18 executes a supply process for supplying the inspection signal S to the conductor pattern P of the circuit board 100 by controlling the connection / disconnection process by the scanner unit 15.

  In this case, the control unit 18 sets one of the conductor patterns P as the first inspected object in the supply process in the first insulation inspection, and sets the other conductor patterns P excluding the first inspected object. A part or all of them is set as a second object to be inspected, and each inspection object point Pj in the second object to be inspected is set to the same potential, while being inspected between the second object to be inspected and the first object to be inspected. A signal S is supplied. Moreover, the control part 18 changes the combination of the conductor pattern P set as a 1st to-be-tested object and a 2nd to-be-tested object for every 1st insulation test | inspection according to the procedure mentioned later.

  Further, the control unit 18 includes a conductor pattern P (corresponding to a specific conductor pattern) having inspection target points Pj of a predetermined number Ar or more in each conductor pattern P on the circuit board 100 of the object to be inspected. Hereinafter, when it is distinguished from other conductor patterns P (also referred to as “conductor pattern Pa”), the conductor pattern Pa is excluded from the target to be set as the first inspected object, and a plurality of first insulation inspections are performed. After that, the second insulation inspection described later is executed to inspect the insulation state between the conductor pattern Pa and the other conductor pattern P based on the resistance value R measured by the measurement unit 16.

The controller 18 executes the above-described supply process in the second insulation test. In this case, the control unit 18 sets the first conductor pattern Pa as the third object to be inspected, and also sets the conductor pattern Pa as the second object to be inspected and performs the first object to be inspected in the first insulation inspection. one set (an example of a part) as a fourth object to be inspected, the inspection point in a fourth object to be inspected of the other conductor pattern P except the set conductor pattern P and its conductor pattern Pa as An inspection signal S is supplied between the fourth object to be inspected and the third object to be inspected while keeping Pj at the same potential.

  In addition, when there are a plurality of conductor patterns Pa, the control unit 18 executes the second insulation inspection a plurality of times while changing the combination of the third inspection object and the fourth inspection object according to the procedure described later. In this case, when performing the second insulation inspection a plurality of times, the control unit 18 performs the conductor pattern Pa set as the third object to be inspected in the second insulation inspection before the second insulation inspection after the second time. Are excluded from the target to be set as the fourth inspected object.

  Next, a circuit board inspection method for inspecting the insulation state between the conductor patterns P in the circuit board 100 using the circuit board inspection apparatus 1 and the operation of the circuit board inspection apparatus 1 at that time will be described with reference to the drawings. explain. The circuit board 100 has eight conductor patterns P1 to P8 as shown in FIG. Moreover, as shown in the figure, the conductor patterns P1 to P8 are provided with one or a plurality (2 to 9) of inspection target points Pj. In addition, it is assumed that the specified number Ar is determined in advance to “3”.

  First, the circuit board 100 of the object to be inspected is placed on a holding base (not shown) in the board holding unit 11, and then the end of the circuit board 100 is sandwiched by a clamping mechanism (not shown) of the board holding unit 11. Then, the circuit board 100 is held by the board holding part 11. Subsequently, an inspection start operation is performed using an operation unit (not shown). At this time, the control unit 18 controls the moving mechanism 13 to move the probe unit 12 downward in accordance with the operation signal output from the operation unit. Thereby, the tip of each probe pin 21 of the probe unit 12 is brought into contact (probing) with each inspection target point Pj in each conductor pattern P.

  Next, the control unit 18 reads the conductor pattern data from the storage unit 17. Subsequently, the control unit 18 determines, based on the conductor pattern data, whether or not a conductor pattern Pa having “3” or more inspection target points Pj as the specified number Ar exists in each conductor pattern P. To do. In this case, in the circuit board 100, as shown in FIG. 2, there are three conductor patterns P3, P4, and P6 having three or more inspection target points Pj, and the control unit 18 uses these conductor patterns P ( Hereinafter, it is determined that the “conductor pattern Pa3, Pa4, Pa6”) is the conductor pattern Pa. Next, the control unit 18 controls the test signal output unit 14 to start outputting the test signal S (for example, a DC voltage signal having a voltage value of 200 V).

  Subsequently, the control unit 18 executes the first insulation inspection a plurality of times (in this example, four times) as follows. In the first first insulation inspection, the control unit 18 first sets three conductor patterns P3, P4, and P6, which are determined to be the conductor pattern Pa among the conductor patterns P1 to P8, as the first object to be inspected. Excluded from the target. As a result, the conductor patterns P1, P2, P5, P7, and P8 are the setting targets of the first inspection object.

  Next, as shown in FIG. 3, the control unit 18 selects the conductor pattern P1 as one of the conductor patterns P1, P2, P5, P7, and P8 as the setting target of the first object to be inspected. The conductor pattern P1 is set as the first object to be inspected. Moreover, the control part 18 sets all the other conductor patterns P2-P8 except the conductor pattern P1 as a 2nd to-be-tested object (refer the column of "the 1st time" in the figure).

  Subsequently, the control unit 18 executes supply processing. In this supply process, the control unit 18 controls the scanner unit 15 so that the probe pin 21 and the inspection signal output unit 14 that are in contact with the inspection target point Pj of the first object to be inspected (conductor pattern P1). Connecting. Further, the control unit 18 controls the scanner unit 15 so that the probe pin 21 in contact with each inspection target point Pj of the second object to be inspected (conductor patterns P2 to P8) has a reference potential (for example, ground potential). Connect to.

  As a result, the inspection signal S is supplied (applied) between the first inspection object and the second inspection object via the probe pins 21. In this case, since the inspection target point Pj of the second object to be inspected is connected to the ground potential via the probe pin 21, each inspection target point Pj is maintained at the same potential (in this example, the ground potential).

  Next, the control unit 18 causes the measurement unit 16 to perform a measurement process to measure the resistance value R between the first inspection object and the second inspection object. Subsequently, the control unit 18 compares the resistance value R measured by the measurement unit 16 with the lower limit value of the resistance value, and inspects the insulation state between the first inspection object and the second inspection object. In this case, the control unit 18 determines that the insulation state is good when the calculated (measured) resistance value is equal to or greater than the lower limit value, and determines that the insulation state is poor when the calculated resistance value is smaller than the lower limit value.

  Next, the control unit 18 executes a second first insulation test. In the second first insulation inspection, the control unit 18 excludes the conductor patterns P3, P4, and P6, which are the conductor patterns Pa, from the objects to be set as the first object to be inspected. In addition, the control unit 18 sets the conductor pattern P1 set as the first object to be tested in the first insulation test before (first time in this example) before that as the first object to be set and the second object. It excludes from the object set up as an inspection object. As a result, the conductor patterns P2, P5, P7, and P8 are set as the first inspection target.

  Subsequently, the control unit 18 is a conductor pattern P to be set for the first object to be inspected (in this example, conductor patterns P2, P5, P7, P8), and the second object to be examined in the immediately preceding first insulation inspection. As one of the conductor patterns P (in this example, conductor patterns P2, P5, P7, P8) that satisfy the condition that the conductor pattern P is set as an inspection object (in this example, conductor patterns P2 to P8) The conductor pattern P2 is selected, and the conductor pattern P2 is excluded from the object to be set as the second object to be tested and set as the first object to be inspected. Moreover, the control part 18 sets all the remaining conductor patterns P3-P8 as a 2nd to-be-inspected object (refer the column of "the 2nd time" in FIG. 3). Next, the control unit 18 executes the supply process, and subsequently inspects the insulation state between the first device under test and the second device under test based on the resistance value R measured by the measurement unit 16.

  Next, the control unit 18 performs a third first insulation test. In the third first insulation inspection, the control unit 18 excludes the conductor patterns P3, P4, and P6, which are the conductor patterns Pa, from the objects to be set as the first object to be inspected. Further, the control unit 18 sets the conductor patterns P1 and P2 set as the first inspected object in the first insulation inspection before (in this example, the first and second times) before that as the first inspected object. And the target to be set as the second object to be inspected. As a result, the conductor patterns P5, P7, and P8 are set as the first inspection target.

  Subsequently, the control unit 18 is a conductor pattern P to be set for the first object to be inspected (in this example, conductor patterns P1, P5, P7, P8), and in the immediately preceding first insulation inspection, the second object to be inspected. As one of the conductor patterns P (in this example, the conductor patterns P5, P7, P8) that satisfy the condition that the conductor pattern P is set as the inspection object (in this example, the conductor patterns P3 to P8), the conductor The pattern P5 is selected, and the conductor pattern P5 is excluded from the object to be set as the second inspection object and set as the first inspection object. Further, the control unit 18 sets a part of the remaining conductor pattern P (in this example, the conductor patterns P6 to P8) as the second object to be inspected (see the “third time” column in FIG. 3). Next, the control unit 18 executes the supply process, and subsequently inspects the insulation state between the first device under test and the second device under test based on the resistance value R measured by the measurement unit 16.

  Next, the control unit 18 performs a fourth first insulation test. In the fourth first insulation inspection, the control unit 18 excludes the conductor patterns P3, P4, and P6, which are the conductor patterns Pa, from the objects to be set as the first object to be inspected. In addition, the control unit 18 uses the first inspected conductor patterns P1, P2, and P5 set as the first inspected object in the first insulation inspection before (first to third in this example). And the target to be set as the second object to be inspected. As a result, the conductor patterns P1, P2, P7, and P8 are the setting targets of the first inspection object.

  Subsequently, the control unit 18 is a conductor pattern P (a conductor pattern P1, P2, P7, P8 in this example) to be set for the first object to be inspected, and the second object to be tested in the immediately preceding first insulation inspection. As one of the conductor patterns P (in this example, the conductor patterns P7, P8) that satisfy the condition that the conductor pattern P is set as the inspection object (in this example, the conductor patterns P6, P7, P8), the conductor The pattern P7 is selected, and the conductor pattern P7 is excluded from the target to be set as the second inspection object and set as the first inspection object. Further, the control unit 18 sets a part of the conductor pattern P (in this example, the conductor pattern P8) as the second object to be inspected (see the “fourth” column in FIG. 3). Next, the control unit 18 executes the supply process, and subsequently inspects the insulation state between the first device under test and the second device under test based on the resistance value R measured by the measurement unit 16. Thus, the first insulation test is completed.

Next, the control unit 18 performs a second insulation test. In this case, since there are a plurality of conductor patterns Pa (three in this example), the control unit 18 performs the second insulation inspection a plurality of times while changing the combination of the third inspection object and the fourth inspection object. . In the first second insulation inspection, as shown in FIG. 4, the control unit 18 selects the conductor pattern Pa3 as one of the conductor patterns Pa3, Pa4, and Pa6, and the conductor pattern Pa3 is subjected to the third inspection. Set as body. In addition, the control unit 18 sets the conductor pattern P3 set as the first object to be inspected in the first insulation inspection performed by setting the conductor pattern Pa3 set as the third object to be inspected as the second object to be inspected. in the example, the conductor pattern P1, P2: a see FIG. 3), the other conductor pattern P (this example except for its conductor pattern Pa3, as one of the conductor patterns P4～P8) (an example of a part) The conductor pattern P4 is selected, and the conductor pattern P4 is set as the fourth object to be inspected (see the “first time” column in FIG. 4).

  Subsequently, the control unit 18 executes a supply process and controls the scanner unit 15 to connect the probe pin 21 in contact with the inspection target point Pj of the third object to be inspected and the inspection signal output unit 14. At the same time, the probe pin 21 in contact with the inspection target point Pj of the fourth object to be inspected is connected to the reference potential. As a result, the inspection signal S is supplied between the fourth object to be inspected and the third object to be inspected while the inspection target points Pj in the fourth object to be inspected are maintained at the same potential. Next, the control unit 18 causes the measurement unit 16 to measure the resistance value R between the third object to be inspected and the fourth object to be inspected. Subsequently, the control unit 18 compares the resistance value R measured by the measurement unit 16 with the lower limit value of the resistance value, and inspects the insulation state between the third inspection object and the fourth inspection object.

Next, the control unit 18 executes a second second insulation test. In the second second insulation inspection, the combination of the third inspection object and the fourth inspection object is changed. Specifically, the control unit 18 sets the conductor pattern Pa3 as the third object to be inspected. Further, the control unit 18 performs the same operation as in the first second insulation inspection among the other conductor patterns P (conductor patterns P4 to P8 in this example) excluding the conductor patterns P1 and P2 and the conductor pattern Pa3. one selects a conductor pattern P5 as (an example of a part), and sets the conductive pattern P 5 as a fourth object to be inspected (see column "second time" in FIG. 4). Subsequently, the control unit 18 performs a supply process, and then inspects the insulation state between the third inspected object and the fourth inspected object based on the resistance value R measured by the measuring unit 16.

  Subsequently, the control unit 18 sets the conductor pattern Pa3 as the third object to be inspected, and executes the third to fifth second insulation inspections while changing the conductor pattern P to be set as the fourth object to be inspected. (Refer to the column “3rd to 5th” in FIG. 4).

  Next, the control unit 18 performs the sixth to ninth second insulation inspections. In this case, the control unit 18 selects the conductor pattern Pa4 as one of the conductor patterns Pa3, Pa4, and Pa6, and sets the conductor pattern Pa4 as the third device under test. Further, the control unit 18 performs the second and subsequent second insulation inspections by setting the conductor pattern Pa4 as the second inspected object and performing the conductor pattern P set as the first inspected object in the first insulation inspection described above. (In this example, the conductor patterns P1, P2: see FIG. 3) and the conductor pattern Pa4 are excluded from the objects to be set as the fourth object to be inspected, and further, the second before the second insulation inspection to be performed. The conductor pattern Pa3 set as the third object to be inspected is set as the fourth object to be inspected in the 2 insulation inspection (for example, when the second insulation inspection is being performed for the sixth time, the first to the fifth second insulation inspection). Excluded from the target. As a result, since the conductor patterns P5 to P8 are set as the fourth inspection object, the control unit 18 sequentially selects one of the conductor patterns P5 to P8 in the sixth to ninth second insulation inspections. Select and set as the fourth object to be inspected. (Refer to the columns “6th” to “9th” in FIG. 4).

  Subsequently, the control unit 18 performs the tenth and eleventh second insulation inspections. In this case, the control unit 18 selects the conductor pattern Pa6 as one of the conductor patterns Pa3, Pa4, Pa6, and sets the conductor pattern Pa6 as the third device under test. The control unit 18 performs the second and subsequent second insulation inspections by setting the conductor pattern Pa6 as the second inspected object and performing the conductor pattern P set as the first inspected object in the first insulation inspection described above. (In this example, the conductor patterns P1, P2, P5: see FIG. 3) and the conductor pattern Pa6 are excluded from the objects to be set as the fourth object to be inspected, and further before the second insulation inspection to be performed. The conductor patterns Pa3 and Pa4 set as the third test object in the second insulation test are excluded from the targets to be set as the fourth test object. As a result, since the conductor patterns P7 and P8 are set as the fourth inspection object, the control unit 18 sequentially selects one of the conductor patterns P7 and P8 in the tenth and eleventh second insulation inspections. Select and set as the fourth object to be inspected. (See the columns “10th” and “11th” in FIG. 4). Thus, the second insulation test is completed. Next, the control unit 18, the results of the first insulation test and the second insulation test are displayed on the display unit outside the figure.

  Here, a medium for supplying the inspection signal S to the conductor pattern P such as a cable or a scanner switch connected to each probe pin 21 and the probe pin 21 that is in contact with each inspection target point Pj of the conductor pattern P (hereinafter, referred to as a medium). , Also referred to as “signal supply medium”), there is a stray capacitance. This stray capacitance is the number of inspection target points Pj connected to the Hi side of the inspection signal S through the signal supply medium, and the inspection target points connected to the Lo side of the inspection signal S through the signal supply medium. The smaller number of Pj is used as a parameter to determine its size. Specifically, as shown in FIG. 3, the stray capacitance between the signal supply media in the first insulation test is the number of points A1 of the test target points Pj of the first test object and the second test object. The smaller the number of points A2 of the inspection target points Pj (the number of points As1 shown at the bottom of the figure) is, the smaller and larger the number. In addition, the stray capacitance between the signal supply media in the second insulation inspection includes the number A3 of inspection target points Pj of the third inspection object and the inspection object points of the fourth inspection object, as shown in FIG. The smaller the number of points P4 of Pj (the number of points As2 shown in the lowermost stage in the figure) is, the smaller and larger it is.

  On the other hand, the larger the stray capacitance between the signal supply media, the longer the time from the start of supply of the inspection signal S to the conductor pattern P until the time when the voltage between the conductor patterns P reaches the specified voltage required for inspection. This makes it difficult to improve inspection efficiency. For this reason, it is preferable that the stray capacitance between the signal supply media is small. In this case, the circuit board 100 is inspected by the conventional configuration and method in which all the conductor patterns Pa are set as the first inspected objects regardless of the number of inspection target points Pj and the first insulation inspection is performed. In some cases, as in the comparative example shown in FIG. 5, the point number As1 that is a parameter for the size of the stray capacitance between the signal supply media is “9” at the maximum.

  On the other hand, in the circuit board inspection apparatus 1 and the circuit board inspection method, when there is a conductor pattern Pa having an inspection target point Pj greater than or equal to the specified number Ar, the conductor pattern Pa is set as the first object to be inspected. The first insulation test is performed excluding the target, and the second insulation test is performed on the conductor pattern Pa, so that the stray capacitance between the signal supply media as shown in FIGS. The number of points As1 and As2 that are the parameters of is suppressed to “3” at the maximum. In this case, in this example, since the maximum number of inspection target points Pj in each conductor pattern P of the circuit board 100 is “9”, the maximum number of points As1 in the conventional configuration and method, and this circuit board inspection apparatus 1 and the maximum number of points As1 and As2 in the circuit board inspection method are slight (in this example, “6”), but in the general circuit board 100, the conductor pattern P having 1000 or more points Pj Since a plurality of conductor patterns P (for example, a connection power source) are provided, the above difference appears as a large value when such a circuit board 100 is inspected. Therefore, in the circuit board inspection apparatus 1 and the circuit board inspection method, the stray capacitance between the signal supply media is sufficiently reduced as compared with the conventional configuration and method, and the inspection efficiency is improved correspondingly. It is possible. In addition, since the stray capacitance between the signal supply media is sufficiently small, the charge charge can be suppressed to a low level. As a result, even if a dielectric breakdown occurs during the execution of the insulation test, the circuit by discharging the charged charge It is possible to reliably prevent the substrate from being damaged.

In the example described above, in the second insulation test, the fourth is set only one conductor pattern P as an object to be inspected, but as shown in FIG. 6, the conductor of the two (an example of a part) A configuration and a method for setting the pattern P as the fourth object to be inspected can also be adopted. Even in this configuration, as shown in the figure, the smaller one of the number of points A1 and A2 that is a parameter of the magnitude of the stray capacitance between the signal supply media is suppressed to “5” at the maximum, It can be understood that the stray capacitance between the signal supply media can be kept sufficiently small as compared with the conventional configuration and method.

  As described above, in the circuit board inspection apparatus 1 and the circuit board inspection method, when there is a conductor pattern Pa having the inspection target point Pj equal to or larger than the predetermined number Ar as a predetermined number, the conductor pattern Pa is set to the first. After performing the first insulation inspection excluding the object to be set as the inspection object, one conductor pattern Pa is set as the third inspection object and the second insulation inspection is executed. For this reason, in the circuit board inspection apparatus 1 and the circuit board inspection method, in the first insulation inspection and the second insulation inspection, the inspection connected to the Hi side of the inspection signal S via the signal supply medium such as the probe pin 21. A signal whose size is determined by the number of target points Pj and the number of test target points Pj connected to the Lo side of the test signal S can be reduced. The stray capacitance between the supply media can be kept sufficiently small. Therefore, according to the circuit board inspection apparatus 1 and the circuit board inspection method, the time from the start of supplying the inspection signal S to the conductor pattern P until the time when the voltage between the conductor patterns P reaches the specified voltage required for the inspection is obtained. As a result, the inspection efficiency can be improved sufficiently. Further, according to the circuit board inspection apparatus 1 and the circuit board inspection method, since the stray capacitance between the signal supply media is sufficiently small, the charge can be suppressed to a low level. Even if the breakdown occurs, it is possible to reliably prevent the circuit board 100 from being damaged by the discharge of the charged charges.

  In addition, according to the circuit board inspection apparatus 1 and the circuit board inspection method, when there are a plurality of specific conductor patterns Pa having inspection target points Pj equal to or greater than the prescribed number Ar, in the second and subsequent second insulation inspections, By excluding the specific conductor pattern Pa set as the third inspected object in the second insulation inspection prior to the setting of the fourth inspected object, the third inspected object and the fourth inspected object Since the number of combinations is reduced, the number of times of the second insulation inspection can be reduced, so that the inspection efficiency can be further improved.

  In the circuit board inspection apparatus 1 and the circuit board inspection method, one conductor pattern P is set as the fourth object to be inspected when the second insulation inspection is performed. Therefore, according to the circuit board inspection apparatus 1 and the circuit board inspection method, in the second insulation inspection, the inspection signal S is compared with the configuration and method in which the plurality of conductor patterns P are set as the fourth inspected object. The smaller one of the number of inspection target points Pj of the conductor pattern P connected to the Hi side and the number of inspection target points Pj of the conductor pattern P connected to the Lo side of the inspection signal S is made smaller. As a result, the stray capacitance between the signal supply media can be further reduced. Therefore, according to the circuit board inspection apparatus 1 and the circuit board inspection method, it is possible to further improve the inspection efficiency and more reliably prevent the circuit board 100 from being damaged during the inspection.

  The circuit board inspection apparatus and the circuit board inspection method are not limited to the above configuration and method. For example, in the first insulation inspection, the conductor pattern P of the first object to be inspected is connected to the inspection signal output unit 14 and the conductor pattern P of the second object to be inspected is connected to the ground potential. On the contrary, a configuration and method for connecting the conductor pattern P of the first object to be inspected to the ground potential as the reference potential and connecting the conductor pattern P of the second object to be inspected to the inspection signal output unit 14. It can also be adopted. Similarly, in the second insulation test, the configuration and method of connecting the conductor pattern P of the third device under test to the inspection signal output unit 14 and connecting the conductor pattern P of the fourth device under test to the ground potential. Instead, the configuration and method of connecting the conductor pattern P of the third object to be inspected to the ground potential as the reference potential and connecting the conductor pattern P of the fourth object to be inspected to the inspection signal output unit 14 are adopted. You can also.

  Further, the example of inspecting the insulation state between the conductor patterns P in the circuit board 100 having the eight conductor patterns P has been described above, but the circuit board 100 having an arbitrary number of three or more conductor patterns P is an object. Also in the inspection, it is possible to achieve the same effect as described above. In the second insulation test, the configuration and method for setting one or two conductor patterns P as the fourth object to be inspected are described above, but the configuration for setting three or more conductor patterns P as the fourth object to be inspected. And methods can also be employed.

DESCRIPTION OF SYMBOLS 1 Circuit board inspection apparatus 14 Inspection signal output part 15 Scanner part 16 Measurement part 18 Control part 21 Probe pin 100 Circuit board Ar Specified number A1, A2, As1, A3, A4, As2 Number of points P1-P8, Pa Conductor pattern Pj Inspection point R Resistance value S Inspection signal

Claims (4)

In a state where an inspection signal is supplied to each conductor pattern via an inspection probe brought into contact with each inspection object point on a circuit board having a plurality of conductor patterns having one or a plurality of inspection object points. A measurement unit for measuring a resistance value between the conductor patterns,
One of the conductor patterns is set as a first object to be inspected and a part or all of the other conductor patterns excluding the first object to be inspected is set as a second object to be inspected. Measured by the measurement unit in a state in which the inspection signal is supplied between the second inspection object and the first inspection object while setting each inspection object point in the second inspection object to the same potential. A first insulation inspection for inspecting an insulation state between the second inspection object and the first inspection object based on the resistance value is a combination of the first inspection object and the second inspection object. In the first insulation inspection after the second time, the conductor pattern set as the first object to be inspected in the first insulation inspection prior to the first insulation inspection is changed. Body and object to be set as the second object to be inspected In addition, one of the conductor patterns set as the second object to be inspected in the immediately preceding first insulation inspection is excluded from the object to be set as the second object to be inspected. A circuit board inspection apparatus having an inspection unit set as an inspection body,
When there is a specific conductor pattern having a predetermined number or more of the inspection target points in each of the conductor patterns on the circuit board, the inspection unit displays the specific conductor pattern as the first object to be inspected. After performing the first insulation test multiple times excluding from the target to be set as
One specific conductor pattern is set as a third object to be inspected, and the specific conductor pattern is set as the second object to be inspected and set as the first object to be inspected in the first insulation inspection performed. above sets the part of the other of the conductor pattern excluding the conductor pattern and the specific conductor pattern as a fourth object to be inspected was, while the respective inspection point in the fourth object to be inspected at the same potential Based on the resistance value measured by the measurement unit in a state where the inspection signal is supplied between the fourth inspected object and the third inspected object, the fourth inspected object and the 3. A circuit board inspection apparatus that performs a second insulation inspection for inspecting an insulation state between the three inspected objects.   When there are a plurality of the specific conductor patterns, the inspection unit sets the specific object set as the third object to be inspected in the second insulation inspection before the second insulation inspection after the second time. The circuit board inspection apparatus according to claim 1, wherein a conductor pattern is excluded from an object to be set as the fourth object to be inspected.   The circuit board inspection apparatus according to claim 1, wherein the inspection unit sets only one conductor pattern as the fourth object to be inspected when the second insulation inspection is performed. One of the conductor patterns in a circuit board having a plurality of conductor patterns having one or a plurality of inspection target points is set as a first object to be inspected, and other than the first object to be inspected is excluded. A part or all of the conductor pattern is set as a second object to be inspected, and the first inspection object and the second object to be inspected are brought into contact with the respective inspection target points through the inspection probes. In a state in which an inspection signal is supplied between the second object to be inspected and the first object to be inspected while setting each inspection object point in the two objects to be inspected to have the same potential, Measuring a resistance value between the first object to be inspected and performing a first insulation inspection for inspecting an insulation state between the second object to be inspected and the first object to be inspected based on the resistance value; A combination of the first inspection object and the second inspection object In addition, when the test is performed a plurality of times, the conductor pattern set as the first object to be inspected in the first insulation inspection prior to the first insulation inspection after the second time is used as the first object to be inspected. In addition, the conductor pattern is excluded from the object to be set as the second object to be inspected, and one conductor pattern among the conductor patterns set as the second object to be inspected in the immediately preceding first insulation inspection is used as the second object to be inspected. A circuit board inspection method for setting as the first object to be inspected excluding a target to be set,
When there is a specific conductor pattern having a predetermined number or more of the inspection target points in each of the conductor patterns on the circuit board, from the target to set the specific conductor pattern as the first inspection object After performing the plurality of first insulation inspections by excluding,
One specific conductor pattern is set as a third object to be inspected, and the specific conductor pattern is set as the second object to be inspected and set as the first object to be inspected in the first insulation inspection performed. above sets the part of the other of the conductor pattern excluding the conductor pattern and the specific conductor pattern as a fourth object to be inspected was, while the respective inspection point in the fourth object to be inspected at the same potential Based on the resistance value measured by the measurement unit in a state where the inspection signal is supplied between the fourth inspected object and the third inspected object, the fourth inspected object and the 3. A circuit board inspection method for performing a second insulation inspection for inspecting an insulation state between the object to be inspected.

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